Physical model of dynamic Joule heating effect for reset process in conductive-bridge random access memory
Abstract Dynamic Joule heating effect of reset process in conductive-bridge random access memory (CBRAM) was investigated theoretically. By introducing the geometry effect of conductive filament (CF), the temperature and electric field distributions in the transient state in both one-dimen-sional an...
Ausführliche Beschreibung
Autor*in: |
Sun, Pengxiao [verfasserIn] Li, Ling [verfasserIn] Lu, Nianduan [verfasserIn] Li, Yingtao [verfasserIn] Wang, Ming [verfasserIn] Xie, Hongwei [verfasserIn] Liu, Su [verfasserIn] Liu, Ming [verfasserIn] |
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Format: |
E-Artikel |
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Sprache: |
Englisch |
Erschienen: |
2014 |
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Schlagwörter: |
Transient Joule heating effect |
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Übergeordnetes Werk: |
Enthalten in: Journal of computational electronics - Dordrecht : Springer Science + Business Media B.V., 2002, 13(2014), 2 vom: 01. Jan., Seite 432-438 |
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Übergeordnetes Werk: |
volume:13 ; year:2014 ; number:2 ; day:01 ; month:01 ; pages:432-438 |
Links: |
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DOI / URN: |
10.1007/s10825-013-0552-x |
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Katalog-ID: |
SPR013584871 |
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520 | |a Abstract Dynamic Joule heating effect of reset process in conductive-bridge random access memory (CBRAM) was investigated theoretically. By introducing the geometry effect of conductive filament (CF), the temperature and electric field distributions in the transient state in both one-dimen-sional and three-dimensional cases were discussed in detail. We found that the CF’s geometry plays an important role in the transient Joule heating process, and the transient thermal effect turns increasingly significant with increasing applied voltage in reset procedure. The proposed position where CF ruptures is between the location of temperature peak and narrow end of the CF rather than the point of temperature peak in the cone-shaped CF system. It is more interesting that the rupture of CF possibly occurs in transient process, before steady-state is established. | ||
650 | 4 | |a Transient Joule heating effect |7 (dpeaa)DE-He213 | |
650 | 4 | |a Conductive-bridge random access memory (CBRAM) |7 (dpeaa)DE-He213 | |
650 | 4 | |a Switching process |7 (dpeaa)DE-He213 | |
700 | 1 | |a Li, Ling |e verfasserin |4 aut | |
700 | 1 | |a Lu, Nianduan |e verfasserin |4 aut | |
700 | 1 | |a Li, Yingtao |e verfasserin |4 aut | |
700 | 1 | |a Wang, Ming |e verfasserin |4 aut | |
700 | 1 | |a Xie, Hongwei |e verfasserin |4 aut | |
700 | 1 | |a Liu, Su |e verfasserin |4 aut | |
700 | 1 | |a Liu, Ming |e verfasserin |4 aut | |
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2014 |
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10.1007/s10825-013-0552-x doi (DE-627)SPR013584871 (SPR)s10825-013-0552-x-e DE-627 ger DE-627 rakwb eng 004 ASE 53.03 bkl 53.52 bkl 54.76 bkl Sun, Pengxiao verfasserin aut Physical model of dynamic Joule heating effect for reset process in conductive-bridge random access memory 2014 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Abstract Dynamic Joule heating effect of reset process in conductive-bridge random access memory (CBRAM) was investigated theoretically. By introducing the geometry effect of conductive filament (CF), the temperature and electric field distributions in the transient state in both one-dimen-sional and three-dimensional cases were discussed in detail. We found that the CF’s geometry plays an important role in the transient Joule heating process, and the transient thermal effect turns increasingly significant with increasing applied voltage in reset procedure. The proposed position where CF ruptures is between the location of temperature peak and narrow end of the CF rather than the point of temperature peak in the cone-shaped CF system. It is more interesting that the rupture of CF possibly occurs in transient process, before steady-state is established. Transient Joule heating effect (dpeaa)DE-He213 Conductive-bridge random access memory (CBRAM) (dpeaa)DE-He213 Switching process (dpeaa)DE-He213 Li, Ling verfasserin aut Lu, Nianduan verfasserin aut Li, Yingtao verfasserin aut Wang, Ming verfasserin aut Xie, Hongwei verfasserin aut Liu, Su verfasserin aut Liu, Ming verfasserin aut Enthalten in Journal of computational electronics Dordrecht : Springer Science + Business Media B.V., 2002 13(2014), 2 vom: 01. Jan., Seite 432-438 (DE-627)340872063 (DE-600)2065612-9 1572-8137 nnns volume:13 year:2014 number:2 day:01 month:01 pages:432-438 https://dx.doi.org/10.1007/s10825-013-0552-x lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_101 GBV_ILN_105 GBV_ILN_110 GBV_ILN_120 GBV_ILN_138 GBV_ILN_150 GBV_ILN_151 GBV_ILN_152 GBV_ILN_161 GBV_ILN_170 GBV_ILN_171 GBV_ILN_187 GBV_ILN_213 GBV_ILN_224 GBV_ILN_230 GBV_ILN_250 GBV_ILN_281 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_636 GBV_ILN_702 GBV_ILN_2001 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2006 GBV_ILN_2007 GBV_ILN_2008 GBV_ILN_2009 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2026 GBV_ILN_2027 GBV_ILN_2031 GBV_ILN_2034 GBV_ILN_2037 GBV_ILN_2038 GBV_ILN_2039 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2055 GBV_ILN_2057 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2070 GBV_ILN_2086 GBV_ILN_2088 GBV_ILN_2093 GBV_ILN_2106 GBV_ILN_2107 GBV_ILN_2108 GBV_ILN_2110 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2116 GBV_ILN_2118 GBV_ILN_2119 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2144 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2188 GBV_ILN_2190 GBV_ILN_2232 GBV_ILN_2336 GBV_ILN_2446 GBV_ILN_2470 GBV_ILN_2472 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_2548 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4046 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4242 GBV_ILN_4246 GBV_ILN_4249 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4336 GBV_ILN_4338 GBV_ILN_4393 GBV_ILN_4700 53.03 ASE 53.52 ASE 54.76 ASE AR 13 2014 2 01 01 432-438 |
spelling |
10.1007/s10825-013-0552-x doi (DE-627)SPR013584871 (SPR)s10825-013-0552-x-e DE-627 ger DE-627 rakwb eng 004 ASE 53.03 bkl 53.52 bkl 54.76 bkl Sun, Pengxiao verfasserin aut Physical model of dynamic Joule heating effect for reset process in conductive-bridge random access memory 2014 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Abstract Dynamic Joule heating effect of reset process in conductive-bridge random access memory (CBRAM) was investigated theoretically. By introducing the geometry effect of conductive filament (CF), the temperature and electric field distributions in the transient state in both one-dimen-sional and three-dimensional cases were discussed in detail. We found that the CF’s geometry plays an important role in the transient Joule heating process, and the transient thermal effect turns increasingly significant with increasing applied voltage in reset procedure. The proposed position where CF ruptures is between the location of temperature peak and narrow end of the CF rather than the point of temperature peak in the cone-shaped CF system. It is more interesting that the rupture of CF possibly occurs in transient process, before steady-state is established. Transient Joule heating effect (dpeaa)DE-He213 Conductive-bridge random access memory (CBRAM) (dpeaa)DE-He213 Switching process (dpeaa)DE-He213 Li, Ling verfasserin aut Lu, Nianduan verfasserin aut Li, Yingtao verfasserin aut Wang, Ming verfasserin aut Xie, Hongwei verfasserin aut Liu, Su verfasserin aut Liu, Ming verfasserin aut Enthalten in Journal of computational electronics Dordrecht : Springer Science + Business Media B.V., 2002 13(2014), 2 vom: 01. Jan., Seite 432-438 (DE-627)340872063 (DE-600)2065612-9 1572-8137 nnns volume:13 year:2014 number:2 day:01 month:01 pages:432-438 https://dx.doi.org/10.1007/s10825-013-0552-x lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_101 GBV_ILN_105 GBV_ILN_110 GBV_ILN_120 GBV_ILN_138 GBV_ILN_150 GBV_ILN_151 GBV_ILN_152 GBV_ILN_161 GBV_ILN_170 GBV_ILN_171 GBV_ILN_187 GBV_ILN_213 GBV_ILN_224 GBV_ILN_230 GBV_ILN_250 GBV_ILN_281 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_636 GBV_ILN_702 GBV_ILN_2001 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2006 GBV_ILN_2007 GBV_ILN_2008 GBV_ILN_2009 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2026 GBV_ILN_2027 GBV_ILN_2031 GBV_ILN_2034 GBV_ILN_2037 GBV_ILN_2038 GBV_ILN_2039 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2055 GBV_ILN_2057 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2070 GBV_ILN_2086 GBV_ILN_2088 GBV_ILN_2093 GBV_ILN_2106 GBV_ILN_2107 GBV_ILN_2108 GBV_ILN_2110 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2116 GBV_ILN_2118 GBV_ILN_2119 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2144 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2188 GBV_ILN_2190 GBV_ILN_2232 GBV_ILN_2336 GBV_ILN_2446 GBV_ILN_2470 GBV_ILN_2472 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_2548 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4046 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4242 GBV_ILN_4246 GBV_ILN_4249 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4336 GBV_ILN_4338 GBV_ILN_4393 GBV_ILN_4700 53.03 ASE 53.52 ASE 54.76 ASE AR 13 2014 2 01 01 432-438 |
allfields_unstemmed |
10.1007/s10825-013-0552-x doi (DE-627)SPR013584871 (SPR)s10825-013-0552-x-e DE-627 ger DE-627 rakwb eng 004 ASE 53.03 bkl 53.52 bkl 54.76 bkl Sun, Pengxiao verfasserin aut Physical model of dynamic Joule heating effect for reset process in conductive-bridge random access memory 2014 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Abstract Dynamic Joule heating effect of reset process in conductive-bridge random access memory (CBRAM) was investigated theoretically. By introducing the geometry effect of conductive filament (CF), the temperature and electric field distributions in the transient state in both one-dimen-sional and three-dimensional cases were discussed in detail. We found that the CF’s geometry plays an important role in the transient Joule heating process, and the transient thermal effect turns increasingly significant with increasing applied voltage in reset procedure. The proposed position where CF ruptures is between the location of temperature peak and narrow end of the CF rather than the point of temperature peak in the cone-shaped CF system. It is more interesting that the rupture of CF possibly occurs in transient process, before steady-state is established. Transient Joule heating effect (dpeaa)DE-He213 Conductive-bridge random access memory (CBRAM) (dpeaa)DE-He213 Switching process (dpeaa)DE-He213 Li, Ling verfasserin aut Lu, Nianduan verfasserin aut Li, Yingtao verfasserin aut Wang, Ming verfasserin aut Xie, Hongwei verfasserin aut Liu, Su verfasserin aut Liu, Ming verfasserin aut Enthalten in Journal of computational electronics Dordrecht : Springer Science + Business Media B.V., 2002 13(2014), 2 vom: 01. Jan., Seite 432-438 (DE-627)340872063 (DE-600)2065612-9 1572-8137 nnns volume:13 year:2014 number:2 day:01 month:01 pages:432-438 https://dx.doi.org/10.1007/s10825-013-0552-x lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_101 GBV_ILN_105 GBV_ILN_110 GBV_ILN_120 GBV_ILN_138 GBV_ILN_150 GBV_ILN_151 GBV_ILN_152 GBV_ILN_161 GBV_ILN_170 GBV_ILN_171 GBV_ILN_187 GBV_ILN_213 GBV_ILN_224 GBV_ILN_230 GBV_ILN_250 GBV_ILN_281 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_636 GBV_ILN_702 GBV_ILN_2001 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2006 GBV_ILN_2007 GBV_ILN_2008 GBV_ILN_2009 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2026 GBV_ILN_2027 GBV_ILN_2031 GBV_ILN_2034 GBV_ILN_2037 GBV_ILN_2038 GBV_ILN_2039 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2055 GBV_ILN_2057 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2070 GBV_ILN_2086 GBV_ILN_2088 GBV_ILN_2093 GBV_ILN_2106 GBV_ILN_2107 GBV_ILN_2108 GBV_ILN_2110 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2116 GBV_ILN_2118 GBV_ILN_2119 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2144 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2188 GBV_ILN_2190 GBV_ILN_2232 GBV_ILN_2336 GBV_ILN_2446 GBV_ILN_2470 GBV_ILN_2472 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_2548 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4046 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4242 GBV_ILN_4246 GBV_ILN_4249 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4336 GBV_ILN_4338 GBV_ILN_4393 GBV_ILN_4700 53.03 ASE 53.52 ASE 54.76 ASE AR 13 2014 2 01 01 432-438 |
allfieldsGer |
10.1007/s10825-013-0552-x doi (DE-627)SPR013584871 (SPR)s10825-013-0552-x-e DE-627 ger DE-627 rakwb eng 004 ASE 53.03 bkl 53.52 bkl 54.76 bkl Sun, Pengxiao verfasserin aut Physical model of dynamic Joule heating effect for reset process in conductive-bridge random access memory 2014 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Abstract Dynamic Joule heating effect of reset process in conductive-bridge random access memory (CBRAM) was investigated theoretically. By introducing the geometry effect of conductive filament (CF), the temperature and electric field distributions in the transient state in both one-dimen-sional and three-dimensional cases were discussed in detail. We found that the CF’s geometry plays an important role in the transient Joule heating process, and the transient thermal effect turns increasingly significant with increasing applied voltage in reset procedure. The proposed position where CF ruptures is between the location of temperature peak and narrow end of the CF rather than the point of temperature peak in the cone-shaped CF system. It is more interesting that the rupture of CF possibly occurs in transient process, before steady-state is established. Transient Joule heating effect (dpeaa)DE-He213 Conductive-bridge random access memory (CBRAM) (dpeaa)DE-He213 Switching process (dpeaa)DE-He213 Li, Ling verfasserin aut Lu, Nianduan verfasserin aut Li, Yingtao verfasserin aut Wang, Ming verfasserin aut Xie, Hongwei verfasserin aut Liu, Su verfasserin aut Liu, Ming verfasserin aut Enthalten in Journal of computational electronics Dordrecht : Springer Science + Business Media B.V., 2002 13(2014), 2 vom: 01. Jan., Seite 432-438 (DE-627)340872063 (DE-600)2065612-9 1572-8137 nnns volume:13 year:2014 number:2 day:01 month:01 pages:432-438 https://dx.doi.org/10.1007/s10825-013-0552-x lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_101 GBV_ILN_105 GBV_ILN_110 GBV_ILN_120 GBV_ILN_138 GBV_ILN_150 GBV_ILN_151 GBV_ILN_152 GBV_ILN_161 GBV_ILN_170 GBV_ILN_171 GBV_ILN_187 GBV_ILN_213 GBV_ILN_224 GBV_ILN_230 GBV_ILN_250 GBV_ILN_281 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_636 GBV_ILN_702 GBV_ILN_2001 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2006 GBV_ILN_2007 GBV_ILN_2008 GBV_ILN_2009 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2026 GBV_ILN_2027 GBV_ILN_2031 GBV_ILN_2034 GBV_ILN_2037 GBV_ILN_2038 GBV_ILN_2039 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2055 GBV_ILN_2057 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2070 GBV_ILN_2086 GBV_ILN_2088 GBV_ILN_2093 GBV_ILN_2106 GBV_ILN_2107 GBV_ILN_2108 GBV_ILN_2110 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2116 GBV_ILN_2118 GBV_ILN_2119 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2144 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2188 GBV_ILN_2190 GBV_ILN_2232 GBV_ILN_2336 GBV_ILN_2446 GBV_ILN_2470 GBV_ILN_2472 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_2548 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4046 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4242 GBV_ILN_4246 GBV_ILN_4249 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4336 GBV_ILN_4338 GBV_ILN_4393 GBV_ILN_4700 53.03 ASE 53.52 ASE 54.76 ASE AR 13 2014 2 01 01 432-438 |
allfieldsSound |
10.1007/s10825-013-0552-x doi (DE-627)SPR013584871 (SPR)s10825-013-0552-x-e DE-627 ger DE-627 rakwb eng 004 ASE 53.03 bkl 53.52 bkl 54.76 bkl Sun, Pengxiao verfasserin aut Physical model of dynamic Joule heating effect for reset process in conductive-bridge random access memory 2014 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Abstract Dynamic Joule heating effect of reset process in conductive-bridge random access memory (CBRAM) was investigated theoretically. By introducing the geometry effect of conductive filament (CF), the temperature and electric field distributions in the transient state in both one-dimen-sional and three-dimensional cases were discussed in detail. We found that the CF’s geometry plays an important role in the transient Joule heating process, and the transient thermal effect turns increasingly significant with increasing applied voltage in reset procedure. The proposed position where CF ruptures is between the location of temperature peak and narrow end of the CF rather than the point of temperature peak in the cone-shaped CF system. It is more interesting that the rupture of CF possibly occurs in transient process, before steady-state is established. Transient Joule heating effect (dpeaa)DE-He213 Conductive-bridge random access memory (CBRAM) (dpeaa)DE-He213 Switching process (dpeaa)DE-He213 Li, Ling verfasserin aut Lu, Nianduan verfasserin aut Li, Yingtao verfasserin aut Wang, Ming verfasserin aut Xie, Hongwei verfasserin aut Liu, Su verfasserin aut Liu, Ming verfasserin aut Enthalten in Journal of computational electronics Dordrecht : Springer Science + Business Media B.V., 2002 13(2014), 2 vom: 01. Jan., Seite 432-438 (DE-627)340872063 (DE-600)2065612-9 1572-8137 nnns volume:13 year:2014 number:2 day:01 month:01 pages:432-438 https://dx.doi.org/10.1007/s10825-013-0552-x lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_101 GBV_ILN_105 GBV_ILN_110 GBV_ILN_120 GBV_ILN_138 GBV_ILN_150 GBV_ILN_151 GBV_ILN_152 GBV_ILN_161 GBV_ILN_170 GBV_ILN_171 GBV_ILN_187 GBV_ILN_213 GBV_ILN_224 GBV_ILN_230 GBV_ILN_250 GBV_ILN_281 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_636 GBV_ILN_702 GBV_ILN_2001 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2006 GBV_ILN_2007 GBV_ILN_2008 GBV_ILN_2009 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2026 GBV_ILN_2027 GBV_ILN_2031 GBV_ILN_2034 GBV_ILN_2037 GBV_ILN_2038 GBV_ILN_2039 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2055 GBV_ILN_2057 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2070 GBV_ILN_2086 GBV_ILN_2088 GBV_ILN_2093 GBV_ILN_2106 GBV_ILN_2107 GBV_ILN_2108 GBV_ILN_2110 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2116 GBV_ILN_2118 GBV_ILN_2119 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2144 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2188 GBV_ILN_2190 GBV_ILN_2232 GBV_ILN_2336 GBV_ILN_2446 GBV_ILN_2470 GBV_ILN_2472 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_2548 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4046 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4242 GBV_ILN_4246 GBV_ILN_4249 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4336 GBV_ILN_4338 GBV_ILN_4393 GBV_ILN_4700 53.03 ASE 53.52 ASE 54.76 ASE AR 13 2014 2 01 01 432-438 |
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Enthalten in Journal of computational electronics 13(2014), 2 vom: 01. Jan., Seite 432-438 volume:13 year:2014 number:2 day:01 month:01 pages:432-438 |
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Enthalten in Journal of computational electronics 13(2014), 2 vom: 01. Jan., Seite 432-438 volume:13 year:2014 number:2 day:01 month:01 pages:432-438 |
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Transient Joule heating effect Conductive-bridge random access memory (CBRAM) Switching process |
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Journal of computational electronics |
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Sun, Pengxiao @@aut@@ Li, Ling @@aut@@ Lu, Nianduan @@aut@@ Li, Yingtao @@aut@@ Wang, Ming @@aut@@ Xie, Hongwei @@aut@@ Liu, Su @@aut@@ Liu, Ming @@aut@@ |
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2014-01-01T00:00:00Z |
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<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01000caa a22002652 4500</leader><controlfield tag="001">SPR013584871</controlfield><controlfield tag="003">DE-627</controlfield><controlfield tag="005">20220111003119.0</controlfield><controlfield tag="007">cr uuu---uuuuu</controlfield><controlfield tag="008">201006s2014 xx |||||o 00| ||eng c</controlfield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1007/s10825-013-0552-x</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-627)SPR013584871</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(SPR)s10825-013-0552-x-e</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-627</subfield><subfield code="b">ger</subfield><subfield code="c">DE-627</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">004</subfield><subfield code="q">ASE</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">53.03</subfield><subfield code="2">bkl</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">53.52</subfield><subfield code="2">bkl</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">54.76</subfield><subfield code="2">bkl</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Sun, Pengxiao</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Physical model of dynamic Joule heating effect for reset process in conductive-bridge random access memory</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">2014</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">Text</subfield><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">Computermedien</subfield><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">Online-Ressource</subfield><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">Abstract Dynamic Joule heating effect of reset process in conductive-bridge random access memory (CBRAM) was investigated theoretically. By introducing the geometry effect of conductive filament (CF), the temperature and electric field distributions in the transient state in both one-dimen-sional and three-dimensional cases were discussed in detail. We found that the CF’s geometry plays an important role in the transient Joule heating process, and the transient thermal effect turns increasingly significant with increasing applied voltage in reset procedure. The proposed position where CF ruptures is between the location of temperature peak and narrow end of the CF rather than the point of temperature peak in the cone-shaped CF system. 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|
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Sun, Pengxiao |
spellingShingle |
Sun, Pengxiao ddc 004 bkl 53.03 bkl 53.52 bkl 54.76 misc Transient Joule heating effect misc Conductive-bridge random access memory (CBRAM) misc Switching process Physical model of dynamic Joule heating effect for reset process in conductive-bridge random access memory |
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004 ASE 53.03 bkl 53.52 bkl 54.76 bkl Physical model of dynamic Joule heating effect for reset process in conductive-bridge random access memory Transient Joule heating effect (dpeaa)DE-He213 Conductive-bridge random access memory (CBRAM) (dpeaa)DE-He213 Switching process (dpeaa)DE-He213 |
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ddc 004 bkl 53.03 bkl 53.52 bkl 54.76 misc Transient Joule heating effect misc Conductive-bridge random access memory (CBRAM) misc Switching process |
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ddc 004 bkl 53.03 bkl 53.52 bkl 54.76 misc Transient Joule heating effect misc Conductive-bridge random access memory (CBRAM) misc Switching process |
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Physical model of dynamic Joule heating effect for reset process in conductive-bridge random access memory |
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Physical model of dynamic Joule heating effect for reset process in conductive-bridge random access memory |
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Sun, Pengxiao Li, Ling Lu, Nianduan Li, Yingtao Wang, Ming Xie, Hongwei Liu, Su Liu, Ming |
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physical model of dynamic joule heating effect for reset process in conductive-bridge random access memory |
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Physical model of dynamic Joule heating effect for reset process in conductive-bridge random access memory |
abstract |
Abstract Dynamic Joule heating effect of reset process in conductive-bridge random access memory (CBRAM) was investigated theoretically. By introducing the geometry effect of conductive filament (CF), the temperature and electric field distributions in the transient state in both one-dimen-sional and three-dimensional cases were discussed in detail. We found that the CF’s geometry plays an important role in the transient Joule heating process, and the transient thermal effect turns increasingly significant with increasing applied voltage in reset procedure. The proposed position where CF ruptures is between the location of temperature peak and narrow end of the CF rather than the point of temperature peak in the cone-shaped CF system. It is more interesting that the rupture of CF possibly occurs in transient process, before steady-state is established. |
abstractGer |
Abstract Dynamic Joule heating effect of reset process in conductive-bridge random access memory (CBRAM) was investigated theoretically. By introducing the geometry effect of conductive filament (CF), the temperature and electric field distributions in the transient state in both one-dimen-sional and three-dimensional cases were discussed in detail. We found that the CF’s geometry plays an important role in the transient Joule heating process, and the transient thermal effect turns increasingly significant with increasing applied voltage in reset procedure. The proposed position where CF ruptures is between the location of temperature peak and narrow end of the CF rather than the point of temperature peak in the cone-shaped CF system. It is more interesting that the rupture of CF possibly occurs in transient process, before steady-state is established. |
abstract_unstemmed |
Abstract Dynamic Joule heating effect of reset process in conductive-bridge random access memory (CBRAM) was investigated theoretically. By introducing the geometry effect of conductive filament (CF), the temperature and electric field distributions in the transient state in both one-dimen-sional and three-dimensional cases were discussed in detail. We found that the CF’s geometry plays an important role in the transient Joule heating process, and the transient thermal effect turns increasingly significant with increasing applied voltage in reset procedure. The proposed position where CF ruptures is between the location of temperature peak and narrow end of the CF rather than the point of temperature peak in the cone-shaped CF system. It is more interesting that the rupture of CF possibly occurs in transient process, before steady-state is established. |
collection_details |
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container_issue |
2 |
title_short |
Physical model of dynamic Joule heating effect for reset process in conductive-bridge random access memory |
url |
https://dx.doi.org/10.1007/s10825-013-0552-x |
remote_bool |
true |
author2 |
Li, Ling Lu, Nianduan Li, Yingtao Wang, Ming Xie, Hongwei Liu, Su Liu, Ming |
author2Str |
Li, Ling Lu, Nianduan Li, Yingtao Wang, Ming Xie, Hongwei Liu, Su Liu, Ming |
ppnlink |
340872063 |
mediatype_str_mv |
c |
isOA_txt |
false |
hochschulschrift_bool |
false |
doi_str |
10.1007/s10825-013-0552-x |
up_date |
2024-07-03T20:45:09.270Z |
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score |
7.401742 |