X-ray specular reflection under conditions of extremely asymmetric noncoplanar diffraction from a bicrystal
Abstract The angular dependence of the intensities of X-ray specular reflection has been rigorously analyzed under conditions of noncoplanar grazing Bragg diffraction in a crystal coated with a crystalline film (bicrystal). It is shown that the anomalous angular dependence of the specular-reflection...
Ausführliche Beschreibung
Gespeichert in:
| Autor*in: |
Bushuev, V. A. [verfasserIn] |
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| Format: |
Artikel |
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| Sprache: |
Englisch |
| Erschienen: |
2003 |
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| Schlagwörter: |
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| Anmerkung: |
© MAIK "Nauka/Interperiodica" 2003 |
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| Übergeordnetes Werk: |
Enthalten in: Crystallography reports - Nauka/Interperiodica, 1993, 48(2003), 2 vom: März, Seite 180-186 |
|---|---|
| Übergeordnetes Werk: |
volume:48 ; year:2003 ; number:2 ; month:03 ; pages:180-186 |
| Links: |
|---|
| DOI / URN: |
10.1134/1.1564191 |
|---|
| Katalog-ID: |
OLC2070243370 |
|---|
| LEADER | 01000caa a22002652 4500 | ||
|---|---|---|---|
| 001 | OLC2070243370 | ||
| 003 | DE-627 | ||
| 005 | 20230504102911.0 | ||
| 007 | tu | ||
| 008 | 200820s2003 xx ||||| 00| ||eng c | ||
| 024 | 7 | |a 10.1134/1.1564191 |2 doi | |
| 035 | |a (DE-627)OLC2070243370 | ||
| 035 | |a (DE-He213)1.1564191-p | ||
| 040 | |a DE-627 |b ger |c DE-627 |e rakwb | ||
| 041 | |a eng | ||
| 082 | 0 | 4 | |a 540 |a 530 |q VZ |
| 100 | 1 | |a Bushuev, V. A. |e verfasserin |4 aut | |
| 245 | 1 | 0 | |a X-ray specular reflection under conditions of extremely asymmetric noncoplanar diffraction from a bicrystal |
| 264 | 1 | |c 2003 | |
| 336 | |a Text |b txt |2 rdacontent | ||
| 337 | |a ohne Hilfsmittel zu benutzen |b n |2 rdamedia | ||
| 338 | |a Band |b nc |2 rdacarrier | ||
| 500 | |a © MAIK "Nauka/Interperiodica" 2003 | ||
| 520 | |a Abstract The angular dependence of the intensities of X-ray specular reflection has been rigorously analyzed under conditions of noncoplanar grazing Bragg diffraction in a crystal coated with a crystalline film (bicrystal). It is shown that the anomalous angular dependence of the specular-reflection intensity is extremely sensitive to the thickness (from fractions of a nanometer up to several nanometers), deformation, and the amorphization degree of the crystalline films. The optimum conditions for recording intensities are attained at grazing angles equal to 1.5–4.0 of the critical angle of the total external reflection. | ||
| 650 | 4 | |a Reflection | |
| 650 | 4 | |a Optimum Condition | |
| 650 | 4 | |a Angular Dependence | |
| 650 | 4 | |a Critical Angle | |
| 650 | 4 | |a Specular Reflection | |
| 700 | 1 | |a Oreshko, A. P. |4 aut | |
| 773 | 0 | 8 | |i Enthalten in |t Crystallography reports |d Nauka/Interperiodica, 1993 |g 48(2003), 2 vom: März, Seite 180-186 |w (DE-627)171187822 |w (DE-600)1162973-3 |w (DE-576)038500337 |x 1063-7745 |7 nnns |
| 773 | 1 | 8 | |g volume:48 |g year:2003 |g number:2 |g month:03 |g pages:180-186 |
| 856 | 4 | 1 | |u https://doi.org/10.1134/1.1564191 |z lizenzpflichtig |3 Volltext |
| 912 | |a GBV_USEFLAG_A | ||
| 912 | |a SYSFLAG_A | ||
| 912 | |a GBV_OLC | ||
| 912 | |a SSG-OLC-TEC | ||
| 912 | |a SSG-OLC-PHY | ||
| 912 | |a SSG-OLC-CHE | ||
| 912 | |a SSG-OLC-GEO | ||
| 912 | |a SSG-OPC-GGO | ||
| 912 | |a GBV_ILN_21 | ||
| 912 | |a GBV_ILN_22 | ||
| 912 | |a GBV_ILN_30 | ||
| 912 | |a GBV_ILN_40 | ||
| 912 | |a GBV_ILN_70 | ||
| 912 | |a GBV_ILN_4116 | ||
| 951 | |a AR | ||
| 952 | |d 48 |j 2003 |e 2 |c 03 |h 180-186 | ||
| author_variant |
v a b va vab a p o ap apo |
|---|---|
| matchkey_str |
article:10637745:2003----::rypclrelcinnecniinoeteeysmercocpaa |
| hierarchy_sort_str |
2003 |
| publishDate |
2003 |
| allfields |
10.1134/1.1564191 doi (DE-627)OLC2070243370 (DE-He213)1.1564191-p DE-627 ger DE-627 rakwb eng 540 530 VZ Bushuev, V. A. verfasserin aut X-ray specular reflection under conditions of extremely asymmetric noncoplanar diffraction from a bicrystal 2003 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © MAIK "Nauka/Interperiodica" 2003 Abstract The angular dependence of the intensities of X-ray specular reflection has been rigorously analyzed under conditions of noncoplanar grazing Bragg diffraction in a crystal coated with a crystalline film (bicrystal). It is shown that the anomalous angular dependence of the specular-reflection intensity is extremely sensitive to the thickness (from fractions of a nanometer up to several nanometers), deformation, and the amorphization degree of the crystalline films. The optimum conditions for recording intensities are attained at grazing angles equal to 1.5–4.0 of the critical angle of the total external reflection. Reflection Optimum Condition Angular Dependence Critical Angle Specular Reflection Oreshko, A. P. aut Enthalten in Crystallography reports Nauka/Interperiodica, 1993 48(2003), 2 vom: März, Seite 180-186 (DE-627)171187822 (DE-600)1162973-3 (DE-576)038500337 1063-7745 nnns volume:48 year:2003 number:2 month:03 pages:180-186 https://doi.org/10.1134/1.1564191 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY SSG-OLC-CHE SSG-OLC-GEO SSG-OPC-GGO GBV_ILN_21 GBV_ILN_22 GBV_ILN_30 GBV_ILN_40 GBV_ILN_70 GBV_ILN_4116 AR 48 2003 2 03 180-186 |
| spelling |
10.1134/1.1564191 doi (DE-627)OLC2070243370 (DE-He213)1.1564191-p DE-627 ger DE-627 rakwb eng 540 530 VZ Bushuev, V. A. verfasserin aut X-ray specular reflection under conditions of extremely asymmetric noncoplanar diffraction from a bicrystal 2003 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © MAIK "Nauka/Interperiodica" 2003 Abstract The angular dependence of the intensities of X-ray specular reflection has been rigorously analyzed under conditions of noncoplanar grazing Bragg diffraction in a crystal coated with a crystalline film (bicrystal). It is shown that the anomalous angular dependence of the specular-reflection intensity is extremely sensitive to the thickness (from fractions of a nanometer up to several nanometers), deformation, and the amorphization degree of the crystalline films. The optimum conditions for recording intensities are attained at grazing angles equal to 1.5–4.0 of the critical angle of the total external reflection. Reflection Optimum Condition Angular Dependence Critical Angle Specular Reflection Oreshko, A. P. aut Enthalten in Crystallography reports Nauka/Interperiodica, 1993 48(2003), 2 vom: März, Seite 180-186 (DE-627)171187822 (DE-600)1162973-3 (DE-576)038500337 1063-7745 nnns volume:48 year:2003 number:2 month:03 pages:180-186 https://doi.org/10.1134/1.1564191 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY SSG-OLC-CHE SSG-OLC-GEO SSG-OPC-GGO GBV_ILN_21 GBV_ILN_22 GBV_ILN_30 GBV_ILN_40 GBV_ILN_70 GBV_ILN_4116 AR 48 2003 2 03 180-186 |
| allfields_unstemmed |
10.1134/1.1564191 doi (DE-627)OLC2070243370 (DE-He213)1.1564191-p DE-627 ger DE-627 rakwb eng 540 530 VZ Bushuev, V. A. verfasserin aut X-ray specular reflection under conditions of extremely asymmetric noncoplanar diffraction from a bicrystal 2003 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © MAIK "Nauka/Interperiodica" 2003 Abstract The angular dependence of the intensities of X-ray specular reflection has been rigorously analyzed under conditions of noncoplanar grazing Bragg diffraction in a crystal coated with a crystalline film (bicrystal). It is shown that the anomalous angular dependence of the specular-reflection intensity is extremely sensitive to the thickness (from fractions of a nanometer up to several nanometers), deformation, and the amorphization degree of the crystalline films. The optimum conditions for recording intensities are attained at grazing angles equal to 1.5–4.0 of the critical angle of the total external reflection. Reflection Optimum Condition Angular Dependence Critical Angle Specular Reflection Oreshko, A. P. aut Enthalten in Crystallography reports Nauka/Interperiodica, 1993 48(2003), 2 vom: März, Seite 180-186 (DE-627)171187822 (DE-600)1162973-3 (DE-576)038500337 1063-7745 nnns volume:48 year:2003 number:2 month:03 pages:180-186 https://doi.org/10.1134/1.1564191 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY SSG-OLC-CHE SSG-OLC-GEO SSG-OPC-GGO GBV_ILN_21 GBV_ILN_22 GBV_ILN_30 GBV_ILN_40 GBV_ILN_70 GBV_ILN_4116 AR 48 2003 2 03 180-186 |
| allfieldsGer |
10.1134/1.1564191 doi (DE-627)OLC2070243370 (DE-He213)1.1564191-p DE-627 ger DE-627 rakwb eng 540 530 VZ Bushuev, V. A. verfasserin aut X-ray specular reflection under conditions of extremely asymmetric noncoplanar diffraction from a bicrystal 2003 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © MAIK "Nauka/Interperiodica" 2003 Abstract The angular dependence of the intensities of X-ray specular reflection has been rigorously analyzed under conditions of noncoplanar grazing Bragg diffraction in a crystal coated with a crystalline film (bicrystal). It is shown that the anomalous angular dependence of the specular-reflection intensity is extremely sensitive to the thickness (from fractions of a nanometer up to several nanometers), deformation, and the amorphization degree of the crystalline films. The optimum conditions for recording intensities are attained at grazing angles equal to 1.5–4.0 of the critical angle of the total external reflection. Reflection Optimum Condition Angular Dependence Critical Angle Specular Reflection Oreshko, A. P. aut Enthalten in Crystallography reports Nauka/Interperiodica, 1993 48(2003), 2 vom: März, Seite 180-186 (DE-627)171187822 (DE-600)1162973-3 (DE-576)038500337 1063-7745 nnns volume:48 year:2003 number:2 month:03 pages:180-186 https://doi.org/10.1134/1.1564191 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY SSG-OLC-CHE SSG-OLC-GEO SSG-OPC-GGO GBV_ILN_21 GBV_ILN_22 GBV_ILN_30 GBV_ILN_40 GBV_ILN_70 GBV_ILN_4116 AR 48 2003 2 03 180-186 |
| allfieldsSound |
10.1134/1.1564191 doi (DE-627)OLC2070243370 (DE-He213)1.1564191-p DE-627 ger DE-627 rakwb eng 540 530 VZ Bushuev, V. A. verfasserin aut X-ray specular reflection under conditions of extremely asymmetric noncoplanar diffraction from a bicrystal 2003 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © MAIK "Nauka/Interperiodica" 2003 Abstract The angular dependence of the intensities of X-ray specular reflection has been rigorously analyzed under conditions of noncoplanar grazing Bragg diffraction in a crystal coated with a crystalline film (bicrystal). It is shown that the anomalous angular dependence of the specular-reflection intensity is extremely sensitive to the thickness (from fractions of a nanometer up to several nanometers), deformation, and the amorphization degree of the crystalline films. The optimum conditions for recording intensities are attained at grazing angles equal to 1.5–4.0 of the critical angle of the total external reflection. Reflection Optimum Condition Angular Dependence Critical Angle Specular Reflection Oreshko, A. P. aut Enthalten in Crystallography reports Nauka/Interperiodica, 1993 48(2003), 2 vom: März, Seite 180-186 (DE-627)171187822 (DE-600)1162973-3 (DE-576)038500337 1063-7745 nnns volume:48 year:2003 number:2 month:03 pages:180-186 https://doi.org/10.1134/1.1564191 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY SSG-OLC-CHE SSG-OLC-GEO SSG-OPC-GGO GBV_ILN_21 GBV_ILN_22 GBV_ILN_30 GBV_ILN_40 GBV_ILN_70 GBV_ILN_4116 AR 48 2003 2 03 180-186 |
| language |
English |
| source |
Enthalten in Crystallography reports 48(2003), 2 vom: März, Seite 180-186 volume:48 year:2003 number:2 month:03 pages:180-186 |
| sourceStr |
Enthalten in Crystallography reports 48(2003), 2 vom: März, Seite 180-186 volume:48 year:2003 number:2 month:03 pages:180-186 |
| format_phy_str_mv |
Article |
| institution |
findex.gbv.de |
| topic_facet |
Reflection Optimum Condition Angular Dependence Critical Angle Specular Reflection |
| dewey-raw |
540 |
| isfreeaccess_bool |
false |
| container_title |
Crystallography reports |
| authorswithroles_txt_mv |
Bushuev, V. A. @@aut@@ Oreshko, A. P. @@aut@@ |
| publishDateDaySort_date |
2003-03-01T00:00:00Z |
| hierarchy_top_id |
171187822 |
| dewey-sort |
3540 |
| id |
OLC2070243370 |
| language_de |
englisch |
| fullrecord |
<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01000caa a22002652 4500</leader><controlfield tag="001">OLC2070243370</controlfield><controlfield tag="003">DE-627</controlfield><controlfield tag="005">20230504102911.0</controlfield><controlfield tag="007">tu</controlfield><controlfield tag="008">200820s2003 xx ||||| 00| ||eng c</controlfield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1134/1.1564191</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-627)OLC2070243370</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-He213)1.1564191-p</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-627</subfield><subfield code="b">ger</subfield><subfield code="c">DE-627</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">540</subfield><subfield code="a">530</subfield><subfield code="q">VZ</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Bushuev, V. A.</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">X-ray specular reflection under conditions of extremely asymmetric noncoplanar diffraction from a bicrystal</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">2003</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">Text</subfield><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">ohne Hilfsmittel zu benutzen</subfield><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">Band</subfield><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">© MAIK "Nauka/Interperiodica" 2003</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">Abstract The angular dependence of the intensities of X-ray specular reflection has been rigorously analyzed under conditions of noncoplanar grazing Bragg diffraction in a crystal coated with a crystalline film (bicrystal). It is shown that the anomalous angular dependence of the specular-reflection intensity is extremely sensitive to the thickness (from fractions of a nanometer up to several nanometers), deformation, and the amorphization degree of the crystalline films. The optimum conditions for recording intensities are attained at grazing angles equal to 1.5–4.0 of the critical angle of the total external reflection.</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Reflection</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Optimum Condition</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Angular Dependence</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Critical Angle</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Specular Reflection</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Oreshko, A. P.</subfield><subfield code="4">aut</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="i">Enthalten in</subfield><subfield code="t">Crystallography reports</subfield><subfield code="d">Nauka/Interperiodica, 1993</subfield><subfield code="g">48(2003), 2 vom: März, Seite 180-186</subfield><subfield code="w">(DE-627)171187822</subfield><subfield code="w">(DE-600)1162973-3</subfield><subfield code="w">(DE-576)038500337</subfield><subfield code="x">1063-7745</subfield><subfield code="7">nnns</subfield></datafield><datafield tag="773" ind1="1" ind2="8"><subfield code="g">volume:48</subfield><subfield code="g">year:2003</subfield><subfield code="g">number:2</subfield><subfield code="g">month:03</subfield><subfield code="g">pages:180-186</subfield></datafield><datafield tag="856" ind1="4" ind2="1"><subfield code="u">https://doi.org/10.1134/1.1564191</subfield><subfield code="z">lizenzpflichtig</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_USEFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SYSFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_OLC</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-TEC</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-PHY</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-CHE</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-GEO</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OPC-GGO</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_21</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_22</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_30</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_40</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_70</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4116</subfield></datafield><datafield tag="951" ind1=" " ind2=" "><subfield code="a">AR</subfield></datafield><datafield tag="952" ind1=" " ind2=" "><subfield code="d">48</subfield><subfield code="j">2003</subfield><subfield code="e">2</subfield><subfield code="c">03</subfield><subfield code="h">180-186</subfield></datafield></record></collection>
|
| author |
Bushuev, V. A. |
| spellingShingle |
Bushuev, V. A. ddc 540 misc Reflection misc Optimum Condition misc Angular Dependence misc Critical Angle misc Specular Reflection X-ray specular reflection under conditions of extremely asymmetric noncoplanar diffraction from a bicrystal |
| authorStr |
Bushuev, V. A. |
| ppnlink_with_tag_str_mv |
@@773@@(DE-627)171187822 |
| format |
Article |
| dewey-ones |
540 - Chemistry & allied sciences 530 - Physics |
| delete_txt_mv |
keep |
| author_role |
aut aut |
| collection |
OLC |
| remote_str |
false |
| illustrated |
Not Illustrated |
| issn |
1063-7745 |
| topic_title |
540 530 VZ X-ray specular reflection under conditions of extremely asymmetric noncoplanar diffraction from a bicrystal Reflection Optimum Condition Angular Dependence Critical Angle Specular Reflection |
| topic |
ddc 540 misc Reflection misc Optimum Condition misc Angular Dependence misc Critical Angle misc Specular Reflection |
| topic_unstemmed |
ddc 540 misc Reflection misc Optimum Condition misc Angular Dependence misc Critical Angle misc Specular Reflection |
| topic_browse |
ddc 540 misc Reflection misc Optimum Condition misc Angular Dependence misc Critical Angle misc Specular Reflection |
| format_facet |
Aufsätze Gedruckte Aufsätze |
| format_main_str_mv |
Text Zeitschrift/Artikel |
| carriertype_str_mv |
nc |
| hierarchy_parent_title |
Crystallography reports |
| hierarchy_parent_id |
171187822 |
| dewey-tens |
540 - Chemistry 530 - Physics |
| hierarchy_top_title |
Crystallography reports |
| isfreeaccess_txt |
false |
| familylinks_str_mv |
(DE-627)171187822 (DE-600)1162973-3 (DE-576)038500337 |
| title |
X-ray specular reflection under conditions of extremely asymmetric noncoplanar diffraction from a bicrystal |
| ctrlnum |
(DE-627)OLC2070243370 (DE-He213)1.1564191-p |
| title_full |
X-ray specular reflection under conditions of extremely asymmetric noncoplanar diffraction from a bicrystal |
| author_sort |
Bushuev, V. A. |
| journal |
Crystallography reports |
| journalStr |
Crystallography reports |
| lang_code |
eng |
| isOA_bool |
false |
| dewey-hundreds |
500 - Science |
| recordtype |
marc |
| publishDateSort |
2003 |
| contenttype_str_mv |
txt |
| container_start_page |
180 |
| author_browse |
Bushuev, V. A. Oreshko, A. P. |
| container_volume |
48 |
| class |
540 530 VZ |
| format_se |
Aufsätze |
| author-letter |
Bushuev, V. A. |
| doi_str_mv |
10.1134/1.1564191 |
| dewey-full |
540 530 |
| title_sort |
x-ray specular reflection under conditions of extremely asymmetric noncoplanar diffraction from a bicrystal |
| title_auth |
X-ray specular reflection under conditions of extremely asymmetric noncoplanar diffraction from a bicrystal |
| abstract |
Abstract The angular dependence of the intensities of X-ray specular reflection has been rigorously analyzed under conditions of noncoplanar grazing Bragg diffraction in a crystal coated with a crystalline film (bicrystal). It is shown that the anomalous angular dependence of the specular-reflection intensity is extremely sensitive to the thickness (from fractions of a nanometer up to several nanometers), deformation, and the amorphization degree of the crystalline films. The optimum conditions for recording intensities are attained at grazing angles equal to 1.5–4.0 of the critical angle of the total external reflection. © MAIK "Nauka/Interperiodica" 2003 |
| abstractGer |
Abstract The angular dependence of the intensities of X-ray specular reflection has been rigorously analyzed under conditions of noncoplanar grazing Bragg diffraction in a crystal coated with a crystalline film (bicrystal). It is shown that the anomalous angular dependence of the specular-reflection intensity is extremely sensitive to the thickness (from fractions of a nanometer up to several nanometers), deformation, and the amorphization degree of the crystalline films. The optimum conditions for recording intensities are attained at grazing angles equal to 1.5–4.0 of the critical angle of the total external reflection. © MAIK "Nauka/Interperiodica" 2003 |
| abstract_unstemmed |
Abstract The angular dependence of the intensities of X-ray specular reflection has been rigorously analyzed under conditions of noncoplanar grazing Bragg diffraction in a crystal coated with a crystalline film (bicrystal). It is shown that the anomalous angular dependence of the specular-reflection intensity is extremely sensitive to the thickness (from fractions of a nanometer up to several nanometers), deformation, and the amorphization degree of the crystalline films. The optimum conditions for recording intensities are attained at grazing angles equal to 1.5–4.0 of the critical angle of the total external reflection. © MAIK "Nauka/Interperiodica" 2003 |
| collection_details |
GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY SSG-OLC-CHE SSG-OLC-GEO SSG-OPC-GGO GBV_ILN_21 GBV_ILN_22 GBV_ILN_30 GBV_ILN_40 GBV_ILN_70 GBV_ILN_4116 |
| container_issue |
2 |
| title_short |
X-ray specular reflection under conditions of extremely asymmetric noncoplanar diffraction from a bicrystal |
| url |
https://doi.org/10.1134/1.1564191 |
| remote_bool |
false |
| author2 |
Oreshko, A. P. |
| author2Str |
Oreshko, A. P. |
| ppnlink |
171187822 |
| mediatype_str_mv |
n |
| isOA_txt |
false |
| hochschulschrift_bool |
false |
| doi_str |
10.1134/1.1564191 |
| up_date |
2024-07-04T00:41:50.276Z |
| _version_ |
1803607039309512704 |
| fullrecord_marcxml |
<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01000caa a22002652 4500</leader><controlfield tag="001">OLC2070243370</controlfield><controlfield tag="003">DE-627</controlfield><controlfield tag="005">20230504102911.0</controlfield><controlfield tag="007">tu</controlfield><controlfield tag="008">200820s2003 xx ||||| 00| ||eng c</controlfield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1134/1.1564191</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-627)OLC2070243370</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-He213)1.1564191-p</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-627</subfield><subfield code="b">ger</subfield><subfield code="c">DE-627</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">540</subfield><subfield code="a">530</subfield><subfield code="q">VZ</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Bushuev, V. A.</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">X-ray specular reflection under conditions of extremely asymmetric noncoplanar diffraction from a bicrystal</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">2003</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">Text</subfield><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">ohne Hilfsmittel zu benutzen</subfield><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">Band</subfield><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">© MAIK "Nauka/Interperiodica" 2003</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">Abstract The angular dependence of the intensities of X-ray specular reflection has been rigorously analyzed under conditions of noncoplanar grazing Bragg diffraction in a crystal coated with a crystalline film (bicrystal). It is shown that the anomalous angular dependence of the specular-reflection intensity is extremely sensitive to the thickness (from fractions of a nanometer up to several nanometers), deformation, and the amorphization degree of the crystalline films. The optimum conditions for recording intensities are attained at grazing angles equal to 1.5–4.0 of the critical angle of the total external reflection.</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Reflection</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Optimum Condition</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Angular Dependence</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Critical Angle</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Specular Reflection</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Oreshko, A. P.</subfield><subfield code="4">aut</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="i">Enthalten in</subfield><subfield code="t">Crystallography reports</subfield><subfield code="d">Nauka/Interperiodica, 1993</subfield><subfield code="g">48(2003), 2 vom: März, Seite 180-186</subfield><subfield code="w">(DE-627)171187822</subfield><subfield code="w">(DE-600)1162973-3</subfield><subfield code="w">(DE-576)038500337</subfield><subfield code="x">1063-7745</subfield><subfield code="7">nnns</subfield></datafield><datafield tag="773" ind1="1" ind2="8"><subfield code="g">volume:48</subfield><subfield code="g">year:2003</subfield><subfield code="g">number:2</subfield><subfield code="g">month:03</subfield><subfield code="g">pages:180-186</subfield></datafield><datafield tag="856" ind1="4" ind2="1"><subfield code="u">https://doi.org/10.1134/1.1564191</subfield><subfield code="z">lizenzpflichtig</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_USEFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SYSFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_OLC</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-TEC</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-PHY</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-CHE</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-GEO</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OPC-GGO</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_21</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_22</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_30</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_40</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_70</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4116</subfield></datafield><datafield tag="951" ind1=" " ind2=" "><subfield code="a">AR</subfield></datafield><datafield tag="952" ind1=" " ind2=" "><subfield code="d">48</subfield><subfield code="j">2003</subfield><subfield code="e">2</subfield><subfield code="c">03</subfield><subfield code="h">180-186</subfield></datafield></record></collection>
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| score |
7.399522 |