Laser Setup for Testing Silicon Microstrip Detectors
Abstract A setup for conducting channel-by-channel testing and calibration of microstrip silicon detectors using collimated laser pulses is described. A feature of this setup is the use of an infrared laser diode to simulate a signal from the passage of a charged particle through the detector substa...
Ausführliche Beschreibung
Gespeichert in:
| Autor*in: |
Kharlamov, P. I. [verfasserIn] |
|---|
| Format: |
Artikel |
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| Sprache: |
Englisch |
| Erschienen: |
2022 |
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| Anmerkung: |
© Pleiades Publishing, Ltd. 2022. ISSN 0020-4412, Instruments and Experimental Techniques, 2022, Vol. 65, No. 3, pp. 386–392. © Pleiades Publishing, Ltd., 2022. Russian Text © The Author(s), 2022, published in Pribory i Tekhnika Eksperimenta, 2022, No. 3, pp. 21–28. |
|---|
| Übergeordnetes Werk: |
Enthalten in: Instruments and experimental techniques - Pleiades Publishing, 1959, 65(2022), 3 vom: Juni, Seite 386-392 |
|---|---|
| Übergeordnetes Werk: |
volume:65 ; year:2022 ; number:3 ; month:06 ; pages:386-392 |
| Links: |
|---|
| DOI / URN: |
10.1134/S0020441222040054 |
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OLC2130770568 |
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| 520 | |a Abstract A setup for conducting channel-by-channel testing and calibration of microstrip silicon detectors using collimated laser pulses is described. A feature of this setup is the use of an infrared laser diode to simulate a signal from the passage of a charged particle through the detector substance. A system of lenses makes it possible to obtain a transverse beam size of up to 5 μm, which, in combination with the use of a precision stepper motor, allows testing of each detector channel in an automatic mode. The operation of the system on modules of the BMN silicon track system is demonstrated. | ||
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| 700 | 1 | |a Merkin, M. M. |4 aut | |
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10.1134/S0020441222040054 doi (DE-627)OLC2130770568 (DE-He213)S0020441222040054-p DE-627 ger DE-627 rakwb eng 620 VZ 11 ssgn Kharlamov, P. I. verfasserin aut Laser Setup for Testing Silicon Microstrip Detectors 2022 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Pleiades Publishing, Ltd. 2022. ISSN 0020-4412, Instruments and Experimental Techniques, 2022, Vol. 65, No. 3, pp. 386–392. © Pleiades Publishing, Ltd., 2022. Russian Text © The Author(s), 2022, published in Pribory i Tekhnika Eksperimenta, 2022, No. 3, pp. 21–28. Abstract A setup for conducting channel-by-channel testing and calibration of microstrip silicon detectors using collimated laser pulses is described. A feature of this setup is the use of an infrared laser diode to simulate a signal from the passage of a charged particle through the detector substance. A system of lenses makes it possible to obtain a transverse beam size of up to 5 μm, which, in combination with the use of a precision stepper motor, allows testing of each detector channel in an automatic mode. The operation of the system on modules of the BMN silicon track system is demonstrated. Shitenkov, M. O. aut Dementev, D. V. aut Leontyev, V. V. aut Merkin, M. M. aut Enthalten in Instruments and experimental techniques Pleiades Publishing, 1959 65(2022), 3 vom: Juni, Seite 386-392 (DE-627)129603007 (DE-600)241643-8 (DE-576)015096815 0020-4412 nnns volume:65 year:2022 number:3 month:06 pages:386-392 https://doi.org/10.1134/S0020441222040054 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY AR 65 2022 3 06 386-392 |
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10.1134/S0020441222040054 doi (DE-627)OLC2130770568 (DE-He213)S0020441222040054-p DE-627 ger DE-627 rakwb eng 620 VZ 11 ssgn Kharlamov, P. I. verfasserin aut Laser Setup for Testing Silicon Microstrip Detectors 2022 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Pleiades Publishing, Ltd. 2022. ISSN 0020-4412, Instruments and Experimental Techniques, 2022, Vol. 65, No. 3, pp. 386–392. © Pleiades Publishing, Ltd., 2022. Russian Text © The Author(s), 2022, published in Pribory i Tekhnika Eksperimenta, 2022, No. 3, pp. 21–28. Abstract A setup for conducting channel-by-channel testing and calibration of microstrip silicon detectors using collimated laser pulses is described. A feature of this setup is the use of an infrared laser diode to simulate a signal from the passage of a charged particle through the detector substance. A system of lenses makes it possible to obtain a transverse beam size of up to 5 μm, which, in combination with the use of a precision stepper motor, allows testing of each detector channel in an automatic mode. The operation of the system on modules of the BMN silicon track system is demonstrated. Shitenkov, M. O. aut Dementev, D. V. aut Leontyev, V. V. aut Merkin, M. M. aut Enthalten in Instruments and experimental techniques Pleiades Publishing, 1959 65(2022), 3 vom: Juni, Seite 386-392 (DE-627)129603007 (DE-600)241643-8 (DE-576)015096815 0020-4412 nnns volume:65 year:2022 number:3 month:06 pages:386-392 https://doi.org/10.1134/S0020441222040054 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY AR 65 2022 3 06 386-392 |
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10.1134/S0020441222040054 doi (DE-627)OLC2130770568 (DE-He213)S0020441222040054-p DE-627 ger DE-627 rakwb eng 620 VZ 11 ssgn Kharlamov, P. I. verfasserin aut Laser Setup for Testing Silicon Microstrip Detectors 2022 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Pleiades Publishing, Ltd. 2022. ISSN 0020-4412, Instruments and Experimental Techniques, 2022, Vol. 65, No. 3, pp. 386–392. © Pleiades Publishing, Ltd., 2022. Russian Text © The Author(s), 2022, published in Pribory i Tekhnika Eksperimenta, 2022, No. 3, pp. 21–28. Abstract A setup for conducting channel-by-channel testing and calibration of microstrip silicon detectors using collimated laser pulses is described. A feature of this setup is the use of an infrared laser diode to simulate a signal from the passage of a charged particle through the detector substance. A system of lenses makes it possible to obtain a transverse beam size of up to 5 μm, which, in combination with the use of a precision stepper motor, allows testing of each detector channel in an automatic mode. The operation of the system on modules of the BMN silicon track system is demonstrated. Shitenkov, M. O. aut Dementev, D. V. aut Leontyev, V. V. aut Merkin, M. M. aut Enthalten in Instruments and experimental techniques Pleiades Publishing, 1959 65(2022), 3 vom: Juni, Seite 386-392 (DE-627)129603007 (DE-600)241643-8 (DE-576)015096815 0020-4412 nnns volume:65 year:2022 number:3 month:06 pages:386-392 https://doi.org/10.1134/S0020441222040054 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY AR 65 2022 3 06 386-392 |
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10.1134/S0020441222040054 doi (DE-627)OLC2130770568 (DE-He213)S0020441222040054-p DE-627 ger DE-627 rakwb eng 620 VZ 11 ssgn Kharlamov, P. I. verfasserin aut Laser Setup for Testing Silicon Microstrip Detectors 2022 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Pleiades Publishing, Ltd. 2022. ISSN 0020-4412, Instruments and Experimental Techniques, 2022, Vol. 65, No. 3, pp. 386–392. © Pleiades Publishing, Ltd., 2022. Russian Text © The Author(s), 2022, published in Pribory i Tekhnika Eksperimenta, 2022, No. 3, pp. 21–28. Abstract A setup for conducting channel-by-channel testing and calibration of microstrip silicon detectors using collimated laser pulses is described. A feature of this setup is the use of an infrared laser diode to simulate a signal from the passage of a charged particle through the detector substance. A system of lenses makes it possible to obtain a transverse beam size of up to 5 μm, which, in combination with the use of a precision stepper motor, allows testing of each detector channel in an automatic mode. The operation of the system on modules of the BMN silicon track system is demonstrated. Shitenkov, M. O. aut Dementev, D. V. aut Leontyev, V. V. aut Merkin, M. M. aut Enthalten in Instruments and experimental techniques Pleiades Publishing, 1959 65(2022), 3 vom: Juni, Seite 386-392 (DE-627)129603007 (DE-600)241643-8 (DE-576)015096815 0020-4412 nnns volume:65 year:2022 number:3 month:06 pages:386-392 https://doi.org/10.1134/S0020441222040054 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY AR 65 2022 3 06 386-392 |
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10.1134/S0020441222040054 doi (DE-627)OLC2130770568 (DE-He213)S0020441222040054-p DE-627 ger DE-627 rakwb eng 620 VZ 11 ssgn Kharlamov, P. I. verfasserin aut Laser Setup for Testing Silicon Microstrip Detectors 2022 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Pleiades Publishing, Ltd. 2022. ISSN 0020-4412, Instruments and Experimental Techniques, 2022, Vol. 65, No. 3, pp. 386–392. © Pleiades Publishing, Ltd., 2022. Russian Text © The Author(s), 2022, published in Pribory i Tekhnika Eksperimenta, 2022, No. 3, pp. 21–28. Abstract A setup for conducting channel-by-channel testing and calibration of microstrip silicon detectors using collimated laser pulses is described. A feature of this setup is the use of an infrared laser diode to simulate a signal from the passage of a charged particle through the detector substance. A system of lenses makes it possible to obtain a transverse beam size of up to 5 μm, which, in combination with the use of a precision stepper motor, allows testing of each detector channel in an automatic mode. The operation of the system on modules of the BMN silicon track system is demonstrated. Shitenkov, M. O. aut Dementev, D. V. aut Leontyev, V. V. aut Merkin, M. M. aut Enthalten in Instruments and experimental techniques Pleiades Publishing, 1959 65(2022), 3 vom: Juni, Seite 386-392 (DE-627)129603007 (DE-600)241643-8 (DE-576)015096815 0020-4412 nnns volume:65 year:2022 number:3 month:06 pages:386-392 https://doi.org/10.1134/S0020441222040054 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY AR 65 2022 3 06 386-392 |
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Abstract A setup for conducting channel-by-channel testing and calibration of microstrip silicon detectors using collimated laser pulses is described. A feature of this setup is the use of an infrared laser diode to simulate a signal from the passage of a charged particle through the detector substance. A system of lenses makes it possible to obtain a transverse beam size of up to 5 μm, which, in combination with the use of a precision stepper motor, allows testing of each detector channel in an automatic mode. The operation of the system on modules of the BMN silicon track system is demonstrated. © Pleiades Publishing, Ltd. 2022. ISSN 0020-4412, Instruments and Experimental Techniques, 2022, Vol. 65, No. 3, pp. 386–392. © Pleiades Publishing, Ltd., 2022. Russian Text © The Author(s), 2022, published in Pribory i Tekhnika Eksperimenta, 2022, No. 3, pp. 21–28. |
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Abstract A setup for conducting channel-by-channel testing and calibration of microstrip silicon detectors using collimated laser pulses is described. A feature of this setup is the use of an infrared laser diode to simulate a signal from the passage of a charged particle through the detector substance. A system of lenses makes it possible to obtain a transverse beam size of up to 5 μm, which, in combination with the use of a precision stepper motor, allows testing of each detector channel in an automatic mode. The operation of the system on modules of the BMN silicon track system is demonstrated. © Pleiades Publishing, Ltd. 2022. ISSN 0020-4412, Instruments and Experimental Techniques, 2022, Vol. 65, No. 3, pp. 386–392. © Pleiades Publishing, Ltd., 2022. Russian Text © The Author(s), 2022, published in Pribory i Tekhnika Eksperimenta, 2022, No. 3, pp. 21–28. |
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Abstract A setup for conducting channel-by-channel testing and calibration of microstrip silicon detectors using collimated laser pulses is described. A feature of this setup is the use of an infrared laser diode to simulate a signal from the passage of a charged particle through the detector substance. A system of lenses makes it possible to obtain a transverse beam size of up to 5 μm, which, in combination with the use of a precision stepper motor, allows testing of each detector channel in an automatic mode. The operation of the system on modules of the BMN silicon track system is demonstrated. © Pleiades Publishing, Ltd. 2022. ISSN 0020-4412, Instruments and Experimental Techniques, 2022, Vol. 65, No. 3, pp. 386–392. © Pleiades Publishing, Ltd., 2022. Russian Text © The Author(s), 2022, published in Pribory i Tekhnika Eksperimenta, 2022, No. 3, pp. 21–28. |
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<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01000naa a22002652 4500</leader><controlfield tag="001">OLC2130770568</controlfield><controlfield tag="003">DE-627</controlfield><controlfield tag="005">20230506030024.0</controlfield><controlfield tag="007">tu</controlfield><controlfield tag="008">230506s2022 xx ||||| 00| ||eng c</controlfield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1134/S0020441222040054</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-627)OLC2130770568</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-He213)S0020441222040054-p</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-627</subfield><subfield code="b">ger</subfield><subfield code="c">DE-627</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">620</subfield><subfield code="q">VZ</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">11</subfield><subfield code="2">ssgn</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Kharlamov, P. I.</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Laser Setup for Testing Silicon Microstrip Detectors</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">2022</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">Text</subfield><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">ohne Hilfsmittel zu benutzen</subfield><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">Band</subfield><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">© Pleiades Publishing, Ltd. 2022. ISSN 0020-4412, Instruments and Experimental Techniques, 2022, Vol. 65, No. 3, pp. 386–392. © Pleiades Publishing, Ltd., 2022. Russian Text © The Author(s), 2022, published in Pribory i Tekhnika Eksperimenta, 2022, No. 3, pp. 21–28.</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">Abstract A setup for conducting channel-by-channel testing and calibration of microstrip silicon detectors using collimated laser pulses is described. A feature of this setup is the use of an infrared laser diode to simulate a signal from the passage of a charged particle through the detector substance. A system of lenses makes it possible to obtain a transverse beam size of up to 5 μm, which, in combination with the use of a precision stepper motor, allows testing of each detector channel in an automatic mode. 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