Coupling of imaging NEXAFS with secondary ion mass spectrometry for the chemical and isotopic analysis of presolar cosmic grains

Abstract We present first results of the combination of imaging photoemission electron spectroscopy with imaging mass spectrometry. Imaging NEXAFS was combined with TOF-SIMS in order to perform a spatially resolved chemical and isotopic analysis of microscopic grain samples. Imaging NEXAFS was used...
Ausführliche Beschreibung

Gespeichert in:
Autor*in:

Berg, Thomas [verfasserIn]

Maul, Jochen

Erdmann, Nicole

Bernhard, Pasqual

Schuppler, Stefan

Nagel, Peter

Sudek, Christa

Ott, Ulrich

Schönhense, Gerd

Format:

E-Artikel

Sprache:

Englisch

Erschienen:

2006

Schlagwörter:

NEXAFS

PEEM

TOF-SIMS

Presolar grains

Mineral phases

Anmerkung:

© Springer-Verlag 2006

Übergeordnetes Werk:

Enthalten in: Analytical and bioanalytical chemistry - Berlin : Springer, 2002, 386(2006), 1 vom: 07. Juli, Seite 119-124

Übergeordnetes Werk:

volume:386 ; year:2006 ; number:1 ; day:07 ; month:07 ; pages:119-124

Links:

Volltext

DOI / URN:

10.1007/s00216-006-0590-3

Katalog-ID:

SPR002158957

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