Temperature-Dependent Phase Segregation in Cu/42Sn-58Bi/Cu Reaction Couples under High Current Density

The effects of current stressing at $ 10^{4} $ A/$ cm^{2} $ on Cu/42Sn-58Bi/Cu reaction couples with a one-dimensional structure at 23°C, 50°C, and 114°C were investigated. The microstructural evolution during electromigration was examined using scanning electron microscopy. The temperature dependen...
Ausführliche Beschreibung

Gespeichert in:
Autor*in:

Xu, Guangchen [verfasserIn]

He, Hongwen

Guo, Fu

Format:

E-Artikel

Sprache:

Englisch

Erschienen:

2008

Schlagwörter:

Electromigration

Joule heating

eutectic Sn-Bi

Anmerkung:

© TMS 2008

Übergeordnetes Werk:

Enthalten in: Journal of electronic materials - Warrendale, Pa : TMS, 1972, 38(2008), 2 vom: 07. Okt., Seite 273-283

Übergeordnetes Werk:

volume:38 ; year:2008 ; number:2 ; day:07 ; month:10 ; pages:273-283

Links:

Volltext

DOI / URN:

10.1007/s11664-008-0562-9

Katalog-ID:

SPR021487162

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