The approximate concurrence of metrological and operational bases when measuring deviations in the shape of surface by straightedge

Gespeichert in:

Autor*in:	Pustovalov, V. G. [verfasserIn]

Format:	Artikel
Sprache:	Englisch

Erschienen:	1981

Schlagwörter:	Physical Chemistry Analytical Chemistry Operational Basis

Anmerkung:	© Plenum Publishing Corporation 1982

Übergeordnetes Werk:	Enthalten in: Measurement techniques - Kluwer Academic Publishers-Plenum Publishers, 1958, 24(1981), 9 vom: Sept., Seite 720-722
Übergeordnetes Werk:	volume:24 ; year:1981 ; number:9 ; month:09 ; pages:720-722

Links:	Volltext

DOI / URN:	10.1007/BF00829944

Katalog-ID:	OLC2047641888

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