Thermal resistance of CNTs-based thermal interface material for high power solid state device packages

Abstract Vertically aligned carbon nanotubes (VACNTs) were synthesized over copper substrate. The diameter and length of the CNTs were 100 nm and 2–3 μm, respectively. Synthesis of CNTs was confirmed by Raman spectrum and verified by TEM as multi walled CNTs. SEM images showed the vertically aligned...
Ausführliche Beschreibung

Gespeichert in:
Autor*in:

Lee, Y. T. [verfasserIn]

Shanmugan, S.

Mutharasu, D.

Format:

E-Artikel

Sprache:

Englisch

Erschienen:

2013

Schlagwörter:

Thermal Resistance

Plasma Enhance Chemical Vapor Deposition

Thermal Contact Resistance

Device Under Test

Thermal Interface Resistance

Anmerkung:

© Springer-Verlag Berlin Heidelberg 2013

Übergeordnetes Werk:

Enthalten in: Applied physics - Berlin : Springer, 1973, 114(2013), 4 vom: 12. Apr., Seite 1145-1152

Übergeordnetes Werk:

volume:114 ; year:2013 ; number:4 ; day:12 ; month:04 ; pages:1145-1152

Links:

Volltext

DOI / URN:

10.1007/s00339-013-7676-5

Katalog-ID:

SPR00413771X

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