Scanning electron microscope studies of striations in ZnS
Abstract ZnS platelets crossed by two orthogonal sets of striations were examined. Nomarski optical interference micrographs and scanning electron microscope (SEM) secondary electron micrographs showed that both sets of striations had associated surface topographical features. One set consisted of p...
Ausführliche Beschreibung
Gespeichert in:
| Autor*in: |
Holt, D. B. [verfasserIn] |
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| Format: |
Artikel |
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| Sprache: |
Englisch |
| Erschienen: |
1970 |
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| Schlagwörter: |
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| Anmerkung: |
© Chapman and Hall Ltd. 1970 |
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| Übergeordnetes Werk: |
Enthalten in: Journal of materials science - Kluwer Academic Publishers, 1966, 5(1970), 7 vom: Juli, Seite 546-556 |
|---|---|
| Übergeordnetes Werk: |
volume:5 ; year:1970 ; number:7 ; month:07 ; pages:546-556 |
| Links: |
|---|
| DOI / URN: |
10.1007/BF00554363 |
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| Katalog-ID: |
OLC2046074351 |
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| 520 | |a Abstract ZnS platelets crossed by two orthogonal sets of striations were examined. Nomarski optical interference micrographs and scanning electron microscope (SEM) secondary electron micrographs showed that both sets of striations had associated surface topographical features. One set consisted of polytype or faulted bands, the other of thickness variations (“linear markings”). SEM cathodoluminescence micrographs showed that in some specimens certain lines in both sets were strong light sources. In other specimens only polytype interfaces were linear cathodoluminescent sources. SEM charge collection micrographs showed that many of the polytype or faulted bands could produce contrast possibly due to the separation of electron-hole pairs by internal electric fields associated with these defects. Transmission electron microscopy showed that there could be several different types of faulted stacking structures in areas a micron square in striated ZnS. | ||
| 650 | 4 | |a Scanning Electron Microscope | |
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10.1007/BF00554363 doi (DE-627)OLC2046074351 (DE-He213)BF00554363-p DE-627 ger DE-627 rakwb eng 670 VZ Holt, D. B. verfasserin aut Scanning electron microscope studies of striations in ZnS 1970 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Chapman and Hall Ltd. 1970 Abstract ZnS platelets crossed by two orthogonal sets of striations were examined. Nomarski optical interference micrographs and scanning electron microscope (SEM) secondary electron micrographs showed that both sets of striations had associated surface topographical features. One set consisted of polytype or faulted bands, the other of thickness variations (“linear markings”). SEM cathodoluminescence micrographs showed that in some specimens certain lines in both sets were strong light sources. In other specimens only polytype interfaces were linear cathodoluminescent sources. SEM charge collection micrographs showed that many of the polytype or faulted bands could produce contrast possibly due to the separation of electron-hole pairs by internal electric fields associated with these defects. Transmission electron microscopy showed that there could be several different types of faulted stacking structures in areas a micron square in striated ZnS. Scanning Electron Microscope Transmission Electron Microscopy Electron Micrographs Microscope Study Electron Microscope Study Culpan, M. aut Enthalten in Journal of materials science Kluwer Academic Publishers, 1966 5(1970), 7 vom: Juli, Seite 546-556 (DE-627)129546372 (DE-600)218324-9 (DE-576)014996774 0022-2461 nnns volume:5 year:1970 number:7 month:07 pages:546-556 https://doi.org/10.1007/BF00554363 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC GBV_ILN_11 GBV_ILN_20 GBV_ILN_23 GBV_ILN_30 GBV_ILN_62 GBV_ILN_65 GBV_ILN_70 GBV_ILN_170 GBV_ILN_2004 GBV_ILN_2006 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2057 GBV_ILN_4309 GBV_ILN_4319 GBV_ILN_4336 AR 5 1970 7 07 546-556 |
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10.1007/BF00554363 doi (DE-627)OLC2046074351 (DE-He213)BF00554363-p DE-627 ger DE-627 rakwb eng 670 VZ Holt, D. B. verfasserin aut Scanning electron microscope studies of striations in ZnS 1970 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Chapman and Hall Ltd. 1970 Abstract ZnS platelets crossed by two orthogonal sets of striations were examined. Nomarski optical interference micrographs and scanning electron microscope (SEM) secondary electron micrographs showed that both sets of striations had associated surface topographical features. One set consisted of polytype or faulted bands, the other of thickness variations (“linear markings”). SEM cathodoluminescence micrographs showed that in some specimens certain lines in both sets were strong light sources. In other specimens only polytype interfaces were linear cathodoluminescent sources. SEM charge collection micrographs showed that many of the polytype or faulted bands could produce contrast possibly due to the separation of electron-hole pairs by internal electric fields associated with these defects. Transmission electron microscopy showed that there could be several different types of faulted stacking structures in areas a micron square in striated ZnS. Scanning Electron Microscope Transmission Electron Microscopy Electron Micrographs Microscope Study Electron Microscope Study Culpan, M. aut Enthalten in Journal of materials science Kluwer Academic Publishers, 1966 5(1970), 7 vom: Juli, Seite 546-556 (DE-627)129546372 (DE-600)218324-9 (DE-576)014996774 0022-2461 nnns volume:5 year:1970 number:7 month:07 pages:546-556 https://doi.org/10.1007/BF00554363 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC GBV_ILN_11 GBV_ILN_20 GBV_ILN_23 GBV_ILN_30 GBV_ILN_62 GBV_ILN_65 GBV_ILN_70 GBV_ILN_170 GBV_ILN_2004 GBV_ILN_2006 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2057 GBV_ILN_4309 GBV_ILN_4319 GBV_ILN_4336 AR 5 1970 7 07 546-556 |
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10.1007/BF00554363 doi (DE-627)OLC2046074351 (DE-He213)BF00554363-p DE-627 ger DE-627 rakwb eng 670 VZ Holt, D. B. verfasserin aut Scanning electron microscope studies of striations in ZnS 1970 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Chapman and Hall Ltd. 1970 Abstract ZnS platelets crossed by two orthogonal sets of striations were examined. Nomarski optical interference micrographs and scanning electron microscope (SEM) secondary electron micrographs showed that both sets of striations had associated surface topographical features. One set consisted of polytype or faulted bands, the other of thickness variations (“linear markings”). SEM cathodoluminescence micrographs showed that in some specimens certain lines in both sets were strong light sources. In other specimens only polytype interfaces were linear cathodoluminescent sources. SEM charge collection micrographs showed that many of the polytype or faulted bands could produce contrast possibly due to the separation of electron-hole pairs by internal electric fields associated with these defects. Transmission electron microscopy showed that there could be several different types of faulted stacking structures in areas a micron square in striated ZnS. Scanning Electron Microscope Transmission Electron Microscopy Electron Micrographs Microscope Study Electron Microscope Study Culpan, M. aut Enthalten in Journal of materials science Kluwer Academic Publishers, 1966 5(1970), 7 vom: Juli, Seite 546-556 (DE-627)129546372 (DE-600)218324-9 (DE-576)014996774 0022-2461 nnns volume:5 year:1970 number:7 month:07 pages:546-556 https://doi.org/10.1007/BF00554363 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC GBV_ILN_11 GBV_ILN_20 GBV_ILN_23 GBV_ILN_30 GBV_ILN_62 GBV_ILN_65 GBV_ILN_70 GBV_ILN_170 GBV_ILN_2004 GBV_ILN_2006 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2057 GBV_ILN_4309 GBV_ILN_4319 GBV_ILN_4336 AR 5 1970 7 07 546-556 |
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10.1007/BF00554363 doi (DE-627)OLC2046074351 (DE-He213)BF00554363-p DE-627 ger DE-627 rakwb eng 670 VZ Holt, D. B. verfasserin aut Scanning electron microscope studies of striations in ZnS 1970 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Chapman and Hall Ltd. 1970 Abstract ZnS platelets crossed by two orthogonal sets of striations were examined. Nomarski optical interference micrographs and scanning electron microscope (SEM) secondary electron micrographs showed that both sets of striations had associated surface topographical features. One set consisted of polytype or faulted bands, the other of thickness variations (“linear markings”). SEM cathodoluminescence micrographs showed that in some specimens certain lines in both sets were strong light sources. In other specimens only polytype interfaces were linear cathodoluminescent sources. SEM charge collection micrographs showed that many of the polytype or faulted bands could produce contrast possibly due to the separation of electron-hole pairs by internal electric fields associated with these defects. Transmission electron microscopy showed that there could be several different types of faulted stacking structures in areas a micron square in striated ZnS. Scanning Electron Microscope Transmission Electron Microscopy Electron Micrographs Microscope Study Electron Microscope Study Culpan, M. aut Enthalten in Journal of materials science Kluwer Academic Publishers, 1966 5(1970), 7 vom: Juli, Seite 546-556 (DE-627)129546372 (DE-600)218324-9 (DE-576)014996774 0022-2461 nnns volume:5 year:1970 number:7 month:07 pages:546-556 https://doi.org/10.1007/BF00554363 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC GBV_ILN_11 GBV_ILN_20 GBV_ILN_23 GBV_ILN_30 GBV_ILN_62 GBV_ILN_65 GBV_ILN_70 GBV_ILN_170 GBV_ILN_2004 GBV_ILN_2006 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2057 GBV_ILN_4309 GBV_ILN_4319 GBV_ILN_4336 AR 5 1970 7 07 546-556 |
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Scanning electron microscope studies of striations in ZnS |
| abstract |
Abstract ZnS platelets crossed by two orthogonal sets of striations were examined. Nomarski optical interference micrographs and scanning electron microscope (SEM) secondary electron micrographs showed that both sets of striations had associated surface topographical features. One set consisted of polytype or faulted bands, the other of thickness variations (“linear markings”). SEM cathodoluminescence micrographs showed that in some specimens certain lines in both sets were strong light sources. In other specimens only polytype interfaces were linear cathodoluminescent sources. SEM charge collection micrographs showed that many of the polytype or faulted bands could produce contrast possibly due to the separation of electron-hole pairs by internal electric fields associated with these defects. Transmission electron microscopy showed that there could be several different types of faulted stacking structures in areas a micron square in striated ZnS. © Chapman and Hall Ltd. 1970 |
| abstractGer |
Abstract ZnS platelets crossed by two orthogonal sets of striations were examined. Nomarski optical interference micrographs and scanning electron microscope (SEM) secondary electron micrographs showed that both sets of striations had associated surface topographical features. One set consisted of polytype or faulted bands, the other of thickness variations (“linear markings”). SEM cathodoluminescence micrographs showed that in some specimens certain lines in both sets were strong light sources. In other specimens only polytype interfaces were linear cathodoluminescent sources. SEM charge collection micrographs showed that many of the polytype or faulted bands could produce contrast possibly due to the separation of electron-hole pairs by internal electric fields associated with these defects. Transmission electron microscopy showed that there could be several different types of faulted stacking structures in areas a micron square in striated ZnS. © Chapman and Hall Ltd. 1970 |
| abstract_unstemmed |
Abstract ZnS platelets crossed by two orthogonal sets of striations were examined. Nomarski optical interference micrographs and scanning electron microscope (SEM) secondary electron micrographs showed that both sets of striations had associated surface topographical features. One set consisted of polytype or faulted bands, the other of thickness variations (“linear markings”). SEM cathodoluminescence micrographs showed that in some specimens certain lines in both sets were strong light sources. In other specimens only polytype interfaces were linear cathodoluminescent sources. SEM charge collection micrographs showed that many of the polytype or faulted bands could produce contrast possibly due to the separation of electron-hole pairs by internal electric fields associated with these defects. Transmission electron microscopy showed that there could be several different types of faulted stacking structures in areas a micron square in striated ZnS. © Chapman and Hall Ltd. 1970 |
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7 |
| title_short |
Scanning electron microscope studies of striations in ZnS |
| url |
https://doi.org/10.1007/BF00554363 |
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| author2 |
Culpan, M. |
| author2Str |
Culpan, M. |
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| doi_str |
10.1007/BF00554363 |
| up_date |
2024-07-04T04:12:26.576Z |
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