The crystallisation of Er-Si-Al-O-N B-phase glass-ceramics

Abstract The development of microstructure during crystallisation of a glass with composition (e/o) 35Er:45Si:20Al:83O:17N has been studied by analytical transmission electron microscopy, including electron spectroscopic imaging. The crystals take up a wide range of composition after crystallisation...
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Autor*in:	Menke, Y. [verfasserIn] Falk, L. K. L. [verfasserIn] Hampshire, S. [verfasserIn]

Format:	E-Artikel
Sprache:	Englisch

Erschienen:	2005

Schlagwörter:	Yttrium Erbium Analytical Transmission Electron Microscopy Ytterbium Silicon Content

Übergeordnetes Werk:	Enthalten in: Journal of materials science - Dordrecht [u.a.] : Springer Science + Business Media B.V, 1966, 40(2005), 24 vom: 05. Okt., Seite 6499-6512
Übergeordnetes Werk:	volume:40 ; year:2005 ; number:24 ; day:05 ; month:10 ; pages:6499-6512

Links:	Volltext

DOI / URN:	10.1007/s10853-005-2151-0

Katalog-ID:	SPR013804057

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520			\|a Abstract The development of microstructure during crystallisation of a glass with composition (e/o) 35Er:45Si:20Al:83O:17N has been studied by analytical transmission electron microscopy, including electron spectroscopic imaging. The crystals take up a wide range of composition after crystallisation heat treatment at 1050 and 1150°C; the erbium cation percentage varies around that of the expected B-phase composition ($ Er_{2} %$ SiAlO_{5} $N), but the aluminium content is slightly lower and the silicon content higher than that. In addition, the erbium content is strongly anti-correlated with the silicon content. A comparison of B-phase composition after crystallisation of equivalent glasses formed with either yttrium, erbium or ytterbium showed that the B-phase solid solution range depends on the particular cation radius. As a consequence of this, the degree of crystallisation and the composition of the residual glass will, for equivalent glasses, also depend on the cation radius. The crystal shape is lenticular after growth at 1050°C, while heat treatment at 1150°C results in crystals with an irregular shape. In addition to crystal growth, the crystallisation heat treatment results in a phase separation of the residual glass whereby smaller silicon and nitrogen rich amorphous features form. These features are effectively pinning boundaries of growing crystals.
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allfields	10.1007/s10853-005-2151-0 doi (DE-627)SPR013804057 (SPR)s10853-005-2151-0-e DE-627 ger DE-627 rakwb eng 670 ASE 51.00 bkl Menke, Y. verfasserin aut The crystallisation of Er-Si-Al-O-N B-phase glass-ceramics 2005 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Abstract The development of microstructure during crystallisation of a glass with composition (e/o) 35Er:45Si:20Al:83O:17N has been studied by analytical transmission electron microscopy, including electron spectroscopic imaging. The crystals take up a wide range of composition after crystallisation heat treatment at 1050 and 1150°C; the erbium cation percentage varies around that of the expected B-phase composition ($ Er_{2} %$ SiAlO_{5} $N), but the aluminium content is slightly lower and the silicon content higher than that. In addition, the erbium content is strongly anti-correlated with the silicon content. A comparison of B-phase composition after crystallisation of equivalent glasses formed with either yttrium, erbium or ytterbium showed that the B-phase solid solution range depends on the particular cation radius. As a consequence of this, the degree of crystallisation and the composition of the residual glass will, for equivalent glasses, also depend on the cation radius. The crystal shape is lenticular after growth at 1050°C, while heat treatment at 1150°C results in crystals with an irregular shape. In addition to crystal growth, the crystallisation heat treatment results in a phase separation of the residual glass whereby smaller silicon and nitrogen rich amorphous features form. These features are effectively pinning boundaries of growing crystals. Yttrium (dpeaa)DE-He213 Erbium (dpeaa)DE-He213 Analytical Transmission Electron Microscopy (dpeaa)DE-He213 Ytterbium (dpeaa)DE-He213 Silicon Content (dpeaa)DE-He213 Falk, L. K. L. verfasserin aut Hampshire, S. verfasserin aut Enthalten in Journal of materials science Dordrecht [u.a.] : Springer Science + Business Media B.V, 1966 40(2005), 24 vom: 05. Okt., Seite 6499-6512 (DE-627)315293969 (DE-600)2015305-3 1573-4803 nnns volume:40 year:2005 number:24 day:05 month:10 pages:6499-6512 https://dx.doi.org/10.1007/s10853-005-2151-0 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_105 GBV_ILN_110 GBV_ILN_120 GBV_ILN_138 GBV_ILN_150 GBV_ILN_151 GBV_ILN_152 GBV_ILN_161 GBV_ILN_170 GBV_ILN_171 GBV_ILN_187 GBV_ILN_206 GBV_ILN_213 GBV_ILN_224 GBV_ILN_230 GBV_ILN_250 GBV_ILN_281 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_636 GBV_ILN_702 GBV_ILN_2001 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2006 GBV_ILN_2007 GBV_ILN_2008 GBV_ILN_2009 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2026 GBV_ILN_2027 GBV_ILN_2031 GBV_ILN_2034 GBV_ILN_2037 GBV_ILN_2038 GBV_ILN_2039 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2055 GBV_ILN_2056 GBV_ILN_2057 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2070 GBV_ILN_2086 GBV_ILN_2088 GBV_ILN_2093 GBV_ILN_2106 GBV_ILN_2107 GBV_ILN_2108 GBV_ILN_2110 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2116 GBV_ILN_2118 GBV_ILN_2119 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2144 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2188 GBV_ILN_2190 GBV_ILN_2232 GBV_ILN_2336 GBV_ILN_2446 GBV_ILN_2470 GBV_ILN_2472 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_2548 GBV_ILN_4012 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4046 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4242 GBV_ILN_4246 GBV_ILN_4249 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4336 GBV_ILN_4338 GBV_ILN_4393 GBV_ILN_4700 51.00 ASE AR 40 2005 24 05 10 6499-6512
spelling	10.1007/s10853-005-2151-0 doi (DE-627)SPR013804057 (SPR)s10853-005-2151-0-e DE-627 ger DE-627 rakwb eng 670 ASE 51.00 bkl Menke, Y. verfasserin aut The crystallisation of Er-Si-Al-O-N B-phase glass-ceramics 2005 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Abstract The development of microstructure during crystallisation of a glass with composition (e/o) 35Er:45Si:20Al:83O:17N has been studied by analytical transmission electron microscopy, including electron spectroscopic imaging. The crystals take up a wide range of composition after crystallisation heat treatment at 1050 and 1150°C; the erbium cation percentage varies around that of the expected B-phase composition ($ Er_{2} %$ SiAlO_{5} $N), but the aluminium content is slightly lower and the silicon content higher than that. In addition, the erbium content is strongly anti-correlated with the silicon content. A comparison of B-phase composition after crystallisation of equivalent glasses formed with either yttrium, erbium or ytterbium showed that the B-phase solid solution range depends on the particular cation radius. As a consequence of this, the degree of crystallisation and the composition of the residual glass will, for equivalent glasses, also depend on the cation radius. The crystal shape is lenticular after growth at 1050°C, while heat treatment at 1150°C results in crystals with an irregular shape. In addition to crystal growth, the crystallisation heat treatment results in a phase separation of the residual glass whereby smaller silicon and nitrogen rich amorphous features form. These features are effectively pinning boundaries of growing crystals. Yttrium (dpeaa)DE-He213 Erbium (dpeaa)DE-He213 Analytical Transmission Electron Microscopy (dpeaa)DE-He213 Ytterbium (dpeaa)DE-He213 Silicon Content (dpeaa)DE-He213 Falk, L. K. L. verfasserin aut Hampshire, S. verfasserin aut Enthalten in Journal of materials science Dordrecht [u.a.] : Springer Science + Business Media B.V, 1966 40(2005), 24 vom: 05. Okt., Seite 6499-6512 (DE-627)315293969 (DE-600)2015305-3 1573-4803 nnns volume:40 year:2005 number:24 day:05 month:10 pages:6499-6512 https://dx.doi.org/10.1007/s10853-005-2151-0 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_105 GBV_ILN_110 GBV_ILN_120 GBV_ILN_138 GBV_ILN_150 GBV_ILN_151 GBV_ILN_152 GBV_ILN_161 GBV_ILN_170 GBV_ILN_171 GBV_ILN_187 GBV_ILN_206 GBV_ILN_213 GBV_ILN_224 GBV_ILN_230 GBV_ILN_250 GBV_ILN_281 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_636 GBV_ILN_702 GBV_ILN_2001 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2006 GBV_ILN_2007 GBV_ILN_2008 GBV_ILN_2009 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2026 GBV_ILN_2027 GBV_ILN_2031 GBV_ILN_2034 GBV_ILN_2037 GBV_ILN_2038 GBV_ILN_2039 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2055 GBV_ILN_2056 GBV_ILN_2057 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2070 GBV_ILN_2086 GBV_ILN_2088 GBV_ILN_2093 GBV_ILN_2106 GBV_ILN_2107 GBV_ILN_2108 GBV_ILN_2110 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2116 GBV_ILN_2118 GBV_ILN_2119 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2144 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2188 GBV_ILN_2190 GBV_ILN_2232 GBV_ILN_2336 GBV_ILN_2446 GBV_ILN_2470 GBV_ILN_2472 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_2548 GBV_ILN_4012 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4046 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4242 GBV_ILN_4246 GBV_ILN_4249 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4336 GBV_ILN_4338 GBV_ILN_4393 GBV_ILN_4700 51.00 ASE AR 40 2005 24 05 10 6499-6512
allfields_unstemmed	10.1007/s10853-005-2151-0 doi (DE-627)SPR013804057 (SPR)s10853-005-2151-0-e DE-627 ger DE-627 rakwb eng 670 ASE 51.00 bkl Menke, Y. verfasserin aut The crystallisation of Er-Si-Al-O-N B-phase glass-ceramics 2005 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Abstract The development of microstructure during crystallisation of a glass with composition (e/o) 35Er:45Si:20Al:83O:17N has been studied by analytical transmission electron microscopy, including electron spectroscopic imaging. The crystals take up a wide range of composition after crystallisation heat treatment at 1050 and 1150°C; the erbium cation percentage varies around that of the expected B-phase composition ($ Er_{2} %$ SiAlO_{5} $N), but the aluminium content is slightly lower and the silicon content higher than that. In addition, the erbium content is strongly anti-correlated with the silicon content. A comparison of B-phase composition after crystallisation of equivalent glasses formed with either yttrium, erbium or ytterbium showed that the B-phase solid solution range depends on the particular cation radius. As a consequence of this, the degree of crystallisation and the composition of the residual glass will, for equivalent glasses, also depend on the cation radius. The crystal shape is lenticular after growth at 1050°C, while heat treatment at 1150°C results in crystals with an irregular shape. In addition to crystal growth, the crystallisation heat treatment results in a phase separation of the residual glass whereby smaller silicon and nitrogen rich amorphous features form. These features are effectively pinning boundaries of growing crystals. Yttrium (dpeaa)DE-He213 Erbium (dpeaa)DE-He213 Analytical Transmission Electron Microscopy (dpeaa)DE-He213 Ytterbium (dpeaa)DE-He213 Silicon Content (dpeaa)DE-He213 Falk, L. K. L. verfasserin aut Hampshire, S. verfasserin aut Enthalten in Journal of materials science Dordrecht [u.a.] : Springer Science + Business Media B.V, 1966 40(2005), 24 vom: 05. Okt., Seite 6499-6512 (DE-627)315293969 (DE-600)2015305-3 1573-4803 nnns volume:40 year:2005 number:24 day:05 month:10 pages:6499-6512 https://dx.doi.org/10.1007/s10853-005-2151-0 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_105 GBV_ILN_110 GBV_ILN_120 GBV_ILN_138 GBV_ILN_150 GBV_ILN_151 GBV_ILN_152 GBV_ILN_161 GBV_ILN_170 GBV_ILN_171 GBV_ILN_187 GBV_ILN_206 GBV_ILN_213 GBV_ILN_224 GBV_ILN_230 GBV_ILN_250 GBV_ILN_281 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_636 GBV_ILN_702 GBV_ILN_2001 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2006 GBV_ILN_2007 GBV_ILN_2008 GBV_ILN_2009 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2026 GBV_ILN_2027 GBV_ILN_2031 GBV_ILN_2034 GBV_ILN_2037 GBV_ILN_2038 GBV_ILN_2039 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2055 GBV_ILN_2056 GBV_ILN_2057 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2070 GBV_ILN_2086 GBV_ILN_2088 GBV_ILN_2093 GBV_ILN_2106 GBV_ILN_2107 GBV_ILN_2108 GBV_ILN_2110 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2116 GBV_ILN_2118 GBV_ILN_2119 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2144 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2188 GBV_ILN_2190 GBV_ILN_2232 GBV_ILN_2336 GBV_ILN_2446 GBV_ILN_2470 GBV_ILN_2472 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_2548 GBV_ILN_4012 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4046 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4242 GBV_ILN_4246 GBV_ILN_4249 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4336 GBV_ILN_4338 GBV_ILN_4393 GBV_ILN_4700 51.00 ASE AR 40 2005 24 05 10 6499-6512
allfieldsGer	10.1007/s10853-005-2151-0 doi (DE-627)SPR013804057 (SPR)s10853-005-2151-0-e DE-627 ger DE-627 rakwb eng 670 ASE 51.00 bkl Menke, Y. verfasserin aut The crystallisation of Er-Si-Al-O-N B-phase glass-ceramics 2005 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Abstract The development of microstructure during crystallisation of a glass with composition (e/o) 35Er:45Si:20Al:83O:17N has been studied by analytical transmission electron microscopy, including electron spectroscopic imaging. The crystals take up a wide range of composition after crystallisation heat treatment at 1050 and 1150°C; the erbium cation percentage varies around that of the expected B-phase composition ($ Er_{2} %$ SiAlO_{5} $N), but the aluminium content is slightly lower and the silicon content higher than that. In addition, the erbium content is strongly anti-correlated with the silicon content. A comparison of B-phase composition after crystallisation of equivalent glasses formed with either yttrium, erbium or ytterbium showed that the B-phase solid solution range depends on the particular cation radius. As a consequence of this, the degree of crystallisation and the composition of the residual glass will, for equivalent glasses, also depend on the cation radius. The crystal shape is lenticular after growth at 1050°C, while heat treatment at 1150°C results in crystals with an irregular shape. In addition to crystal growth, the crystallisation heat treatment results in a phase separation of the residual glass whereby smaller silicon and nitrogen rich amorphous features form. These features are effectively pinning boundaries of growing crystals. Yttrium (dpeaa)DE-He213 Erbium (dpeaa)DE-He213 Analytical Transmission Electron Microscopy (dpeaa)DE-He213 Ytterbium (dpeaa)DE-He213 Silicon Content (dpeaa)DE-He213 Falk, L. K. L. verfasserin aut Hampshire, S. verfasserin aut Enthalten in Journal of materials science Dordrecht [u.a.] : Springer Science + Business Media B.V, 1966 40(2005), 24 vom: 05. Okt., Seite 6499-6512 (DE-627)315293969 (DE-600)2015305-3 1573-4803 nnns volume:40 year:2005 number:24 day:05 month:10 pages:6499-6512 https://dx.doi.org/10.1007/s10853-005-2151-0 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_105 GBV_ILN_110 GBV_ILN_120 GBV_ILN_138 GBV_ILN_150 GBV_ILN_151 GBV_ILN_152 GBV_ILN_161 GBV_ILN_170 GBV_ILN_171 GBV_ILN_187 GBV_ILN_206 GBV_ILN_213 GBV_ILN_224 GBV_ILN_230 GBV_ILN_250 GBV_ILN_281 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_636 GBV_ILN_702 GBV_ILN_2001 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2006 GBV_ILN_2007 GBV_ILN_2008 GBV_ILN_2009 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2026 GBV_ILN_2027 GBV_ILN_2031 GBV_ILN_2034 GBV_ILN_2037 GBV_ILN_2038 GBV_ILN_2039 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2055 GBV_ILN_2056 GBV_ILN_2057 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2070 GBV_ILN_2086 GBV_ILN_2088 GBV_ILN_2093 GBV_ILN_2106 GBV_ILN_2107 GBV_ILN_2108 GBV_ILN_2110 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2116 GBV_ILN_2118 GBV_ILN_2119 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2144 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2188 GBV_ILN_2190 GBV_ILN_2232 GBV_ILN_2336 GBV_ILN_2446 GBV_ILN_2470 GBV_ILN_2472 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_2548 GBV_ILN_4012 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4046 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4242 GBV_ILN_4246 GBV_ILN_4249 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4336 GBV_ILN_4338 GBV_ILN_4393 GBV_ILN_4700 51.00 ASE AR 40 2005 24 05 10 6499-6512
allfieldsSound	10.1007/s10853-005-2151-0 doi (DE-627)SPR013804057 (SPR)s10853-005-2151-0-e DE-627 ger DE-627 rakwb eng 670 ASE 51.00 bkl Menke, Y. verfasserin aut The crystallisation of Er-Si-Al-O-N B-phase glass-ceramics 2005 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Abstract The development of microstructure during crystallisation of a glass with composition (e/o) 35Er:45Si:20Al:83O:17N has been studied by analytical transmission electron microscopy, including electron spectroscopic imaging. The crystals take up a wide range of composition after crystallisation heat treatment at 1050 and 1150°C; the erbium cation percentage varies around that of the expected B-phase composition ($ Er_{2} %$ SiAlO_{5} $N), but the aluminium content is slightly lower and the silicon content higher than that. In addition, the erbium content is strongly anti-correlated with the silicon content. A comparison of B-phase composition after crystallisation of equivalent glasses formed with either yttrium, erbium or ytterbium showed that the B-phase solid solution range depends on the particular cation radius. As a consequence of this, the degree of crystallisation and the composition of the residual glass will, for equivalent glasses, also depend on the cation radius. The crystal shape is lenticular after growth at 1050°C, while heat treatment at 1150°C results in crystals with an irregular shape. In addition to crystal growth, the crystallisation heat treatment results in a phase separation of the residual glass whereby smaller silicon and nitrogen rich amorphous features form. These features are effectively pinning boundaries of growing crystals. Yttrium (dpeaa)DE-He213 Erbium (dpeaa)DE-He213 Analytical Transmission Electron Microscopy (dpeaa)DE-He213 Ytterbium (dpeaa)DE-He213 Silicon Content (dpeaa)DE-He213 Falk, L. K. L. verfasserin aut Hampshire, S. verfasserin aut Enthalten in Journal of materials science Dordrecht [u.a.] : Springer Science + Business Media B.V, 1966 40(2005), 24 vom: 05. Okt., Seite 6499-6512 (DE-627)315293969 (DE-600)2015305-3 1573-4803 nnns volume:40 year:2005 number:24 day:05 month:10 pages:6499-6512 https://dx.doi.org/10.1007/s10853-005-2151-0 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_105 GBV_ILN_110 GBV_ILN_120 GBV_ILN_138 GBV_ILN_150 GBV_ILN_151 GBV_ILN_152 GBV_ILN_161 GBV_ILN_170 GBV_ILN_171 GBV_ILN_187 GBV_ILN_206 GBV_ILN_213 GBV_ILN_224 GBV_ILN_230 GBV_ILN_250 GBV_ILN_281 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_636 GBV_ILN_702 GBV_ILN_2001 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2006 GBV_ILN_2007 GBV_ILN_2008 GBV_ILN_2009 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2026 GBV_ILN_2027 GBV_ILN_2031 GBV_ILN_2034 GBV_ILN_2037 GBV_ILN_2038 GBV_ILN_2039 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2055 GBV_ILN_2056 GBV_ILN_2057 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2070 GBV_ILN_2086 GBV_ILN_2088 GBV_ILN_2093 GBV_ILN_2106 GBV_ILN_2107 GBV_ILN_2108 GBV_ILN_2110 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2116 GBV_ILN_2118 GBV_ILN_2119 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2144 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2188 GBV_ILN_2190 GBV_ILN_2232 GBV_ILN_2336 GBV_ILN_2446 GBV_ILN_2470 GBV_ILN_2472 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_2548 GBV_ILN_4012 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4046 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4242 GBV_ILN_4246 GBV_ILN_4249 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4336 GBV_ILN_4338 GBV_ILN_4393 GBV_ILN_4700 51.00 ASE AR 40 2005 24 05 10 6499-6512
language	English
source	Enthalten in Journal of materials science 40(2005), 24 vom: 05. Okt., Seite 6499-6512 volume:40 year:2005 number:24 day:05 month:10 pages:6499-6512
sourceStr	Enthalten in Journal of materials science 40(2005), 24 vom: 05. Okt., Seite 6499-6512 volume:40 year:2005 number:24 day:05 month:10 pages:6499-6512
format_phy_str_mv	Article
institution	findex.gbv.de
topic_facet	Yttrium Erbium Analytical Transmission Electron Microscopy Ytterbium Silicon Content
dewey-raw	670
isfreeaccess_bool	false
container_title	Journal of materials science
authorswithroles_txt_mv	Menke, Y. @@aut@@ Falk, L. K. L. @@aut@@ Hampshire, S. @@aut@@
publishDateDaySort_date	2005-10-05T00:00:00Z
hierarchy_top_id	315293969
dewey-sort	3670
id	SPR013804057
language_de	englisch
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author	Menke, Y.
spellingShingle	Menke, Y. ddc 670 bkl 51.00 misc Yttrium misc Erbium misc Analytical Transmission Electron Microscopy misc Ytterbium misc Silicon Content The crystallisation of Er-Si-Al-O-N B-phase glass-ceramics
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topic_title	670 ASE 51.00 bkl The crystallisation of Er-Si-Al-O-N B-phase glass-ceramics Yttrium (dpeaa)DE-He213 Erbium (dpeaa)DE-He213 Analytical Transmission Electron Microscopy (dpeaa)DE-He213 Ytterbium (dpeaa)DE-He213 Silicon Content (dpeaa)DE-He213
topic	ddc 670 bkl 51.00 misc Yttrium misc Erbium misc Analytical Transmission Electron Microscopy misc Ytterbium misc Silicon Content
topic_unstemmed	ddc 670 bkl 51.00 misc Yttrium misc Erbium misc Analytical Transmission Electron Microscopy misc Ytterbium misc Silicon Content
topic_browse	ddc 670 bkl 51.00 misc Yttrium misc Erbium misc Analytical Transmission Electron Microscopy misc Ytterbium misc Silicon Content
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title	The crystallisation of Er-Si-Al-O-N B-phase glass-ceramics
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title_full	The crystallisation of Er-Si-Al-O-N B-phase glass-ceramics
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journal	Journal of materials science
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author_browse	Menke, Y. Falk, L. K. L. Hampshire, S.
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title_sort	crystallisation of er-si-al-o-n b-phase glass-ceramics
title_auth	The crystallisation of Er-Si-Al-O-N B-phase glass-ceramics
abstract	Abstract The development of microstructure during crystallisation of a glass with composition (e/o) 35Er:45Si:20Al:83O:17N has been studied by analytical transmission electron microscopy, including electron spectroscopic imaging. The crystals take up a wide range of composition after crystallisation heat treatment at 1050 and 1150°C; the erbium cation percentage varies around that of the expected B-phase composition ($ Er_{2} %$ SiAlO_{5} $N), but the aluminium content is slightly lower and the silicon content higher than that. In addition, the erbium content is strongly anti-correlated with the silicon content. A comparison of B-phase composition after crystallisation of equivalent glasses formed with either yttrium, erbium or ytterbium showed that the B-phase solid solution range depends on the particular cation radius. As a consequence of this, the degree of crystallisation and the composition of the residual glass will, for equivalent glasses, also depend on the cation radius. The crystal shape is lenticular after growth at 1050°C, while heat treatment at 1150°C results in crystals with an irregular shape. In addition to crystal growth, the crystallisation heat treatment results in a phase separation of the residual glass whereby smaller silicon and nitrogen rich amorphous features form. These features are effectively pinning boundaries of growing crystals.
abstractGer	Abstract The development of microstructure during crystallisation of a glass with composition (e/o) 35Er:45Si:20Al:83O:17N has been studied by analytical transmission electron microscopy, including electron spectroscopic imaging. The crystals take up a wide range of composition after crystallisation heat treatment at 1050 and 1150°C; the erbium cation percentage varies around that of the expected B-phase composition ($ Er_{2} %$ SiAlO_{5} $N), but the aluminium content is slightly lower and the silicon content higher than that. In addition, the erbium content is strongly anti-correlated with the silicon content. A comparison of B-phase composition after crystallisation of equivalent glasses formed with either yttrium, erbium or ytterbium showed that the B-phase solid solution range depends on the particular cation radius. As a consequence of this, the degree of crystallisation and the composition of the residual glass will, for equivalent glasses, also depend on the cation radius. The crystal shape is lenticular after growth at 1050°C, while heat treatment at 1150°C results in crystals with an irregular shape. In addition to crystal growth, the crystallisation heat treatment results in a phase separation of the residual glass whereby smaller silicon and nitrogen rich amorphous features form. These features are effectively pinning boundaries of growing crystals.
abstract_unstemmed	Abstract The development of microstructure during crystallisation of a glass with composition (e/o) 35Er:45Si:20Al:83O:17N has been studied by analytical transmission electron microscopy, including electron spectroscopic imaging. The crystals take up a wide range of composition after crystallisation heat treatment at 1050 and 1150°C; the erbium cation percentage varies around that of the expected B-phase composition ($ Er_{2} %$ SiAlO_{5} $N), but the aluminium content is slightly lower and the silicon content higher than that. In addition, the erbium content is strongly anti-correlated with the silicon content. A comparison of B-phase composition after crystallisation of equivalent glasses formed with either yttrium, erbium or ytterbium showed that the B-phase solid solution range depends on the particular cation radius. As a consequence of this, the degree of crystallisation and the composition of the residual glass will, for equivalent glasses, also depend on the cation radius. The crystal shape is lenticular after growth at 1050°C, while heat treatment at 1150°C results in crystals with an irregular shape. In addition to crystal growth, the crystallisation heat treatment results in a phase separation of the residual glass whereby smaller silicon and nitrogen rich amorphous features form. These features are effectively pinning boundaries of growing crystals.
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container_issue	24
title_short	The crystallisation of Er-Si-Al-O-N B-phase glass-ceramics
url	https://dx.doi.org/10.1007/s10853-005-2151-0
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author2	Falk, L. K. L. Hampshire, S.
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doi_str	10.1007/s10853-005-2151-0
up_date	2024-07-03T22:15:37.283Z
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fullrecord_marcxml	<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01000caa a22002652 4500</leader><controlfield tag="001">SPR013804057</controlfield><controlfield tag="003">DE-627</controlfield><controlfield tag="005">20220111003755.0</controlfield><controlfield tag="007">cr uuu---uuuuu</controlfield><controlfield tag="008">201006s2005 xx \|\|\|\|\|o 00\| \|\|eng c</controlfield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1007/s10853-005-2151-0</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-627)SPR013804057</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(SPR)s10853-005-2151-0-e</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-627</subfield><subfield code="b">ger</subfield><subfield code="c">DE-627</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">670</subfield><subfield code="q">ASE</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">51.00</subfield><subfield code="2">bkl</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Menke, Y.</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="4"><subfield code="a">The crystallisation of Er-Si-Al-O-N B-phase glass-ceramics</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">2005</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">Text</subfield><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">Computermedien</subfield><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">Online-Ressource</subfield><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">Abstract The development of microstructure during crystallisation of a glass with composition (e/o) 35Er:45Si:20Al:83O:17N has been studied by analytical transmission electron microscopy, including electron spectroscopic imaging. The crystals take up a wide range of composition after crystallisation heat treatment at 1050 and 1150°C; the erbium cation percentage varies around that of the expected B-phase composition ($ Er_{2} %$ SiAlO_{5} $N), but the aluminium content is slightly lower and the silicon content higher than that. In addition, the erbium content is strongly anti-correlated with the silicon content. A comparison of B-phase composition after crystallisation of equivalent glasses formed with either yttrium, erbium or ytterbium showed that the B-phase solid solution range depends on the particular cation radius. As a consequence of this, the degree of crystallisation and the composition of the residual glass will, for equivalent glasses, also depend on the cation radius. The crystal shape is lenticular after growth at 1050°C, while heat treatment at 1150°C results in crystals with an irregular shape. In addition to crystal growth, the crystallisation heat treatment results in a phase separation of the residual glass whereby smaller silicon and nitrogen rich amorphous features form. 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L.</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Hampshire, S.</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="i">Enthalten in</subfield><subfield code="t">Journal of materials science</subfield><subfield code="d">Dordrecht [u.a.] : Springer Science + Business Media B.V, 1966</subfield><subfield code="g">40(2005), 24 vom: 05. 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The crystallisation of Er-Si-Al-O-N B-phase glass-ceramics

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