VI-Based Measurement System Focusing on Space Applications
Abstract This article describes in detail a custom, high-performance, compact, flexible and reconfigurable test equipment. This measurement system is able to perform, locally or remotely, the electrical characterization of semiconductor devices and integrated circuits (ICs) under ionizing irradiatio...
Ausführliche Beschreibung
Autor*in: |
Seixas, L. E. [verfasserIn] |
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Format: |
Artikel |
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Sprache: |
Englisch |
Erschienen: |
2017 |
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Schlagwörter: |
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Anmerkung: |
© Springer Science+Business Media New York 2017 |
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Übergeordnetes Werk: |
Enthalten in: Journal of electronic testing - Springer US, 1990, 33(2017), 2 vom: 07. März, Seite 267-274 |
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Übergeordnetes Werk: |
volume:33 ; year:2017 ; number:2 ; day:07 ; month:03 ; pages:267-274 |
Links: |
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DOI / URN: |
10.1007/s10836-017-5651-3 |
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Katalog-ID: |
OLC2075593809 |
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10.1007/s10836-017-5651-3 doi (DE-627)OLC2075593809 (DE-He213)s10836-017-5651-3-p DE-627 ger DE-627 rakwb eng 004 670 VZ Seixas, L. E. verfasserin aut VI-Based Measurement System Focusing on Space Applications 2017 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Springer Science+Business Media New York 2017 Abstract This article describes in detail a custom, high-performance, compact, flexible and reconfigurable test equipment. This measurement system is able to perform, locally or remotely, the electrical characterization of semiconductor devices and integrated circuits (ICs) under ionizing irradiation tests. This measurement platform can be managed remotely through serial, Local Network Area (LAN) link, allowing the electrical characterization of these devices in harsh test environments. Using this customized test measurement system, we were capable to reduce total test time by 1/3 in our TID test application. PXI test equipment IC electrical characterization Radiations effects on ICs Finco, S. aut Gimenez, S. P. aut Enthalten in Journal of electronic testing Springer US, 1990 33(2017), 2 vom: 07. März, Seite 267-274 (DE-627)130869090 (DE-600)1033317-4 (DE-576)024991600 0923-8174 nnns volume:33 year:2017 number:2 day:07 month:03 pages:267-274 https://doi.org/10.1007/s10836-017-5651-3 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-MAT GBV_ILN_70 GBV_ILN_4318 AR 33 2017 2 07 03 267-274 |
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Abstract This article describes in detail a custom, high-performance, compact, flexible and reconfigurable test equipment. This measurement system is able to perform, locally or remotely, the electrical characterization of semiconductor devices and integrated circuits (ICs) under ionizing irradiation tests. This measurement platform can be managed remotely through serial, Local Network Area (LAN) link, allowing the electrical characterization of these devices in harsh test environments. Using this customized test measurement system, we were capable to reduce total test time by 1/3 in our TID test application. © Springer Science+Business Media New York 2017 |
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Abstract This article describes in detail a custom, high-performance, compact, flexible and reconfigurable test equipment. This measurement system is able to perform, locally or remotely, the electrical characterization of semiconductor devices and integrated circuits (ICs) under ionizing irradiation tests. This measurement platform can be managed remotely through serial, Local Network Area (LAN) link, allowing the electrical characterization of these devices in harsh test environments. Using this customized test measurement system, we were capable to reduce total test time by 1/3 in our TID test application. © Springer Science+Business Media New York 2017 |
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Abstract This article describes in detail a custom, high-performance, compact, flexible and reconfigurable test equipment. This measurement system is able to perform, locally or remotely, the electrical characterization of semiconductor devices and integrated circuits (ICs) under ionizing irradiation tests. This measurement platform can be managed remotely through serial, Local Network Area (LAN) link, allowing the electrical characterization of these devices in harsh test environments. Using this customized test measurement system, we were capable to reduce total test time by 1/3 in our TID test application. © Springer Science+Business Media New York 2017 |
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E.</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">VI-Based Measurement System Focusing on Space Applications</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">2017</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">Text</subfield><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">ohne Hilfsmittel zu benutzen</subfield><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">Band</subfield><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">© Springer Science+Business Media New York 2017</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">Abstract This article describes in detail a custom, high-performance, compact, flexible and reconfigurable test equipment. 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Using this customized test measurement system, we were capable to reduce total test time by 1/3 in our TID test application.</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">PXI test equipment</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">IC electrical characterization</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Radiations effects on ICs</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Finco, S.</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Gimenez, S. P.</subfield><subfield code="4">aut</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="i">Enthalten in</subfield><subfield code="t">Journal of electronic testing</subfield><subfield code="d">Springer US, 1990</subfield><subfield code="g">33(2017), 2 vom: 07. März, Seite 267-274</subfield><subfield code="w">(DE-627)130869090</subfield><subfield code="w">(DE-600)1033317-4</subfield><subfield code="w">(DE-576)024991600</subfield><subfield code="x">0923-8174</subfield><subfield code="7">nnns</subfield></datafield><datafield tag="773" ind1="1" ind2="8"><subfield code="g">volume:33</subfield><subfield code="g">year:2017</subfield><subfield code="g">number:2</subfield><subfield code="g">day:07</subfield><subfield code="g">month:03</subfield><subfield code="g">pages:267-274</subfield></datafield><datafield tag="856" ind1="4" ind2="1"><subfield code="u">https://doi.org/10.1007/s10836-017-5651-3</subfield><subfield code="z">lizenzpflichtig</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_USEFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SYSFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_OLC</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-TEC</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-MAT</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_70</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4318</subfield></datafield><datafield tag="951" ind1=" " ind2=" "><subfield code="a">AR</subfield></datafield><datafield tag="952" ind1=" " ind2=" "><subfield code="d">33</subfield><subfield code="j">2017</subfield><subfield code="e">2</subfield><subfield code="b">07</subfield><subfield code="c">03</subfield><subfield code="h">267-274</subfield></datafield></record></collection>
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