An integrated framework for software to provide yield data cleaning and estimation of an opportunity index for site-specific crop management

Abstract This paper proposes an integrated framework for software that provides yield data cleaning and yield opportunity index (Yi) calculation for site-specific crop management (SSCM). The artifacts in many yield data sets, which inevitably occur, can pose a significant effect on the validity of Y...
Ausführliche Beschreibung

Gespeichert in:
Autor*in:

Sun, Wei [verfasserIn]

Whelan, Brett [verfasserIn]

McBratney, Alex B. [verfasserIn]

Minasny, Budiman [verfasserIn]

Format:

E-Artikel

Sprache:

Englisch

Erschienen:

2012

Schlagwörter:

Precision agriculture

Yield variability

Spatial variation

Yield maps

Yield data trimming

Übergeordnetes Werk:

Enthalten in: Precision agriculture - Dordrecht [u.a.] : Springer Science + Business Media B.V, 1999, 14(2012), 4 vom: 18. Dez., Seite 376-391

Übergeordnetes Werk:

volume:14 ; year:2012 ; number:4 ; day:18 ; month:12 ; pages:376-391

Links:

Volltext

DOI / URN:

10.1007/s11119-012-9300-7

Katalog-ID:

SPR016885465

Nicht das Richtige dabei?

Schreiben Sie uns!