Analyzing and modeling the performance degradation of flash A/D converters due to substrate noise coupling

Abstract This paper presents a model to evaluate the impact of substrate noise on a CMOS regenerative comparator and moreover to predict the resulting performance degradation of a flash analog-to-digital (A/D) converter. The proposed approach initially relates substrate noise to the induced timing u...
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Gespeichert in:

Autor*in:	Stefanou, Athanasios [verfasserIn] Gielen, Georges [verfasserIn]

Format:	E-Artikel
Sprache:	Englisch

Erschienen:	2010

Schlagwörter:	Substrate noise Distortion Flash analog-to-digital converter (ADC) Regenerative comparator Non-uniform sampling

Übergeordnetes Werk:	Enthalten in: Analog integrated circuits and signal processing - Dordrecht [u.a.] : Springer Science + Business Media B.V, 1991, 65(2010), 2 vom: 04. Apr., Seite 185-195
Übergeordnetes Werk:	volume:65 ; year:2010 ; number:2 ; day:04 ; month:04 ; pages:185-195

Links:	Volltext

DOI / URN:	10.1007/s10470-010-9475-7

Katalog-ID:	SPR010311564

Internformat


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520			\|a Abstract This paper presents a model to evaluate the impact of substrate noise on a CMOS regenerative comparator and moreover to predict the resulting performance degradation of a flash analog-to-digital (A/D) converter. The proposed approach initially relates substrate noise to the induced timing uncertainty of the comparator by means of an analytical linear model. In particular, the analysis first focuses on analyzing and expressing the resulting non-uniform sampling distortion in regenerative comparators in the presence of a deterministic ground bounce. Two sources of distortion are identified and evaluated: the input-dependent and the substrate noise-dependent one. For each error contributor, the analysis investigates two cases of timing error, based on the frequency correlation of the interfering signal with the sampling clock. The properties (number and power of distortion tones) of the sampling error spectrum are found to be highly dependent on the spectral content of the interfering signal and the sampling clock, while the model captures accurately the induced distortion. Subsequently, the linear model is extended to estimate the degradation of flash A/D converters and is utilized to predict the performance of practical flash and time-interleaved converters in the presence of substrate noise.
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author_variant	a s as g g gg
matchkey_str	article:15731979:2010----::nlznadoeighpromneerdtoofahdovresu
hierarchy_sort_str	2010
bklnumber	53.55 53.73
publishDate	2010
allfields	10.1007/s10470-010-9475-7 doi (DE-627)SPR010311564 (SPR)s10470-010-9475-7-e DE-627 ger DE-627 rakwb eng 004 ASE 53.55 bkl 53.73 bkl Stefanou, Athanasios verfasserin aut Analyzing and modeling the performance degradation of flash A/D converters due to substrate noise coupling 2010 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Abstract This paper presents a model to evaluate the impact of substrate noise on a CMOS regenerative comparator and moreover to predict the resulting performance degradation of a flash analog-to-digital (A/D) converter. The proposed approach initially relates substrate noise to the induced timing uncertainty of the comparator by means of an analytical linear model. In particular, the analysis first focuses on analyzing and expressing the resulting non-uniform sampling distortion in regenerative comparators in the presence of a deterministic ground bounce. Two sources of distortion are identified and evaluated: the input-dependent and the substrate noise-dependent one. For each error contributor, the analysis investigates two cases of timing error, based on the frequency correlation of the interfering signal with the sampling clock. The properties (number and power of distortion tones) of the sampling error spectrum are found to be highly dependent on the spectral content of the interfering signal and the sampling clock, while the model captures accurately the induced distortion. Subsequently, the linear model is extended to estimate the degradation of flash A/D converters and is utilized to predict the performance of practical flash and time-interleaved converters in the presence of substrate noise. Substrate noise (dpeaa)DE-He213 Distortion (dpeaa)DE-He213 Flash analog-to-digital converter (ADC) (dpeaa)DE-He213 Regenerative comparator (dpeaa)DE-He213 Non-uniform sampling (dpeaa)DE-He213 Gielen, Georges verfasserin aut Enthalten in Analog integrated circuits and signal processing Dordrecht [u.a.] : Springer Science + Business Media B.V, 1991 65(2010), 2 vom: 04. Apr., Seite 185-195 (DE-627)271348925 (DE-600)1479772-0 1573-1979 nnns volume:65 year:2010 number:2 day:04 month:04 pages:185-195 https://dx.doi.org/10.1007/s10470-010-9475-7 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_101 GBV_ILN_105 GBV_ILN_110 GBV_ILN_120 GBV_ILN_138 GBV_ILN_150 GBV_ILN_151 GBV_ILN_152 GBV_ILN_161 GBV_ILN_170 GBV_ILN_171 GBV_ILN_187 GBV_ILN_213 GBV_ILN_224 GBV_ILN_230 GBV_ILN_250 GBV_ILN_281 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_636 GBV_ILN_702 GBV_ILN_2001 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2006 GBV_ILN_2007 GBV_ILN_2008 GBV_ILN_2009 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2026 GBV_ILN_2027 GBV_ILN_2031 GBV_ILN_2034 GBV_ILN_2037 GBV_ILN_2038 GBV_ILN_2039 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2055 GBV_ILN_2057 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2070 GBV_ILN_2086 GBV_ILN_2088 GBV_ILN_2093 GBV_ILN_2106 GBV_ILN_2107 GBV_ILN_2108 GBV_ILN_2110 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2116 GBV_ILN_2118 GBV_ILN_2119 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2144 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2188 GBV_ILN_2190 GBV_ILN_2232 GBV_ILN_2336 GBV_ILN_2446 GBV_ILN_2470 GBV_ILN_2472 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_2548 GBV_ILN_4012 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4046 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4242 GBV_ILN_4246 GBV_ILN_4249 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4336 GBV_ILN_4338 GBV_ILN_4393 GBV_ILN_4700 53.55 ASE 53.73 ASE AR 65 2010 2 04 04 185-195
spelling	10.1007/s10470-010-9475-7 doi (DE-627)SPR010311564 (SPR)s10470-010-9475-7-e DE-627 ger DE-627 rakwb eng 004 ASE 53.55 bkl 53.73 bkl Stefanou, Athanasios verfasserin aut Analyzing and modeling the performance degradation of flash A/D converters due to substrate noise coupling 2010 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Abstract This paper presents a model to evaluate the impact of substrate noise on a CMOS regenerative comparator and moreover to predict the resulting performance degradation of a flash analog-to-digital (A/D) converter. The proposed approach initially relates substrate noise to the induced timing uncertainty of the comparator by means of an analytical linear model. In particular, the analysis first focuses on analyzing and expressing the resulting non-uniform sampling distortion in regenerative comparators in the presence of a deterministic ground bounce. Two sources of distortion are identified and evaluated: the input-dependent and the substrate noise-dependent one. For each error contributor, the analysis investigates two cases of timing error, based on the frequency correlation of the interfering signal with the sampling clock. The properties (number and power of distortion tones) of the sampling error spectrum are found to be highly dependent on the spectral content of the interfering signal and the sampling clock, while the model captures accurately the induced distortion. Subsequently, the linear model is extended to estimate the degradation of flash A/D converters and is utilized to predict the performance of practical flash and time-interleaved converters in the presence of substrate noise. Substrate noise (dpeaa)DE-He213 Distortion (dpeaa)DE-He213 Flash analog-to-digital converter (ADC) (dpeaa)DE-He213 Regenerative comparator (dpeaa)DE-He213 Non-uniform sampling (dpeaa)DE-He213 Gielen, Georges verfasserin aut Enthalten in Analog integrated circuits and signal processing Dordrecht [u.a.] : Springer Science + Business Media B.V, 1991 65(2010), 2 vom: 04. Apr., Seite 185-195 (DE-627)271348925 (DE-600)1479772-0 1573-1979 nnns volume:65 year:2010 number:2 day:04 month:04 pages:185-195 https://dx.doi.org/10.1007/s10470-010-9475-7 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_101 GBV_ILN_105 GBV_ILN_110 GBV_ILN_120 GBV_ILN_138 GBV_ILN_150 GBV_ILN_151 GBV_ILN_152 GBV_ILN_161 GBV_ILN_170 GBV_ILN_171 GBV_ILN_187 GBV_ILN_213 GBV_ILN_224 GBV_ILN_230 GBV_ILN_250 GBV_ILN_281 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_636 GBV_ILN_702 GBV_ILN_2001 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2006 GBV_ILN_2007 GBV_ILN_2008 GBV_ILN_2009 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2026 GBV_ILN_2027 GBV_ILN_2031 GBV_ILN_2034 GBV_ILN_2037 GBV_ILN_2038 GBV_ILN_2039 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2055 GBV_ILN_2057 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2070 GBV_ILN_2086 GBV_ILN_2088 GBV_ILN_2093 GBV_ILN_2106 GBV_ILN_2107 GBV_ILN_2108 GBV_ILN_2110 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2116 GBV_ILN_2118 GBV_ILN_2119 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2144 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2188 GBV_ILN_2190 GBV_ILN_2232 GBV_ILN_2336 GBV_ILN_2446 GBV_ILN_2470 GBV_ILN_2472 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_2548 GBV_ILN_4012 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4046 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4242 GBV_ILN_4246 GBV_ILN_4249 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4336 GBV_ILN_4338 GBV_ILN_4393 GBV_ILN_4700 53.55 ASE 53.73 ASE AR 65 2010 2 04 04 185-195
allfields_unstemmed	10.1007/s10470-010-9475-7 doi (DE-627)SPR010311564 (SPR)s10470-010-9475-7-e DE-627 ger DE-627 rakwb eng 004 ASE 53.55 bkl 53.73 bkl Stefanou, Athanasios verfasserin aut Analyzing and modeling the performance degradation of flash A/D converters due to substrate noise coupling 2010 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Abstract This paper presents a model to evaluate the impact of substrate noise on a CMOS regenerative comparator and moreover to predict the resulting performance degradation of a flash analog-to-digital (A/D) converter. The proposed approach initially relates substrate noise to the induced timing uncertainty of the comparator by means of an analytical linear model. In particular, the analysis first focuses on analyzing and expressing the resulting non-uniform sampling distortion in regenerative comparators in the presence of a deterministic ground bounce. Two sources of distortion are identified and evaluated: the input-dependent and the substrate noise-dependent one. For each error contributor, the analysis investigates two cases of timing error, based on the frequency correlation of the interfering signal with the sampling clock. The properties (number and power of distortion tones) of the sampling error spectrum are found to be highly dependent on the spectral content of the interfering signal and the sampling clock, while the model captures accurately the induced distortion. Subsequently, the linear model is extended to estimate the degradation of flash A/D converters and is utilized to predict the performance of practical flash and time-interleaved converters in the presence of substrate noise. Substrate noise (dpeaa)DE-He213 Distortion (dpeaa)DE-He213 Flash analog-to-digital converter (ADC) (dpeaa)DE-He213 Regenerative comparator (dpeaa)DE-He213 Non-uniform sampling (dpeaa)DE-He213 Gielen, Georges verfasserin aut Enthalten in Analog integrated circuits and signal processing Dordrecht [u.a.] : Springer Science + Business Media B.V, 1991 65(2010), 2 vom: 04. Apr., Seite 185-195 (DE-627)271348925 (DE-600)1479772-0 1573-1979 nnns volume:65 year:2010 number:2 day:04 month:04 pages:185-195 https://dx.doi.org/10.1007/s10470-010-9475-7 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_101 GBV_ILN_105 GBV_ILN_110 GBV_ILN_120 GBV_ILN_138 GBV_ILN_150 GBV_ILN_151 GBV_ILN_152 GBV_ILN_161 GBV_ILN_170 GBV_ILN_171 GBV_ILN_187 GBV_ILN_213 GBV_ILN_224 GBV_ILN_230 GBV_ILN_250 GBV_ILN_281 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_636 GBV_ILN_702 GBV_ILN_2001 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2006 GBV_ILN_2007 GBV_ILN_2008 GBV_ILN_2009 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2026 GBV_ILN_2027 GBV_ILN_2031 GBV_ILN_2034 GBV_ILN_2037 GBV_ILN_2038 GBV_ILN_2039 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2055 GBV_ILN_2057 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2070 GBV_ILN_2086 GBV_ILN_2088 GBV_ILN_2093 GBV_ILN_2106 GBV_ILN_2107 GBV_ILN_2108 GBV_ILN_2110 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2116 GBV_ILN_2118 GBV_ILN_2119 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2144 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2188 GBV_ILN_2190 GBV_ILN_2232 GBV_ILN_2336 GBV_ILN_2446 GBV_ILN_2470 GBV_ILN_2472 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_2548 GBV_ILN_4012 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4046 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4242 GBV_ILN_4246 GBV_ILN_4249 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4336 GBV_ILN_4338 GBV_ILN_4393 GBV_ILN_4700 53.55 ASE 53.73 ASE AR 65 2010 2 04 04 185-195
allfieldsGer	10.1007/s10470-010-9475-7 doi (DE-627)SPR010311564 (SPR)s10470-010-9475-7-e DE-627 ger DE-627 rakwb eng 004 ASE 53.55 bkl 53.73 bkl Stefanou, Athanasios verfasserin aut Analyzing and modeling the performance degradation of flash A/D converters due to substrate noise coupling 2010 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Abstract This paper presents a model to evaluate the impact of substrate noise on a CMOS regenerative comparator and moreover to predict the resulting performance degradation of a flash analog-to-digital (A/D) converter. The proposed approach initially relates substrate noise to the induced timing uncertainty of the comparator by means of an analytical linear model. In particular, the analysis first focuses on analyzing and expressing the resulting non-uniform sampling distortion in regenerative comparators in the presence of a deterministic ground bounce. Two sources of distortion are identified and evaluated: the input-dependent and the substrate noise-dependent one. For each error contributor, the analysis investigates two cases of timing error, based on the frequency correlation of the interfering signal with the sampling clock. The properties (number and power of distortion tones) of the sampling error spectrum are found to be highly dependent on the spectral content of the interfering signal and the sampling clock, while the model captures accurately the induced distortion. Subsequently, the linear model is extended to estimate the degradation of flash A/D converters and is utilized to predict the performance of practical flash and time-interleaved converters in the presence of substrate noise. Substrate noise (dpeaa)DE-He213 Distortion (dpeaa)DE-He213 Flash analog-to-digital converter (ADC) (dpeaa)DE-He213 Regenerative comparator (dpeaa)DE-He213 Non-uniform sampling (dpeaa)DE-He213 Gielen, Georges verfasserin aut Enthalten in Analog integrated circuits and signal processing Dordrecht [u.a.] : Springer Science + Business Media B.V, 1991 65(2010), 2 vom: 04. Apr., Seite 185-195 (DE-627)271348925 (DE-600)1479772-0 1573-1979 nnns volume:65 year:2010 number:2 day:04 month:04 pages:185-195 https://dx.doi.org/10.1007/s10470-010-9475-7 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_101 GBV_ILN_105 GBV_ILN_110 GBV_ILN_120 GBV_ILN_138 GBV_ILN_150 GBV_ILN_151 GBV_ILN_152 GBV_ILN_161 GBV_ILN_170 GBV_ILN_171 GBV_ILN_187 GBV_ILN_213 GBV_ILN_224 GBV_ILN_230 GBV_ILN_250 GBV_ILN_281 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_636 GBV_ILN_702 GBV_ILN_2001 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2006 GBV_ILN_2007 GBV_ILN_2008 GBV_ILN_2009 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2026 GBV_ILN_2027 GBV_ILN_2031 GBV_ILN_2034 GBV_ILN_2037 GBV_ILN_2038 GBV_ILN_2039 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2055 GBV_ILN_2057 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2070 GBV_ILN_2086 GBV_ILN_2088 GBV_ILN_2093 GBV_ILN_2106 GBV_ILN_2107 GBV_ILN_2108 GBV_ILN_2110 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2116 GBV_ILN_2118 GBV_ILN_2119 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2144 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2188 GBV_ILN_2190 GBV_ILN_2232 GBV_ILN_2336 GBV_ILN_2446 GBV_ILN_2470 GBV_ILN_2472 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_2548 GBV_ILN_4012 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4046 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4242 GBV_ILN_4246 GBV_ILN_4249 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4336 GBV_ILN_4338 GBV_ILN_4393 GBV_ILN_4700 53.55 ASE 53.73 ASE AR 65 2010 2 04 04 185-195
allfieldsSound	10.1007/s10470-010-9475-7 doi (DE-627)SPR010311564 (SPR)s10470-010-9475-7-e DE-627 ger DE-627 rakwb eng 004 ASE 53.55 bkl 53.73 bkl Stefanou, Athanasios verfasserin aut Analyzing and modeling the performance degradation of flash A/D converters due to substrate noise coupling 2010 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Abstract This paper presents a model to evaluate the impact of substrate noise on a CMOS regenerative comparator and moreover to predict the resulting performance degradation of a flash analog-to-digital (A/D) converter. The proposed approach initially relates substrate noise to the induced timing uncertainty of the comparator by means of an analytical linear model. In particular, the analysis first focuses on analyzing and expressing the resulting non-uniform sampling distortion in regenerative comparators in the presence of a deterministic ground bounce. Two sources of distortion are identified and evaluated: the input-dependent and the substrate noise-dependent one. For each error contributor, the analysis investigates two cases of timing error, based on the frequency correlation of the interfering signal with the sampling clock. The properties (number and power of distortion tones) of the sampling error spectrum are found to be highly dependent on the spectral content of the interfering signal and the sampling clock, while the model captures accurately the induced distortion. Subsequently, the linear model is extended to estimate the degradation of flash A/D converters and is utilized to predict the performance of practical flash and time-interleaved converters in the presence of substrate noise. Substrate noise (dpeaa)DE-He213 Distortion (dpeaa)DE-He213 Flash analog-to-digital converter (ADC) (dpeaa)DE-He213 Regenerative comparator (dpeaa)DE-He213 Non-uniform sampling (dpeaa)DE-He213 Gielen, Georges verfasserin aut Enthalten in Analog integrated circuits and signal processing Dordrecht [u.a.] : Springer Science + Business Media B.V, 1991 65(2010), 2 vom: 04. Apr., Seite 185-195 (DE-627)271348925 (DE-600)1479772-0 1573-1979 nnns volume:65 year:2010 number:2 day:04 month:04 pages:185-195 https://dx.doi.org/10.1007/s10470-010-9475-7 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_101 GBV_ILN_105 GBV_ILN_110 GBV_ILN_120 GBV_ILN_138 GBV_ILN_150 GBV_ILN_151 GBV_ILN_152 GBV_ILN_161 GBV_ILN_170 GBV_ILN_171 GBV_ILN_187 GBV_ILN_213 GBV_ILN_224 GBV_ILN_230 GBV_ILN_250 GBV_ILN_281 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_636 GBV_ILN_702 GBV_ILN_2001 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2006 GBV_ILN_2007 GBV_ILN_2008 GBV_ILN_2009 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2026 GBV_ILN_2027 GBV_ILN_2031 GBV_ILN_2034 GBV_ILN_2037 GBV_ILN_2038 GBV_ILN_2039 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2055 GBV_ILN_2057 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2070 GBV_ILN_2086 GBV_ILN_2088 GBV_ILN_2093 GBV_ILN_2106 GBV_ILN_2107 GBV_ILN_2108 GBV_ILN_2110 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2116 GBV_ILN_2118 GBV_ILN_2119 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2144 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2188 GBV_ILN_2190 GBV_ILN_2232 GBV_ILN_2336 GBV_ILN_2446 GBV_ILN_2470 GBV_ILN_2472 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_2548 GBV_ILN_4012 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4046 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4242 GBV_ILN_4246 GBV_ILN_4249 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4336 GBV_ILN_4338 GBV_ILN_4393 GBV_ILN_4700 53.55 ASE 53.73 ASE AR 65 2010 2 04 04 185-195
language	English
source	Enthalten in Analog integrated circuits and signal processing 65(2010), 2 vom: 04. Apr., Seite 185-195 volume:65 year:2010 number:2 day:04 month:04 pages:185-195
sourceStr	Enthalten in Analog integrated circuits and signal processing 65(2010), 2 vom: 04. Apr., Seite 185-195 volume:65 year:2010 number:2 day:04 month:04 pages:185-195
format_phy_str_mv	Article
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topic_facet	Substrate noise Distortion Flash analog-to-digital converter (ADC) Regenerative comparator Non-uniform sampling
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container_title	Analog integrated circuits and signal processing
authorswithroles_txt_mv	Stefanou, Athanasios @@aut@@ Gielen, Georges @@aut@@
publishDateDaySort_date	2010-04-04T00:00:00Z
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The proposed approach initially relates substrate noise to the induced timing uncertainty of the comparator by means of an analytical linear model. In particular, the analysis first focuses on analyzing and expressing the resulting non-uniform sampling distortion in regenerative comparators in the presence of a deterministic ground bounce. Two sources of distortion are identified and evaluated: the input-dependent and the substrate noise-dependent one. For each error contributor, the analysis investigates two cases of timing error, based on the frequency correlation of the interfering signal with the sampling clock. The properties (number and power of distortion tones) of the sampling error spectrum are found to be highly dependent on the spectral content of the interfering signal and the sampling clock, while the model captures accurately the induced distortion. 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author	Stefanou, Athanasios
spellingShingle	Stefanou, Athanasios ddc 004 bkl 53.55 bkl 53.73 misc Substrate noise misc Distortion misc Flash analog-to-digital converter (ADC) misc Regenerative comparator misc Non-uniform sampling Analyzing and modeling the performance degradation of flash A/D converters due to substrate noise coupling
authorStr	Stefanou, Athanasios
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topic_title	004 ASE 53.55 bkl 53.73 bkl Analyzing and modeling the performance degradation of flash A/D converters due to substrate noise coupling Substrate noise (dpeaa)DE-He213 Distortion (dpeaa)DE-He213 Flash analog-to-digital converter (ADC) (dpeaa)DE-He213 Regenerative comparator (dpeaa)DE-He213 Non-uniform sampling (dpeaa)DE-He213
topic	ddc 004 bkl 53.55 bkl 53.73 misc Substrate noise misc Distortion misc Flash analog-to-digital converter (ADC) misc Regenerative comparator misc Non-uniform sampling
topic_unstemmed	ddc 004 bkl 53.55 bkl 53.73 misc Substrate noise misc Distortion misc Flash analog-to-digital converter (ADC) misc Regenerative comparator misc Non-uniform sampling
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title	Analyzing and modeling the performance degradation of flash A/D converters due to substrate noise coupling
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title_full	Analyzing and modeling the performance degradation of flash A/D converters due to substrate noise coupling
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title_sort	analyzing and modeling the performance degradation of flash a/d converters due to substrate noise coupling
title_auth	Analyzing and modeling the performance degradation of flash A/D converters due to substrate noise coupling
abstract	Abstract This paper presents a model to evaluate the impact of substrate noise on a CMOS regenerative comparator and moreover to predict the resulting performance degradation of a flash analog-to-digital (A/D) converter. The proposed approach initially relates substrate noise to the induced timing uncertainty of the comparator by means of an analytical linear model. In particular, the analysis first focuses on analyzing and expressing the resulting non-uniform sampling distortion in regenerative comparators in the presence of a deterministic ground bounce. Two sources of distortion are identified and evaluated: the input-dependent and the substrate noise-dependent one. For each error contributor, the analysis investigates two cases of timing error, based on the frequency correlation of the interfering signal with the sampling clock. The properties (number and power of distortion tones) of the sampling error spectrum are found to be highly dependent on the spectral content of the interfering signal and the sampling clock, while the model captures accurately the induced distortion. Subsequently, the linear model is extended to estimate the degradation of flash A/D converters and is utilized to predict the performance of practical flash and time-interleaved converters in the presence of substrate noise.
abstractGer	Abstract This paper presents a model to evaluate the impact of substrate noise on a CMOS regenerative comparator and moreover to predict the resulting performance degradation of a flash analog-to-digital (A/D) converter. The proposed approach initially relates substrate noise to the induced timing uncertainty of the comparator by means of an analytical linear model. In particular, the analysis first focuses on analyzing and expressing the resulting non-uniform sampling distortion in regenerative comparators in the presence of a deterministic ground bounce. Two sources of distortion are identified and evaluated: the input-dependent and the substrate noise-dependent one. For each error contributor, the analysis investigates two cases of timing error, based on the frequency correlation of the interfering signal with the sampling clock. The properties (number and power of distortion tones) of the sampling error spectrum are found to be highly dependent on the spectral content of the interfering signal and the sampling clock, while the model captures accurately the induced distortion. Subsequently, the linear model is extended to estimate the degradation of flash A/D converters and is utilized to predict the performance of practical flash and time-interleaved converters in the presence of substrate noise.
abstract_unstemmed	Abstract This paper presents a model to evaluate the impact of substrate noise on a CMOS regenerative comparator and moreover to predict the resulting performance degradation of a flash analog-to-digital (A/D) converter. The proposed approach initially relates substrate noise to the induced timing uncertainty of the comparator by means of an analytical linear model. In particular, the analysis first focuses on analyzing and expressing the resulting non-uniform sampling distortion in regenerative comparators in the presence of a deterministic ground bounce. Two sources of distortion are identified and evaluated: the input-dependent and the substrate noise-dependent one. For each error contributor, the analysis investigates two cases of timing error, based on the frequency correlation of the interfering signal with the sampling clock. The properties (number and power of distortion tones) of the sampling error spectrum are found to be highly dependent on the spectral content of the interfering signal and the sampling clock, while the model captures accurately the induced distortion. Subsequently, the linear model is extended to estimate the degradation of flash A/D converters and is utilized to predict the performance of practical flash and time-interleaved converters in the presence of substrate noise.
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title_short	Analyzing and modeling the performance degradation of flash A/D converters due to substrate noise coupling
url	https://dx.doi.org/10.1007/s10470-010-9475-7
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author2	Gielen, Georges
author2Str	Gielen, Georges
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doi_str	10.1007/s10470-010-9475-7
up_date	2024-07-03T15:18:17.162Z
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Analyzing and modeling the performance degradation of flash A/D converters due to substrate noise coupling

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