Determination of spatial grain size with the area-weighted grain area distribution of the planar sections in polycrystalline materials
Abstract The electron backscattering diffraction (EBSD) technique has made it quite easy to obtain the grain area distribution in a planar section of the polycrystalline materials. Usually, area-weighted grain area and number-weighted grain area show completely different distribution profiles. Inste...
Ausführliche Beschreibung
Autor*in: |
Yin, Fuxing [verfasserIn] |
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Format: |
Artikel |
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Sprache: |
Englisch |
Erschienen: |
2006 |
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Schlagwörter: |
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Anmerkung: |
© ASM International & TMS-The Minerals Metals and Materials Society 2006 |
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Übergeordnetes Werk: |
Enthalten in: Metallurgical and materials transactions / A - Springer-Verlag, 1994, 37(2006), 12 vom: Dez., Seite 3707-3714 |
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Übergeordnetes Werk: |
volume:37 ; year:2006 ; number:12 ; month:12 ; pages:3707-3714 |
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DOI / URN: |
10.1007/s11661-006-1064-0 |
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Katalog-ID: |
OLC2054024716 |
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520 | |a Abstract The electron backscattering diffraction (EBSD) technique has made it quite easy to obtain the grain area distribution in a planar section of the polycrystalline materials. Usually, area-weighted grain area and number-weighted grain area show completely different distribution profiles. Instead of the nominal average grain size calculated from the grain area distribution results, the spatial grain size and its distribution character reflect the real features of the materials and those parameters are expected through a simple measurement on the planar sections. In the present work, the section area distribution model of a randomly sliced truncated octahedron is used to relate the lognormally distributed spatial grain size to the area-weighted grain size distribution features. Based on the truncated octahedron grain shape model, area-weighted grain area distribution is derived by convoluting the lognormal distribution of the area of the section with the maximum section area (SMSA) in each grain and the area-weighted section area distribution of the sliced truncated octahedron. It is found that area-weighted grain area distribution on a planar section shows also the lognormal distribution character when the spatial grain size has the lognormal distribution character. Meanwhile, the variance parameter, τ(ins), and the mean value of grain area, $$X_s^{mean} $$, obtained by fitting the area-weighted grain area distribution, have also been related to the lognormal distribution characters of the spatial grain size, i.e., A and $$\overline \nu _n $$. The simulation results are then experimentally checked on a polygonal grain structure of hot-rolled low-carbon steel by applying the point-sampling method to obtain the spatial grain size distribution features. | ||
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10.1007/s11661-006-1064-0 doi (DE-627)OLC2054024716 (DE-He213)s11661-006-1064-0-p DE-627 ger DE-627 rakwb eng 670 530 VZ 19,1 ssgn Yin, Fuxing verfasserin aut Determination of spatial grain size with the area-weighted grain area distribution of the planar sections in polycrystalline materials 2006 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © ASM International & TMS-The Minerals Metals and Materials Society 2006 Abstract The electron backscattering diffraction (EBSD) technique has made it quite easy to obtain the grain area distribution in a planar section of the polycrystalline materials. Usually, area-weighted grain area and number-weighted grain area show completely different distribution profiles. Instead of the nominal average grain size calculated from the grain area distribution results, the spatial grain size and its distribution character reflect the real features of the materials and those parameters are expected through a simple measurement on the planar sections. In the present work, the section area distribution model of a randomly sliced truncated octahedron is used to relate the lognormally distributed spatial grain size to the area-weighted grain size distribution features. Based on the truncated octahedron grain shape model, area-weighted grain area distribution is derived by convoluting the lognormal distribution of the area of the section with the maximum section area (SMSA) in each grain and the area-weighted section area distribution of the sliced truncated octahedron. It is found that area-weighted grain area distribution on a planar section shows also the lognormal distribution character when the spatial grain size has the lognormal distribution character. Meanwhile, the variance parameter, τ(ins), and the mean value of grain area, $$X_s^{mean} $$, obtained by fitting the area-weighted grain area distribution, have also been related to the lognormal distribution characters of the spatial grain size, i.e., A and $$\overline \nu _n $$. The simulation results are then experimentally checked on a polygonal grain structure of hot-rolled low-carbon steel by applying the point-sampling method to obtain the spatial grain size distribution features. Material Transaction Section Area Grain Size Distribution Area Distribution Planar Section Sakurai, Atsuko aut Song, Xiaoyan aut Enthalten in Metallurgical and materials transactions / A Springer-Verlag, 1994 37(2006), 12 vom: Dez., Seite 3707-3714 (DE-627)171342011 (DE-600)1179415-X (DE-576)038876930 1073-5623 nnns volume:37 year:2006 number:12 month:12 pages:3707-3714 https://doi.org/10.1007/s11661-006-1064-0 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY GBV_ILN_20 GBV_ILN_23 GBV_ILN_30 GBV_ILN_62 GBV_ILN_70 GBV_ILN_602 GBV_ILN_2006 GBV_ILN_2020 GBV_ILN_2027 GBV_ILN_4116 GBV_ILN_4313 GBV_ILN_4316 GBV_ILN_4319 GBV_ILN_4700 AR 37 2006 12 12 3707-3714 |
spelling |
10.1007/s11661-006-1064-0 doi (DE-627)OLC2054024716 (DE-He213)s11661-006-1064-0-p DE-627 ger DE-627 rakwb eng 670 530 VZ 19,1 ssgn Yin, Fuxing verfasserin aut Determination of spatial grain size with the area-weighted grain area distribution of the planar sections in polycrystalline materials 2006 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © ASM International & TMS-The Minerals Metals and Materials Society 2006 Abstract The electron backscattering diffraction (EBSD) technique has made it quite easy to obtain the grain area distribution in a planar section of the polycrystalline materials. Usually, area-weighted grain area and number-weighted grain area show completely different distribution profiles. Instead of the nominal average grain size calculated from the grain area distribution results, the spatial grain size and its distribution character reflect the real features of the materials and those parameters are expected through a simple measurement on the planar sections. In the present work, the section area distribution model of a randomly sliced truncated octahedron is used to relate the lognormally distributed spatial grain size to the area-weighted grain size distribution features. Based on the truncated octahedron grain shape model, area-weighted grain area distribution is derived by convoluting the lognormal distribution of the area of the section with the maximum section area (SMSA) in each grain and the area-weighted section area distribution of the sliced truncated octahedron. It is found that area-weighted grain area distribution on a planar section shows also the lognormal distribution character when the spatial grain size has the lognormal distribution character. Meanwhile, the variance parameter, τ(ins), and the mean value of grain area, $$X_s^{mean} $$, obtained by fitting the area-weighted grain area distribution, have also been related to the lognormal distribution characters of the spatial grain size, i.e., A and $$\overline \nu _n $$. The simulation results are then experimentally checked on a polygonal grain structure of hot-rolled low-carbon steel by applying the point-sampling method to obtain the spatial grain size distribution features. Material Transaction Section Area Grain Size Distribution Area Distribution Planar Section Sakurai, Atsuko aut Song, Xiaoyan aut Enthalten in Metallurgical and materials transactions / A Springer-Verlag, 1994 37(2006), 12 vom: Dez., Seite 3707-3714 (DE-627)171342011 (DE-600)1179415-X (DE-576)038876930 1073-5623 nnns volume:37 year:2006 number:12 month:12 pages:3707-3714 https://doi.org/10.1007/s11661-006-1064-0 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY GBV_ILN_20 GBV_ILN_23 GBV_ILN_30 GBV_ILN_62 GBV_ILN_70 GBV_ILN_602 GBV_ILN_2006 GBV_ILN_2020 GBV_ILN_2027 GBV_ILN_4116 GBV_ILN_4313 GBV_ILN_4316 GBV_ILN_4319 GBV_ILN_4700 AR 37 2006 12 12 3707-3714 |
allfields_unstemmed |
10.1007/s11661-006-1064-0 doi (DE-627)OLC2054024716 (DE-He213)s11661-006-1064-0-p DE-627 ger DE-627 rakwb eng 670 530 VZ 19,1 ssgn Yin, Fuxing verfasserin aut Determination of spatial grain size with the area-weighted grain area distribution of the planar sections in polycrystalline materials 2006 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © ASM International & TMS-The Minerals Metals and Materials Society 2006 Abstract The electron backscattering diffraction (EBSD) technique has made it quite easy to obtain the grain area distribution in a planar section of the polycrystalline materials. Usually, area-weighted grain area and number-weighted grain area show completely different distribution profiles. Instead of the nominal average grain size calculated from the grain area distribution results, the spatial grain size and its distribution character reflect the real features of the materials and those parameters are expected through a simple measurement on the planar sections. In the present work, the section area distribution model of a randomly sliced truncated octahedron is used to relate the lognormally distributed spatial grain size to the area-weighted grain size distribution features. Based on the truncated octahedron grain shape model, area-weighted grain area distribution is derived by convoluting the lognormal distribution of the area of the section with the maximum section area (SMSA) in each grain and the area-weighted section area distribution of the sliced truncated octahedron. It is found that area-weighted grain area distribution on a planar section shows also the lognormal distribution character when the spatial grain size has the lognormal distribution character. Meanwhile, the variance parameter, τ(ins), and the mean value of grain area, $$X_s^{mean} $$, obtained by fitting the area-weighted grain area distribution, have also been related to the lognormal distribution characters of the spatial grain size, i.e., A and $$\overline \nu _n $$. The simulation results are then experimentally checked on a polygonal grain structure of hot-rolled low-carbon steel by applying the point-sampling method to obtain the spatial grain size distribution features. Material Transaction Section Area Grain Size Distribution Area Distribution Planar Section Sakurai, Atsuko aut Song, Xiaoyan aut Enthalten in Metallurgical and materials transactions / A Springer-Verlag, 1994 37(2006), 12 vom: Dez., Seite 3707-3714 (DE-627)171342011 (DE-600)1179415-X (DE-576)038876930 1073-5623 nnns volume:37 year:2006 number:12 month:12 pages:3707-3714 https://doi.org/10.1007/s11661-006-1064-0 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY GBV_ILN_20 GBV_ILN_23 GBV_ILN_30 GBV_ILN_62 GBV_ILN_70 GBV_ILN_602 GBV_ILN_2006 GBV_ILN_2020 GBV_ILN_2027 GBV_ILN_4116 GBV_ILN_4313 GBV_ILN_4316 GBV_ILN_4319 GBV_ILN_4700 AR 37 2006 12 12 3707-3714 |
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10.1007/s11661-006-1064-0 doi (DE-627)OLC2054024716 (DE-He213)s11661-006-1064-0-p DE-627 ger DE-627 rakwb eng 670 530 VZ 19,1 ssgn Yin, Fuxing verfasserin aut Determination of spatial grain size with the area-weighted grain area distribution of the planar sections in polycrystalline materials 2006 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © ASM International & TMS-The Minerals Metals and Materials Society 2006 Abstract The electron backscattering diffraction (EBSD) technique has made it quite easy to obtain the grain area distribution in a planar section of the polycrystalline materials. Usually, area-weighted grain area and number-weighted grain area show completely different distribution profiles. Instead of the nominal average grain size calculated from the grain area distribution results, the spatial grain size and its distribution character reflect the real features of the materials and those parameters are expected through a simple measurement on the planar sections. In the present work, the section area distribution model of a randomly sliced truncated octahedron is used to relate the lognormally distributed spatial grain size to the area-weighted grain size distribution features. Based on the truncated octahedron grain shape model, area-weighted grain area distribution is derived by convoluting the lognormal distribution of the area of the section with the maximum section area (SMSA) in each grain and the area-weighted section area distribution of the sliced truncated octahedron. It is found that area-weighted grain area distribution on a planar section shows also the lognormal distribution character when the spatial grain size has the lognormal distribution character. Meanwhile, the variance parameter, τ(ins), and the mean value of grain area, $$X_s^{mean} $$, obtained by fitting the area-weighted grain area distribution, have also been related to the lognormal distribution characters of the spatial grain size, i.e., A and $$\overline \nu _n $$. The simulation results are then experimentally checked on a polygonal grain structure of hot-rolled low-carbon steel by applying the point-sampling method to obtain the spatial grain size distribution features. Material Transaction Section Area Grain Size Distribution Area Distribution Planar Section Sakurai, Atsuko aut Song, Xiaoyan aut Enthalten in Metallurgical and materials transactions / A Springer-Verlag, 1994 37(2006), 12 vom: Dez., Seite 3707-3714 (DE-627)171342011 (DE-600)1179415-X (DE-576)038876930 1073-5623 nnns volume:37 year:2006 number:12 month:12 pages:3707-3714 https://doi.org/10.1007/s11661-006-1064-0 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY GBV_ILN_20 GBV_ILN_23 GBV_ILN_30 GBV_ILN_62 GBV_ILN_70 GBV_ILN_602 GBV_ILN_2006 GBV_ILN_2020 GBV_ILN_2027 GBV_ILN_4116 GBV_ILN_4313 GBV_ILN_4316 GBV_ILN_4319 GBV_ILN_4700 AR 37 2006 12 12 3707-3714 |
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10.1007/s11661-006-1064-0 doi (DE-627)OLC2054024716 (DE-He213)s11661-006-1064-0-p DE-627 ger DE-627 rakwb eng 670 530 VZ 19,1 ssgn Yin, Fuxing verfasserin aut Determination of spatial grain size with the area-weighted grain area distribution of the planar sections in polycrystalline materials 2006 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © ASM International & TMS-The Minerals Metals and Materials Society 2006 Abstract The electron backscattering diffraction (EBSD) technique has made it quite easy to obtain the grain area distribution in a planar section of the polycrystalline materials. Usually, area-weighted grain area and number-weighted grain area show completely different distribution profiles. Instead of the nominal average grain size calculated from the grain area distribution results, the spatial grain size and its distribution character reflect the real features of the materials and those parameters are expected through a simple measurement on the planar sections. In the present work, the section area distribution model of a randomly sliced truncated octahedron is used to relate the lognormally distributed spatial grain size to the area-weighted grain size distribution features. Based on the truncated octahedron grain shape model, area-weighted grain area distribution is derived by convoluting the lognormal distribution of the area of the section with the maximum section area (SMSA) in each grain and the area-weighted section area distribution of the sliced truncated octahedron. It is found that area-weighted grain area distribution on a planar section shows also the lognormal distribution character when the spatial grain size has the lognormal distribution character. Meanwhile, the variance parameter, τ(ins), and the mean value of grain area, $$X_s^{mean} $$, obtained by fitting the area-weighted grain area distribution, have also been related to the lognormal distribution characters of the spatial grain size, i.e., A and $$\overline \nu _n $$. The simulation results are then experimentally checked on a polygonal grain structure of hot-rolled low-carbon steel by applying the point-sampling method to obtain the spatial grain size distribution features. Material Transaction Section Area Grain Size Distribution Area Distribution Planar Section Sakurai, Atsuko aut Song, Xiaoyan aut Enthalten in Metallurgical and materials transactions / A Springer-Verlag, 1994 37(2006), 12 vom: Dez., Seite 3707-3714 (DE-627)171342011 (DE-600)1179415-X (DE-576)038876930 1073-5623 nnns volume:37 year:2006 number:12 month:12 pages:3707-3714 https://doi.org/10.1007/s11661-006-1064-0 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY GBV_ILN_20 GBV_ILN_23 GBV_ILN_30 GBV_ILN_62 GBV_ILN_70 GBV_ILN_602 GBV_ILN_2006 GBV_ILN_2020 GBV_ILN_2027 GBV_ILN_4116 GBV_ILN_4313 GBV_ILN_4316 GBV_ILN_4319 GBV_ILN_4700 AR 37 2006 12 12 3707-3714 |
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Enthalten in Metallurgical and materials transactions / A 37(2006), 12 vom: Dez., Seite 3707-3714 volume:37 year:2006 number:12 month:12 pages:3707-3714 |
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determination of spatial grain size with the area-weighted grain area distribution of the planar sections in polycrystalline materials |
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Determination of spatial grain size with the area-weighted grain area distribution of the planar sections in polycrystalline materials |
abstract |
Abstract The electron backscattering diffraction (EBSD) technique has made it quite easy to obtain the grain area distribution in a planar section of the polycrystalline materials. Usually, area-weighted grain area and number-weighted grain area show completely different distribution profiles. Instead of the nominal average grain size calculated from the grain area distribution results, the spatial grain size and its distribution character reflect the real features of the materials and those parameters are expected through a simple measurement on the planar sections. In the present work, the section area distribution model of a randomly sliced truncated octahedron is used to relate the lognormally distributed spatial grain size to the area-weighted grain size distribution features. Based on the truncated octahedron grain shape model, area-weighted grain area distribution is derived by convoluting the lognormal distribution of the area of the section with the maximum section area (SMSA) in each grain and the area-weighted section area distribution of the sliced truncated octahedron. It is found that area-weighted grain area distribution on a planar section shows also the lognormal distribution character when the spatial grain size has the lognormal distribution character. Meanwhile, the variance parameter, τ(ins), and the mean value of grain area, $$X_s^{mean} $$, obtained by fitting the area-weighted grain area distribution, have also been related to the lognormal distribution characters of the spatial grain size, i.e., A and $$\overline \nu _n $$. The simulation results are then experimentally checked on a polygonal grain structure of hot-rolled low-carbon steel by applying the point-sampling method to obtain the spatial grain size distribution features. © ASM International & TMS-The Minerals Metals and Materials Society 2006 |
abstractGer |
Abstract The electron backscattering diffraction (EBSD) technique has made it quite easy to obtain the grain area distribution in a planar section of the polycrystalline materials. Usually, area-weighted grain area and number-weighted grain area show completely different distribution profiles. Instead of the nominal average grain size calculated from the grain area distribution results, the spatial grain size and its distribution character reflect the real features of the materials and those parameters are expected through a simple measurement on the planar sections. In the present work, the section area distribution model of a randomly sliced truncated octahedron is used to relate the lognormally distributed spatial grain size to the area-weighted grain size distribution features. Based on the truncated octahedron grain shape model, area-weighted grain area distribution is derived by convoluting the lognormal distribution of the area of the section with the maximum section area (SMSA) in each grain and the area-weighted section area distribution of the sliced truncated octahedron. It is found that area-weighted grain area distribution on a planar section shows also the lognormal distribution character when the spatial grain size has the lognormal distribution character. Meanwhile, the variance parameter, τ(ins), and the mean value of grain area, $$X_s^{mean} $$, obtained by fitting the area-weighted grain area distribution, have also been related to the lognormal distribution characters of the spatial grain size, i.e., A and $$\overline \nu _n $$. The simulation results are then experimentally checked on a polygonal grain structure of hot-rolled low-carbon steel by applying the point-sampling method to obtain the spatial grain size distribution features. © ASM International & TMS-The Minerals Metals and Materials Society 2006 |
abstract_unstemmed |
Abstract The electron backscattering diffraction (EBSD) technique has made it quite easy to obtain the grain area distribution in a planar section of the polycrystalline materials. Usually, area-weighted grain area and number-weighted grain area show completely different distribution profiles. Instead of the nominal average grain size calculated from the grain area distribution results, the spatial grain size and its distribution character reflect the real features of the materials and those parameters are expected through a simple measurement on the planar sections. In the present work, the section area distribution model of a randomly sliced truncated octahedron is used to relate the lognormally distributed spatial grain size to the area-weighted grain size distribution features. Based on the truncated octahedron grain shape model, area-weighted grain area distribution is derived by convoluting the lognormal distribution of the area of the section with the maximum section area (SMSA) in each grain and the area-weighted section area distribution of the sliced truncated octahedron. It is found that area-weighted grain area distribution on a planar section shows also the lognormal distribution character when the spatial grain size has the lognormal distribution character. Meanwhile, the variance parameter, τ(ins), and the mean value of grain area, $$X_s^{mean} $$, obtained by fitting the area-weighted grain area distribution, have also been related to the lognormal distribution characters of the spatial grain size, i.e., A and $$\overline \nu _n $$. The simulation results are then experimentally checked on a polygonal grain structure of hot-rolled low-carbon steel by applying the point-sampling method to obtain the spatial grain size distribution features. © ASM International & TMS-The Minerals Metals and Materials Society 2006 |
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