Structural and optical characterization of Ni-doped CdS quantum dots

Abstract Ni-doped CdS quantum dots have been prepared by chemical precipitation technique. The X-diffraction results indicated that the particle size of Ni-doped CdS nanoparticles is smaller than that of undoped CdS and no secondary phase was observed. The average grain size of the nanoparticles is...
Ausführliche Beschreibung

Gespeichert in:
Autor*in:

Thambidurai, M. [verfasserIn]

Muthukumarasamy, N.

Agilan, S.

Sabari Arul, N.

Murugan, N.

Balasundaraprabhu, R.

Format:

Artikel

Sprache:

Englisch

Erschienen:

2010

Schlagwörter:

High Resolution Transmission Electron Microscope

Field Emission Scanning Electron Microscope Image

Quantum Confinement Effect

High Resolution Transmission Electron Microscope Image

Anmerkung:

© Springer Science+Business Media, LLC 2010

Übergeordnetes Werk:

Enthalten in: Journal of materials science - Springer US, 1966, 46(2010), 9 vom: 29. Dez., Seite 3200-3206

Übergeordnetes Werk:

volume:46 ; year:2010 ; number:9 ; day:29 ; month:12 ; pages:3200-3206

Links:

Volltext

DOI / URN:

10.1007/s10853-010-5204-y

Katalog-ID:

OLC2046366158

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