Confocal microscopy as a tool for the study of the emission characteristics of high-power LEDs
Abstract We report on an experimental set-up based on a confocal principle in order to acquire the light-intensity distribution (XZ and XY optical sections) of high-power LEDs. To be able to record the emission characteristics of millimeter-sized LEDs and to carry out the measurements with high prec...
Ausführliche Beschreibung
Autor*in: |
Kuna, L. [verfasserIn] |
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E-Artikel |
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Sprache: |
Englisch |
Erschienen: |
2008 |
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Schlagwörter: |
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Anmerkung: |
© Springer-Verlag 2008 |
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Übergeordnetes Werk: |
Enthalten in: Applied physics - Berlin : Springer, 1981, 91(2008), 3-4 vom: 09. Mai, Seite 571-577 |
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Übergeordnetes Werk: |
volume:91 ; year:2008 ; number:3-4 ; day:09 ; month:05 ; pages:571-577 |
Links: |
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DOI / URN: |
10.1007/s00340-008-3031-5 |
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Katalog-ID: |
SPR004221370 |
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520 | |a Abstract We report on an experimental set-up based on a confocal principle in order to acquire the light-intensity distribution (XZ and XY optical sections) of high-power LEDs. To be able to record the emission characteristics of millimeter-sized LEDs and to carry out the measurements with high precision the set-up consists of a moving stage and stationary rather than scanning optics, along with a lock-in amplifier in combination with a photodiode as a detection unit. The optical sections recorded provide valuable information on the light-intensity distribution and the light propagation both within transparent substrates (in case of flip-chip LEDs) as well as in the ambient of the LEDs. In order to evaluate the accuracy of the measurement technique, the impact of the numerical aperture of the objective lens on the shape of the optical sections recorded was tested for a set of different objective lenses. The method reported provides new opportunities for a direct determination not only of the amount but also the directionality of the light extraction from LEDs that are processed in order to improve the light-extraction efficiency. | ||
650 | 4 | |a Numerical Aperture |7 (dpeaa)DE-He213 | |
650 | 4 | |a Sapphire Substrate |7 (dpeaa)DE-He213 | |
650 | 4 | |a Optical Section |7 (dpeaa)DE-He213 | |
650 | 4 | |a Light Extraction |7 (dpeaa)DE-He213 | |
650 | 4 | |a Light Intensity Distribution |7 (dpeaa)DE-He213 | |
700 | 1 | |a Sommer, C. |4 aut | |
700 | 1 | |a Zinterl, E. |4 aut | |
700 | 1 | |a Wenzl, F.P. |4 aut | |
700 | 1 | |a Pachler, P. |4 aut | |
700 | 1 | |a Hartmann, P. |4 aut | |
700 | 1 | |a Tasch, S. |4 aut | |
700 | 1 | |a Leising, G. |4 aut | |
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2008 |
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10.1007/s00340-008-3031-5 doi (DE-627)SPR004221370 (SPR)s00340-008-3031-5-e DE-627 ger DE-627 rakwb eng Kuna, L. verfasserin aut Confocal microscopy as a tool for the study of the emission characteristics of high-power LEDs 2008 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier © Springer-Verlag 2008 Abstract We report on an experimental set-up based on a confocal principle in order to acquire the light-intensity distribution (XZ and XY optical sections) of high-power LEDs. To be able to record the emission characteristics of millimeter-sized LEDs and to carry out the measurements with high precision the set-up consists of a moving stage and stationary rather than scanning optics, along with a lock-in amplifier in combination with a photodiode as a detection unit. The optical sections recorded provide valuable information on the light-intensity distribution and the light propagation both within transparent substrates (in case of flip-chip LEDs) as well as in the ambient of the LEDs. In order to evaluate the accuracy of the measurement technique, the impact of the numerical aperture of the objective lens on the shape of the optical sections recorded was tested for a set of different objective lenses. The method reported provides new opportunities for a direct determination not only of the amount but also the directionality of the light extraction from LEDs that are processed in order to improve the light-extraction efficiency. Numerical Aperture (dpeaa)DE-He213 Sapphire Substrate (dpeaa)DE-He213 Optical Section (dpeaa)DE-He213 Light Extraction (dpeaa)DE-He213 Light Intensity Distribution (dpeaa)DE-He213 Sommer, C. aut Zinterl, E. aut Wenzl, F.P. aut Pachler, P. aut Hartmann, P. aut Tasch, S. aut Leising, G. aut Enthalten in Applied physics Berlin : Springer, 1981 91(2008), 3-4 vom: 09. Mai, Seite 571-577 (DE-627)253389933 (DE-600)1458437-2 1432-0649 nnns volume:91 year:2008 number:3-4 day:09 month:05 pages:571-577 https://dx.doi.org/10.1007/s00340-008-3031-5 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_101 GBV_ILN_105 GBV_ILN_110 GBV_ILN_120 GBV_ILN_138 GBV_ILN_150 GBV_ILN_151 GBV_ILN_152 GBV_ILN_161 GBV_ILN_170 GBV_ILN_171 GBV_ILN_187 GBV_ILN_206 GBV_ILN_213 GBV_ILN_224 GBV_ILN_230 GBV_ILN_250 GBV_ILN_267 GBV_ILN_281 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_636 GBV_ILN_702 GBV_ILN_2001 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2006 GBV_ILN_2007 GBV_ILN_2008 GBV_ILN_2009 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2026 GBV_ILN_2027 GBV_ILN_2031 GBV_ILN_2034 GBV_ILN_2037 GBV_ILN_2038 GBV_ILN_2039 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2055 GBV_ILN_2056 GBV_ILN_2057 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2070 GBV_ILN_2086 GBV_ILN_2088 GBV_ILN_2093 GBV_ILN_2106 GBV_ILN_2107 GBV_ILN_2108 GBV_ILN_2110 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2116 GBV_ILN_2118 GBV_ILN_2119 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2144 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2188 GBV_ILN_2190 GBV_ILN_2232 GBV_ILN_2336 GBV_ILN_2446 GBV_ILN_2470 GBV_ILN_2472 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_2548 GBV_ILN_4012 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4046 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4242 GBV_ILN_4246 GBV_ILN_4249 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4328 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4336 GBV_ILN_4338 GBV_ILN_4393 GBV_ILN_4700 AR 91 2008 3-4 09 05 571-577 |
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10.1007/s00340-008-3031-5 doi (DE-627)SPR004221370 (SPR)s00340-008-3031-5-e DE-627 ger DE-627 rakwb eng Kuna, L. verfasserin aut Confocal microscopy as a tool for the study of the emission characteristics of high-power LEDs 2008 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier © Springer-Verlag 2008 Abstract We report on an experimental set-up based on a confocal principle in order to acquire the light-intensity distribution (XZ and XY optical sections) of high-power LEDs. To be able to record the emission characteristics of millimeter-sized LEDs and to carry out the measurements with high precision the set-up consists of a moving stage and stationary rather than scanning optics, along with a lock-in amplifier in combination with a photodiode as a detection unit. The optical sections recorded provide valuable information on the light-intensity distribution and the light propagation both within transparent substrates (in case of flip-chip LEDs) as well as in the ambient of the LEDs. In order to evaluate the accuracy of the measurement technique, the impact of the numerical aperture of the objective lens on the shape of the optical sections recorded was tested for a set of different objective lenses. The method reported provides new opportunities for a direct determination not only of the amount but also the directionality of the light extraction from LEDs that are processed in order to improve the light-extraction efficiency. Numerical Aperture (dpeaa)DE-He213 Sapphire Substrate (dpeaa)DE-He213 Optical Section (dpeaa)DE-He213 Light Extraction (dpeaa)DE-He213 Light Intensity Distribution (dpeaa)DE-He213 Sommer, C. aut Zinterl, E. aut Wenzl, F.P. aut Pachler, P. aut Hartmann, P. aut Tasch, S. aut Leising, G. aut Enthalten in Applied physics Berlin : Springer, 1981 91(2008), 3-4 vom: 09. Mai, Seite 571-577 (DE-627)253389933 (DE-600)1458437-2 1432-0649 nnns volume:91 year:2008 number:3-4 day:09 month:05 pages:571-577 https://dx.doi.org/10.1007/s00340-008-3031-5 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_101 GBV_ILN_105 GBV_ILN_110 GBV_ILN_120 GBV_ILN_138 GBV_ILN_150 GBV_ILN_151 GBV_ILN_152 GBV_ILN_161 GBV_ILN_170 GBV_ILN_171 GBV_ILN_187 GBV_ILN_206 GBV_ILN_213 GBV_ILN_224 GBV_ILN_230 GBV_ILN_250 GBV_ILN_267 GBV_ILN_281 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_636 GBV_ILN_702 GBV_ILN_2001 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2006 GBV_ILN_2007 GBV_ILN_2008 GBV_ILN_2009 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2026 GBV_ILN_2027 GBV_ILN_2031 GBV_ILN_2034 GBV_ILN_2037 GBV_ILN_2038 GBV_ILN_2039 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2055 GBV_ILN_2056 GBV_ILN_2057 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2070 GBV_ILN_2086 GBV_ILN_2088 GBV_ILN_2093 GBV_ILN_2106 GBV_ILN_2107 GBV_ILN_2108 GBV_ILN_2110 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2116 GBV_ILN_2118 GBV_ILN_2119 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2144 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2188 GBV_ILN_2190 GBV_ILN_2232 GBV_ILN_2336 GBV_ILN_2446 GBV_ILN_2470 GBV_ILN_2472 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_2548 GBV_ILN_4012 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4046 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4242 GBV_ILN_4246 GBV_ILN_4249 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4328 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4336 GBV_ILN_4338 GBV_ILN_4393 GBV_ILN_4700 AR 91 2008 3-4 09 05 571-577 |
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10.1007/s00340-008-3031-5 doi (DE-627)SPR004221370 (SPR)s00340-008-3031-5-e DE-627 ger DE-627 rakwb eng Kuna, L. verfasserin aut Confocal microscopy as a tool for the study of the emission characteristics of high-power LEDs 2008 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier © Springer-Verlag 2008 Abstract We report on an experimental set-up based on a confocal principle in order to acquire the light-intensity distribution (XZ and XY optical sections) of high-power LEDs. To be able to record the emission characteristics of millimeter-sized LEDs and to carry out the measurements with high precision the set-up consists of a moving stage and stationary rather than scanning optics, along with a lock-in amplifier in combination with a photodiode as a detection unit. The optical sections recorded provide valuable information on the light-intensity distribution and the light propagation both within transparent substrates (in case of flip-chip LEDs) as well as in the ambient of the LEDs. In order to evaluate the accuracy of the measurement technique, the impact of the numerical aperture of the objective lens on the shape of the optical sections recorded was tested for a set of different objective lenses. The method reported provides new opportunities for a direct determination not only of the amount but also the directionality of the light extraction from LEDs that are processed in order to improve the light-extraction efficiency. Numerical Aperture (dpeaa)DE-He213 Sapphire Substrate (dpeaa)DE-He213 Optical Section (dpeaa)DE-He213 Light Extraction (dpeaa)DE-He213 Light Intensity Distribution (dpeaa)DE-He213 Sommer, C. aut Zinterl, E. aut Wenzl, F.P. aut Pachler, P. aut Hartmann, P. aut Tasch, S. aut Leising, G. aut Enthalten in Applied physics Berlin : Springer, 1981 91(2008), 3-4 vom: 09. Mai, Seite 571-577 (DE-627)253389933 (DE-600)1458437-2 1432-0649 nnns volume:91 year:2008 number:3-4 day:09 month:05 pages:571-577 https://dx.doi.org/10.1007/s00340-008-3031-5 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_101 GBV_ILN_105 GBV_ILN_110 GBV_ILN_120 GBV_ILN_138 GBV_ILN_150 GBV_ILN_151 GBV_ILN_152 GBV_ILN_161 GBV_ILN_170 GBV_ILN_171 GBV_ILN_187 GBV_ILN_206 GBV_ILN_213 GBV_ILN_224 GBV_ILN_230 GBV_ILN_250 GBV_ILN_267 GBV_ILN_281 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_636 GBV_ILN_702 GBV_ILN_2001 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2006 GBV_ILN_2007 GBV_ILN_2008 GBV_ILN_2009 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2026 GBV_ILN_2027 GBV_ILN_2031 GBV_ILN_2034 GBV_ILN_2037 GBV_ILN_2038 GBV_ILN_2039 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2055 GBV_ILN_2056 GBV_ILN_2057 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2070 GBV_ILN_2086 GBV_ILN_2088 GBV_ILN_2093 GBV_ILN_2106 GBV_ILN_2107 GBV_ILN_2108 GBV_ILN_2110 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2116 GBV_ILN_2118 GBV_ILN_2119 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2144 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2188 GBV_ILN_2190 GBV_ILN_2232 GBV_ILN_2336 GBV_ILN_2446 GBV_ILN_2470 GBV_ILN_2472 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_2548 GBV_ILN_4012 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4046 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4242 GBV_ILN_4246 GBV_ILN_4249 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4328 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4336 GBV_ILN_4338 GBV_ILN_4393 GBV_ILN_4700 AR 91 2008 3-4 09 05 571-577 |
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10.1007/s00340-008-3031-5 doi (DE-627)SPR004221370 (SPR)s00340-008-3031-5-e DE-627 ger DE-627 rakwb eng Kuna, L. verfasserin aut Confocal microscopy as a tool for the study of the emission characteristics of high-power LEDs 2008 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier © Springer-Verlag 2008 Abstract We report on an experimental set-up based on a confocal principle in order to acquire the light-intensity distribution (XZ and XY optical sections) of high-power LEDs. To be able to record the emission characteristics of millimeter-sized LEDs and to carry out the measurements with high precision the set-up consists of a moving stage and stationary rather than scanning optics, along with a lock-in amplifier in combination with a photodiode as a detection unit. The optical sections recorded provide valuable information on the light-intensity distribution and the light propagation both within transparent substrates (in case of flip-chip LEDs) as well as in the ambient of the LEDs. In order to evaluate the accuracy of the measurement technique, the impact of the numerical aperture of the objective lens on the shape of the optical sections recorded was tested for a set of different objective lenses. The method reported provides new opportunities for a direct determination not only of the amount but also the directionality of the light extraction from LEDs that are processed in order to improve the light-extraction efficiency. Numerical Aperture (dpeaa)DE-He213 Sapphire Substrate (dpeaa)DE-He213 Optical Section (dpeaa)DE-He213 Light Extraction (dpeaa)DE-He213 Light Intensity Distribution (dpeaa)DE-He213 Sommer, C. aut Zinterl, E. aut Wenzl, F.P. aut Pachler, P. aut Hartmann, P. aut Tasch, S. aut Leising, G. aut Enthalten in Applied physics Berlin : Springer, 1981 91(2008), 3-4 vom: 09. Mai, Seite 571-577 (DE-627)253389933 (DE-600)1458437-2 1432-0649 nnns volume:91 year:2008 number:3-4 day:09 month:05 pages:571-577 https://dx.doi.org/10.1007/s00340-008-3031-5 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_101 GBV_ILN_105 GBV_ILN_110 GBV_ILN_120 GBV_ILN_138 GBV_ILN_150 GBV_ILN_151 GBV_ILN_152 GBV_ILN_161 GBV_ILN_170 GBV_ILN_171 GBV_ILN_187 GBV_ILN_206 GBV_ILN_213 GBV_ILN_224 GBV_ILN_230 GBV_ILN_250 GBV_ILN_267 GBV_ILN_281 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_636 GBV_ILN_702 GBV_ILN_2001 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2006 GBV_ILN_2007 GBV_ILN_2008 GBV_ILN_2009 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2026 GBV_ILN_2027 GBV_ILN_2031 GBV_ILN_2034 GBV_ILN_2037 GBV_ILN_2038 GBV_ILN_2039 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2055 GBV_ILN_2056 GBV_ILN_2057 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2070 GBV_ILN_2086 GBV_ILN_2088 GBV_ILN_2093 GBV_ILN_2106 GBV_ILN_2107 GBV_ILN_2108 GBV_ILN_2110 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2116 GBV_ILN_2118 GBV_ILN_2119 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2144 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2188 GBV_ILN_2190 GBV_ILN_2232 GBV_ILN_2336 GBV_ILN_2446 GBV_ILN_2470 GBV_ILN_2472 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_2548 GBV_ILN_4012 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4046 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4242 GBV_ILN_4246 GBV_ILN_4249 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4328 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4336 GBV_ILN_4338 GBV_ILN_4393 GBV_ILN_4700 AR 91 2008 3-4 09 05 571-577 |
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10.1007/s00340-008-3031-5 doi (DE-627)SPR004221370 (SPR)s00340-008-3031-5-e DE-627 ger DE-627 rakwb eng Kuna, L. verfasserin aut Confocal microscopy as a tool for the study of the emission characteristics of high-power LEDs 2008 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier © Springer-Verlag 2008 Abstract We report on an experimental set-up based on a confocal principle in order to acquire the light-intensity distribution (XZ and XY optical sections) of high-power LEDs. To be able to record the emission characteristics of millimeter-sized LEDs and to carry out the measurements with high precision the set-up consists of a moving stage and stationary rather than scanning optics, along with a lock-in amplifier in combination with a photodiode as a detection unit. The optical sections recorded provide valuable information on the light-intensity distribution and the light propagation both within transparent substrates (in case of flip-chip LEDs) as well as in the ambient of the LEDs. In order to evaluate the accuracy of the measurement technique, the impact of the numerical aperture of the objective lens on the shape of the optical sections recorded was tested for a set of different objective lenses. The method reported provides new opportunities for a direct determination not only of the amount but also the directionality of the light extraction from LEDs that are processed in order to improve the light-extraction efficiency. Numerical Aperture (dpeaa)DE-He213 Sapphire Substrate (dpeaa)DE-He213 Optical Section (dpeaa)DE-He213 Light Extraction (dpeaa)DE-He213 Light Intensity Distribution (dpeaa)DE-He213 Sommer, C. aut Zinterl, E. aut Wenzl, F.P. aut Pachler, P. aut Hartmann, P. aut Tasch, S. aut Leising, G. aut Enthalten in Applied physics Berlin : Springer, 1981 91(2008), 3-4 vom: 09. Mai, Seite 571-577 (DE-627)253389933 (DE-600)1458437-2 1432-0649 nnns volume:91 year:2008 number:3-4 day:09 month:05 pages:571-577 https://dx.doi.org/10.1007/s00340-008-3031-5 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_101 GBV_ILN_105 GBV_ILN_110 GBV_ILN_120 GBV_ILN_138 GBV_ILN_150 GBV_ILN_151 GBV_ILN_152 GBV_ILN_161 GBV_ILN_170 GBV_ILN_171 GBV_ILN_187 GBV_ILN_206 GBV_ILN_213 GBV_ILN_224 GBV_ILN_230 GBV_ILN_250 GBV_ILN_267 GBV_ILN_281 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_636 GBV_ILN_702 GBV_ILN_2001 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2006 GBV_ILN_2007 GBV_ILN_2008 GBV_ILN_2009 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2026 GBV_ILN_2027 GBV_ILN_2031 GBV_ILN_2034 GBV_ILN_2037 GBV_ILN_2038 GBV_ILN_2039 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2055 GBV_ILN_2056 GBV_ILN_2057 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2070 GBV_ILN_2086 GBV_ILN_2088 GBV_ILN_2093 GBV_ILN_2106 GBV_ILN_2107 GBV_ILN_2108 GBV_ILN_2110 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2116 GBV_ILN_2118 GBV_ILN_2119 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2144 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2188 GBV_ILN_2190 GBV_ILN_2232 GBV_ILN_2336 GBV_ILN_2446 GBV_ILN_2470 GBV_ILN_2472 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_2548 GBV_ILN_4012 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4046 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4242 GBV_ILN_4246 GBV_ILN_4249 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4328 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4336 GBV_ILN_4338 GBV_ILN_4393 GBV_ILN_4700 AR 91 2008 3-4 09 05 571-577 |
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Enthalten in Applied physics 91(2008), 3-4 vom: 09. Mai, Seite 571-577 volume:91 year:2008 number:3-4 day:09 month:05 pages:571-577 |
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Numerical Aperture Sapphire Substrate Optical Section Light Extraction Light Intensity Distribution |
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Kuna, L. @@aut@@ Sommer, C. @@aut@@ Zinterl, E. @@aut@@ Wenzl, F.P. @@aut@@ Pachler, P. @@aut@@ Hartmann, P. @@aut@@ Tasch, S. @@aut@@ Leising, G. @@aut@@ |
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Kuna, L. misc Numerical Aperture misc Sapphire Substrate misc Optical Section misc Light Extraction misc Light Intensity Distribution Confocal microscopy as a tool for the study of the emission characteristics of high-power LEDs |
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Confocal microscopy as a tool for the study of the emission characteristics of high-power LEDs Numerical Aperture (dpeaa)DE-He213 Sapphire Substrate (dpeaa)DE-He213 Optical Section (dpeaa)DE-He213 Light Extraction (dpeaa)DE-He213 Light Intensity Distribution (dpeaa)DE-He213 |
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Kuna, L. Sommer, C. Zinterl, E. Wenzl, F.P. Pachler, P. Hartmann, P. Tasch, S. Leising, G. |
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confocal microscopy as a tool for the study of the emission characteristics of high-power leds |
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Confocal microscopy as a tool for the study of the emission characteristics of high-power LEDs |
abstract |
Abstract We report on an experimental set-up based on a confocal principle in order to acquire the light-intensity distribution (XZ and XY optical sections) of high-power LEDs. To be able to record the emission characteristics of millimeter-sized LEDs and to carry out the measurements with high precision the set-up consists of a moving stage and stationary rather than scanning optics, along with a lock-in amplifier in combination with a photodiode as a detection unit. The optical sections recorded provide valuable information on the light-intensity distribution and the light propagation both within transparent substrates (in case of flip-chip LEDs) as well as in the ambient of the LEDs. In order to evaluate the accuracy of the measurement technique, the impact of the numerical aperture of the objective lens on the shape of the optical sections recorded was tested for a set of different objective lenses. The method reported provides new opportunities for a direct determination not only of the amount but also the directionality of the light extraction from LEDs that are processed in order to improve the light-extraction efficiency. © Springer-Verlag 2008 |
abstractGer |
Abstract We report on an experimental set-up based on a confocal principle in order to acquire the light-intensity distribution (XZ and XY optical sections) of high-power LEDs. To be able to record the emission characteristics of millimeter-sized LEDs and to carry out the measurements with high precision the set-up consists of a moving stage and stationary rather than scanning optics, along with a lock-in amplifier in combination with a photodiode as a detection unit. The optical sections recorded provide valuable information on the light-intensity distribution and the light propagation both within transparent substrates (in case of flip-chip LEDs) as well as in the ambient of the LEDs. In order to evaluate the accuracy of the measurement technique, the impact of the numerical aperture of the objective lens on the shape of the optical sections recorded was tested for a set of different objective lenses. The method reported provides new opportunities for a direct determination not only of the amount but also the directionality of the light extraction from LEDs that are processed in order to improve the light-extraction efficiency. © Springer-Verlag 2008 |
abstract_unstemmed |
Abstract We report on an experimental set-up based on a confocal principle in order to acquire the light-intensity distribution (XZ and XY optical sections) of high-power LEDs. To be able to record the emission characteristics of millimeter-sized LEDs and to carry out the measurements with high precision the set-up consists of a moving stage and stationary rather than scanning optics, along with a lock-in amplifier in combination with a photodiode as a detection unit. The optical sections recorded provide valuable information on the light-intensity distribution and the light propagation both within transparent substrates (in case of flip-chip LEDs) as well as in the ambient of the LEDs. In order to evaluate the accuracy of the measurement technique, the impact of the numerical aperture of the objective lens on the shape of the optical sections recorded was tested for a set of different objective lenses. The method reported provides new opportunities for a direct determination not only of the amount but also the directionality of the light extraction from LEDs that are processed in order to improve the light-extraction efficiency. © Springer-Verlag 2008 |
collection_details |
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container_issue |
3-4 |
title_short |
Confocal microscopy as a tool for the study of the emission characteristics of high-power LEDs |
url |
https://dx.doi.org/10.1007/s00340-008-3031-5 |
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author2 |
Sommer, C. Zinterl, E. Wenzl, F.P. Pachler, P. Hartmann, P. Tasch, S. Leising, G. |
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Sommer, C. Zinterl, E. Wenzl, F.P. Pachler, P. Hartmann, P. Tasch, S. Leising, G. |
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doi_str |
10.1007/s00340-008-3031-5 |
up_date |
2024-07-04T00:11:45.158Z |
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|
score |
7.401372 |