Crystalline coherence length effects on the thermal conductivity of MgO thin films
Abstract Phonon scattering in crystalline systems can be strongly dictated by a wide array of defects, many of which can be difficult to observe via standard microscopy techniques. We experimentally demonstrate that the phonon thermal conductivity of MgO thin films is proportional to the crystal’s c...
Ausführliche Beschreibung
Gespeichert in:
| Autor*in: |
Meyer, Kelsey E. [verfasserIn] |
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| Format: |
Artikel |
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| Sprache: |
Englisch |
| Erschienen: |
2016 |
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| Schlagwörter: |
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| Anmerkung: |
© Springer Science+Business Media New York 2016 |
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| Übergeordnetes Werk: |
Enthalten in: Journal of materials science - Springer US, 1966, 51(2016), 23 vom: 05. Aug., Seite 10408-10417 |
|---|---|
| Übergeordnetes Werk: |
volume:51 ; year:2016 ; number:23 ; day:05 ; month:08 ; pages:10408-10417 |
| Links: |
|---|
| DOI / URN: |
10.1007/s10853-016-0261-5 |
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| Katalog-ID: |
OLC2046416791 |
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| 520 | |a Abstract Phonon scattering in crystalline systems can be strongly dictated by a wide array of defects, many of which can be difficult to observe via standard microscopy techniques. We experimentally demonstrate that the phonon thermal conductivity of MgO thin films is proportional to the crystal’s coherence length, a property of a solid that quantifies the length scale associated with crystalline imperfections. Sputter-deposited films were prepared on (100)-oriented silicon and then annealed to vary the crystalline coherence, as characterized using x-ray diffraction line broadening. We find that the measured thermal conductivity of the MgO films varies proportionally with crystalline coherence length, which is ultimately limited by the grain size. The microstructural length scales associated with crystalline defects, such as small-angle tilt boundaries, dictate this crystalline coherence length, and our results demonstrate the role that this length scale has on the phonon thermal conductivity of thin films. Our results suggest that this crystalline coherence length scale provides a measure of the limiting phonon mean free path in crystalline solids, a quantity that is often difficult to measure and observe with more traditional imagining techniques. | ||
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| 650 | 4 | |a Coherence Length | |
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| 700 | 1 | |a Maria, Jon-Paul |4 aut | |
| 700 | 1 | |a Ihlefeld, Jon F. |4 aut | |
| 700 | 1 | |a Hopkins, Patrick E. |4 aut | |
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10.1007/s10853-016-0261-5 doi (DE-627)OLC2046416791 (DE-He213)s10853-016-0261-5-p DE-627 ger DE-627 rakwb eng 670 VZ Meyer, Kelsey E. verfasserin aut Crystalline coherence length effects on the thermal conductivity of MgO thin films 2016 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Springer Science+Business Media New York 2016 Abstract Phonon scattering in crystalline systems can be strongly dictated by a wide array of defects, many of which can be difficult to observe via standard microscopy techniques. We experimentally demonstrate that the phonon thermal conductivity of MgO thin films is proportional to the crystal’s coherence length, a property of a solid that quantifies the length scale associated with crystalline imperfections. Sputter-deposited films were prepared on (100)-oriented silicon and then annealed to vary the crystalline coherence, as characterized using x-ray diffraction line broadening. We find that the measured thermal conductivity of the MgO films varies proportionally with crystalline coherence length, which is ultimately limited by the grain size. The microstructural length scales associated with crystalline defects, such as small-angle tilt boundaries, dictate this crystalline coherence length, and our results demonstrate the role that this length scale has on the phonon thermal conductivity of thin films. Our results suggest that this crystalline coherence length scale provides a measure of the limiting phonon mean free path in crystalline solids, a quantity that is often difficult to measure and observe with more traditional imagining techniques. Thermal Conductivity Coherence Length Thermal Conductivity Measurement Phonon Thermal Conductivity Thermal Boundary Conductance Cheaito, Ramez aut Paisley, Elizabeth aut Shelton, Christopher T. aut Braun, Jeffrey L. aut Maria, Jon-Paul aut Ihlefeld, Jon F. aut Hopkins, Patrick E. aut Enthalten in Journal of materials science Springer US, 1966 51(2016), 23 vom: 05. Aug., Seite 10408-10417 (DE-627)129546372 (DE-600)218324-9 (DE-576)014996774 0022-2461 nnns volume:51 year:2016 number:23 day:05 month:08 pages:10408-10417 https://doi.org/10.1007/s10853-016-0261-5 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC GBV_ILN_30 GBV_ILN_70 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_4046 GBV_ILN_4305 GBV_ILN_4323 AR 51 2016 23 05 08 10408-10417 |
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10.1007/s10853-016-0261-5 doi (DE-627)OLC2046416791 (DE-He213)s10853-016-0261-5-p DE-627 ger DE-627 rakwb eng 670 VZ Meyer, Kelsey E. verfasserin aut Crystalline coherence length effects on the thermal conductivity of MgO thin films 2016 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Springer Science+Business Media New York 2016 Abstract Phonon scattering in crystalline systems can be strongly dictated by a wide array of defects, many of which can be difficult to observe via standard microscopy techniques. We experimentally demonstrate that the phonon thermal conductivity of MgO thin films is proportional to the crystal’s coherence length, a property of a solid that quantifies the length scale associated with crystalline imperfections. Sputter-deposited films were prepared on (100)-oriented silicon and then annealed to vary the crystalline coherence, as characterized using x-ray diffraction line broadening. We find that the measured thermal conductivity of the MgO films varies proportionally with crystalline coherence length, which is ultimately limited by the grain size. The microstructural length scales associated with crystalline defects, such as small-angle tilt boundaries, dictate this crystalline coherence length, and our results demonstrate the role that this length scale has on the phonon thermal conductivity of thin films. Our results suggest that this crystalline coherence length scale provides a measure of the limiting phonon mean free path in crystalline solids, a quantity that is often difficult to measure and observe with more traditional imagining techniques. Thermal Conductivity Coherence Length Thermal Conductivity Measurement Phonon Thermal Conductivity Thermal Boundary Conductance Cheaito, Ramez aut Paisley, Elizabeth aut Shelton, Christopher T. aut Braun, Jeffrey L. aut Maria, Jon-Paul aut Ihlefeld, Jon F. aut Hopkins, Patrick E. aut Enthalten in Journal of materials science Springer US, 1966 51(2016), 23 vom: 05. Aug., Seite 10408-10417 (DE-627)129546372 (DE-600)218324-9 (DE-576)014996774 0022-2461 nnns volume:51 year:2016 number:23 day:05 month:08 pages:10408-10417 https://doi.org/10.1007/s10853-016-0261-5 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC GBV_ILN_30 GBV_ILN_70 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_4046 GBV_ILN_4305 GBV_ILN_4323 AR 51 2016 23 05 08 10408-10417 |
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10.1007/s10853-016-0261-5 doi (DE-627)OLC2046416791 (DE-He213)s10853-016-0261-5-p DE-627 ger DE-627 rakwb eng 670 VZ Meyer, Kelsey E. verfasserin aut Crystalline coherence length effects on the thermal conductivity of MgO thin films 2016 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Springer Science+Business Media New York 2016 Abstract Phonon scattering in crystalline systems can be strongly dictated by a wide array of defects, many of which can be difficult to observe via standard microscopy techniques. We experimentally demonstrate that the phonon thermal conductivity of MgO thin films is proportional to the crystal’s coherence length, a property of a solid that quantifies the length scale associated with crystalline imperfections. Sputter-deposited films were prepared on (100)-oriented silicon and then annealed to vary the crystalline coherence, as characterized using x-ray diffraction line broadening. We find that the measured thermal conductivity of the MgO films varies proportionally with crystalline coherence length, which is ultimately limited by the grain size. The microstructural length scales associated with crystalline defects, such as small-angle tilt boundaries, dictate this crystalline coherence length, and our results demonstrate the role that this length scale has on the phonon thermal conductivity of thin films. Our results suggest that this crystalline coherence length scale provides a measure of the limiting phonon mean free path in crystalline solids, a quantity that is often difficult to measure and observe with more traditional imagining techniques. Thermal Conductivity Coherence Length Thermal Conductivity Measurement Phonon Thermal Conductivity Thermal Boundary Conductance Cheaito, Ramez aut Paisley, Elizabeth aut Shelton, Christopher T. aut Braun, Jeffrey L. aut Maria, Jon-Paul aut Ihlefeld, Jon F. aut Hopkins, Patrick E. aut Enthalten in Journal of materials science Springer US, 1966 51(2016), 23 vom: 05. Aug., Seite 10408-10417 (DE-627)129546372 (DE-600)218324-9 (DE-576)014996774 0022-2461 nnns volume:51 year:2016 number:23 day:05 month:08 pages:10408-10417 https://doi.org/10.1007/s10853-016-0261-5 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC GBV_ILN_30 GBV_ILN_70 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_4046 GBV_ILN_4305 GBV_ILN_4323 AR 51 2016 23 05 08 10408-10417 |
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10.1007/s10853-016-0261-5 doi (DE-627)OLC2046416791 (DE-He213)s10853-016-0261-5-p DE-627 ger DE-627 rakwb eng 670 VZ Meyer, Kelsey E. verfasserin aut Crystalline coherence length effects on the thermal conductivity of MgO thin films 2016 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Springer Science+Business Media New York 2016 Abstract Phonon scattering in crystalline systems can be strongly dictated by a wide array of defects, many of which can be difficult to observe via standard microscopy techniques. We experimentally demonstrate that the phonon thermal conductivity of MgO thin films is proportional to the crystal’s coherence length, a property of a solid that quantifies the length scale associated with crystalline imperfections. Sputter-deposited films were prepared on (100)-oriented silicon and then annealed to vary the crystalline coherence, as characterized using x-ray diffraction line broadening. We find that the measured thermal conductivity of the MgO films varies proportionally with crystalline coherence length, which is ultimately limited by the grain size. The microstructural length scales associated with crystalline defects, such as small-angle tilt boundaries, dictate this crystalline coherence length, and our results demonstrate the role that this length scale has on the phonon thermal conductivity of thin films. Our results suggest that this crystalline coherence length scale provides a measure of the limiting phonon mean free path in crystalline solids, a quantity that is often difficult to measure and observe with more traditional imagining techniques. Thermal Conductivity Coherence Length Thermal Conductivity Measurement Phonon Thermal Conductivity Thermal Boundary Conductance Cheaito, Ramez aut Paisley, Elizabeth aut Shelton, Christopher T. aut Braun, Jeffrey L. aut Maria, Jon-Paul aut Ihlefeld, Jon F. aut Hopkins, Patrick E. aut Enthalten in Journal of materials science Springer US, 1966 51(2016), 23 vom: 05. Aug., Seite 10408-10417 (DE-627)129546372 (DE-600)218324-9 (DE-576)014996774 0022-2461 nnns volume:51 year:2016 number:23 day:05 month:08 pages:10408-10417 https://doi.org/10.1007/s10853-016-0261-5 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC GBV_ILN_30 GBV_ILN_70 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_4046 GBV_ILN_4305 GBV_ILN_4323 AR 51 2016 23 05 08 10408-10417 |
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10.1007/s10853-016-0261-5 doi (DE-627)OLC2046416791 (DE-He213)s10853-016-0261-5-p DE-627 ger DE-627 rakwb eng 670 VZ Meyer, Kelsey E. verfasserin aut Crystalline coherence length effects on the thermal conductivity of MgO thin films 2016 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Springer Science+Business Media New York 2016 Abstract Phonon scattering in crystalline systems can be strongly dictated by a wide array of defects, many of which can be difficult to observe via standard microscopy techniques. We experimentally demonstrate that the phonon thermal conductivity of MgO thin films is proportional to the crystal’s coherence length, a property of a solid that quantifies the length scale associated with crystalline imperfections. Sputter-deposited films were prepared on (100)-oriented silicon and then annealed to vary the crystalline coherence, as characterized using x-ray diffraction line broadening. We find that the measured thermal conductivity of the MgO films varies proportionally with crystalline coherence length, which is ultimately limited by the grain size. The microstructural length scales associated with crystalline defects, such as small-angle tilt boundaries, dictate this crystalline coherence length, and our results demonstrate the role that this length scale has on the phonon thermal conductivity of thin films. Our results suggest that this crystalline coherence length scale provides a measure of the limiting phonon mean free path in crystalline solids, a quantity that is often difficult to measure and observe with more traditional imagining techniques. Thermal Conductivity Coherence Length Thermal Conductivity Measurement Phonon Thermal Conductivity Thermal Boundary Conductance Cheaito, Ramez aut Paisley, Elizabeth aut Shelton, Christopher T. aut Braun, Jeffrey L. aut Maria, Jon-Paul aut Ihlefeld, Jon F. aut Hopkins, Patrick E. aut Enthalten in Journal of materials science Springer US, 1966 51(2016), 23 vom: 05. Aug., Seite 10408-10417 (DE-627)129546372 (DE-600)218324-9 (DE-576)014996774 0022-2461 nnns volume:51 year:2016 number:23 day:05 month:08 pages:10408-10417 https://doi.org/10.1007/s10853-016-0261-5 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC GBV_ILN_30 GBV_ILN_70 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_4046 GBV_ILN_4305 GBV_ILN_4323 AR 51 2016 23 05 08 10408-10417 |
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Crystalline coherence length effects on the thermal conductivity of MgO thin films |
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Crystalline coherence length effects on the thermal conductivity of MgO thin films |
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Meyer, Kelsey E. |
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Meyer, Kelsey E. Cheaito, Ramez Paisley, Elizabeth Shelton, Christopher T. Braun, Jeffrey L. Maria, Jon-Paul Ihlefeld, Jon F. Hopkins, Patrick E. |
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crystalline coherence length effects on the thermal conductivity of mgo thin films |
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Crystalline coherence length effects on the thermal conductivity of MgO thin films |
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Abstract Phonon scattering in crystalline systems can be strongly dictated by a wide array of defects, many of which can be difficult to observe via standard microscopy techniques. We experimentally demonstrate that the phonon thermal conductivity of MgO thin films is proportional to the crystal’s coherence length, a property of a solid that quantifies the length scale associated with crystalline imperfections. Sputter-deposited films were prepared on (100)-oriented silicon and then annealed to vary the crystalline coherence, as characterized using x-ray diffraction line broadening. We find that the measured thermal conductivity of the MgO films varies proportionally with crystalline coherence length, which is ultimately limited by the grain size. The microstructural length scales associated with crystalline defects, such as small-angle tilt boundaries, dictate this crystalline coherence length, and our results demonstrate the role that this length scale has on the phonon thermal conductivity of thin films. Our results suggest that this crystalline coherence length scale provides a measure of the limiting phonon mean free path in crystalline solids, a quantity that is often difficult to measure and observe with more traditional imagining techniques. © Springer Science+Business Media New York 2016 |
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Abstract Phonon scattering in crystalline systems can be strongly dictated by a wide array of defects, many of which can be difficult to observe via standard microscopy techniques. We experimentally demonstrate that the phonon thermal conductivity of MgO thin films is proportional to the crystal’s coherence length, a property of a solid that quantifies the length scale associated with crystalline imperfections. Sputter-deposited films were prepared on (100)-oriented silicon and then annealed to vary the crystalline coherence, as characterized using x-ray diffraction line broadening. We find that the measured thermal conductivity of the MgO films varies proportionally with crystalline coherence length, which is ultimately limited by the grain size. The microstructural length scales associated with crystalline defects, such as small-angle tilt boundaries, dictate this crystalline coherence length, and our results demonstrate the role that this length scale has on the phonon thermal conductivity of thin films. Our results suggest that this crystalline coherence length scale provides a measure of the limiting phonon mean free path in crystalline solids, a quantity that is often difficult to measure and observe with more traditional imagining techniques. © Springer Science+Business Media New York 2016 |
| abstract_unstemmed |
Abstract Phonon scattering in crystalline systems can be strongly dictated by a wide array of defects, many of which can be difficult to observe via standard microscopy techniques. We experimentally demonstrate that the phonon thermal conductivity of MgO thin films is proportional to the crystal’s coherence length, a property of a solid that quantifies the length scale associated with crystalline imperfections. Sputter-deposited films were prepared on (100)-oriented silicon and then annealed to vary the crystalline coherence, as characterized using x-ray diffraction line broadening. We find that the measured thermal conductivity of the MgO films varies proportionally with crystalline coherence length, which is ultimately limited by the grain size. The microstructural length scales associated with crystalline defects, such as small-angle tilt boundaries, dictate this crystalline coherence length, and our results demonstrate the role that this length scale has on the phonon thermal conductivity of thin films. Our results suggest that this crystalline coherence length scale provides a measure of the limiting phonon mean free path in crystalline solids, a quantity that is often difficult to measure and observe with more traditional imagining techniques. © Springer Science+Business Media New York 2016 |
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Crystalline coherence length effects on the thermal conductivity of MgO thin films |
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