A study on mass spectrometry of methylated [60] fullerenes using the “in-beam” electron impact technique
Abstract Mass spectra of the methylated [60]fullerenes were obtained by EI mass spectrometry using “desorption” or “in-beam” technique. The mass spectra of the methylated fullerenes, $ C_{60} $$ Me_{n} $, have the molecular ion peak $ M^{+} $ indicating that the product is stable under the MS (EI) c...
Ausführliche Beschreibung
Autor*in: |
Al-Matar, Hamad M. [verfasserIn] |
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Format: |
Artikel |
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Sprache: |
Englisch |
Erschienen: |
2005 |
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Schlagwörter: |
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Anmerkung: |
© American Society for Mass Spectrometry 2005 |
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Übergeordnetes Werk: |
Enthalten in: Journal of the American Society for Mass Spectrometry - Springer-Verlag, 1990, 16(2005), 8 vom: 01. Aug., Seite 1311-1315 |
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Übergeordnetes Werk: |
volume:16 ; year:2005 ; number:8 ; day:01 ; month:08 ; pages:1311-1315 |
Links: |
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DOI / URN: |
10.1016/j.jasms.2005.03.022 |
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Katalog-ID: |
OLC2097664210 |
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10.1016/j.jasms.2005.03.022 doi (DE-627)OLC2097664210 (DE-He213)j.jasms.2005.03.022-p DE-627 ger DE-627 rakwb eng 530 VZ 11 ssgn Al-Matar, Hamad M. verfasserin aut A study on mass spectrometry of methylated [60] fullerenes using the “in-beam” electron impact technique 2005 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © American Society for Mass Spectrometry 2005 Abstract Mass spectra of the methylated [60]fullerenes were obtained by EI mass spectrometry using “desorption” or “in-beam” technique. The mass spectra of the methylated fullerenes, $ C_{60} $$ Me_{n} $, have the molecular ion peak $ M^{+} $ indicating that the product is stable under the MS (EI) conditions. The appearance of an intense peak at m/z 360 was assigned to the formation of fullerene dication C60++. The remaining peaks were assigned to successive loss of methyl groups from molecular monocation and dication. Fullerene Kuwait Successive Loss Electron Impact Mass Spectrometry Direct Insertion Probe Badawy, Sayed M. aut Enthalten in Journal of the American Society for Mass Spectrometry Springer-Verlag, 1990 16(2005), 8 vom: 01. Aug., Seite 1311-1315 (DE-627)130977357 (DE-600)1073671-2 (DE-576)277732093 1044-0305 nnns volume:16 year:2005 number:8 day:01 month:08 pages:1311-1315 https://doi.org/10.1016/j.jasms.2005.03.022 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-PHY SSG-OLC-CHE GBV_ILN_40 GBV_ILN_70 GBV_ILN_4012 GBV_ILN_4125 GBV_ILN_4307 GBV_ILN_4313 AR 16 2005 8 01 08 1311-1315 |
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10.1016/j.jasms.2005.03.022 doi (DE-627)OLC2097664210 (DE-He213)j.jasms.2005.03.022-p DE-627 ger DE-627 rakwb eng 530 VZ 11 ssgn Al-Matar, Hamad M. verfasserin aut A study on mass spectrometry of methylated [60] fullerenes using the “in-beam” electron impact technique 2005 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © American Society for Mass Spectrometry 2005 Abstract Mass spectra of the methylated [60]fullerenes were obtained by EI mass spectrometry using “desorption” or “in-beam” technique. The mass spectra of the methylated fullerenes, $ C_{60} $$ Me_{n} $, have the molecular ion peak $ M^{+} $ indicating that the product is stable under the MS (EI) conditions. The appearance of an intense peak at m/z 360 was assigned to the formation of fullerene dication C60++. The remaining peaks were assigned to successive loss of methyl groups from molecular monocation and dication. Fullerene Kuwait Successive Loss Electron Impact Mass Spectrometry Direct Insertion Probe Badawy, Sayed M. aut Enthalten in Journal of the American Society for Mass Spectrometry Springer-Verlag, 1990 16(2005), 8 vom: 01. Aug., Seite 1311-1315 (DE-627)130977357 (DE-600)1073671-2 (DE-576)277732093 1044-0305 nnns volume:16 year:2005 number:8 day:01 month:08 pages:1311-1315 https://doi.org/10.1016/j.jasms.2005.03.022 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-PHY SSG-OLC-CHE GBV_ILN_40 GBV_ILN_70 GBV_ILN_4012 GBV_ILN_4125 GBV_ILN_4307 GBV_ILN_4313 AR 16 2005 8 01 08 1311-1315 |
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10.1016/j.jasms.2005.03.022 doi (DE-627)OLC2097664210 (DE-He213)j.jasms.2005.03.022-p DE-627 ger DE-627 rakwb eng 530 VZ 11 ssgn Al-Matar, Hamad M. verfasserin aut A study on mass spectrometry of methylated [60] fullerenes using the “in-beam” electron impact technique 2005 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © American Society for Mass Spectrometry 2005 Abstract Mass spectra of the methylated [60]fullerenes were obtained by EI mass spectrometry using “desorption” or “in-beam” technique. The mass spectra of the methylated fullerenes, $ C_{60} $$ Me_{n} $, have the molecular ion peak $ M^{+} $ indicating that the product is stable under the MS (EI) conditions. The appearance of an intense peak at m/z 360 was assigned to the formation of fullerene dication C60++. The remaining peaks were assigned to successive loss of methyl groups from molecular monocation and dication. Fullerene Kuwait Successive Loss Electron Impact Mass Spectrometry Direct Insertion Probe Badawy, Sayed M. aut Enthalten in Journal of the American Society for Mass Spectrometry Springer-Verlag, 1990 16(2005), 8 vom: 01. Aug., Seite 1311-1315 (DE-627)130977357 (DE-600)1073671-2 (DE-576)277732093 1044-0305 nnns volume:16 year:2005 number:8 day:01 month:08 pages:1311-1315 https://doi.org/10.1016/j.jasms.2005.03.022 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-PHY SSG-OLC-CHE GBV_ILN_40 GBV_ILN_70 GBV_ILN_4012 GBV_ILN_4125 GBV_ILN_4307 GBV_ILN_4313 AR 16 2005 8 01 08 1311-1315 |
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10.1016/j.jasms.2005.03.022 doi (DE-627)OLC2097664210 (DE-He213)j.jasms.2005.03.022-p DE-627 ger DE-627 rakwb eng 530 VZ 11 ssgn Al-Matar, Hamad M. verfasserin aut A study on mass spectrometry of methylated [60] fullerenes using the “in-beam” electron impact technique 2005 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © American Society for Mass Spectrometry 2005 Abstract Mass spectra of the methylated [60]fullerenes were obtained by EI mass spectrometry using “desorption” or “in-beam” technique. The mass spectra of the methylated fullerenes, $ C_{60} $$ Me_{n} $, have the molecular ion peak $ M^{+} $ indicating that the product is stable under the MS (EI) conditions. The appearance of an intense peak at m/z 360 was assigned to the formation of fullerene dication C60++. The remaining peaks were assigned to successive loss of methyl groups from molecular monocation and dication. Fullerene Kuwait Successive Loss Electron Impact Mass Spectrometry Direct Insertion Probe Badawy, Sayed M. aut Enthalten in Journal of the American Society for Mass Spectrometry Springer-Verlag, 1990 16(2005), 8 vom: 01. Aug., Seite 1311-1315 (DE-627)130977357 (DE-600)1073671-2 (DE-576)277732093 1044-0305 nnns volume:16 year:2005 number:8 day:01 month:08 pages:1311-1315 https://doi.org/10.1016/j.jasms.2005.03.022 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-PHY SSG-OLC-CHE GBV_ILN_40 GBV_ILN_70 GBV_ILN_4012 GBV_ILN_4125 GBV_ILN_4307 GBV_ILN_4313 AR 16 2005 8 01 08 1311-1315 |
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Al-Matar, Hamad M. |
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A study on mass spectrometry of methylated [60] fullerenes using the “in-beam” electron impact technique |
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Abstract Mass spectra of the methylated [60]fullerenes were obtained by EI mass spectrometry using “desorption” or “in-beam” technique. The mass spectra of the methylated fullerenes, $ C_{60} $$ Me_{n} $, have the molecular ion peak $ M^{+} $ indicating that the product is stable under the MS (EI) conditions. The appearance of an intense peak at m/z 360 was assigned to the formation of fullerene dication C60++. The remaining peaks were assigned to successive loss of methyl groups from molecular monocation and dication. © American Society for Mass Spectrometry 2005 |
abstractGer |
Abstract Mass spectra of the methylated [60]fullerenes were obtained by EI mass spectrometry using “desorption” or “in-beam” technique. The mass spectra of the methylated fullerenes, $ C_{60} $$ Me_{n} $, have the molecular ion peak $ M^{+} $ indicating that the product is stable under the MS (EI) conditions. The appearance of an intense peak at m/z 360 was assigned to the formation of fullerene dication C60++. The remaining peaks were assigned to successive loss of methyl groups from molecular monocation and dication. © American Society for Mass Spectrometry 2005 |
abstract_unstemmed |
Abstract Mass spectra of the methylated [60]fullerenes were obtained by EI mass spectrometry using “desorption” or “in-beam” technique. The mass spectra of the methylated fullerenes, $ C_{60} $$ Me_{n} $, have the molecular ion peak $ M^{+} $ indicating that the product is stable under the MS (EI) conditions. The appearance of an intense peak at m/z 360 was assigned to the formation of fullerene dication C60++. The remaining peaks were assigned to successive loss of methyl groups from molecular monocation and dication. © American Society for Mass Spectrometry 2005 |
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<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01000naa a22002652 4500</leader><controlfield tag="001">OLC2097664210</controlfield><controlfield tag="003">DE-627</controlfield><controlfield tag="005">20230401154420.0</controlfield><controlfield tag="007">tu</controlfield><controlfield tag="008">230401s2005 xx ||||| 00| ||eng c</controlfield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1016/j.jasms.2005.03.022</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-627)OLC2097664210</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-He213)j.jasms.2005.03.022-p</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-627</subfield><subfield code="b">ger</subfield><subfield code="c">DE-627</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">530</subfield><subfield code="q">VZ</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">11</subfield><subfield code="2">ssgn</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Al-Matar, Hamad M.</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">A study on mass spectrometry of methylated [60] fullerenes using the “in-beam” electron impact technique</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">2005</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">Text</subfield><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">ohne Hilfsmittel zu benutzen</subfield><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">Band</subfield><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">© American Society for Mass Spectrometry 2005</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">Abstract Mass spectra of the methylated [60]fullerenes were obtained by EI mass spectrometry using “desorption” or “in-beam” technique. The mass spectra of the methylated fullerenes, $ C_{60} $$ Me_{n} $, have the molecular ion peak $ M^{+} $ indicating that the product is stable under the MS (EI) conditions. The appearance of an intense peak at m/z 360 was assigned to the formation of fullerene dication C60++. 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