Applications for Low Frequency Impedance Analysis Systems
Abstract We present methodology and instrumentation used to carry out and log automated multiple electrical impedance measurements using multiplexed control. We also address the issue of measurement error introduced by the instrumentation, and demonstrate how we reduce these effects in our experimen...
Ausführliche Beschreibung
Autor*in: |
Giassa, Matthew [verfasserIn] |
---|
Format: |
Artikel |
---|---|
Sprache: |
Englisch |
Erschienen: |
2009 |
---|
Schlagwörter: |
---|
Anmerkung: |
© Springer Science+Business Media, LLC 2009 |
---|
Übergeordnetes Werk: |
Enthalten in: Journal of electronic testing - Springer US, 1990, 26(2009), 1 vom: 15. Dez., Seite 139-144 |
---|---|
Übergeordnetes Werk: |
volume:26 ; year:2009 ; number:1 ; day:15 ; month:12 ; pages:139-144 |
Links: |
---|
DOI / URN: |
10.1007/s10836-009-5125-3 |
---|
Katalog-ID: |
OLC2075588872 |
---|
LEADER | 01000caa a22002652 4500 | ||
---|---|---|---|
001 | OLC2075588872 | ||
003 | DE-627 | ||
005 | 20230503114700.0 | ||
007 | tu | ||
008 | 200820s2009 xx ||||| 00| ||eng c | ||
024 | 7 | |a 10.1007/s10836-009-5125-3 |2 doi | |
035 | |a (DE-627)OLC2075588872 | ||
035 | |a (DE-He213)s10836-009-5125-3-p | ||
040 | |a DE-627 |b ger |c DE-627 |e rakwb | ||
041 | |a eng | ||
082 | 0 | 4 | |a 004 |a 670 |q VZ |
100 | 1 | |a Giassa, Matthew |e verfasserin |4 aut | |
245 | 1 | 0 | |a Applications for Low Frequency Impedance Analysis Systems |
264 | 1 | |c 2009 | |
336 | |a Text |b txt |2 rdacontent | ||
337 | |a ohne Hilfsmittel zu benutzen |b n |2 rdamedia | ||
338 | |a Band |b nc |2 rdacarrier | ||
500 | |a © Springer Science+Business Media, LLC 2009 | ||
520 | |a Abstract We present methodology and instrumentation used to carry out and log automated multiple electrical impedance measurements using multiplexed control. We also address the issue of measurement error introduced by the instrumentation, and demonstrate how we reduce these effects in our experiments. Finally, we present two potential applications for our automated electrical impedance analysis systems: tissue scanning and mapping via impedance measurements between arrays of electrodes, and materials testing of novel conductive polymer materials. | ||
650 | 4 | |a Bio impedance analysis | |
650 | 4 | |a Cole-Cole plots | |
650 | 4 | |a Electrical impedance tomography | |
700 | 1 | |a Khosla, Ajit |4 aut | |
700 | 1 | |a Gray, Bonnie |4 aut | |
700 | 1 | |a Parameswaran, Ash |4 aut | |
700 | 1 | |a Kohli, Kirpal |4 aut | |
700 | 1 | |a Ramaseshan, Ramani |4 aut | |
773 | 0 | 8 | |i Enthalten in |t Journal of electronic testing |d Springer US, 1990 |g 26(2009), 1 vom: 15. Dez., Seite 139-144 |w (DE-627)130869090 |w (DE-600)1033317-4 |w (DE-576)024991600 |x 0923-8174 |7 nnns |
773 | 1 | 8 | |g volume:26 |g year:2009 |g number:1 |g day:15 |g month:12 |g pages:139-144 |
856 | 4 | 1 | |u https://doi.org/10.1007/s10836-009-5125-3 |z lizenzpflichtig |3 Volltext |
912 | |a GBV_USEFLAG_A | ||
912 | |a SYSFLAG_A | ||
912 | |a GBV_OLC | ||
912 | |a SSG-OLC-TEC | ||
912 | |a SSG-OLC-MAT | ||
912 | |a GBV_ILN_70 | ||
912 | |a GBV_ILN_285 | ||
912 | |a GBV_ILN_2005 | ||
912 | |a GBV_ILN_2006 | ||
912 | |a GBV_ILN_2020 | ||
912 | |a GBV_ILN_4307 | ||
912 | |a GBV_ILN_4318 | ||
951 | |a AR | ||
952 | |d 26 |j 2009 |e 1 |b 15 |c 12 |h 139-144 |
author_variant |
m g mg a k ak b g bg a p ap k k kk r r rr |
---|---|
matchkey_str |
article:09238174:2009----::plctosolwrqecipdne |
hierarchy_sort_str |
2009 |
publishDate |
2009 |
allfields |
10.1007/s10836-009-5125-3 doi (DE-627)OLC2075588872 (DE-He213)s10836-009-5125-3-p DE-627 ger DE-627 rakwb eng 004 670 VZ Giassa, Matthew verfasserin aut Applications for Low Frequency Impedance Analysis Systems 2009 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Springer Science+Business Media, LLC 2009 Abstract We present methodology and instrumentation used to carry out and log automated multiple electrical impedance measurements using multiplexed control. We also address the issue of measurement error introduced by the instrumentation, and demonstrate how we reduce these effects in our experiments. Finally, we present two potential applications for our automated electrical impedance analysis systems: tissue scanning and mapping via impedance measurements between arrays of electrodes, and materials testing of novel conductive polymer materials. Bio impedance analysis Cole-Cole plots Electrical impedance tomography Khosla, Ajit aut Gray, Bonnie aut Parameswaran, Ash aut Kohli, Kirpal aut Ramaseshan, Ramani aut Enthalten in Journal of electronic testing Springer US, 1990 26(2009), 1 vom: 15. Dez., Seite 139-144 (DE-627)130869090 (DE-600)1033317-4 (DE-576)024991600 0923-8174 nnns volume:26 year:2009 number:1 day:15 month:12 pages:139-144 https://doi.org/10.1007/s10836-009-5125-3 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-MAT GBV_ILN_70 GBV_ILN_285 GBV_ILN_2005 GBV_ILN_2006 GBV_ILN_2020 GBV_ILN_4307 GBV_ILN_4318 AR 26 2009 1 15 12 139-144 |
spelling |
10.1007/s10836-009-5125-3 doi (DE-627)OLC2075588872 (DE-He213)s10836-009-5125-3-p DE-627 ger DE-627 rakwb eng 004 670 VZ Giassa, Matthew verfasserin aut Applications for Low Frequency Impedance Analysis Systems 2009 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Springer Science+Business Media, LLC 2009 Abstract We present methodology and instrumentation used to carry out and log automated multiple electrical impedance measurements using multiplexed control. We also address the issue of measurement error introduced by the instrumentation, and demonstrate how we reduce these effects in our experiments. Finally, we present two potential applications for our automated electrical impedance analysis systems: tissue scanning and mapping via impedance measurements between arrays of electrodes, and materials testing of novel conductive polymer materials. Bio impedance analysis Cole-Cole plots Electrical impedance tomography Khosla, Ajit aut Gray, Bonnie aut Parameswaran, Ash aut Kohli, Kirpal aut Ramaseshan, Ramani aut Enthalten in Journal of electronic testing Springer US, 1990 26(2009), 1 vom: 15. Dez., Seite 139-144 (DE-627)130869090 (DE-600)1033317-4 (DE-576)024991600 0923-8174 nnns volume:26 year:2009 number:1 day:15 month:12 pages:139-144 https://doi.org/10.1007/s10836-009-5125-3 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-MAT GBV_ILN_70 GBV_ILN_285 GBV_ILN_2005 GBV_ILN_2006 GBV_ILN_2020 GBV_ILN_4307 GBV_ILN_4318 AR 26 2009 1 15 12 139-144 |
allfields_unstemmed |
10.1007/s10836-009-5125-3 doi (DE-627)OLC2075588872 (DE-He213)s10836-009-5125-3-p DE-627 ger DE-627 rakwb eng 004 670 VZ Giassa, Matthew verfasserin aut Applications for Low Frequency Impedance Analysis Systems 2009 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Springer Science+Business Media, LLC 2009 Abstract We present methodology and instrumentation used to carry out and log automated multiple electrical impedance measurements using multiplexed control. We also address the issue of measurement error introduced by the instrumentation, and demonstrate how we reduce these effects in our experiments. Finally, we present two potential applications for our automated electrical impedance analysis systems: tissue scanning and mapping via impedance measurements between arrays of electrodes, and materials testing of novel conductive polymer materials. Bio impedance analysis Cole-Cole plots Electrical impedance tomography Khosla, Ajit aut Gray, Bonnie aut Parameswaran, Ash aut Kohli, Kirpal aut Ramaseshan, Ramani aut Enthalten in Journal of electronic testing Springer US, 1990 26(2009), 1 vom: 15. Dez., Seite 139-144 (DE-627)130869090 (DE-600)1033317-4 (DE-576)024991600 0923-8174 nnns volume:26 year:2009 number:1 day:15 month:12 pages:139-144 https://doi.org/10.1007/s10836-009-5125-3 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-MAT GBV_ILN_70 GBV_ILN_285 GBV_ILN_2005 GBV_ILN_2006 GBV_ILN_2020 GBV_ILN_4307 GBV_ILN_4318 AR 26 2009 1 15 12 139-144 |
allfieldsGer |
10.1007/s10836-009-5125-3 doi (DE-627)OLC2075588872 (DE-He213)s10836-009-5125-3-p DE-627 ger DE-627 rakwb eng 004 670 VZ Giassa, Matthew verfasserin aut Applications for Low Frequency Impedance Analysis Systems 2009 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Springer Science+Business Media, LLC 2009 Abstract We present methodology and instrumentation used to carry out and log automated multiple electrical impedance measurements using multiplexed control. We also address the issue of measurement error introduced by the instrumentation, and demonstrate how we reduce these effects in our experiments. Finally, we present two potential applications for our automated electrical impedance analysis systems: tissue scanning and mapping via impedance measurements between arrays of electrodes, and materials testing of novel conductive polymer materials. Bio impedance analysis Cole-Cole plots Electrical impedance tomography Khosla, Ajit aut Gray, Bonnie aut Parameswaran, Ash aut Kohli, Kirpal aut Ramaseshan, Ramani aut Enthalten in Journal of electronic testing Springer US, 1990 26(2009), 1 vom: 15. Dez., Seite 139-144 (DE-627)130869090 (DE-600)1033317-4 (DE-576)024991600 0923-8174 nnns volume:26 year:2009 number:1 day:15 month:12 pages:139-144 https://doi.org/10.1007/s10836-009-5125-3 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-MAT GBV_ILN_70 GBV_ILN_285 GBV_ILN_2005 GBV_ILN_2006 GBV_ILN_2020 GBV_ILN_4307 GBV_ILN_4318 AR 26 2009 1 15 12 139-144 |
allfieldsSound |
10.1007/s10836-009-5125-3 doi (DE-627)OLC2075588872 (DE-He213)s10836-009-5125-3-p DE-627 ger DE-627 rakwb eng 004 670 VZ Giassa, Matthew verfasserin aut Applications for Low Frequency Impedance Analysis Systems 2009 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Springer Science+Business Media, LLC 2009 Abstract We present methodology and instrumentation used to carry out and log automated multiple electrical impedance measurements using multiplexed control. We also address the issue of measurement error introduced by the instrumentation, and demonstrate how we reduce these effects in our experiments. Finally, we present two potential applications for our automated electrical impedance analysis systems: tissue scanning and mapping via impedance measurements between arrays of electrodes, and materials testing of novel conductive polymer materials. Bio impedance analysis Cole-Cole plots Electrical impedance tomography Khosla, Ajit aut Gray, Bonnie aut Parameswaran, Ash aut Kohli, Kirpal aut Ramaseshan, Ramani aut Enthalten in Journal of electronic testing Springer US, 1990 26(2009), 1 vom: 15. Dez., Seite 139-144 (DE-627)130869090 (DE-600)1033317-4 (DE-576)024991600 0923-8174 nnns volume:26 year:2009 number:1 day:15 month:12 pages:139-144 https://doi.org/10.1007/s10836-009-5125-3 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-MAT GBV_ILN_70 GBV_ILN_285 GBV_ILN_2005 GBV_ILN_2006 GBV_ILN_2020 GBV_ILN_4307 GBV_ILN_4318 AR 26 2009 1 15 12 139-144 |
language |
English |
source |
Enthalten in Journal of electronic testing 26(2009), 1 vom: 15. Dez., Seite 139-144 volume:26 year:2009 number:1 day:15 month:12 pages:139-144 |
sourceStr |
Enthalten in Journal of electronic testing 26(2009), 1 vom: 15. Dez., Seite 139-144 volume:26 year:2009 number:1 day:15 month:12 pages:139-144 |
format_phy_str_mv |
Article |
institution |
findex.gbv.de |
topic_facet |
Bio impedance analysis Cole-Cole plots Electrical impedance tomography |
dewey-raw |
004 |
isfreeaccess_bool |
false |
container_title |
Journal of electronic testing |
authorswithroles_txt_mv |
Giassa, Matthew @@aut@@ Khosla, Ajit @@aut@@ Gray, Bonnie @@aut@@ Parameswaran, Ash @@aut@@ Kohli, Kirpal @@aut@@ Ramaseshan, Ramani @@aut@@ |
publishDateDaySort_date |
2009-12-15T00:00:00Z |
hierarchy_top_id |
130869090 |
dewey-sort |
14 |
id |
OLC2075588872 |
language_de |
englisch |
fullrecord |
<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01000caa a22002652 4500</leader><controlfield tag="001">OLC2075588872</controlfield><controlfield tag="003">DE-627</controlfield><controlfield tag="005">20230503114700.0</controlfield><controlfield tag="007">tu</controlfield><controlfield tag="008">200820s2009 xx ||||| 00| ||eng c</controlfield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1007/s10836-009-5125-3</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-627)OLC2075588872</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-He213)s10836-009-5125-3-p</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-627</subfield><subfield code="b">ger</subfield><subfield code="c">DE-627</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">004</subfield><subfield code="a">670</subfield><subfield code="q">VZ</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Giassa, Matthew</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Applications for Low Frequency Impedance Analysis Systems</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">2009</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">Text</subfield><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">ohne Hilfsmittel zu benutzen</subfield><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">Band</subfield><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">© Springer Science+Business Media, LLC 2009</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">Abstract We present methodology and instrumentation used to carry out and log automated multiple electrical impedance measurements using multiplexed control. We also address the issue of measurement error introduced by the instrumentation, and demonstrate how we reduce these effects in our experiments. Finally, we present two potential applications for our automated electrical impedance analysis systems: tissue scanning and mapping via impedance measurements between arrays of electrodes, and materials testing of novel conductive polymer materials.</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Bio impedance analysis</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Cole-Cole plots</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electrical impedance tomography</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Khosla, Ajit</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Gray, Bonnie</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Parameswaran, Ash</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Kohli, Kirpal</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Ramaseshan, Ramani</subfield><subfield code="4">aut</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="i">Enthalten in</subfield><subfield code="t">Journal of electronic testing</subfield><subfield code="d">Springer US, 1990</subfield><subfield code="g">26(2009), 1 vom: 15. Dez., Seite 139-144</subfield><subfield code="w">(DE-627)130869090</subfield><subfield code="w">(DE-600)1033317-4</subfield><subfield code="w">(DE-576)024991600</subfield><subfield code="x">0923-8174</subfield><subfield code="7">nnns</subfield></datafield><datafield tag="773" ind1="1" ind2="8"><subfield code="g">volume:26</subfield><subfield code="g">year:2009</subfield><subfield code="g">number:1</subfield><subfield code="g">day:15</subfield><subfield code="g">month:12</subfield><subfield code="g">pages:139-144</subfield></datafield><datafield tag="856" ind1="4" ind2="1"><subfield code="u">https://doi.org/10.1007/s10836-009-5125-3</subfield><subfield code="z">lizenzpflichtig</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_USEFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SYSFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_OLC</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-TEC</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-MAT</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_70</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_285</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2005</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2006</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2020</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4307</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4318</subfield></datafield><datafield tag="951" ind1=" " ind2=" "><subfield code="a">AR</subfield></datafield><datafield tag="952" ind1=" " ind2=" "><subfield code="d">26</subfield><subfield code="j">2009</subfield><subfield code="e">1</subfield><subfield code="b">15</subfield><subfield code="c">12</subfield><subfield code="h">139-144</subfield></datafield></record></collection>
|
author |
Giassa, Matthew |
spellingShingle |
Giassa, Matthew ddc 004 misc Bio impedance analysis misc Cole-Cole plots misc Electrical impedance tomography Applications for Low Frequency Impedance Analysis Systems |
authorStr |
Giassa, Matthew |
ppnlink_with_tag_str_mv |
@@773@@(DE-627)130869090 |
format |
Article |
dewey-ones |
004 - Data processing & computer science 670 - Manufacturing |
delete_txt_mv |
keep |
author_role |
aut aut aut aut aut aut |
collection |
OLC |
remote_str |
false |
illustrated |
Not Illustrated |
issn |
0923-8174 |
topic_title |
004 670 VZ Applications for Low Frequency Impedance Analysis Systems Bio impedance analysis Cole-Cole plots Electrical impedance tomography |
topic |
ddc 004 misc Bio impedance analysis misc Cole-Cole plots misc Electrical impedance tomography |
topic_unstemmed |
ddc 004 misc Bio impedance analysis misc Cole-Cole plots misc Electrical impedance tomography |
topic_browse |
ddc 004 misc Bio impedance analysis misc Cole-Cole plots misc Electrical impedance tomography |
format_facet |
Aufsätze Gedruckte Aufsätze |
format_main_str_mv |
Text Zeitschrift/Artikel |
carriertype_str_mv |
nc |
hierarchy_parent_title |
Journal of electronic testing |
hierarchy_parent_id |
130869090 |
dewey-tens |
000 - Computer science, knowledge & systems 670 - Manufacturing |
hierarchy_top_title |
Journal of electronic testing |
isfreeaccess_txt |
false |
familylinks_str_mv |
(DE-627)130869090 (DE-600)1033317-4 (DE-576)024991600 |
title |
Applications for Low Frequency Impedance Analysis Systems |
ctrlnum |
(DE-627)OLC2075588872 (DE-He213)s10836-009-5125-3-p |
title_full |
Applications for Low Frequency Impedance Analysis Systems |
author_sort |
Giassa, Matthew |
journal |
Journal of electronic testing |
journalStr |
Journal of electronic testing |
lang_code |
eng |
isOA_bool |
false |
dewey-hundreds |
000 - Computer science, information & general works 600 - Technology |
recordtype |
marc |
publishDateSort |
2009 |
contenttype_str_mv |
txt |
container_start_page |
139 |
author_browse |
Giassa, Matthew Khosla, Ajit Gray, Bonnie Parameswaran, Ash Kohli, Kirpal Ramaseshan, Ramani |
container_volume |
26 |
class |
004 670 VZ |
format_se |
Aufsätze |
author-letter |
Giassa, Matthew |
doi_str_mv |
10.1007/s10836-009-5125-3 |
dewey-full |
004 670 |
title_sort |
applications for low frequency impedance analysis systems |
title_auth |
Applications for Low Frequency Impedance Analysis Systems |
abstract |
Abstract We present methodology and instrumentation used to carry out and log automated multiple electrical impedance measurements using multiplexed control. We also address the issue of measurement error introduced by the instrumentation, and demonstrate how we reduce these effects in our experiments. Finally, we present two potential applications for our automated electrical impedance analysis systems: tissue scanning and mapping via impedance measurements between arrays of electrodes, and materials testing of novel conductive polymer materials. © Springer Science+Business Media, LLC 2009 |
abstractGer |
Abstract We present methodology and instrumentation used to carry out and log automated multiple electrical impedance measurements using multiplexed control. We also address the issue of measurement error introduced by the instrumentation, and demonstrate how we reduce these effects in our experiments. Finally, we present two potential applications for our automated electrical impedance analysis systems: tissue scanning and mapping via impedance measurements between arrays of electrodes, and materials testing of novel conductive polymer materials. © Springer Science+Business Media, LLC 2009 |
abstract_unstemmed |
Abstract We present methodology and instrumentation used to carry out and log automated multiple electrical impedance measurements using multiplexed control. We also address the issue of measurement error introduced by the instrumentation, and demonstrate how we reduce these effects in our experiments. Finally, we present two potential applications for our automated electrical impedance analysis systems: tissue scanning and mapping via impedance measurements between arrays of electrodes, and materials testing of novel conductive polymer materials. © Springer Science+Business Media, LLC 2009 |
collection_details |
GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-MAT GBV_ILN_70 GBV_ILN_285 GBV_ILN_2005 GBV_ILN_2006 GBV_ILN_2020 GBV_ILN_4307 GBV_ILN_4318 |
container_issue |
1 |
title_short |
Applications for Low Frequency Impedance Analysis Systems |
url |
https://doi.org/10.1007/s10836-009-5125-3 |
remote_bool |
false |
author2 |
Khosla, Ajit Gray, Bonnie Parameswaran, Ash Kohli, Kirpal Ramaseshan, Ramani |
author2Str |
Khosla, Ajit Gray, Bonnie Parameswaran, Ash Kohli, Kirpal Ramaseshan, Ramani |
ppnlink |
130869090 |
mediatype_str_mv |
n |
isOA_txt |
false |
hochschulschrift_bool |
false |
doi_str |
10.1007/s10836-009-5125-3 |
up_date |
2024-07-04T01:43:09.586Z |
_version_ |
1803610897343578112 |
fullrecord_marcxml |
<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01000caa a22002652 4500</leader><controlfield tag="001">OLC2075588872</controlfield><controlfield tag="003">DE-627</controlfield><controlfield tag="005">20230503114700.0</controlfield><controlfield tag="007">tu</controlfield><controlfield tag="008">200820s2009 xx ||||| 00| ||eng c</controlfield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1007/s10836-009-5125-3</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-627)OLC2075588872</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-He213)s10836-009-5125-3-p</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-627</subfield><subfield code="b">ger</subfield><subfield code="c">DE-627</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">004</subfield><subfield code="a">670</subfield><subfield code="q">VZ</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Giassa, Matthew</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Applications for Low Frequency Impedance Analysis Systems</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">2009</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">Text</subfield><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">ohne Hilfsmittel zu benutzen</subfield><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">Band</subfield><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">© Springer Science+Business Media, LLC 2009</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">Abstract We present methodology and instrumentation used to carry out and log automated multiple electrical impedance measurements using multiplexed control. We also address the issue of measurement error introduced by the instrumentation, and demonstrate how we reduce these effects in our experiments. Finally, we present two potential applications for our automated electrical impedance analysis systems: tissue scanning and mapping via impedance measurements between arrays of electrodes, and materials testing of novel conductive polymer materials.</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Bio impedance analysis</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Cole-Cole plots</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electrical impedance tomography</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Khosla, Ajit</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Gray, Bonnie</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Parameswaran, Ash</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Kohli, Kirpal</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Ramaseshan, Ramani</subfield><subfield code="4">aut</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="i">Enthalten in</subfield><subfield code="t">Journal of electronic testing</subfield><subfield code="d">Springer US, 1990</subfield><subfield code="g">26(2009), 1 vom: 15. Dez., Seite 139-144</subfield><subfield code="w">(DE-627)130869090</subfield><subfield code="w">(DE-600)1033317-4</subfield><subfield code="w">(DE-576)024991600</subfield><subfield code="x">0923-8174</subfield><subfield code="7">nnns</subfield></datafield><datafield tag="773" ind1="1" ind2="8"><subfield code="g">volume:26</subfield><subfield code="g">year:2009</subfield><subfield code="g">number:1</subfield><subfield code="g">day:15</subfield><subfield code="g">month:12</subfield><subfield code="g">pages:139-144</subfield></datafield><datafield tag="856" ind1="4" ind2="1"><subfield code="u">https://doi.org/10.1007/s10836-009-5125-3</subfield><subfield code="z">lizenzpflichtig</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_USEFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SYSFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_OLC</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-TEC</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-MAT</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_70</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_285</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2005</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2006</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2020</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4307</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4318</subfield></datafield><datafield tag="951" ind1=" " ind2=" "><subfield code="a">AR</subfield></datafield><datafield tag="952" ind1=" " ind2=" "><subfield code="d">26</subfield><subfield code="j">2009</subfield><subfield code="e">1</subfield><subfield code="b">15</subfield><subfield code="c">12</subfield><subfield code="h">139-144</subfield></datafield></record></collection>
|
score |
7.401106 |