An experimental refinement of solid–solution relationship in Ca-α-Sialon ceramics by analytical electron microscopy
Abstract Local dopant compositions within individual α-Sialon grains were measured by analytical electron microscopy (AEM) in hot-pressed $ Ca_{x} $$ Si_{12−3x} $$ Al_{3x} $$ O_{x} $$ N_{16−x} $ (x = 0.3–1.4) ceramics. The reduction of local x values from the nominal dopant compositions is about 40%...
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| Autor*in: |
Zhu, Bo [verfasserIn] |
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| Format: |
Artikel |
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| Sprache: |
Englisch |
| Erschienen: |
2011 |
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| Schlagwörter: |
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| Anmerkung: |
© Springer Science+Business Media, LLC 2011 |
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| Übergeordnetes Werk: |
Enthalten in: Journal of materials science - Springer US, 1966, 46(2011), 23 vom: 25. Juni, Seite 7377-7383 |
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| Übergeordnetes Werk: |
volume:46 ; year:2011 ; number:23 ; day:25 ; month:06 ; pages:7377-7383 |
| Links: |
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| DOI / URN: |
10.1007/s10853-011-5698-y |
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OLC2046371550 |
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| 520 | |a Abstract Local dopant compositions within individual α-Sialon grains were measured by analytical electron microscopy (AEM) in hot-pressed $ Ca_{x} $$ Si_{12−3x} $$ Al_{3x} $$ O_{x} $$ N_{16−x} $ (x = 0.3–1.4) ceramics. The reduction of local x values from the nominal dopant compositions is about 40% in general, and it reaches 60% for the end member (x = 1.4) which contains inclusions of AlN-based 21R phase. This results exhibit stronger departures from x than the previous report of 30% dopants missing in α-Sialon phase by electron probe micro-analysis (EPMA) [J Eur Ceram Soc 19:1637, 1999]. Amorphous films of ~1 nm thick were commonly found at grain boundaries (GBs), which could only take a small fraction of undetected dopants while the film composition exhibits a quite different behavior. The general presence of GB films can rationalize the discrepancy between AEM and EPMA results by their differences in probe size and detection geometry, while the much larger gap in the end member suggests the existence of Ca-rich glasses in the intergranular regions. By excluding this end member, a linear relation between dopant solution and lattice expansion is restored in α-Sialon structure, which leads to 20 and 80% increases of the expansion coefficients from those given in the previous and original reports, respectively. This study not only demonstrated the necessity of solubility study in ceramics by AEM refinement, but also opens a new front to correlate the solution behavior with the intergranular glass/amorphous structures, both were regarded so far as largely independent. | ||
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10.1007/s10853-011-5698-y doi (DE-627)OLC2046371550 (DE-He213)s10853-011-5698-y-p DE-627 ger DE-627 rakwb eng 670 VZ Zhu, Bo verfasserin aut An experimental refinement of solid–solution relationship in Ca-α-Sialon ceramics by analytical electron microscopy 2011 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Springer Science+Business Media, LLC 2011 Abstract Local dopant compositions within individual α-Sialon grains were measured by analytical electron microscopy (AEM) in hot-pressed $ Ca_{x} $$ Si_{12−3x} $$ Al_{3x} $$ O_{x} $$ N_{16−x} $ (x = 0.3–1.4) ceramics. The reduction of local x values from the nominal dopant compositions is about 40% in general, and it reaches 60% for the end member (x = 1.4) which contains inclusions of AlN-based 21R phase. This results exhibit stronger departures from x than the previous report of 30% dopants missing in α-Sialon phase by electron probe micro-analysis (EPMA) [J Eur Ceram Soc 19:1637, 1999]. Amorphous films of ~1 nm thick were commonly found at grain boundaries (GBs), which could only take a small fraction of undetected dopants while the film composition exhibits a quite different behavior. The general presence of GB films can rationalize the discrepancy between AEM and EPMA results by their differences in probe size and detection geometry, while the much larger gap in the end member suggests the existence of Ca-rich glasses in the intergranular regions. By excluding this end member, a linear relation between dopant solution and lattice expansion is restored in α-Sialon structure, which leads to 20 and 80% increases of the expansion coefficients from those given in the previous and original reports, respectively. This study not only demonstrated the necessity of solubility study in ceramics by AEM refinement, but also opens a new front to correlate the solution behavior with the intergranular glass/amorphous structures, both were regarded so far as largely independent. Grain Boundary Analytical Electron Microscopy Solution Level Dopant Solution Thin Transmission Electron Microscopy Foil Gu, Hui aut Wang, Pei-ling aut Enthalten in Journal of materials science Springer US, 1966 46(2011), 23 vom: 25. Juni, Seite 7377-7383 (DE-627)129546372 (DE-600)218324-9 (DE-576)014996774 0022-2461 nnns volume:46 year:2011 number:23 day:25 month:06 pages:7377-7383 https://doi.org/10.1007/s10853-011-5698-y lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC GBV_ILN_20 GBV_ILN_21 GBV_ILN_23 GBV_ILN_30 GBV_ILN_32 GBV_ILN_70 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2006 GBV_ILN_2015 GBV_ILN_4046 GBV_ILN_4305 GBV_ILN_4323 AR 46 2011 23 25 06 7377-7383 |
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10.1007/s10853-011-5698-y doi (DE-627)OLC2046371550 (DE-He213)s10853-011-5698-y-p DE-627 ger DE-627 rakwb eng 670 VZ Zhu, Bo verfasserin aut An experimental refinement of solid–solution relationship in Ca-α-Sialon ceramics by analytical electron microscopy 2011 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Springer Science+Business Media, LLC 2011 Abstract Local dopant compositions within individual α-Sialon grains were measured by analytical electron microscopy (AEM) in hot-pressed $ Ca_{x} $$ Si_{12−3x} $$ Al_{3x} $$ O_{x} $$ N_{16−x} $ (x = 0.3–1.4) ceramics. The reduction of local x values from the nominal dopant compositions is about 40% in general, and it reaches 60% for the end member (x = 1.4) which contains inclusions of AlN-based 21R phase. This results exhibit stronger departures from x than the previous report of 30% dopants missing in α-Sialon phase by electron probe micro-analysis (EPMA) [J Eur Ceram Soc 19:1637, 1999]. Amorphous films of ~1 nm thick were commonly found at grain boundaries (GBs), which could only take a small fraction of undetected dopants while the film composition exhibits a quite different behavior. The general presence of GB films can rationalize the discrepancy between AEM and EPMA results by their differences in probe size and detection geometry, while the much larger gap in the end member suggests the existence of Ca-rich glasses in the intergranular regions. By excluding this end member, a linear relation between dopant solution and lattice expansion is restored in α-Sialon structure, which leads to 20 and 80% increases of the expansion coefficients from those given in the previous and original reports, respectively. This study not only demonstrated the necessity of solubility study in ceramics by AEM refinement, but also opens a new front to correlate the solution behavior with the intergranular glass/amorphous structures, both were regarded so far as largely independent. Grain Boundary Analytical Electron Microscopy Solution Level Dopant Solution Thin Transmission Electron Microscopy Foil Gu, Hui aut Wang, Pei-ling aut Enthalten in Journal of materials science Springer US, 1966 46(2011), 23 vom: 25. Juni, Seite 7377-7383 (DE-627)129546372 (DE-600)218324-9 (DE-576)014996774 0022-2461 nnns volume:46 year:2011 number:23 day:25 month:06 pages:7377-7383 https://doi.org/10.1007/s10853-011-5698-y lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC GBV_ILN_20 GBV_ILN_21 GBV_ILN_23 GBV_ILN_30 GBV_ILN_32 GBV_ILN_70 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2006 GBV_ILN_2015 GBV_ILN_4046 GBV_ILN_4305 GBV_ILN_4323 AR 46 2011 23 25 06 7377-7383 |
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10.1007/s10853-011-5698-y doi (DE-627)OLC2046371550 (DE-He213)s10853-011-5698-y-p DE-627 ger DE-627 rakwb eng 670 VZ Zhu, Bo verfasserin aut An experimental refinement of solid–solution relationship in Ca-α-Sialon ceramics by analytical electron microscopy 2011 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Springer Science+Business Media, LLC 2011 Abstract Local dopant compositions within individual α-Sialon grains were measured by analytical electron microscopy (AEM) in hot-pressed $ Ca_{x} $$ Si_{12−3x} $$ Al_{3x} $$ O_{x} $$ N_{16−x} $ (x = 0.3–1.4) ceramics. The reduction of local x values from the nominal dopant compositions is about 40% in general, and it reaches 60% for the end member (x = 1.4) which contains inclusions of AlN-based 21R phase. This results exhibit stronger departures from x than the previous report of 30% dopants missing in α-Sialon phase by electron probe micro-analysis (EPMA) [J Eur Ceram Soc 19:1637, 1999]. Amorphous films of ~1 nm thick were commonly found at grain boundaries (GBs), which could only take a small fraction of undetected dopants while the film composition exhibits a quite different behavior. The general presence of GB films can rationalize the discrepancy between AEM and EPMA results by their differences in probe size and detection geometry, while the much larger gap in the end member suggests the existence of Ca-rich glasses in the intergranular regions. By excluding this end member, a linear relation between dopant solution and lattice expansion is restored in α-Sialon structure, which leads to 20 and 80% increases of the expansion coefficients from those given in the previous and original reports, respectively. This study not only demonstrated the necessity of solubility study in ceramics by AEM refinement, but also opens a new front to correlate the solution behavior with the intergranular glass/amorphous structures, both were regarded so far as largely independent. Grain Boundary Analytical Electron Microscopy Solution Level Dopant Solution Thin Transmission Electron Microscopy Foil Gu, Hui aut Wang, Pei-ling aut Enthalten in Journal of materials science Springer US, 1966 46(2011), 23 vom: 25. Juni, Seite 7377-7383 (DE-627)129546372 (DE-600)218324-9 (DE-576)014996774 0022-2461 nnns volume:46 year:2011 number:23 day:25 month:06 pages:7377-7383 https://doi.org/10.1007/s10853-011-5698-y lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC GBV_ILN_20 GBV_ILN_21 GBV_ILN_23 GBV_ILN_30 GBV_ILN_32 GBV_ILN_70 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2006 GBV_ILN_2015 GBV_ILN_4046 GBV_ILN_4305 GBV_ILN_4323 AR 46 2011 23 25 06 7377-7383 |
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10.1007/s10853-011-5698-y doi (DE-627)OLC2046371550 (DE-He213)s10853-011-5698-y-p DE-627 ger DE-627 rakwb eng 670 VZ Zhu, Bo verfasserin aut An experimental refinement of solid–solution relationship in Ca-α-Sialon ceramics by analytical electron microscopy 2011 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Springer Science+Business Media, LLC 2011 Abstract Local dopant compositions within individual α-Sialon grains were measured by analytical electron microscopy (AEM) in hot-pressed $ Ca_{x} $$ Si_{12−3x} $$ Al_{3x} $$ O_{x} $$ N_{16−x} $ (x = 0.3–1.4) ceramics. The reduction of local x values from the nominal dopant compositions is about 40% in general, and it reaches 60% for the end member (x = 1.4) which contains inclusions of AlN-based 21R phase. This results exhibit stronger departures from x than the previous report of 30% dopants missing in α-Sialon phase by electron probe micro-analysis (EPMA) [J Eur Ceram Soc 19:1637, 1999]. Amorphous films of ~1 nm thick were commonly found at grain boundaries (GBs), which could only take a small fraction of undetected dopants while the film composition exhibits a quite different behavior. The general presence of GB films can rationalize the discrepancy between AEM and EPMA results by their differences in probe size and detection geometry, while the much larger gap in the end member suggests the existence of Ca-rich glasses in the intergranular regions. By excluding this end member, a linear relation between dopant solution and lattice expansion is restored in α-Sialon structure, which leads to 20 and 80% increases of the expansion coefficients from those given in the previous and original reports, respectively. This study not only demonstrated the necessity of solubility study in ceramics by AEM refinement, but also opens a new front to correlate the solution behavior with the intergranular glass/amorphous structures, both were regarded so far as largely independent. Grain Boundary Analytical Electron Microscopy Solution Level Dopant Solution Thin Transmission Electron Microscopy Foil Gu, Hui aut Wang, Pei-ling aut Enthalten in Journal of materials science Springer US, 1966 46(2011), 23 vom: 25. Juni, Seite 7377-7383 (DE-627)129546372 (DE-600)218324-9 (DE-576)014996774 0022-2461 nnns volume:46 year:2011 number:23 day:25 month:06 pages:7377-7383 https://doi.org/10.1007/s10853-011-5698-y lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC GBV_ILN_20 GBV_ILN_21 GBV_ILN_23 GBV_ILN_30 GBV_ILN_32 GBV_ILN_70 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2006 GBV_ILN_2015 GBV_ILN_4046 GBV_ILN_4305 GBV_ILN_4323 AR 46 2011 23 25 06 7377-7383 |
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10.1007/s10853-011-5698-y doi (DE-627)OLC2046371550 (DE-He213)s10853-011-5698-y-p DE-627 ger DE-627 rakwb eng 670 VZ Zhu, Bo verfasserin aut An experimental refinement of solid–solution relationship in Ca-α-Sialon ceramics by analytical electron microscopy 2011 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Springer Science+Business Media, LLC 2011 Abstract Local dopant compositions within individual α-Sialon grains were measured by analytical electron microscopy (AEM) in hot-pressed $ Ca_{x} $$ Si_{12−3x} $$ Al_{3x} $$ O_{x} $$ N_{16−x} $ (x = 0.3–1.4) ceramics. The reduction of local x values from the nominal dopant compositions is about 40% in general, and it reaches 60% for the end member (x = 1.4) which contains inclusions of AlN-based 21R phase. This results exhibit stronger departures from x than the previous report of 30% dopants missing in α-Sialon phase by electron probe micro-analysis (EPMA) [J Eur Ceram Soc 19:1637, 1999]. Amorphous films of ~1 nm thick were commonly found at grain boundaries (GBs), which could only take a small fraction of undetected dopants while the film composition exhibits a quite different behavior. The general presence of GB films can rationalize the discrepancy between AEM and EPMA results by their differences in probe size and detection geometry, while the much larger gap in the end member suggests the existence of Ca-rich glasses in the intergranular regions. By excluding this end member, a linear relation between dopant solution and lattice expansion is restored in α-Sialon structure, which leads to 20 and 80% increases of the expansion coefficients from those given in the previous and original reports, respectively. This study not only demonstrated the necessity of solubility study in ceramics by AEM refinement, but also opens a new front to correlate the solution behavior with the intergranular glass/amorphous structures, both were regarded so far as largely independent. Grain Boundary Analytical Electron Microscopy Solution Level Dopant Solution Thin Transmission Electron Microscopy Foil Gu, Hui aut Wang, Pei-ling aut Enthalten in Journal of materials science Springer US, 1966 46(2011), 23 vom: 25. Juni, Seite 7377-7383 (DE-627)129546372 (DE-600)218324-9 (DE-576)014996774 0022-2461 nnns volume:46 year:2011 number:23 day:25 month:06 pages:7377-7383 https://doi.org/10.1007/s10853-011-5698-y lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC GBV_ILN_20 GBV_ILN_21 GBV_ILN_23 GBV_ILN_30 GBV_ILN_32 GBV_ILN_70 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2006 GBV_ILN_2015 GBV_ILN_4046 GBV_ILN_4305 GBV_ILN_4323 AR 46 2011 23 25 06 7377-7383 |
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an experimental refinement of solid–solution relationship in ca-α-sialon ceramics by analytical electron microscopy |
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An experimental refinement of solid–solution relationship in Ca-α-Sialon ceramics by analytical electron microscopy |
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Abstract Local dopant compositions within individual α-Sialon grains were measured by analytical electron microscopy (AEM) in hot-pressed $ Ca_{x} $$ Si_{12−3x} $$ Al_{3x} $$ O_{x} $$ N_{16−x} $ (x = 0.3–1.4) ceramics. The reduction of local x values from the nominal dopant compositions is about 40% in general, and it reaches 60% for the end member (x = 1.4) which contains inclusions of AlN-based 21R phase. This results exhibit stronger departures from x than the previous report of 30% dopants missing in α-Sialon phase by electron probe micro-analysis (EPMA) [J Eur Ceram Soc 19:1637, 1999]. Amorphous films of ~1 nm thick were commonly found at grain boundaries (GBs), which could only take a small fraction of undetected dopants while the film composition exhibits a quite different behavior. The general presence of GB films can rationalize the discrepancy between AEM and EPMA results by their differences in probe size and detection geometry, while the much larger gap in the end member suggests the existence of Ca-rich glasses in the intergranular regions. By excluding this end member, a linear relation between dopant solution and lattice expansion is restored in α-Sialon structure, which leads to 20 and 80% increases of the expansion coefficients from those given in the previous and original reports, respectively. This study not only demonstrated the necessity of solubility study in ceramics by AEM refinement, but also opens a new front to correlate the solution behavior with the intergranular glass/amorphous structures, both were regarded so far as largely independent. © Springer Science+Business Media, LLC 2011 |
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Abstract Local dopant compositions within individual α-Sialon grains were measured by analytical electron microscopy (AEM) in hot-pressed $ Ca_{x} $$ Si_{12−3x} $$ Al_{3x} $$ O_{x} $$ N_{16−x} $ (x = 0.3–1.4) ceramics. The reduction of local x values from the nominal dopant compositions is about 40% in general, and it reaches 60% for the end member (x = 1.4) which contains inclusions of AlN-based 21R phase. This results exhibit stronger departures from x than the previous report of 30% dopants missing in α-Sialon phase by electron probe micro-analysis (EPMA) [J Eur Ceram Soc 19:1637, 1999]. Amorphous films of ~1 nm thick were commonly found at grain boundaries (GBs), which could only take a small fraction of undetected dopants while the film composition exhibits a quite different behavior. The general presence of GB films can rationalize the discrepancy between AEM and EPMA results by their differences in probe size and detection geometry, while the much larger gap in the end member suggests the existence of Ca-rich glasses in the intergranular regions. By excluding this end member, a linear relation between dopant solution and lattice expansion is restored in α-Sialon structure, which leads to 20 and 80% increases of the expansion coefficients from those given in the previous and original reports, respectively. This study not only demonstrated the necessity of solubility study in ceramics by AEM refinement, but also opens a new front to correlate the solution behavior with the intergranular glass/amorphous structures, both were regarded so far as largely independent. © Springer Science+Business Media, LLC 2011 |
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Abstract Local dopant compositions within individual α-Sialon grains were measured by analytical electron microscopy (AEM) in hot-pressed $ Ca_{x} $$ Si_{12−3x} $$ Al_{3x} $$ O_{x} $$ N_{16−x} $ (x = 0.3–1.4) ceramics. The reduction of local x values from the nominal dopant compositions is about 40% in general, and it reaches 60% for the end member (x = 1.4) which contains inclusions of AlN-based 21R phase. This results exhibit stronger departures from x than the previous report of 30% dopants missing in α-Sialon phase by electron probe micro-analysis (EPMA) [J Eur Ceram Soc 19:1637, 1999]. Amorphous films of ~1 nm thick were commonly found at grain boundaries (GBs), which could only take a small fraction of undetected dopants while the film composition exhibits a quite different behavior. The general presence of GB films can rationalize the discrepancy between AEM and EPMA results by their differences in probe size and detection geometry, while the much larger gap in the end member suggests the existence of Ca-rich glasses in the intergranular regions. By excluding this end member, a linear relation between dopant solution and lattice expansion is restored in α-Sialon structure, which leads to 20 and 80% increases of the expansion coefficients from those given in the previous and original reports, respectively. This study not only demonstrated the necessity of solubility study in ceramics by AEM refinement, but also opens a new front to correlate the solution behavior with the intergranular glass/amorphous structures, both were regarded so far as largely independent. © Springer Science+Business Media, LLC 2011 |
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