Confocal microscopy as a tool for the study of the emission characteristics of high-power LEDs

Abstract We report on an experimental set-up based on a confocal principle in order to acquire the light-intensity distribution (XZ and XY optical sections) of high-power LEDs. To be able to record the emission characteristics of millimeter-sized LEDs and to carry out the measurements with high prec...
Ausführliche Beschreibung

Gespeichert in:
Autor*in:

Kuna, L. [verfasserIn]

Sommer, C.

Zinterl, E.

Wenzl, F.P.

Pachler, P.

Hartmann, P.

Tasch, S.

Leising, G.

Format:

E-Artikel

Sprache:

Englisch

Erschienen:

2008

Schlagwörter:

Numerical Aperture

Sapphire Substrate

Optical Section

Light Extraction

Light Intensity Distribution

Anmerkung:

© Springer-Verlag 2008

Übergeordnetes Werk:

Enthalten in: Applied physics - Berlin : Springer, 1981, 91(2008), 3-4 vom: 09. Mai, Seite 571-577

Übergeordnetes Werk:

volume:91 ; year:2008 ; number:3-4 ; day:09 ; month:05 ; pages:571-577

Links:

Volltext

DOI / URN:

10.1007/s00340-008-3031-5

Katalog-ID:

SPR004221370

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