Synthesis and characterization of undoped and tin-doped ZnO nanostructures
Abstract In this paper, undoped and tin-doped ZnO nanostructures were grown onto non-conductive substrates by a simple solution method. Structural, morphological, optical and electrical properties of the structures were investigated with respect to tin concentration. From XRD studies, all the ZnO na...
Ausführliche Beschreibung
Gespeichert in:
| Autor*in: |
Kahraman, S. [verfasserIn] |
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| Format: |
E-Artikel |
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| Sprache: |
Englisch |
| Erschienen: |
2012 |
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| Schlagwörter: |
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| Anmerkung: |
© Springer-Verlag 2012 |
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| Übergeordnetes Werk: |
Enthalten in: Applied physics - Berlin : Springer, 1973, 109(2012), 1 vom: 04. Aug., Seite 87-93 |
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| Übergeordnetes Werk: |
volume:109 ; year:2012 ; number:1 ; day:04 ; month:08 ; pages:87-93 |
| Links: |
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| DOI / URN: |
10.1007/s00339-012-7093-1 |
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| Katalog-ID: |
SPR004128117 |
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| 520 | |a Abstract In this paper, undoped and tin-doped ZnO nanostructures were grown onto non-conductive substrates by a simple solution method. Structural, morphological, optical and electrical properties of the structures were investigated with respect to tin concentration. From XRD studies, all the ZnO nanostructures were found as hexagonal wurtzite type structures growing preponderantly oriented with c-axis normal to the substrate. An increase in tin content resulted in a decrease in grain size, whereas the dislocation density increases. SEM observations indicated that all the structures were textured throughout the substrates without any cracks or pores. The influence of incorporation of tin on surface morphology of the samples was clearly seen. Average diameter of the nanostructures decreased with increasing tin content. Absorption spectra of the structures revealed that the band gap of the films increases with increasing tin concentration. It is found that the tin-doped samples have higher average transmittance than the undoped one. The 1 % tin-doped sample exhibited ∼80 % average transparency, which was the best transparency among the doped samples. Electrical measurements showed that resistivity of the structures increased with increasing dopant concentration. This increasing was attributed due to a decrease in carrier concentration caused by carrier traps at the grain boundaries. | ||
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| 700 | 1 | |a Çetinkara, H. A. |4 aut | |
| 700 | 1 | |a Güder, H. S. |4 aut | |
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10.1007/s00339-012-7093-1 doi (DE-627)SPR004128117 (SPR)s00339-012-7093-1-e DE-627 ger DE-627 rakwb eng Kahraman, S. verfasserin aut Synthesis and characterization of undoped and tin-doped ZnO nanostructures 2012 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier © Springer-Verlag 2012 Abstract In this paper, undoped and tin-doped ZnO nanostructures were grown onto non-conductive substrates by a simple solution method. Structural, morphological, optical and electrical properties of the structures were investigated with respect to tin concentration. From XRD studies, all the ZnO nanostructures were found as hexagonal wurtzite type structures growing preponderantly oriented with c-axis normal to the substrate. An increase in tin content resulted in a decrease in grain size, whereas the dislocation density increases. SEM observations indicated that all the structures were textured throughout the substrates without any cracks or pores. The influence of incorporation of tin on surface morphology of the samples was clearly seen. Average diameter of the nanostructures decreased with increasing tin content. Absorption spectra of the structures revealed that the band gap of the films increases with increasing tin concentration. It is found that the tin-doped samples have higher average transmittance than the undoped one. The 1 % tin-doped sample exhibited ∼80 % average transparency, which was the best transparency among the doped samples. Electrical measurements showed that resistivity of the structures increased with increasing dopant concentration. This increasing was attributed due to a decrease in carrier concentration caused by carrier traps at the grain boundaries. Chemical Bath Deposition (dpeaa)DE-He213 Carrier Trap (dpeaa)DE-He213 Chemical Bath Deposition Method (dpeaa)DE-He213 Zinc Nitrate Solution (dpeaa)DE-He213 Average Transparency (dpeaa)DE-He213 Bayansal, F. aut Çakmak, H. M. aut Çetinkara, H. A. aut Güder, H. S. aut Enthalten in Applied physics Berlin : Springer, 1973 109(2012), 1 vom: 04. Aug., Seite 87-93 (DE-627)235503231 (DE-600)1398311-8 1432-0630 nnns volume:109 year:2012 number:1 day:04 month:08 pages:87-93 https://dx.doi.org/10.1007/s00339-012-7093-1 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER SSG-OLC-PHA GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_101 GBV_ILN_105 GBV_ILN_110 GBV_ILN_120 GBV_ILN_138 GBV_ILN_150 GBV_ILN_151 GBV_ILN_152 GBV_ILN_161 GBV_ILN_170 GBV_ILN_171 GBV_ILN_187 GBV_ILN_206 GBV_ILN_213 GBV_ILN_224 GBV_ILN_230 GBV_ILN_250 GBV_ILN_267 GBV_ILN_281 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_636 GBV_ILN_702 GBV_ILN_2001 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2006 GBV_ILN_2007 GBV_ILN_2008 GBV_ILN_2009 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2026 GBV_ILN_2027 GBV_ILN_2031 GBV_ILN_2034 GBV_ILN_2037 GBV_ILN_2038 GBV_ILN_2039 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2055 GBV_ILN_2056 GBV_ILN_2057 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2070 GBV_ILN_2086 GBV_ILN_2088 GBV_ILN_2093 GBV_ILN_2106 GBV_ILN_2107 GBV_ILN_2108 GBV_ILN_2110 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2116 GBV_ILN_2118 GBV_ILN_2119 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2144 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2188 GBV_ILN_2190 GBV_ILN_2232 GBV_ILN_2336 GBV_ILN_2446 GBV_ILN_2470 GBV_ILN_2472 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_2548 GBV_ILN_4012 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4046 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4242 GBV_ILN_4246 GBV_ILN_4249 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4328 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4336 GBV_ILN_4338 GBV_ILN_4393 GBV_ILN_4700 AR 109 2012 1 04 08 87-93 |
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10.1007/s00339-012-7093-1 doi (DE-627)SPR004128117 (SPR)s00339-012-7093-1-e DE-627 ger DE-627 rakwb eng Kahraman, S. verfasserin aut Synthesis and characterization of undoped and tin-doped ZnO nanostructures 2012 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier © Springer-Verlag 2012 Abstract In this paper, undoped and tin-doped ZnO nanostructures were grown onto non-conductive substrates by a simple solution method. Structural, morphological, optical and electrical properties of the structures were investigated with respect to tin concentration. From XRD studies, all the ZnO nanostructures were found as hexagonal wurtzite type structures growing preponderantly oriented with c-axis normal to the substrate. An increase in tin content resulted in a decrease in grain size, whereas the dislocation density increases. SEM observations indicated that all the structures were textured throughout the substrates without any cracks or pores. The influence of incorporation of tin on surface morphology of the samples was clearly seen. Average diameter of the nanostructures decreased with increasing tin content. Absorption spectra of the structures revealed that the band gap of the films increases with increasing tin concentration. It is found that the tin-doped samples have higher average transmittance than the undoped one. The 1 % tin-doped sample exhibited ∼80 % average transparency, which was the best transparency among the doped samples. Electrical measurements showed that resistivity of the structures increased with increasing dopant concentration. This increasing was attributed due to a decrease in carrier concentration caused by carrier traps at the grain boundaries. Chemical Bath Deposition (dpeaa)DE-He213 Carrier Trap (dpeaa)DE-He213 Chemical Bath Deposition Method (dpeaa)DE-He213 Zinc Nitrate Solution (dpeaa)DE-He213 Average Transparency (dpeaa)DE-He213 Bayansal, F. aut Çakmak, H. M. aut Çetinkara, H. A. aut Güder, H. S. aut Enthalten in Applied physics Berlin : Springer, 1973 109(2012), 1 vom: 04. Aug., Seite 87-93 (DE-627)235503231 (DE-600)1398311-8 1432-0630 nnns volume:109 year:2012 number:1 day:04 month:08 pages:87-93 https://dx.doi.org/10.1007/s00339-012-7093-1 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER SSG-OLC-PHA GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_101 GBV_ILN_105 GBV_ILN_110 GBV_ILN_120 GBV_ILN_138 GBV_ILN_150 GBV_ILN_151 GBV_ILN_152 GBV_ILN_161 GBV_ILN_170 GBV_ILN_171 GBV_ILN_187 GBV_ILN_206 GBV_ILN_213 GBV_ILN_224 GBV_ILN_230 GBV_ILN_250 GBV_ILN_267 GBV_ILN_281 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_636 GBV_ILN_702 GBV_ILN_2001 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2006 GBV_ILN_2007 GBV_ILN_2008 GBV_ILN_2009 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2026 GBV_ILN_2027 GBV_ILN_2031 GBV_ILN_2034 GBV_ILN_2037 GBV_ILN_2038 GBV_ILN_2039 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2055 GBV_ILN_2056 GBV_ILN_2057 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2070 GBV_ILN_2086 GBV_ILN_2088 GBV_ILN_2093 GBV_ILN_2106 GBV_ILN_2107 GBV_ILN_2108 GBV_ILN_2110 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2116 GBV_ILN_2118 GBV_ILN_2119 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2144 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2188 GBV_ILN_2190 GBV_ILN_2232 GBV_ILN_2336 GBV_ILN_2446 GBV_ILN_2470 GBV_ILN_2472 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_2548 GBV_ILN_4012 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4046 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4242 GBV_ILN_4246 GBV_ILN_4249 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4328 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4336 GBV_ILN_4338 GBV_ILN_4393 GBV_ILN_4700 AR 109 2012 1 04 08 87-93 |
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10.1007/s00339-012-7093-1 doi (DE-627)SPR004128117 (SPR)s00339-012-7093-1-e DE-627 ger DE-627 rakwb eng Kahraman, S. verfasserin aut Synthesis and characterization of undoped and tin-doped ZnO nanostructures 2012 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier © Springer-Verlag 2012 Abstract In this paper, undoped and tin-doped ZnO nanostructures were grown onto non-conductive substrates by a simple solution method. Structural, morphological, optical and electrical properties of the structures were investigated with respect to tin concentration. From XRD studies, all the ZnO nanostructures were found as hexagonal wurtzite type structures growing preponderantly oriented with c-axis normal to the substrate. An increase in tin content resulted in a decrease in grain size, whereas the dislocation density increases. SEM observations indicated that all the structures were textured throughout the substrates without any cracks or pores. The influence of incorporation of tin on surface morphology of the samples was clearly seen. Average diameter of the nanostructures decreased with increasing tin content. Absorption spectra of the structures revealed that the band gap of the films increases with increasing tin concentration. It is found that the tin-doped samples have higher average transmittance than the undoped one. The 1 % tin-doped sample exhibited ∼80 % average transparency, which was the best transparency among the doped samples. Electrical measurements showed that resistivity of the structures increased with increasing dopant concentration. This increasing was attributed due to a decrease in carrier concentration caused by carrier traps at the grain boundaries. Chemical Bath Deposition (dpeaa)DE-He213 Carrier Trap (dpeaa)DE-He213 Chemical Bath Deposition Method (dpeaa)DE-He213 Zinc Nitrate Solution (dpeaa)DE-He213 Average Transparency (dpeaa)DE-He213 Bayansal, F. aut Çakmak, H. M. aut Çetinkara, H. A. aut Güder, H. S. aut Enthalten in Applied physics Berlin : Springer, 1973 109(2012), 1 vom: 04. Aug., Seite 87-93 (DE-627)235503231 (DE-600)1398311-8 1432-0630 nnns volume:109 year:2012 number:1 day:04 month:08 pages:87-93 https://dx.doi.org/10.1007/s00339-012-7093-1 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER SSG-OLC-PHA GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_101 GBV_ILN_105 GBV_ILN_110 GBV_ILN_120 GBV_ILN_138 GBV_ILN_150 GBV_ILN_151 GBV_ILN_152 GBV_ILN_161 GBV_ILN_170 GBV_ILN_171 GBV_ILN_187 GBV_ILN_206 GBV_ILN_213 GBV_ILN_224 GBV_ILN_230 GBV_ILN_250 GBV_ILN_267 GBV_ILN_281 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_636 GBV_ILN_702 GBV_ILN_2001 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2006 GBV_ILN_2007 GBV_ILN_2008 GBV_ILN_2009 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2026 GBV_ILN_2027 GBV_ILN_2031 GBV_ILN_2034 GBV_ILN_2037 GBV_ILN_2038 GBV_ILN_2039 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2055 GBV_ILN_2056 GBV_ILN_2057 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2070 GBV_ILN_2086 GBV_ILN_2088 GBV_ILN_2093 GBV_ILN_2106 GBV_ILN_2107 GBV_ILN_2108 GBV_ILN_2110 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2116 GBV_ILN_2118 GBV_ILN_2119 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2144 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2188 GBV_ILN_2190 GBV_ILN_2232 GBV_ILN_2336 GBV_ILN_2446 GBV_ILN_2470 GBV_ILN_2472 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_2548 GBV_ILN_4012 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4046 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4242 GBV_ILN_4246 GBV_ILN_4249 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4328 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4336 GBV_ILN_4338 GBV_ILN_4393 GBV_ILN_4700 AR 109 2012 1 04 08 87-93 |
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10.1007/s00339-012-7093-1 doi (DE-627)SPR004128117 (SPR)s00339-012-7093-1-e DE-627 ger DE-627 rakwb eng Kahraman, S. verfasserin aut Synthesis and characterization of undoped and tin-doped ZnO nanostructures 2012 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier © Springer-Verlag 2012 Abstract In this paper, undoped and tin-doped ZnO nanostructures were grown onto non-conductive substrates by a simple solution method. Structural, morphological, optical and electrical properties of the structures were investigated with respect to tin concentration. From XRD studies, all the ZnO nanostructures were found as hexagonal wurtzite type structures growing preponderantly oriented with c-axis normal to the substrate. An increase in tin content resulted in a decrease in grain size, whereas the dislocation density increases. SEM observations indicated that all the structures were textured throughout the substrates without any cracks or pores. The influence of incorporation of tin on surface morphology of the samples was clearly seen. Average diameter of the nanostructures decreased with increasing tin content. Absorption spectra of the structures revealed that the band gap of the films increases with increasing tin concentration. It is found that the tin-doped samples have higher average transmittance than the undoped one. The 1 % tin-doped sample exhibited ∼80 % average transparency, which was the best transparency among the doped samples. Electrical measurements showed that resistivity of the structures increased with increasing dopant concentration. This increasing was attributed due to a decrease in carrier concentration caused by carrier traps at the grain boundaries. Chemical Bath Deposition (dpeaa)DE-He213 Carrier Trap (dpeaa)DE-He213 Chemical Bath Deposition Method (dpeaa)DE-He213 Zinc Nitrate Solution (dpeaa)DE-He213 Average Transparency (dpeaa)DE-He213 Bayansal, F. aut Çakmak, H. M. aut Çetinkara, H. A. aut Güder, H. S. aut Enthalten in Applied physics Berlin : Springer, 1973 109(2012), 1 vom: 04. Aug., Seite 87-93 (DE-627)235503231 (DE-600)1398311-8 1432-0630 nnns volume:109 year:2012 number:1 day:04 month:08 pages:87-93 https://dx.doi.org/10.1007/s00339-012-7093-1 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER SSG-OLC-PHA GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_101 GBV_ILN_105 GBV_ILN_110 GBV_ILN_120 GBV_ILN_138 GBV_ILN_150 GBV_ILN_151 GBV_ILN_152 GBV_ILN_161 GBV_ILN_170 GBV_ILN_171 GBV_ILN_187 GBV_ILN_206 GBV_ILN_213 GBV_ILN_224 GBV_ILN_230 GBV_ILN_250 GBV_ILN_267 GBV_ILN_281 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_636 GBV_ILN_702 GBV_ILN_2001 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2006 GBV_ILN_2007 GBV_ILN_2008 GBV_ILN_2009 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2026 GBV_ILN_2027 GBV_ILN_2031 GBV_ILN_2034 GBV_ILN_2037 GBV_ILN_2038 GBV_ILN_2039 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2055 GBV_ILN_2056 GBV_ILN_2057 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2070 GBV_ILN_2086 GBV_ILN_2088 GBV_ILN_2093 GBV_ILN_2106 GBV_ILN_2107 GBV_ILN_2108 GBV_ILN_2110 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2116 GBV_ILN_2118 GBV_ILN_2119 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2144 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2188 GBV_ILN_2190 GBV_ILN_2232 GBV_ILN_2336 GBV_ILN_2446 GBV_ILN_2470 GBV_ILN_2472 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_2548 GBV_ILN_4012 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4046 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4242 GBV_ILN_4246 GBV_ILN_4249 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4328 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4336 GBV_ILN_4338 GBV_ILN_4393 GBV_ILN_4700 AR 109 2012 1 04 08 87-93 |
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10.1007/s00339-012-7093-1 doi (DE-627)SPR004128117 (SPR)s00339-012-7093-1-e DE-627 ger DE-627 rakwb eng Kahraman, S. verfasserin aut Synthesis and characterization of undoped and tin-doped ZnO nanostructures 2012 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier © Springer-Verlag 2012 Abstract In this paper, undoped and tin-doped ZnO nanostructures were grown onto non-conductive substrates by a simple solution method. Structural, morphological, optical and electrical properties of the structures were investigated with respect to tin concentration. From XRD studies, all the ZnO nanostructures were found as hexagonal wurtzite type structures growing preponderantly oriented with c-axis normal to the substrate. An increase in tin content resulted in a decrease in grain size, whereas the dislocation density increases. SEM observations indicated that all the structures were textured throughout the substrates without any cracks or pores. The influence of incorporation of tin on surface morphology of the samples was clearly seen. Average diameter of the nanostructures decreased with increasing tin content. Absorption spectra of the structures revealed that the band gap of the films increases with increasing tin concentration. It is found that the tin-doped samples have higher average transmittance than the undoped one. The 1 % tin-doped sample exhibited ∼80 % average transparency, which was the best transparency among the doped samples. Electrical measurements showed that resistivity of the structures increased with increasing dopant concentration. This increasing was attributed due to a decrease in carrier concentration caused by carrier traps at the grain boundaries. Chemical Bath Deposition (dpeaa)DE-He213 Carrier Trap (dpeaa)DE-He213 Chemical Bath Deposition Method (dpeaa)DE-He213 Zinc Nitrate Solution (dpeaa)DE-He213 Average Transparency (dpeaa)DE-He213 Bayansal, F. aut Çakmak, H. M. aut Çetinkara, H. A. aut Güder, H. S. aut Enthalten in Applied physics Berlin : Springer, 1973 109(2012), 1 vom: 04. Aug., Seite 87-93 (DE-627)235503231 (DE-600)1398311-8 1432-0630 nnns volume:109 year:2012 number:1 day:04 month:08 pages:87-93 https://dx.doi.org/10.1007/s00339-012-7093-1 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER SSG-OLC-PHA GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_101 GBV_ILN_105 GBV_ILN_110 GBV_ILN_120 GBV_ILN_138 GBV_ILN_150 GBV_ILN_151 GBV_ILN_152 GBV_ILN_161 GBV_ILN_170 GBV_ILN_171 GBV_ILN_187 GBV_ILN_206 GBV_ILN_213 GBV_ILN_224 GBV_ILN_230 GBV_ILN_250 GBV_ILN_267 GBV_ILN_281 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_636 GBV_ILN_702 GBV_ILN_2001 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2006 GBV_ILN_2007 GBV_ILN_2008 GBV_ILN_2009 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2026 GBV_ILN_2027 GBV_ILN_2031 GBV_ILN_2034 GBV_ILN_2037 GBV_ILN_2038 GBV_ILN_2039 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2055 GBV_ILN_2056 GBV_ILN_2057 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2070 GBV_ILN_2086 GBV_ILN_2088 GBV_ILN_2093 GBV_ILN_2106 GBV_ILN_2107 GBV_ILN_2108 GBV_ILN_2110 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2116 GBV_ILN_2118 GBV_ILN_2119 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2144 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2188 GBV_ILN_2190 GBV_ILN_2232 GBV_ILN_2336 GBV_ILN_2446 GBV_ILN_2470 GBV_ILN_2472 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_2548 GBV_ILN_4012 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4046 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4242 GBV_ILN_4246 GBV_ILN_4249 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4328 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4336 GBV_ILN_4338 GBV_ILN_4393 GBV_ILN_4700 AR 109 2012 1 04 08 87-93 |
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Kahraman, S. @@aut@@ Bayansal, F. @@aut@@ Çakmak, H. M. @@aut@@ Çetinkara, H. A. @@aut@@ Güder, H. S. @@aut@@ |
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Structural, morphological, optical and electrical properties of the structures were investigated with respect to tin concentration. From XRD studies, all the ZnO nanostructures were found as hexagonal wurtzite type structures growing preponderantly oriented with c-axis normal to the substrate. An increase in tin content resulted in a decrease in grain size, whereas the dislocation density increases. SEM observations indicated that all the structures were textured throughout the substrates without any cracks or pores. The influence of incorporation of tin on surface morphology of the samples was clearly seen. Average diameter of the nanostructures decreased with increasing tin content. Absorption spectra of the structures revealed that the band gap of the films increases with increasing tin concentration. It is found that the tin-doped samples have higher average transmittance than the undoped one. The 1 % tin-doped sample exhibited ∼80 % average transparency, which was the best transparency among the doped samples. Electrical measurements showed that resistivity of the structures increased with increasing dopant concentration. 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Kahraman, S. |
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Kahraman, S. misc Chemical Bath Deposition misc Carrier Trap misc Chemical Bath Deposition Method misc Zinc Nitrate Solution misc Average Transparency Synthesis and characterization of undoped and tin-doped ZnO nanostructures |
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Synthesis and characterization of undoped and tin-doped ZnO nanostructures Chemical Bath Deposition (dpeaa)DE-He213 Carrier Trap (dpeaa)DE-He213 Chemical Bath Deposition Method (dpeaa)DE-He213 Zinc Nitrate Solution (dpeaa)DE-He213 Average Transparency (dpeaa)DE-He213 |
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Synthesis and characterization of undoped and tin-doped ZnO nanostructures |
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synthesis and characterization of undoped and tin-doped zno nanostructures |
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Synthesis and characterization of undoped and tin-doped ZnO nanostructures |
| abstract |
Abstract In this paper, undoped and tin-doped ZnO nanostructures were grown onto non-conductive substrates by a simple solution method. Structural, morphological, optical and electrical properties of the structures were investigated with respect to tin concentration. From XRD studies, all the ZnO nanostructures were found as hexagonal wurtzite type structures growing preponderantly oriented with c-axis normal to the substrate. An increase in tin content resulted in a decrease in grain size, whereas the dislocation density increases. SEM observations indicated that all the structures were textured throughout the substrates without any cracks or pores. The influence of incorporation of tin on surface morphology of the samples was clearly seen. Average diameter of the nanostructures decreased with increasing tin content. Absorption spectra of the structures revealed that the band gap of the films increases with increasing tin concentration. It is found that the tin-doped samples have higher average transmittance than the undoped one. The 1 % tin-doped sample exhibited ∼80 % average transparency, which was the best transparency among the doped samples. Electrical measurements showed that resistivity of the structures increased with increasing dopant concentration. This increasing was attributed due to a decrease in carrier concentration caused by carrier traps at the grain boundaries. © Springer-Verlag 2012 |
| abstractGer |
Abstract In this paper, undoped and tin-doped ZnO nanostructures were grown onto non-conductive substrates by a simple solution method. Structural, morphological, optical and electrical properties of the structures were investigated with respect to tin concentration. From XRD studies, all the ZnO nanostructures were found as hexagonal wurtzite type structures growing preponderantly oriented with c-axis normal to the substrate. An increase in tin content resulted in a decrease in grain size, whereas the dislocation density increases. SEM observations indicated that all the structures were textured throughout the substrates without any cracks or pores. The influence of incorporation of tin on surface morphology of the samples was clearly seen. Average diameter of the nanostructures decreased with increasing tin content. Absorption spectra of the structures revealed that the band gap of the films increases with increasing tin concentration. It is found that the tin-doped samples have higher average transmittance than the undoped one. The 1 % tin-doped sample exhibited ∼80 % average transparency, which was the best transparency among the doped samples. Electrical measurements showed that resistivity of the structures increased with increasing dopant concentration. This increasing was attributed due to a decrease in carrier concentration caused by carrier traps at the grain boundaries. © Springer-Verlag 2012 |
| abstract_unstemmed |
Abstract In this paper, undoped and tin-doped ZnO nanostructures were grown onto non-conductive substrates by a simple solution method. Structural, morphological, optical and electrical properties of the structures were investigated with respect to tin concentration. From XRD studies, all the ZnO nanostructures were found as hexagonal wurtzite type structures growing preponderantly oriented with c-axis normal to the substrate. An increase in tin content resulted in a decrease in grain size, whereas the dislocation density increases. SEM observations indicated that all the structures were textured throughout the substrates without any cracks or pores. The influence of incorporation of tin on surface morphology of the samples was clearly seen. Average diameter of the nanostructures decreased with increasing tin content. Absorption spectra of the structures revealed that the band gap of the films increases with increasing tin concentration. It is found that the tin-doped samples have higher average transmittance than the undoped one. The 1 % tin-doped sample exhibited ∼80 % average transparency, which was the best transparency among the doped samples. Electrical measurements showed that resistivity of the structures increased with increasing dopant concentration. This increasing was attributed due to a decrease in carrier concentration caused by carrier traps at the grain boundaries. © Springer-Verlag 2012 |
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Synthesis and characterization of undoped and tin-doped ZnO nanostructures |
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Bayansal, F. Çakmak, H. M. Çetinkara, H. A. Güder, H. S. |
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Bayansal, F. Çakmak, H. M. Çetinkara, H. A. Güder, H. S. |
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| score |
7.400199 |