Influence of structural defects on the thermal conductivity of polycrystalline and single-crystal PbTe
Abstract We have measured the thermal conductivity of unannealed and annealed (800 K, 120 h) polycrystalline and single-crystal PbTe samples at temperatures from 80 to 303 K, evaluated the electronic and lattice components of their thermal conductivity, and determined the thermal resistivity due to...
Ausführliche Beschreibung
Gespeichert in:
| Autor*in: |
Bagieva, G. Z. [verfasserIn] Murtuzov, G. M. [verfasserIn] Abdinova, G. D. [verfasserIn] Allakhverdiev, E. A. [verfasserIn] Abdinov, D. Sh. [verfasserIn] |
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| Format: |
E-Artikel |
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| Sprache: |
Englisch |
| Erschienen: |
2012 |
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| Schlagwörter: |
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| Übergeordnetes Werk: |
Enthalten in: Inorganic materials - Dordrecht [u.a.] : Springer Science + Business Media B.V, 1996, 48(2012), 8 vom: 14. Juli, Seite 789-791 |
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| Übergeordnetes Werk: |
volume:48 ; year:2012 ; number:8 ; day:14 ; month:07 ; pages:789-791 |
| Links: |
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| DOI / URN: |
10.1134/S0020168512070023 |
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| Katalog-ID: |
SPR013629999 |
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| 520 | |a Abstract We have measured the thermal conductivity of unannealed and annealed (800 K, 120 h) polycrystalline and single-crystal PbTe samples at temperatures from 80 to 303 K, evaluated the electronic and lattice components of their thermal conductivity, and determined the thermal resistivity due to structural defects, whose concentration in the unannealed single-crystal samples reaches ∼$ 10^{17} $ $ cm^{−3} $. The results demonstrate that the thermal resistivity of the unannealed polycrystalline and single-crystal samples is 9.4 and 1.7 cm K/W, respectively. Annealing eliminates the defects, thereby increasing the lattice thermal conductivity of the material. | ||
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| 700 | 1 | |a Abdinova, G. D. |e verfasserin |4 aut | |
| 700 | 1 | |a Allakhverdiev, E. A. |e verfasserin |4 aut | |
| 700 | 1 | |a Abdinov, D. Sh. |e verfasserin |4 aut | |
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10.1134/S0020168512070023 doi (DE-627)SPR013629999 (SPR)S0020168512070023-e DE-627 ger DE-627 rakwb eng 540 600 670 ASE 35.40 bkl Bagieva, G. Z. verfasserin aut Influence of structural defects on the thermal conductivity of polycrystalline and single-crystal PbTe 2012 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Abstract We have measured the thermal conductivity of unannealed and annealed (800 K, 120 h) polycrystalline and single-crystal PbTe samples at temperatures from 80 to 303 K, evaluated the electronic and lattice components of their thermal conductivity, and determined the thermal resistivity due to structural defects, whose concentration in the unannealed single-crystal samples reaches ∼$ 10^{17} $ $ cm^{−3} $. The results demonstrate that the thermal resistivity of the unannealed polycrystalline and single-crystal samples is 9.4 and 1.7 cm K/W, respectively. Annealing eliminates the defects, thereby increasing the lattice thermal conductivity of the material. Structural Defect (dpeaa)DE-He213 PbTe (dpeaa)DE-He213 PbSe (dpeaa)DE-He213 Single Crystal Sample (dpeaa)DE-He213 Excess Tellurium (dpeaa)DE-He213 Murtuzov, G. M. verfasserin aut Abdinova, G. D. verfasserin aut Allakhverdiev, E. A. verfasserin aut Abdinov, D. Sh. verfasserin aut Enthalten in Inorganic materials Dordrecht [u.a.] : Springer Science + Business Media B.V, 1996 48(2012), 8 vom: 14. Juli, Seite 789-791 (DE-627)334292719 (DE-600)2057339-X 1608-3172 nnns volume:48 year:2012 number:8 day:14 month:07 pages:789-791 https://dx.doi.org/10.1134/S0020168512070023 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER SSG-OLC-PHA GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_101 GBV_ILN_105 GBV_ILN_110 GBV_ILN_120 GBV_ILN_138 GBV_ILN_150 GBV_ILN_151 GBV_ILN_152 GBV_ILN_161 GBV_ILN_170 GBV_ILN_171 GBV_ILN_187 GBV_ILN_206 GBV_ILN_213 GBV_ILN_224 GBV_ILN_230 GBV_ILN_250 GBV_ILN_281 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_636 GBV_ILN_702 GBV_ILN_2001 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2006 GBV_ILN_2007 GBV_ILN_2008 GBV_ILN_2009 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2026 GBV_ILN_2027 GBV_ILN_2031 GBV_ILN_2034 GBV_ILN_2037 GBV_ILN_2038 GBV_ILN_2039 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2055 GBV_ILN_2056 GBV_ILN_2057 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2070 GBV_ILN_2086 GBV_ILN_2088 GBV_ILN_2093 GBV_ILN_2106 GBV_ILN_2107 GBV_ILN_2108 GBV_ILN_2110 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2116 GBV_ILN_2118 GBV_ILN_2119 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2144 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2188 GBV_ILN_2190 GBV_ILN_2232 GBV_ILN_2336 GBV_ILN_2446 GBV_ILN_2470 GBV_ILN_2472 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_2548 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4046 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4242 GBV_ILN_4246 GBV_ILN_4249 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4336 GBV_ILN_4338 GBV_ILN_4393 GBV_ILN_4700 35.40 ASE AR 48 2012 8 14 07 789-791 |
| spelling |
10.1134/S0020168512070023 doi (DE-627)SPR013629999 (SPR)S0020168512070023-e DE-627 ger DE-627 rakwb eng 540 600 670 ASE 35.40 bkl Bagieva, G. Z. verfasserin aut Influence of structural defects on the thermal conductivity of polycrystalline and single-crystal PbTe 2012 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Abstract We have measured the thermal conductivity of unannealed and annealed (800 K, 120 h) polycrystalline and single-crystal PbTe samples at temperatures from 80 to 303 K, evaluated the electronic and lattice components of their thermal conductivity, and determined the thermal resistivity due to structural defects, whose concentration in the unannealed single-crystal samples reaches ∼$ 10^{17} $ $ cm^{−3} $. The results demonstrate that the thermal resistivity of the unannealed polycrystalline and single-crystal samples is 9.4 and 1.7 cm K/W, respectively. Annealing eliminates the defects, thereby increasing the lattice thermal conductivity of the material. Structural Defect (dpeaa)DE-He213 PbTe (dpeaa)DE-He213 PbSe (dpeaa)DE-He213 Single Crystal Sample (dpeaa)DE-He213 Excess Tellurium (dpeaa)DE-He213 Murtuzov, G. M. verfasserin aut Abdinova, G. D. verfasserin aut Allakhverdiev, E. A. verfasserin aut Abdinov, D. Sh. verfasserin aut Enthalten in Inorganic materials Dordrecht [u.a.] : Springer Science + Business Media B.V, 1996 48(2012), 8 vom: 14. Juli, Seite 789-791 (DE-627)334292719 (DE-600)2057339-X 1608-3172 nnns volume:48 year:2012 number:8 day:14 month:07 pages:789-791 https://dx.doi.org/10.1134/S0020168512070023 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER SSG-OLC-PHA GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_101 GBV_ILN_105 GBV_ILN_110 GBV_ILN_120 GBV_ILN_138 GBV_ILN_150 GBV_ILN_151 GBV_ILN_152 GBV_ILN_161 GBV_ILN_170 GBV_ILN_171 GBV_ILN_187 GBV_ILN_206 GBV_ILN_213 GBV_ILN_224 GBV_ILN_230 GBV_ILN_250 GBV_ILN_281 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_636 GBV_ILN_702 GBV_ILN_2001 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2006 GBV_ILN_2007 GBV_ILN_2008 GBV_ILN_2009 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2026 GBV_ILN_2027 GBV_ILN_2031 GBV_ILN_2034 GBV_ILN_2037 GBV_ILN_2038 GBV_ILN_2039 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2055 GBV_ILN_2056 GBV_ILN_2057 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2070 GBV_ILN_2086 GBV_ILN_2088 GBV_ILN_2093 GBV_ILN_2106 GBV_ILN_2107 GBV_ILN_2108 GBV_ILN_2110 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2116 GBV_ILN_2118 GBV_ILN_2119 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2144 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2188 GBV_ILN_2190 GBV_ILN_2232 GBV_ILN_2336 GBV_ILN_2446 GBV_ILN_2470 GBV_ILN_2472 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_2548 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4046 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4242 GBV_ILN_4246 GBV_ILN_4249 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4336 GBV_ILN_4338 GBV_ILN_4393 GBV_ILN_4700 35.40 ASE AR 48 2012 8 14 07 789-791 |
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10.1134/S0020168512070023 doi (DE-627)SPR013629999 (SPR)S0020168512070023-e DE-627 ger DE-627 rakwb eng 540 600 670 ASE 35.40 bkl Bagieva, G. Z. verfasserin aut Influence of structural defects on the thermal conductivity of polycrystalline and single-crystal PbTe 2012 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Abstract We have measured the thermal conductivity of unannealed and annealed (800 K, 120 h) polycrystalline and single-crystal PbTe samples at temperatures from 80 to 303 K, evaluated the electronic and lattice components of their thermal conductivity, and determined the thermal resistivity due to structural defects, whose concentration in the unannealed single-crystal samples reaches ∼$ 10^{17} $ $ cm^{−3} $. The results demonstrate that the thermal resistivity of the unannealed polycrystalline and single-crystal samples is 9.4 and 1.7 cm K/W, respectively. Annealing eliminates the defects, thereby increasing the lattice thermal conductivity of the material. Structural Defect (dpeaa)DE-He213 PbTe (dpeaa)DE-He213 PbSe (dpeaa)DE-He213 Single Crystal Sample (dpeaa)DE-He213 Excess Tellurium (dpeaa)DE-He213 Murtuzov, G. M. verfasserin aut Abdinova, G. D. verfasserin aut Allakhverdiev, E. A. verfasserin aut Abdinov, D. Sh. verfasserin aut Enthalten in Inorganic materials Dordrecht [u.a.] : Springer Science + Business Media B.V, 1996 48(2012), 8 vom: 14. Juli, Seite 789-791 (DE-627)334292719 (DE-600)2057339-X 1608-3172 nnns volume:48 year:2012 number:8 day:14 month:07 pages:789-791 https://dx.doi.org/10.1134/S0020168512070023 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER SSG-OLC-PHA GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_101 GBV_ILN_105 GBV_ILN_110 GBV_ILN_120 GBV_ILN_138 GBV_ILN_150 GBV_ILN_151 GBV_ILN_152 GBV_ILN_161 GBV_ILN_170 GBV_ILN_171 GBV_ILN_187 GBV_ILN_206 GBV_ILN_213 GBV_ILN_224 GBV_ILN_230 GBV_ILN_250 GBV_ILN_281 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_636 GBV_ILN_702 GBV_ILN_2001 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2006 GBV_ILN_2007 GBV_ILN_2008 GBV_ILN_2009 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2026 GBV_ILN_2027 GBV_ILN_2031 GBV_ILN_2034 GBV_ILN_2037 GBV_ILN_2038 GBV_ILN_2039 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2055 GBV_ILN_2056 GBV_ILN_2057 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2070 GBV_ILN_2086 GBV_ILN_2088 GBV_ILN_2093 GBV_ILN_2106 GBV_ILN_2107 GBV_ILN_2108 GBV_ILN_2110 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2116 GBV_ILN_2118 GBV_ILN_2119 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2144 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2188 GBV_ILN_2190 GBV_ILN_2232 GBV_ILN_2336 GBV_ILN_2446 GBV_ILN_2470 GBV_ILN_2472 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_2548 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4046 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4242 GBV_ILN_4246 GBV_ILN_4249 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4336 GBV_ILN_4338 GBV_ILN_4393 GBV_ILN_4700 35.40 ASE AR 48 2012 8 14 07 789-791 |
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10.1134/S0020168512070023 doi (DE-627)SPR013629999 (SPR)S0020168512070023-e DE-627 ger DE-627 rakwb eng 540 600 670 ASE 35.40 bkl Bagieva, G. Z. verfasserin aut Influence of structural defects on the thermal conductivity of polycrystalline and single-crystal PbTe 2012 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Abstract We have measured the thermal conductivity of unannealed and annealed (800 K, 120 h) polycrystalline and single-crystal PbTe samples at temperatures from 80 to 303 K, evaluated the electronic and lattice components of their thermal conductivity, and determined the thermal resistivity due to structural defects, whose concentration in the unannealed single-crystal samples reaches ∼$ 10^{17} $ $ cm^{−3} $. The results demonstrate that the thermal resistivity of the unannealed polycrystalline and single-crystal samples is 9.4 and 1.7 cm K/W, respectively. Annealing eliminates the defects, thereby increasing the lattice thermal conductivity of the material. Structural Defect (dpeaa)DE-He213 PbTe (dpeaa)DE-He213 PbSe (dpeaa)DE-He213 Single Crystal Sample (dpeaa)DE-He213 Excess Tellurium (dpeaa)DE-He213 Murtuzov, G. M. verfasserin aut Abdinova, G. D. verfasserin aut Allakhverdiev, E. A. verfasserin aut Abdinov, D. Sh. verfasserin aut Enthalten in Inorganic materials Dordrecht [u.a.] : Springer Science + Business Media B.V, 1996 48(2012), 8 vom: 14. Juli, Seite 789-791 (DE-627)334292719 (DE-600)2057339-X 1608-3172 nnns volume:48 year:2012 number:8 day:14 month:07 pages:789-791 https://dx.doi.org/10.1134/S0020168512070023 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER SSG-OLC-PHA GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_101 GBV_ILN_105 GBV_ILN_110 GBV_ILN_120 GBV_ILN_138 GBV_ILN_150 GBV_ILN_151 GBV_ILN_152 GBV_ILN_161 GBV_ILN_170 GBV_ILN_171 GBV_ILN_187 GBV_ILN_206 GBV_ILN_213 GBV_ILN_224 GBV_ILN_230 GBV_ILN_250 GBV_ILN_281 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_636 GBV_ILN_702 GBV_ILN_2001 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2006 GBV_ILN_2007 GBV_ILN_2008 GBV_ILN_2009 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2026 GBV_ILN_2027 GBV_ILN_2031 GBV_ILN_2034 GBV_ILN_2037 GBV_ILN_2038 GBV_ILN_2039 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2055 GBV_ILN_2056 GBV_ILN_2057 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2070 GBV_ILN_2086 GBV_ILN_2088 GBV_ILN_2093 GBV_ILN_2106 GBV_ILN_2107 GBV_ILN_2108 GBV_ILN_2110 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2116 GBV_ILN_2118 GBV_ILN_2119 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2144 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2188 GBV_ILN_2190 GBV_ILN_2232 GBV_ILN_2336 GBV_ILN_2446 GBV_ILN_2470 GBV_ILN_2472 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_2548 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4046 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4242 GBV_ILN_4246 GBV_ILN_4249 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4336 GBV_ILN_4338 GBV_ILN_4393 GBV_ILN_4700 35.40 ASE AR 48 2012 8 14 07 789-791 |
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10.1134/S0020168512070023 doi (DE-627)SPR013629999 (SPR)S0020168512070023-e DE-627 ger DE-627 rakwb eng 540 600 670 ASE 35.40 bkl Bagieva, G. Z. verfasserin aut Influence of structural defects on the thermal conductivity of polycrystalline and single-crystal PbTe 2012 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Abstract We have measured the thermal conductivity of unannealed and annealed (800 K, 120 h) polycrystalline and single-crystal PbTe samples at temperatures from 80 to 303 K, evaluated the electronic and lattice components of their thermal conductivity, and determined the thermal resistivity due to structural defects, whose concentration in the unannealed single-crystal samples reaches ∼$ 10^{17} $ $ cm^{−3} $. The results demonstrate that the thermal resistivity of the unannealed polycrystalline and single-crystal samples is 9.4 and 1.7 cm K/W, respectively. Annealing eliminates the defects, thereby increasing the lattice thermal conductivity of the material. Structural Defect (dpeaa)DE-He213 PbTe (dpeaa)DE-He213 PbSe (dpeaa)DE-He213 Single Crystal Sample (dpeaa)DE-He213 Excess Tellurium (dpeaa)DE-He213 Murtuzov, G. M. verfasserin aut Abdinova, G. D. verfasserin aut Allakhverdiev, E. A. verfasserin aut Abdinov, D. Sh. verfasserin aut Enthalten in Inorganic materials Dordrecht [u.a.] : Springer Science + Business Media B.V, 1996 48(2012), 8 vom: 14. Juli, Seite 789-791 (DE-627)334292719 (DE-600)2057339-X 1608-3172 nnns volume:48 year:2012 number:8 day:14 month:07 pages:789-791 https://dx.doi.org/10.1134/S0020168512070023 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER SSG-OLC-PHA GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_101 GBV_ILN_105 GBV_ILN_110 GBV_ILN_120 GBV_ILN_138 GBV_ILN_150 GBV_ILN_151 GBV_ILN_152 GBV_ILN_161 GBV_ILN_170 GBV_ILN_171 GBV_ILN_187 GBV_ILN_206 GBV_ILN_213 GBV_ILN_224 GBV_ILN_230 GBV_ILN_250 GBV_ILN_281 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_636 GBV_ILN_702 GBV_ILN_2001 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2006 GBV_ILN_2007 GBV_ILN_2008 GBV_ILN_2009 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2026 GBV_ILN_2027 GBV_ILN_2031 GBV_ILN_2034 GBV_ILN_2037 GBV_ILN_2038 GBV_ILN_2039 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2055 GBV_ILN_2056 GBV_ILN_2057 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2070 GBV_ILN_2086 GBV_ILN_2088 GBV_ILN_2093 GBV_ILN_2106 GBV_ILN_2107 GBV_ILN_2108 GBV_ILN_2110 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2116 GBV_ILN_2118 GBV_ILN_2119 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2144 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2188 GBV_ILN_2190 GBV_ILN_2232 GBV_ILN_2336 GBV_ILN_2446 GBV_ILN_2470 GBV_ILN_2472 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_2548 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4046 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4242 GBV_ILN_4246 GBV_ILN_4249 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4336 GBV_ILN_4338 GBV_ILN_4393 GBV_ILN_4700 35.40 ASE AR 48 2012 8 14 07 789-791 |
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Enthalten in Inorganic materials 48(2012), 8 vom: 14. Juli, Seite 789-791 volume:48 year:2012 number:8 day:14 month:07 pages:789-791 |
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Structural Defect PbTe PbSe Single Crystal Sample Excess Tellurium |
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Bagieva, G. Z. @@aut@@ Murtuzov, G. M. @@aut@@ Abdinova, G. D. @@aut@@ Allakhverdiev, E. A. @@aut@@ Abdinov, D. Sh. @@aut@@ |
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Bagieva, G. Z. |
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Bagieva, G. Z. ddc 540 bkl 35.40 misc Structural Defect misc PbTe misc PbSe misc Single Crystal Sample misc Excess Tellurium Influence of structural defects on the thermal conductivity of polycrystalline and single-crystal PbTe |
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540 600 670 ASE 35.40 bkl Influence of structural defects on the thermal conductivity of polycrystalline and single-crystal PbTe Structural Defect (dpeaa)DE-He213 PbTe (dpeaa)DE-He213 PbSe (dpeaa)DE-He213 Single Crystal Sample (dpeaa)DE-He213 Excess Tellurium (dpeaa)DE-He213 |
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ddc 540 bkl 35.40 misc Structural Defect misc PbTe misc PbSe misc Single Crystal Sample misc Excess Tellurium |
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Influence of structural defects on the thermal conductivity of polycrystalline and single-crystal PbTe |
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Influence of structural defects on the thermal conductivity of polycrystalline and single-crystal PbTe |
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Inorganic materials |
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Bagieva, G. Z. Murtuzov, G. M. Abdinova, G. D. Allakhverdiev, E. A. Abdinov, D. Sh. |
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influence of structural defects on the thermal conductivity of polycrystalline and single-crystal pbte |
| title_auth |
Influence of structural defects on the thermal conductivity of polycrystalline and single-crystal PbTe |
| abstract |
Abstract We have measured the thermal conductivity of unannealed and annealed (800 K, 120 h) polycrystalline and single-crystal PbTe samples at temperatures from 80 to 303 K, evaluated the electronic and lattice components of their thermal conductivity, and determined the thermal resistivity due to structural defects, whose concentration in the unannealed single-crystal samples reaches ∼$ 10^{17} $ $ cm^{−3} $. The results demonstrate that the thermal resistivity of the unannealed polycrystalline and single-crystal samples is 9.4 and 1.7 cm K/W, respectively. Annealing eliminates the defects, thereby increasing the lattice thermal conductivity of the material. |
| abstractGer |
Abstract We have measured the thermal conductivity of unannealed and annealed (800 K, 120 h) polycrystalline and single-crystal PbTe samples at temperatures from 80 to 303 K, evaluated the electronic and lattice components of their thermal conductivity, and determined the thermal resistivity due to structural defects, whose concentration in the unannealed single-crystal samples reaches ∼$ 10^{17} $ $ cm^{−3} $. The results demonstrate that the thermal resistivity of the unannealed polycrystalline and single-crystal samples is 9.4 and 1.7 cm K/W, respectively. Annealing eliminates the defects, thereby increasing the lattice thermal conductivity of the material. |
| abstract_unstemmed |
Abstract We have measured the thermal conductivity of unannealed and annealed (800 K, 120 h) polycrystalline and single-crystal PbTe samples at temperatures from 80 to 303 K, evaluated the electronic and lattice components of their thermal conductivity, and determined the thermal resistivity due to structural defects, whose concentration in the unannealed single-crystal samples reaches ∼$ 10^{17} $ $ cm^{−3} $. The results demonstrate that the thermal resistivity of the unannealed polycrystalline and single-crystal samples is 9.4 and 1.7 cm K/W, respectively. Annealing eliminates the defects, thereby increasing the lattice thermal conductivity of the material. |
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Influence of structural defects on the thermal conductivity of polycrystalline and single-crystal PbTe |
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https://dx.doi.org/10.1134/S0020168512070023 |
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Murtuzov, G. M. Abdinova, G. D. Allakhverdiev, E. A. Abdinov, D. Sh |
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Murtuzov, G. M. Abdinova, G. D. Allakhverdiev, E. A. Abdinov, D. Sh |
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10.1134/S0020168512070023 |
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2024-07-03T21:04:31.962Z |
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| score |
7.4011145 |