Design and fabrication of a square shape bulk mode MEMS resonators
Abstract This paper reports the design, simulation and fabrication of a micromechanical square shape resonators fabricated in single crystal silicon using a silicon on isolator wafer. Two different types of excitation for square shape resonators were used to stimulate Lame mode and square mode of re...
Ausführliche Beschreibung
Autor*in: |
Zarifi, Mohammad Hossein [verfasserIn] Daneshmand, Mojgan [verfasserIn] |
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Format: |
E-Artikel |
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Sprache: |
Englisch |
Erschienen: |
2014 |
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Schlagwörter: |
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Übergeordnetes Werk: |
Enthalten in: Microsystem technologies - Berlin : Springer, 1994, 21(2014), 11 vom: 19. Okt., Seite 2455-2462 |
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Übergeordnetes Werk: |
volume:21 ; year:2014 ; number:11 ; day:19 ; month:10 ; pages:2455-2462 |
Links: |
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DOI / URN: |
10.1007/s00542-014-2347-9 |
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Katalog-ID: |
SPR006831982 |
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520 | |a Abstract This paper reports the design, simulation and fabrication of a micromechanical square shape resonators fabricated in single crystal silicon using a silicon on isolator wafer. Two different types of excitation for square shape resonators were used to stimulate Lame mode and square mode of resonance. The fabricated devices were studied under different bias voltage and in air at room temperature. The highest quality factor measured for the Lame mode resonator was 11,121 and for the square mode was 9,120 for square mode at 3.17 and 4.01 MHz, under the 80 V DC bias voltage across 1.5 μm actuation gap. It has been shown that by adding raggedy edge, the coupling capacitor has increased. Mass detection capabilities of these resonators were also investigated by adding an extra layer of gold. Frequency and quality factor variation was observed for each of the fabricated resonators. Adding a mass of 76 pgr leads to resonance frequency shift of 3.1 kHz in Lame mode structure. In this experiment quality factor drop was observed because of continues film layer of gold metal, with a thickness of 100 nm. | ||
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10.1007/s00542-014-2347-9 doi (DE-627)SPR006831982 (SPR)s00542-014-2347-9-e DE-627 ger DE-627 rakwb eng 510 ASE 50.94 bkl Zarifi, Mohammad Hossein verfasserin aut Design and fabrication of a square shape bulk mode MEMS resonators 2014 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Abstract This paper reports the design, simulation and fabrication of a micromechanical square shape resonators fabricated in single crystal silicon using a silicon on isolator wafer. Two different types of excitation for square shape resonators were used to stimulate Lame mode and square mode of resonance. The fabricated devices were studied under different bias voltage and in air at room temperature. The highest quality factor measured for the Lame mode resonator was 11,121 and for the square mode was 9,120 for square mode at 3.17 and 4.01 MHz, under the 80 V DC bias voltage across 1.5 μm actuation gap. It has been shown that by adding raggedy edge, the coupling capacitor has increased. Mass detection capabilities of these resonators were also investigated by adding an extra layer of gold. Frequency and quality factor variation was observed for each of the fabricated resonators. Adding a mass of 76 pgr leads to resonance frequency shift of 3.1 kHz in Lame mode structure. In this experiment quality factor drop was observed because of continues film layer of gold metal, with a thickness of 100 nm. Quality Factor (dpeaa)DE-He213 Mode Resonator (dpeaa)DE-He213 High Quality Factor (dpeaa)DE-He213 Resonance Frequency Shift (dpeaa)DE-He213 Resonance Plate (dpeaa)DE-He213 Daneshmand, Mojgan verfasserin aut Enthalten in Microsystem technologies Berlin : Springer, 1994 21(2014), 11 vom: 19. Okt., Seite 2455-2462 (DE-627)270128182 (DE-600)1476561-5 1432-1858 nnns volume:21 year:2014 number:11 day:19 month:10 pages:2455-2462 https://dx.doi.org/10.1007/s00542-014-2347-9 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER SSG-OPC-MAT SSG-OPC-ASE GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_105 GBV_ILN_110 GBV_ILN_120 GBV_ILN_138 GBV_ILN_150 GBV_ILN_151 GBV_ILN_152 GBV_ILN_161 GBV_ILN_170 GBV_ILN_171 GBV_ILN_187 GBV_ILN_213 GBV_ILN_224 GBV_ILN_230 GBV_ILN_250 GBV_ILN_266 GBV_ILN_267 GBV_ILN_281 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_636 GBV_ILN_702 GBV_ILN_2001 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2006 GBV_ILN_2007 GBV_ILN_2008 GBV_ILN_2009 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2026 GBV_ILN_2027 GBV_ILN_2031 GBV_ILN_2034 GBV_ILN_2037 GBV_ILN_2038 GBV_ILN_2039 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2055 GBV_ILN_2057 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2070 GBV_ILN_2086 GBV_ILN_2088 GBV_ILN_2093 GBV_ILN_2106 GBV_ILN_2107 GBV_ILN_2108 GBV_ILN_2110 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2116 GBV_ILN_2118 GBV_ILN_2119 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2144 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2188 GBV_ILN_2190 GBV_ILN_2232 GBV_ILN_2336 GBV_ILN_2446 GBV_ILN_2470 GBV_ILN_2472 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_2548 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4046 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4242 GBV_ILN_4246 GBV_ILN_4249 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4336 GBV_ILN_4338 GBV_ILN_4393 GBV_ILN_4700 50.94 ASE AR 21 2014 11 19 10 2455-2462 |
spelling |
10.1007/s00542-014-2347-9 doi (DE-627)SPR006831982 (SPR)s00542-014-2347-9-e DE-627 ger DE-627 rakwb eng 510 ASE 50.94 bkl Zarifi, Mohammad Hossein verfasserin aut Design and fabrication of a square shape bulk mode MEMS resonators 2014 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Abstract This paper reports the design, simulation and fabrication of a micromechanical square shape resonators fabricated in single crystal silicon using a silicon on isolator wafer. Two different types of excitation for square shape resonators were used to stimulate Lame mode and square mode of resonance. The fabricated devices were studied under different bias voltage and in air at room temperature. The highest quality factor measured for the Lame mode resonator was 11,121 and for the square mode was 9,120 for square mode at 3.17 and 4.01 MHz, under the 80 V DC bias voltage across 1.5 μm actuation gap. It has been shown that by adding raggedy edge, the coupling capacitor has increased. Mass detection capabilities of these resonators were also investigated by adding an extra layer of gold. Frequency and quality factor variation was observed for each of the fabricated resonators. Adding a mass of 76 pgr leads to resonance frequency shift of 3.1 kHz in Lame mode structure. In this experiment quality factor drop was observed because of continues film layer of gold metal, with a thickness of 100 nm. Quality Factor (dpeaa)DE-He213 Mode Resonator (dpeaa)DE-He213 High Quality Factor (dpeaa)DE-He213 Resonance Frequency Shift (dpeaa)DE-He213 Resonance Plate (dpeaa)DE-He213 Daneshmand, Mojgan verfasserin aut Enthalten in Microsystem technologies Berlin : Springer, 1994 21(2014), 11 vom: 19. Okt., Seite 2455-2462 (DE-627)270128182 (DE-600)1476561-5 1432-1858 nnns volume:21 year:2014 number:11 day:19 month:10 pages:2455-2462 https://dx.doi.org/10.1007/s00542-014-2347-9 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER SSG-OPC-MAT SSG-OPC-ASE GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_105 GBV_ILN_110 GBV_ILN_120 GBV_ILN_138 GBV_ILN_150 GBV_ILN_151 GBV_ILN_152 GBV_ILN_161 GBV_ILN_170 GBV_ILN_171 GBV_ILN_187 GBV_ILN_213 GBV_ILN_224 GBV_ILN_230 GBV_ILN_250 GBV_ILN_266 GBV_ILN_267 GBV_ILN_281 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_636 GBV_ILN_702 GBV_ILN_2001 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2006 GBV_ILN_2007 GBV_ILN_2008 GBV_ILN_2009 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2026 GBV_ILN_2027 GBV_ILN_2031 GBV_ILN_2034 GBV_ILN_2037 GBV_ILN_2038 GBV_ILN_2039 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2055 GBV_ILN_2057 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2070 GBV_ILN_2086 GBV_ILN_2088 GBV_ILN_2093 GBV_ILN_2106 GBV_ILN_2107 GBV_ILN_2108 GBV_ILN_2110 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2116 GBV_ILN_2118 GBV_ILN_2119 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2144 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2188 GBV_ILN_2190 GBV_ILN_2232 GBV_ILN_2336 GBV_ILN_2446 GBV_ILN_2470 GBV_ILN_2472 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_2548 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4046 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4242 GBV_ILN_4246 GBV_ILN_4249 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4336 GBV_ILN_4338 GBV_ILN_4393 GBV_ILN_4700 50.94 ASE AR 21 2014 11 19 10 2455-2462 |
allfields_unstemmed |
10.1007/s00542-014-2347-9 doi (DE-627)SPR006831982 (SPR)s00542-014-2347-9-e DE-627 ger DE-627 rakwb eng 510 ASE 50.94 bkl Zarifi, Mohammad Hossein verfasserin aut Design and fabrication of a square shape bulk mode MEMS resonators 2014 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Abstract This paper reports the design, simulation and fabrication of a micromechanical square shape resonators fabricated in single crystal silicon using a silicon on isolator wafer. Two different types of excitation for square shape resonators were used to stimulate Lame mode and square mode of resonance. The fabricated devices were studied under different bias voltage and in air at room temperature. The highest quality factor measured for the Lame mode resonator was 11,121 and for the square mode was 9,120 for square mode at 3.17 and 4.01 MHz, under the 80 V DC bias voltage across 1.5 μm actuation gap. It has been shown that by adding raggedy edge, the coupling capacitor has increased. Mass detection capabilities of these resonators were also investigated by adding an extra layer of gold. Frequency and quality factor variation was observed for each of the fabricated resonators. Adding a mass of 76 pgr leads to resonance frequency shift of 3.1 kHz in Lame mode structure. In this experiment quality factor drop was observed because of continues film layer of gold metal, with a thickness of 100 nm. Quality Factor (dpeaa)DE-He213 Mode Resonator (dpeaa)DE-He213 High Quality Factor (dpeaa)DE-He213 Resonance Frequency Shift (dpeaa)DE-He213 Resonance Plate (dpeaa)DE-He213 Daneshmand, Mojgan verfasserin aut Enthalten in Microsystem technologies Berlin : Springer, 1994 21(2014), 11 vom: 19. Okt., Seite 2455-2462 (DE-627)270128182 (DE-600)1476561-5 1432-1858 nnns volume:21 year:2014 number:11 day:19 month:10 pages:2455-2462 https://dx.doi.org/10.1007/s00542-014-2347-9 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER SSG-OPC-MAT SSG-OPC-ASE GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_105 GBV_ILN_110 GBV_ILN_120 GBV_ILN_138 GBV_ILN_150 GBV_ILN_151 GBV_ILN_152 GBV_ILN_161 GBV_ILN_170 GBV_ILN_171 GBV_ILN_187 GBV_ILN_213 GBV_ILN_224 GBV_ILN_230 GBV_ILN_250 GBV_ILN_266 GBV_ILN_267 GBV_ILN_281 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_636 GBV_ILN_702 GBV_ILN_2001 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2006 GBV_ILN_2007 GBV_ILN_2008 GBV_ILN_2009 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2026 GBV_ILN_2027 GBV_ILN_2031 GBV_ILN_2034 GBV_ILN_2037 GBV_ILN_2038 GBV_ILN_2039 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2055 GBV_ILN_2057 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2070 GBV_ILN_2086 GBV_ILN_2088 GBV_ILN_2093 GBV_ILN_2106 GBV_ILN_2107 GBV_ILN_2108 GBV_ILN_2110 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2116 GBV_ILN_2118 GBV_ILN_2119 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2144 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2188 GBV_ILN_2190 GBV_ILN_2232 GBV_ILN_2336 GBV_ILN_2446 GBV_ILN_2470 GBV_ILN_2472 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_2548 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4046 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4242 GBV_ILN_4246 GBV_ILN_4249 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4336 GBV_ILN_4338 GBV_ILN_4393 GBV_ILN_4700 50.94 ASE AR 21 2014 11 19 10 2455-2462 |
allfieldsGer |
10.1007/s00542-014-2347-9 doi (DE-627)SPR006831982 (SPR)s00542-014-2347-9-e DE-627 ger DE-627 rakwb eng 510 ASE 50.94 bkl Zarifi, Mohammad Hossein verfasserin aut Design and fabrication of a square shape bulk mode MEMS resonators 2014 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Abstract This paper reports the design, simulation and fabrication of a micromechanical square shape resonators fabricated in single crystal silicon using a silicon on isolator wafer. Two different types of excitation for square shape resonators were used to stimulate Lame mode and square mode of resonance. The fabricated devices were studied under different bias voltage and in air at room temperature. The highest quality factor measured for the Lame mode resonator was 11,121 and for the square mode was 9,120 for square mode at 3.17 and 4.01 MHz, under the 80 V DC bias voltage across 1.5 μm actuation gap. It has been shown that by adding raggedy edge, the coupling capacitor has increased. Mass detection capabilities of these resonators were also investigated by adding an extra layer of gold. Frequency and quality factor variation was observed for each of the fabricated resonators. Adding a mass of 76 pgr leads to resonance frequency shift of 3.1 kHz in Lame mode structure. In this experiment quality factor drop was observed because of continues film layer of gold metal, with a thickness of 100 nm. Quality Factor (dpeaa)DE-He213 Mode Resonator (dpeaa)DE-He213 High Quality Factor (dpeaa)DE-He213 Resonance Frequency Shift (dpeaa)DE-He213 Resonance Plate (dpeaa)DE-He213 Daneshmand, Mojgan verfasserin aut Enthalten in Microsystem technologies Berlin : Springer, 1994 21(2014), 11 vom: 19. Okt., Seite 2455-2462 (DE-627)270128182 (DE-600)1476561-5 1432-1858 nnns volume:21 year:2014 number:11 day:19 month:10 pages:2455-2462 https://dx.doi.org/10.1007/s00542-014-2347-9 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER SSG-OPC-MAT SSG-OPC-ASE GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_105 GBV_ILN_110 GBV_ILN_120 GBV_ILN_138 GBV_ILN_150 GBV_ILN_151 GBV_ILN_152 GBV_ILN_161 GBV_ILN_170 GBV_ILN_171 GBV_ILN_187 GBV_ILN_213 GBV_ILN_224 GBV_ILN_230 GBV_ILN_250 GBV_ILN_266 GBV_ILN_267 GBV_ILN_281 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_636 GBV_ILN_702 GBV_ILN_2001 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2006 GBV_ILN_2007 GBV_ILN_2008 GBV_ILN_2009 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2026 GBV_ILN_2027 GBV_ILN_2031 GBV_ILN_2034 GBV_ILN_2037 GBV_ILN_2038 GBV_ILN_2039 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2055 GBV_ILN_2057 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2070 GBV_ILN_2086 GBV_ILN_2088 GBV_ILN_2093 GBV_ILN_2106 GBV_ILN_2107 GBV_ILN_2108 GBV_ILN_2110 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2116 GBV_ILN_2118 GBV_ILN_2119 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2144 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2188 GBV_ILN_2190 GBV_ILN_2232 GBV_ILN_2336 GBV_ILN_2446 GBV_ILN_2470 GBV_ILN_2472 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_2548 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4046 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4242 GBV_ILN_4246 GBV_ILN_4249 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4336 GBV_ILN_4338 GBV_ILN_4393 GBV_ILN_4700 50.94 ASE AR 21 2014 11 19 10 2455-2462 |
allfieldsSound |
10.1007/s00542-014-2347-9 doi (DE-627)SPR006831982 (SPR)s00542-014-2347-9-e DE-627 ger DE-627 rakwb eng 510 ASE 50.94 bkl Zarifi, Mohammad Hossein verfasserin aut Design and fabrication of a square shape bulk mode MEMS resonators 2014 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Abstract This paper reports the design, simulation and fabrication of a micromechanical square shape resonators fabricated in single crystal silicon using a silicon on isolator wafer. Two different types of excitation for square shape resonators were used to stimulate Lame mode and square mode of resonance. The fabricated devices were studied under different bias voltage and in air at room temperature. The highest quality factor measured for the Lame mode resonator was 11,121 and for the square mode was 9,120 for square mode at 3.17 and 4.01 MHz, under the 80 V DC bias voltage across 1.5 μm actuation gap. It has been shown that by adding raggedy edge, the coupling capacitor has increased. Mass detection capabilities of these resonators were also investigated by adding an extra layer of gold. Frequency and quality factor variation was observed for each of the fabricated resonators. Adding a mass of 76 pgr leads to resonance frequency shift of 3.1 kHz in Lame mode structure. In this experiment quality factor drop was observed because of continues film layer of gold metal, with a thickness of 100 nm. Quality Factor (dpeaa)DE-He213 Mode Resonator (dpeaa)DE-He213 High Quality Factor (dpeaa)DE-He213 Resonance Frequency Shift (dpeaa)DE-He213 Resonance Plate (dpeaa)DE-He213 Daneshmand, Mojgan verfasserin aut Enthalten in Microsystem technologies Berlin : Springer, 1994 21(2014), 11 vom: 19. Okt., Seite 2455-2462 (DE-627)270128182 (DE-600)1476561-5 1432-1858 nnns volume:21 year:2014 number:11 day:19 month:10 pages:2455-2462 https://dx.doi.org/10.1007/s00542-014-2347-9 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER SSG-OPC-MAT SSG-OPC-ASE GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_105 GBV_ILN_110 GBV_ILN_120 GBV_ILN_138 GBV_ILN_150 GBV_ILN_151 GBV_ILN_152 GBV_ILN_161 GBV_ILN_170 GBV_ILN_171 GBV_ILN_187 GBV_ILN_213 GBV_ILN_224 GBV_ILN_230 GBV_ILN_250 GBV_ILN_266 GBV_ILN_267 GBV_ILN_281 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_636 GBV_ILN_702 GBV_ILN_2001 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2006 GBV_ILN_2007 GBV_ILN_2008 GBV_ILN_2009 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2026 GBV_ILN_2027 GBV_ILN_2031 GBV_ILN_2034 GBV_ILN_2037 GBV_ILN_2038 GBV_ILN_2039 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2055 GBV_ILN_2057 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2070 GBV_ILN_2086 GBV_ILN_2088 GBV_ILN_2093 GBV_ILN_2106 GBV_ILN_2107 GBV_ILN_2108 GBV_ILN_2110 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2116 GBV_ILN_2118 GBV_ILN_2119 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2144 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2188 GBV_ILN_2190 GBV_ILN_2232 GBV_ILN_2336 GBV_ILN_2446 GBV_ILN_2470 GBV_ILN_2472 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_2548 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4046 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4242 GBV_ILN_4246 GBV_ILN_4249 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4336 GBV_ILN_4338 GBV_ILN_4393 GBV_ILN_4700 50.94 ASE AR 21 2014 11 19 10 2455-2462 |
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Zarifi, Mohammad Hossein @@aut@@ Daneshmand, Mojgan @@aut@@ |
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|
author |
Zarifi, Mohammad Hossein |
spellingShingle |
Zarifi, Mohammad Hossein ddc 510 bkl 50.94 misc Quality Factor misc Mode Resonator misc High Quality Factor misc Resonance Frequency Shift misc Resonance Plate Design and fabrication of a square shape bulk mode MEMS resonators |
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510 ASE 50.94 bkl Design and fabrication of a square shape bulk mode MEMS resonators Quality Factor (dpeaa)DE-He213 Mode Resonator (dpeaa)DE-He213 High Quality Factor (dpeaa)DE-He213 Resonance Frequency Shift (dpeaa)DE-He213 Resonance Plate (dpeaa)DE-He213 |
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ddc 510 bkl 50.94 misc Quality Factor misc Mode Resonator misc High Quality Factor misc Resonance Frequency Shift misc Resonance Plate |
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Design and fabrication of a square shape bulk mode MEMS resonators |
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design and fabrication of a square shape bulk mode mems resonators |
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Design and fabrication of a square shape bulk mode MEMS resonators |
abstract |
Abstract This paper reports the design, simulation and fabrication of a micromechanical square shape resonators fabricated in single crystal silicon using a silicon on isolator wafer. Two different types of excitation for square shape resonators were used to stimulate Lame mode and square mode of resonance. The fabricated devices were studied under different bias voltage and in air at room temperature. The highest quality factor measured for the Lame mode resonator was 11,121 and for the square mode was 9,120 for square mode at 3.17 and 4.01 MHz, under the 80 V DC bias voltage across 1.5 μm actuation gap. It has been shown that by adding raggedy edge, the coupling capacitor has increased. Mass detection capabilities of these resonators were also investigated by adding an extra layer of gold. Frequency and quality factor variation was observed for each of the fabricated resonators. Adding a mass of 76 pgr leads to resonance frequency shift of 3.1 kHz in Lame mode structure. In this experiment quality factor drop was observed because of continues film layer of gold metal, with a thickness of 100 nm. |
abstractGer |
Abstract This paper reports the design, simulation and fabrication of a micromechanical square shape resonators fabricated in single crystal silicon using a silicon on isolator wafer. Two different types of excitation for square shape resonators were used to stimulate Lame mode and square mode of resonance. The fabricated devices were studied under different bias voltage and in air at room temperature. The highest quality factor measured for the Lame mode resonator was 11,121 and for the square mode was 9,120 for square mode at 3.17 and 4.01 MHz, under the 80 V DC bias voltage across 1.5 μm actuation gap. It has been shown that by adding raggedy edge, the coupling capacitor has increased. Mass detection capabilities of these resonators were also investigated by adding an extra layer of gold. Frequency and quality factor variation was observed for each of the fabricated resonators. Adding a mass of 76 pgr leads to resonance frequency shift of 3.1 kHz in Lame mode structure. In this experiment quality factor drop was observed because of continues film layer of gold metal, with a thickness of 100 nm. |
abstract_unstemmed |
Abstract This paper reports the design, simulation and fabrication of a micromechanical square shape resonators fabricated in single crystal silicon using a silicon on isolator wafer. Two different types of excitation for square shape resonators were used to stimulate Lame mode and square mode of resonance. The fabricated devices were studied under different bias voltage and in air at room temperature. The highest quality factor measured for the Lame mode resonator was 11,121 and for the square mode was 9,120 for square mode at 3.17 and 4.01 MHz, under the 80 V DC bias voltage across 1.5 μm actuation gap. It has been shown that by adding raggedy edge, the coupling capacitor has increased. Mass detection capabilities of these resonators were also investigated by adding an extra layer of gold. Frequency and quality factor variation was observed for each of the fabricated resonators. Adding a mass of 76 pgr leads to resonance frequency shift of 3.1 kHz in Lame mode structure. In this experiment quality factor drop was observed because of continues film layer of gold metal, with a thickness of 100 nm. |
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container_issue |
11 |
title_short |
Design and fabrication of a square shape bulk mode MEMS resonators |
url |
https://dx.doi.org/10.1007/s00542-014-2347-9 |
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author2 |
Daneshmand, Mojgan |
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Daneshmand, Mojgan |
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doi_str |
10.1007/s00542-014-2347-9 |
up_date |
2024-07-04T00:52:27.737Z |
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score |
7.399557 |