Study of the structural and magnetic characteristics of epitaxial $ Fe_{3} $Si/Si(111) films
Abstract The results of the structural and magnetic studies of the epitaxial structure prepared during the simultaneous evaporation from two iron and silicon sources on an atomically pure Si(111)7 × 7 surface at a substrate temperature of 150°C have been presented. The epitaxial structure has been i...
Ausführliche Beschreibung
Autor*in: |
Yakovlev, I. A. [verfasserIn] |
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Format: |
Artikel |
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Sprache: |
Englisch |
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2014 |
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Anmerkung: |
© Pleiades Publishing, Inc. 2014 |
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Übergeordnetes Werk: |
Enthalten in: Journal of experimental and theoretical physics / JETP letters - Pleiades Publishing, 1993, 99(2014), 9 vom: Juli, Seite 527-530 |
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Übergeordnetes Werk: |
volume:99 ; year:2014 ; number:9 ; month:07 ; pages:527-530 |
Links: |
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DOI / URN: |
10.1134/S0021364014090124 |
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Katalog-ID: |
OLC2085803377 |
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520 | |a Abstract The results of the structural and magnetic studies of the epitaxial structure prepared during the simultaneous evaporation from two iron and silicon sources on an atomically pure Si(111)7 × 7 surface at a substrate temperature of 150°C have been presented. The epitaxial structure has been identified as a single-crystal $ Fe_{3} $Si silicide film with the orientation Si[111]‖$ Fe_{3} $Si[111] using methods of the X-ray structural analysis, transmission electron microscopy, and reflection high-energy electron diffraction. It has been established that the epitaxial $ Fe_{3} $Si film at room temperature has magnetic uniaxial anisotropy (Ha = 26 Oe) and a relatively narrow uniform ferromagnetic resonance line (ΔH = 11.57 Oe) measured at a pump frequency of 2.274 GHz. | ||
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650 | 4 | |a Reflection High Energy Electron Diffraction | |
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700 | 1 | |a Tarasov, I. A. |4 aut | |
700 | 1 | |a Ovchinnikov, S. G. |4 aut | |
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10.1134/S0021364014090124 doi (DE-627)OLC2085803377 (DE-He213)S0021364014090124-p DE-627 ger DE-627 rakwb eng 530 VZ 33.00 bkl Yakovlev, I. A. verfasserin aut Study of the structural and magnetic characteristics of epitaxial $ Fe_{3} $Si/Si(111) films 2014 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Pleiades Publishing, Inc. 2014 Abstract The results of the structural and magnetic studies of the epitaxial structure prepared during the simultaneous evaporation from two iron and silicon sources on an atomically pure Si(111)7 × 7 surface at a substrate temperature of 150°C have been presented. The epitaxial structure has been identified as a single-crystal $ Fe_{3} $Si silicide film with the orientation Si[111]‖$ Fe_{3} $Si[111] using methods of the X-ray structural analysis, transmission electron microscopy, and reflection high-energy electron diffraction. It has been established that the epitaxial $ Fe_{3} $Si film at room temperature has magnetic uniaxial anisotropy (Ha = 26 Oe) and a relatively narrow uniform ferromagnetic resonance line (ΔH = 11.57 Oe) measured at a pump frequency of 2.274 GHz. JETP Letter Ferromagnetic Resonance Reflection High Energy Electron Diffraction Pump Frequency Epitaxial Structure Varnakov, S. N. aut Belyaev, B. A. aut Zharkov, S. M. aut Molokeev, M. S. aut Tarasov, I. A. aut Ovchinnikov, S. G. aut Enthalten in Journal of experimental and theoretical physics / JETP letters Pleiades Publishing, 1993 99(2014), 9 vom: Juli, Seite 527-530 (DE-627)182384713 (DE-600)917787-5 (DE-576)053745841 0021-3640 nnns volume:99 year:2014 number:9 month:07 pages:527-530 https://doi.org/10.1134/S0021364014090124 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-PHY 33.00 VZ AR 99 2014 9 07 527-530 |
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10.1134/S0021364014090124 doi (DE-627)OLC2085803377 (DE-He213)S0021364014090124-p DE-627 ger DE-627 rakwb eng 530 VZ 33.00 bkl Yakovlev, I. A. verfasserin aut Study of the structural and magnetic characteristics of epitaxial $ Fe_{3} $Si/Si(111) films 2014 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Pleiades Publishing, Inc. 2014 Abstract The results of the structural and magnetic studies of the epitaxial structure prepared during the simultaneous evaporation from two iron and silicon sources on an atomically pure Si(111)7 × 7 surface at a substrate temperature of 150°C have been presented. The epitaxial structure has been identified as a single-crystal $ Fe_{3} $Si silicide film with the orientation Si[111]‖$ Fe_{3} $Si[111] using methods of the X-ray structural analysis, transmission electron microscopy, and reflection high-energy electron diffraction. It has been established that the epitaxial $ Fe_{3} $Si film at room temperature has magnetic uniaxial anisotropy (Ha = 26 Oe) and a relatively narrow uniform ferromagnetic resonance line (ΔH = 11.57 Oe) measured at a pump frequency of 2.274 GHz. JETP Letter Ferromagnetic Resonance Reflection High Energy Electron Diffraction Pump Frequency Epitaxial Structure Varnakov, S. N. aut Belyaev, B. A. aut Zharkov, S. M. aut Molokeev, M. S. aut Tarasov, I. A. aut Ovchinnikov, S. G. aut Enthalten in Journal of experimental and theoretical physics / JETP letters Pleiades Publishing, 1993 99(2014), 9 vom: Juli, Seite 527-530 (DE-627)182384713 (DE-600)917787-5 (DE-576)053745841 0021-3640 nnns volume:99 year:2014 number:9 month:07 pages:527-530 https://doi.org/10.1134/S0021364014090124 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-PHY 33.00 VZ AR 99 2014 9 07 527-530 |
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10.1134/S0021364014090124 doi (DE-627)OLC2085803377 (DE-He213)S0021364014090124-p DE-627 ger DE-627 rakwb eng 530 VZ 33.00 bkl Yakovlev, I. A. verfasserin aut Study of the structural and magnetic characteristics of epitaxial $ Fe_{3} $Si/Si(111) films 2014 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Pleiades Publishing, Inc. 2014 Abstract The results of the structural and magnetic studies of the epitaxial structure prepared during the simultaneous evaporation from two iron and silicon sources on an atomically pure Si(111)7 × 7 surface at a substrate temperature of 150°C have been presented. The epitaxial structure has been identified as a single-crystal $ Fe_{3} $Si silicide film with the orientation Si[111]‖$ Fe_{3} $Si[111] using methods of the X-ray structural analysis, transmission electron microscopy, and reflection high-energy electron diffraction. It has been established that the epitaxial $ Fe_{3} $Si film at room temperature has magnetic uniaxial anisotropy (Ha = 26 Oe) and a relatively narrow uniform ferromagnetic resonance line (ΔH = 11.57 Oe) measured at a pump frequency of 2.274 GHz. JETP Letter Ferromagnetic Resonance Reflection High Energy Electron Diffraction Pump Frequency Epitaxial Structure Varnakov, S. N. aut Belyaev, B. A. aut Zharkov, S. M. aut Molokeev, M. S. aut Tarasov, I. A. aut Ovchinnikov, S. G. aut Enthalten in Journal of experimental and theoretical physics / JETP letters Pleiades Publishing, 1993 99(2014), 9 vom: Juli, Seite 527-530 (DE-627)182384713 (DE-600)917787-5 (DE-576)053745841 0021-3640 nnns volume:99 year:2014 number:9 month:07 pages:527-530 https://doi.org/10.1134/S0021364014090124 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-PHY 33.00 VZ AR 99 2014 9 07 527-530 |
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10.1134/S0021364014090124 doi (DE-627)OLC2085803377 (DE-He213)S0021364014090124-p DE-627 ger DE-627 rakwb eng 530 VZ 33.00 bkl Yakovlev, I. A. verfasserin aut Study of the structural and magnetic characteristics of epitaxial $ Fe_{3} $Si/Si(111) films 2014 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Pleiades Publishing, Inc. 2014 Abstract The results of the structural and magnetic studies of the epitaxial structure prepared during the simultaneous evaporation from two iron and silicon sources on an atomically pure Si(111)7 × 7 surface at a substrate temperature of 150°C have been presented. The epitaxial structure has been identified as a single-crystal $ Fe_{3} $Si silicide film with the orientation Si[111]‖$ Fe_{3} $Si[111] using methods of the X-ray structural analysis, transmission electron microscopy, and reflection high-energy electron diffraction. It has been established that the epitaxial $ Fe_{3} $Si film at room temperature has magnetic uniaxial anisotropy (Ha = 26 Oe) and a relatively narrow uniform ferromagnetic resonance line (ΔH = 11.57 Oe) measured at a pump frequency of 2.274 GHz. JETP Letter Ferromagnetic Resonance Reflection High Energy Electron Diffraction Pump Frequency Epitaxial Structure Varnakov, S. N. aut Belyaev, B. A. aut Zharkov, S. M. aut Molokeev, M. S. aut Tarasov, I. A. aut Ovchinnikov, S. G. aut Enthalten in Journal of experimental and theoretical physics / JETP letters Pleiades Publishing, 1993 99(2014), 9 vom: Juli, Seite 527-530 (DE-627)182384713 (DE-600)917787-5 (DE-576)053745841 0021-3640 nnns volume:99 year:2014 number:9 month:07 pages:527-530 https://doi.org/10.1134/S0021364014090124 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-PHY 33.00 VZ AR 99 2014 9 07 527-530 |
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10.1134/S0021364014090124 doi (DE-627)OLC2085803377 (DE-He213)S0021364014090124-p DE-627 ger DE-627 rakwb eng 530 VZ 33.00 bkl Yakovlev, I. A. verfasserin aut Study of the structural and magnetic characteristics of epitaxial $ Fe_{3} $Si/Si(111) films 2014 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Pleiades Publishing, Inc. 2014 Abstract The results of the structural and magnetic studies of the epitaxial structure prepared during the simultaneous evaporation from two iron and silicon sources on an atomically pure Si(111)7 × 7 surface at a substrate temperature of 150°C have been presented. The epitaxial structure has been identified as a single-crystal $ Fe_{3} $Si silicide film with the orientation Si[111]‖$ Fe_{3} $Si[111] using methods of the X-ray structural analysis, transmission electron microscopy, and reflection high-energy electron diffraction. It has been established that the epitaxial $ Fe_{3} $Si film at room temperature has magnetic uniaxial anisotropy (Ha = 26 Oe) and a relatively narrow uniform ferromagnetic resonance line (ΔH = 11.57 Oe) measured at a pump frequency of 2.274 GHz. JETP Letter Ferromagnetic Resonance Reflection High Energy Electron Diffraction Pump Frequency Epitaxial Structure Varnakov, S. N. aut Belyaev, B. A. aut Zharkov, S. M. aut Molokeev, M. S. aut Tarasov, I. A. aut Ovchinnikov, S. G. aut Enthalten in Journal of experimental and theoretical physics / JETP letters Pleiades Publishing, 1993 99(2014), 9 vom: Juli, Seite 527-530 (DE-627)182384713 (DE-600)917787-5 (DE-576)053745841 0021-3640 nnns volume:99 year:2014 number:9 month:07 pages:527-530 https://doi.org/10.1134/S0021364014090124 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-PHY 33.00 VZ AR 99 2014 9 07 527-530 |
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Study of the structural and magnetic characteristics of epitaxial $ Fe_{3} $Si/Si(111) films |
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Abstract The results of the structural and magnetic studies of the epitaxial structure prepared during the simultaneous evaporation from two iron and silicon sources on an atomically pure Si(111)7 × 7 surface at a substrate temperature of 150°C have been presented. The epitaxial structure has been identified as a single-crystal $ Fe_{3} $Si silicide film with the orientation Si[111]‖$ Fe_{3} $Si[111] using methods of the X-ray structural analysis, transmission electron microscopy, and reflection high-energy electron diffraction. It has been established that the epitaxial $ Fe_{3} $Si film at room temperature has magnetic uniaxial anisotropy (Ha = 26 Oe) and a relatively narrow uniform ferromagnetic resonance line (ΔH = 11.57 Oe) measured at a pump frequency of 2.274 GHz. © Pleiades Publishing, Inc. 2014 |
abstractGer |
Abstract The results of the structural and magnetic studies of the epitaxial structure prepared during the simultaneous evaporation from two iron and silicon sources on an atomically pure Si(111)7 × 7 surface at a substrate temperature of 150°C have been presented. The epitaxial structure has been identified as a single-crystal $ Fe_{3} $Si silicide film with the orientation Si[111]‖$ Fe_{3} $Si[111] using methods of the X-ray structural analysis, transmission electron microscopy, and reflection high-energy electron diffraction. It has been established that the epitaxial $ Fe_{3} $Si film at room temperature has magnetic uniaxial anisotropy (Ha = 26 Oe) and a relatively narrow uniform ferromagnetic resonance line (ΔH = 11.57 Oe) measured at a pump frequency of 2.274 GHz. © Pleiades Publishing, Inc. 2014 |
abstract_unstemmed |
Abstract The results of the structural and magnetic studies of the epitaxial structure prepared during the simultaneous evaporation from two iron and silicon sources on an atomically pure Si(111)7 × 7 surface at a substrate temperature of 150°C have been presented. The epitaxial structure has been identified as a single-crystal $ Fe_{3} $Si silicide film with the orientation Si[111]‖$ Fe_{3} $Si[111] using methods of the X-ray structural analysis, transmission electron microscopy, and reflection high-energy electron diffraction. It has been established that the epitaxial $ Fe_{3} $Si film at room temperature has magnetic uniaxial anisotropy (Ha = 26 Oe) and a relatively narrow uniform ferromagnetic resonance line (ΔH = 11.57 Oe) measured at a pump frequency of 2.274 GHz. © Pleiades Publishing, Inc. 2014 |
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container_issue |
9 |
title_short |
Study of the structural and magnetic characteristics of epitaxial $ Fe_{3} $Si/Si(111) films |
url |
https://doi.org/10.1134/S0021364014090124 |
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author2 |
Varnakov, S. N. Belyaev, B. A. Zharkov, S. M. Molokeev, M. S. Tarasov, I. A. Ovchinnikov, S. G. |
author2Str |
Varnakov, S. N. Belyaev, B. A. Zharkov, S. M. Molokeev, M. S. Tarasov, I. A. Ovchinnikov, S. G. |
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doi_str |
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up_date |
2024-07-04T07:57:19.906Z |
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