Revisit to Histogram Method for ADC Linearity Test: Examination of Input Signal and Ratio of Input and Sampling Frequencies
Abstract This paper revisits histogram method for ADC linearity test. Here two methods are proposed for low cost test of histogram method. The first proposal is two-tone sine wave input for code selective histogram method for SAR ADC. In SAR ADC, the DNL of the codes corresponding to the internal DA...
Ausführliche Beschreibung
Autor*in: |
Zhao, Yujie [verfasserIn] |
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Format: |
Artikel |
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Sprache: |
Englisch |
Erschienen: |
2022 |
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Anmerkung: |
© The Author(s), under exclusive licence to Springer Science+Business Media, LLC, part of Springer Nature 2022 |
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Übergeordnetes Werk: |
Enthalten in: Journal of electronic testing - Springer US, 1990, 38(2022), 1 vom: Feb., Seite 21-38 |
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Übergeordnetes Werk: |
volume:38 ; year:2022 ; number:1 ; month:02 ; pages:21-38 |
Links: |
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DOI / URN: |
10.1007/s10836-022-05988-y |
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Katalog-ID: |
OLC2078529990 |
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520 | |a Abstract This paper revisits histogram method for ADC linearity test. Here two methods are proposed for low cost test of histogram method. The first proposal is two-tone sine wave input for code selective histogram method for SAR ADC. In SAR ADC, the DNL of the codes corresponding to the internal DAC output voltages of the MSB bits can be large when the DAC employs a binary-weighted configuration. Therefore, in the proposed method, frequency of appearance of the codes is increased to make the length of the bins relatively long with two-tone sine wave input. It realizes low cost test and high-quality linearity test. The 2nd proposal is decision method of the ratio of the input and sampling frequencies with classical number theory. The proposed method decides the ratio based on metallic ratio or theory of prime numbers. This guarantees random data sampling to get accurate calibration result with relatively small number of histogram data. | ||
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10.1007/s10836-022-05988-y doi (DE-627)OLC2078529990 (DE-He213)s10836-022-05988-y-p DE-627 ger DE-627 rakwb eng 004 670 VZ Zhao, Yujie verfasserin (orcid)0000-0001-8119-3120 aut Revisit to Histogram Method for ADC Linearity Test: Examination of Input Signal and Ratio of Input and Sampling Frequencies 2022 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © The Author(s), under exclusive licence to Springer Science+Business Media, LLC, part of Springer Nature 2022 Abstract This paper revisits histogram method for ADC linearity test. Here two methods are proposed for low cost test of histogram method. The first proposal is two-tone sine wave input for code selective histogram method for SAR ADC. In SAR ADC, the DNL of the codes corresponding to the internal DAC output voltages of the MSB bits can be large when the DAC employs a binary-weighted configuration. Therefore, in the proposed method, frequency of appearance of the codes is increased to make the length of the bins relatively long with two-tone sine wave input. It realizes low cost test and high-quality linearity test. The 2nd proposal is decision method of the ratio of the input and sampling frequencies with classical number theory. The proposed method decides the ratio based on metallic ratio or theory of prime numbers. This guarantees random data sampling to get accurate calibration result with relatively small number of histogram data. Code Selective Method Histogram Method Linearity Test Mettalic Ratio Sampling SAR ADC Two-Tone Katoh, Kentaroh aut Kuwana, Anna aut Katayama, Shogo aut Wei, Jianglin aut Kobayashi, Haruo aut Nakatani, Takayuki aut Hatayama, Kazumi aut Sato, Keno aut Ishida, Takashi aut Okamoto, Toshiyuki aut Ichikawa, Tamotsu aut Enthalten in Journal of electronic testing Springer US, 1990 38(2022), 1 vom: Feb., Seite 21-38 (DE-627)130869090 (DE-600)1033317-4 (DE-576)024991600 0923-8174 nnns volume:38 year:2022 number:1 month:02 pages:21-38 https://doi.org/10.1007/s10836-022-05988-y lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-MAT AR 38 2022 1 02 21-38 |
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10.1007/s10836-022-05988-y doi (DE-627)OLC2078529990 (DE-He213)s10836-022-05988-y-p DE-627 ger DE-627 rakwb eng 004 670 VZ Zhao, Yujie verfasserin (orcid)0000-0001-8119-3120 aut Revisit to Histogram Method for ADC Linearity Test: Examination of Input Signal and Ratio of Input and Sampling Frequencies 2022 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © The Author(s), under exclusive licence to Springer Science+Business Media, LLC, part of Springer Nature 2022 Abstract This paper revisits histogram method for ADC linearity test. Here two methods are proposed for low cost test of histogram method. The first proposal is two-tone sine wave input for code selective histogram method for SAR ADC. In SAR ADC, the DNL of the codes corresponding to the internal DAC output voltages of the MSB bits can be large when the DAC employs a binary-weighted configuration. Therefore, in the proposed method, frequency of appearance of the codes is increased to make the length of the bins relatively long with two-tone sine wave input. It realizes low cost test and high-quality linearity test. The 2nd proposal is decision method of the ratio of the input and sampling frequencies with classical number theory. The proposed method decides the ratio based on metallic ratio or theory of prime numbers. This guarantees random data sampling to get accurate calibration result with relatively small number of histogram data. Code Selective Method Histogram Method Linearity Test Mettalic Ratio Sampling SAR ADC Two-Tone Katoh, Kentaroh aut Kuwana, Anna aut Katayama, Shogo aut Wei, Jianglin aut Kobayashi, Haruo aut Nakatani, Takayuki aut Hatayama, Kazumi aut Sato, Keno aut Ishida, Takashi aut Okamoto, Toshiyuki aut Ichikawa, Tamotsu aut Enthalten in Journal of electronic testing Springer US, 1990 38(2022), 1 vom: Feb., Seite 21-38 (DE-627)130869090 (DE-600)1033317-4 (DE-576)024991600 0923-8174 nnns volume:38 year:2022 number:1 month:02 pages:21-38 https://doi.org/10.1007/s10836-022-05988-y lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-MAT AR 38 2022 1 02 21-38 |
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10.1007/s10836-022-05988-y doi (DE-627)OLC2078529990 (DE-He213)s10836-022-05988-y-p DE-627 ger DE-627 rakwb eng 004 670 VZ Zhao, Yujie verfasserin (orcid)0000-0001-8119-3120 aut Revisit to Histogram Method for ADC Linearity Test: Examination of Input Signal and Ratio of Input and Sampling Frequencies 2022 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © The Author(s), under exclusive licence to Springer Science+Business Media, LLC, part of Springer Nature 2022 Abstract This paper revisits histogram method for ADC linearity test. Here two methods are proposed for low cost test of histogram method. The first proposal is two-tone sine wave input for code selective histogram method for SAR ADC. In SAR ADC, the DNL of the codes corresponding to the internal DAC output voltages of the MSB bits can be large when the DAC employs a binary-weighted configuration. Therefore, in the proposed method, frequency of appearance of the codes is increased to make the length of the bins relatively long with two-tone sine wave input. It realizes low cost test and high-quality linearity test. The 2nd proposal is decision method of the ratio of the input and sampling frequencies with classical number theory. The proposed method decides the ratio based on metallic ratio or theory of prime numbers. This guarantees random data sampling to get accurate calibration result with relatively small number of histogram data. Code Selective Method Histogram Method Linearity Test Mettalic Ratio Sampling SAR ADC Two-Tone Katoh, Kentaroh aut Kuwana, Anna aut Katayama, Shogo aut Wei, Jianglin aut Kobayashi, Haruo aut Nakatani, Takayuki aut Hatayama, Kazumi aut Sato, Keno aut Ishida, Takashi aut Okamoto, Toshiyuki aut Ichikawa, Tamotsu aut Enthalten in Journal of electronic testing Springer US, 1990 38(2022), 1 vom: Feb., Seite 21-38 (DE-627)130869090 (DE-600)1033317-4 (DE-576)024991600 0923-8174 nnns volume:38 year:2022 number:1 month:02 pages:21-38 https://doi.org/10.1007/s10836-022-05988-y lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-MAT AR 38 2022 1 02 21-38 |
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10.1007/s10836-022-05988-y doi (DE-627)OLC2078529990 (DE-He213)s10836-022-05988-y-p DE-627 ger DE-627 rakwb eng 004 670 VZ Zhao, Yujie verfasserin (orcid)0000-0001-8119-3120 aut Revisit to Histogram Method for ADC Linearity Test: Examination of Input Signal and Ratio of Input and Sampling Frequencies 2022 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © The Author(s), under exclusive licence to Springer Science+Business Media, LLC, part of Springer Nature 2022 Abstract This paper revisits histogram method for ADC linearity test. Here two methods are proposed for low cost test of histogram method. The first proposal is two-tone sine wave input for code selective histogram method for SAR ADC. In SAR ADC, the DNL of the codes corresponding to the internal DAC output voltages of the MSB bits can be large when the DAC employs a binary-weighted configuration. Therefore, in the proposed method, frequency of appearance of the codes is increased to make the length of the bins relatively long with two-tone sine wave input. It realizes low cost test and high-quality linearity test. The 2nd proposal is decision method of the ratio of the input and sampling frequencies with classical number theory. The proposed method decides the ratio based on metallic ratio or theory of prime numbers. This guarantees random data sampling to get accurate calibration result with relatively small number of histogram data. Code Selective Method Histogram Method Linearity Test Mettalic Ratio Sampling SAR ADC Two-Tone Katoh, Kentaroh aut Kuwana, Anna aut Katayama, Shogo aut Wei, Jianglin aut Kobayashi, Haruo aut Nakatani, Takayuki aut Hatayama, Kazumi aut Sato, Keno aut Ishida, Takashi aut Okamoto, Toshiyuki aut Ichikawa, Tamotsu aut Enthalten in Journal of electronic testing Springer US, 1990 38(2022), 1 vom: Feb., Seite 21-38 (DE-627)130869090 (DE-600)1033317-4 (DE-576)024991600 0923-8174 nnns volume:38 year:2022 number:1 month:02 pages:21-38 https://doi.org/10.1007/s10836-022-05988-y lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-MAT AR 38 2022 1 02 21-38 |
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Zhao, Yujie Katoh, Kentaroh Kuwana, Anna Katayama, Shogo Wei, Jianglin Kobayashi, Haruo Nakatani, Takayuki Hatayama, Kazumi Sato, Keno Ishida, Takashi Okamoto, Toshiyuki Ichikawa, Tamotsu |
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Zhao, Yujie |
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revisit to histogram method for adc linearity test: examination of input signal and ratio of input and sampling frequencies |
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Revisit to Histogram Method for ADC Linearity Test: Examination of Input Signal and Ratio of Input and Sampling Frequencies |
abstract |
Abstract This paper revisits histogram method for ADC linearity test. Here two methods are proposed for low cost test of histogram method. The first proposal is two-tone sine wave input for code selective histogram method for SAR ADC. In SAR ADC, the DNL of the codes corresponding to the internal DAC output voltages of the MSB bits can be large when the DAC employs a binary-weighted configuration. Therefore, in the proposed method, frequency of appearance of the codes is increased to make the length of the bins relatively long with two-tone sine wave input. It realizes low cost test and high-quality linearity test. The 2nd proposal is decision method of the ratio of the input and sampling frequencies with classical number theory. The proposed method decides the ratio based on metallic ratio or theory of prime numbers. This guarantees random data sampling to get accurate calibration result with relatively small number of histogram data. © The Author(s), under exclusive licence to Springer Science+Business Media, LLC, part of Springer Nature 2022 |
abstractGer |
Abstract This paper revisits histogram method for ADC linearity test. Here two methods are proposed for low cost test of histogram method. The first proposal is two-tone sine wave input for code selective histogram method for SAR ADC. In SAR ADC, the DNL of the codes corresponding to the internal DAC output voltages of the MSB bits can be large when the DAC employs a binary-weighted configuration. Therefore, in the proposed method, frequency of appearance of the codes is increased to make the length of the bins relatively long with two-tone sine wave input. It realizes low cost test and high-quality linearity test. The 2nd proposal is decision method of the ratio of the input and sampling frequencies with classical number theory. The proposed method decides the ratio based on metallic ratio or theory of prime numbers. This guarantees random data sampling to get accurate calibration result with relatively small number of histogram data. © The Author(s), under exclusive licence to Springer Science+Business Media, LLC, part of Springer Nature 2022 |
abstract_unstemmed |
Abstract This paper revisits histogram method for ADC linearity test. Here two methods are proposed for low cost test of histogram method. The first proposal is two-tone sine wave input for code selective histogram method for SAR ADC. In SAR ADC, the DNL of the codes corresponding to the internal DAC output voltages of the MSB bits can be large when the DAC employs a binary-weighted configuration. Therefore, in the proposed method, frequency of appearance of the codes is increased to make the length of the bins relatively long with two-tone sine wave input. It realizes low cost test and high-quality linearity test. The 2nd proposal is decision method of the ratio of the input and sampling frequencies with classical number theory. The proposed method decides the ratio based on metallic ratio or theory of prime numbers. This guarantees random data sampling to get accurate calibration result with relatively small number of histogram data. © The Author(s), under exclusive licence to Springer Science+Business Media, LLC, part of Springer Nature 2022 |
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title_short |
Revisit to Histogram Method for ADC Linearity Test: Examination of Input Signal and Ratio of Input and Sampling Frequencies |
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https://doi.org/10.1007/s10836-022-05988-y |
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Katoh, Kentaroh Kuwana, Anna Katayama, Shogo Wei, Jianglin Kobayashi, Haruo Nakatani, Takayuki Hatayama, Kazumi Sato, Keno Ishida, Takashi Okamoto, Toshiyuki Ichikawa, Tamotsu |
author2Str |
Katoh, Kentaroh Kuwana, Anna Katayama, Shogo Wei, Jianglin Kobayashi, Haruo Nakatani, Takayuki Hatayama, Kazumi Sato, Keno Ishida, Takashi Okamoto, Toshiyuki Ichikawa, Tamotsu |
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