Study of the omnidirectional photonic bandgap for dielectric mirrors based on porous silicon: effect of optical and physical thickness

Abstract We report the theoretical comparison of the omnidirectional photonic bandgap (OPBG) of one-dimensional dielectric photonic structures, using three different refractive index profiles: sinusoidal, Gaussian, and Bragg. For different values of physical thickness (PT) and optical thickness (OT)...
Ausführliche Beschreibung

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Autor*in:	Ariza-Flores, Augusto David [verfasserIn] Gaggero-Sager, Luis Manuel [verfasserIn] Agarwal, Vivechana [verfasserIn]

Format:	E-Artikel
Sprache:	Englisch

Erschienen:	2012

Schlagwörter:	Omnidirectional mirrors Porous silicon Multilayered mirrors Dielectric mirrors

Übergeordnetes Werk:	Enthalten in: Nanoscale research letters - New York, NY [u.a.] : Springer, 2006, 7(2012), 1 vom: 13. Juli
Übergeordnetes Werk:	volume:7 ; year:2012 ; number:1 ; day:13 ; month:07

Links:	Volltext

DOI / URN:	10.1186/1556-276X-7-391

Katalog-ID:	SPR02171598X

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520			\|a Abstract We report the theoretical comparison of the omnidirectional photonic bandgap (OPBG) of one-dimensional dielectric photonic structures, using three different refractive index profiles: sinusoidal, Gaussian, and Bragg. For different values of physical thickness (PT) and optical thickness (OT), the tunability of the OPBG of each profile is shown to depend on the maximum/minimum refractive indices. With an increase in the value of the maximum refractive index, the structures with the same PT showed a linear increment of the OPBG, in contrast to the structures with the same OT, showing an optimal combination of refractive indices for each structure to generate the maximum OPBG. An experimental verification was carried out with a multilayered dielectric porous silicon structure for all the three profiles.
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allfields	10.1186/1556-276X-7-391 doi (DE-627)SPR02171598X (SPR)1556-276X-7-391-e DE-627 ger DE-627 rakwb eng 600 ASE Ariza-Flores, Augusto David verfasserin aut Study of the omnidirectional photonic bandgap for dielectric mirrors based on porous silicon: effect of optical and physical thickness 2012 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Abstract We report the theoretical comparison of the omnidirectional photonic bandgap (OPBG) of one-dimensional dielectric photonic structures, using three different refractive index profiles: sinusoidal, Gaussian, and Bragg. For different values of physical thickness (PT) and optical thickness (OT), the tunability of the OPBG of each profile is shown to depend on the maximum/minimum refractive indices. With an increase in the value of the maximum refractive index, the structures with the same PT showed a linear increment of the OPBG, in contrast to the structures with the same OT, showing an optimal combination of refractive indices for each structure to generate the maximum OPBG. An experimental verification was carried out with a multilayered dielectric porous silicon structure for all the three profiles. Omnidirectional mirrors (dpeaa)DE-He213 Porous silicon (dpeaa)DE-He213 Multilayered mirrors (dpeaa)DE-He213 Dielectric mirrors (dpeaa)DE-He213 Gaggero-Sager, Luis Manuel verfasserin aut Agarwal, Vivechana verfasserin aut Enthalten in Nanoscale research letters New York, NY [u.a.] : Springer, 2006 7(2012), 1 vom: 13. Juli (DE-627)518632474 (DE-600)2253244-4 1556-276X nnns volume:7 year:2012 number:1 day:13 month:07 https://dx.doi.org/10.1186/1556-276X-7-391 kostenfrei Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_95 GBV_ILN_105 GBV_ILN_110 GBV_ILN_151 GBV_ILN_161 GBV_ILN_170 GBV_ILN_213 GBV_ILN_230 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_2014 GBV_ILN_2027 GBV_ILN_2055 GBV_ILN_4012 GBV_ILN_4037 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4249 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4335 GBV_ILN_4338 GBV_ILN_4367 GBV_ILN_4700 AR 7 2012 1 13 07
spelling	10.1186/1556-276X-7-391 doi (DE-627)SPR02171598X (SPR)1556-276X-7-391-e DE-627 ger DE-627 rakwb eng 600 ASE Ariza-Flores, Augusto David verfasserin aut Study of the omnidirectional photonic bandgap for dielectric mirrors based on porous silicon: effect of optical and physical thickness 2012 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Abstract We report the theoretical comparison of the omnidirectional photonic bandgap (OPBG) of one-dimensional dielectric photonic structures, using three different refractive index profiles: sinusoidal, Gaussian, and Bragg. For different values of physical thickness (PT) and optical thickness (OT), the tunability of the OPBG of each profile is shown to depend on the maximum/minimum refractive indices. With an increase in the value of the maximum refractive index, the structures with the same PT showed a linear increment of the OPBG, in contrast to the structures with the same OT, showing an optimal combination of refractive indices for each structure to generate the maximum OPBG. An experimental verification was carried out with a multilayered dielectric porous silicon structure for all the three profiles. Omnidirectional mirrors (dpeaa)DE-He213 Porous silicon (dpeaa)DE-He213 Multilayered mirrors (dpeaa)DE-He213 Dielectric mirrors (dpeaa)DE-He213 Gaggero-Sager, Luis Manuel verfasserin aut Agarwal, Vivechana verfasserin aut Enthalten in Nanoscale research letters New York, NY [u.a.] : Springer, 2006 7(2012), 1 vom: 13. Juli (DE-627)518632474 (DE-600)2253244-4 1556-276X nnns volume:7 year:2012 number:1 day:13 month:07 https://dx.doi.org/10.1186/1556-276X-7-391 kostenfrei Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_95 GBV_ILN_105 GBV_ILN_110 GBV_ILN_151 GBV_ILN_161 GBV_ILN_170 GBV_ILN_213 GBV_ILN_230 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_2014 GBV_ILN_2027 GBV_ILN_2055 GBV_ILN_4012 GBV_ILN_4037 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4249 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4335 GBV_ILN_4338 GBV_ILN_4367 GBV_ILN_4700 AR 7 2012 1 13 07
allfields_unstemmed	10.1186/1556-276X-7-391 doi (DE-627)SPR02171598X (SPR)1556-276X-7-391-e DE-627 ger DE-627 rakwb eng 600 ASE Ariza-Flores, Augusto David verfasserin aut Study of the omnidirectional photonic bandgap for dielectric mirrors based on porous silicon: effect of optical and physical thickness 2012 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Abstract We report the theoretical comparison of the omnidirectional photonic bandgap (OPBG) of one-dimensional dielectric photonic structures, using three different refractive index profiles: sinusoidal, Gaussian, and Bragg. For different values of physical thickness (PT) and optical thickness (OT), the tunability of the OPBG of each profile is shown to depend on the maximum/minimum refractive indices. With an increase in the value of the maximum refractive index, the structures with the same PT showed a linear increment of the OPBG, in contrast to the structures with the same OT, showing an optimal combination of refractive indices for each structure to generate the maximum OPBG. An experimental verification was carried out with a multilayered dielectric porous silicon structure for all the three profiles. Omnidirectional mirrors (dpeaa)DE-He213 Porous silicon (dpeaa)DE-He213 Multilayered mirrors (dpeaa)DE-He213 Dielectric mirrors (dpeaa)DE-He213 Gaggero-Sager, Luis Manuel verfasserin aut Agarwal, Vivechana verfasserin aut Enthalten in Nanoscale research letters New York, NY [u.a.] : Springer, 2006 7(2012), 1 vom: 13. Juli (DE-627)518632474 (DE-600)2253244-4 1556-276X nnns volume:7 year:2012 number:1 day:13 month:07 https://dx.doi.org/10.1186/1556-276X-7-391 kostenfrei Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_95 GBV_ILN_105 GBV_ILN_110 GBV_ILN_151 GBV_ILN_161 GBV_ILN_170 GBV_ILN_213 GBV_ILN_230 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_2014 GBV_ILN_2027 GBV_ILN_2055 GBV_ILN_4012 GBV_ILN_4037 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4249 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4335 GBV_ILN_4338 GBV_ILN_4367 GBV_ILN_4700 AR 7 2012 1 13 07
allfieldsGer	10.1186/1556-276X-7-391 doi (DE-627)SPR02171598X (SPR)1556-276X-7-391-e DE-627 ger DE-627 rakwb eng 600 ASE Ariza-Flores, Augusto David verfasserin aut Study of the omnidirectional photonic bandgap for dielectric mirrors based on porous silicon: effect of optical and physical thickness 2012 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Abstract We report the theoretical comparison of the omnidirectional photonic bandgap (OPBG) of one-dimensional dielectric photonic structures, using three different refractive index profiles: sinusoidal, Gaussian, and Bragg. For different values of physical thickness (PT) and optical thickness (OT), the tunability of the OPBG of each profile is shown to depend on the maximum/minimum refractive indices. With an increase in the value of the maximum refractive index, the structures with the same PT showed a linear increment of the OPBG, in contrast to the structures with the same OT, showing an optimal combination of refractive indices for each structure to generate the maximum OPBG. An experimental verification was carried out with a multilayered dielectric porous silicon structure for all the three profiles. Omnidirectional mirrors (dpeaa)DE-He213 Porous silicon (dpeaa)DE-He213 Multilayered mirrors (dpeaa)DE-He213 Dielectric mirrors (dpeaa)DE-He213 Gaggero-Sager, Luis Manuel verfasserin aut Agarwal, Vivechana verfasserin aut Enthalten in Nanoscale research letters New York, NY [u.a.] : Springer, 2006 7(2012), 1 vom: 13. Juli (DE-627)518632474 (DE-600)2253244-4 1556-276X nnns volume:7 year:2012 number:1 day:13 month:07 https://dx.doi.org/10.1186/1556-276X-7-391 kostenfrei Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_95 GBV_ILN_105 GBV_ILN_110 GBV_ILN_151 GBV_ILN_161 GBV_ILN_170 GBV_ILN_213 GBV_ILN_230 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_2014 GBV_ILN_2027 GBV_ILN_2055 GBV_ILN_4012 GBV_ILN_4037 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4249 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4335 GBV_ILN_4338 GBV_ILN_4367 GBV_ILN_4700 AR 7 2012 1 13 07
allfieldsSound	10.1186/1556-276X-7-391 doi (DE-627)SPR02171598X (SPR)1556-276X-7-391-e DE-627 ger DE-627 rakwb eng 600 ASE Ariza-Flores, Augusto David verfasserin aut Study of the omnidirectional photonic bandgap for dielectric mirrors based on porous silicon: effect of optical and physical thickness 2012 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Abstract We report the theoretical comparison of the omnidirectional photonic bandgap (OPBG) of one-dimensional dielectric photonic structures, using three different refractive index profiles: sinusoidal, Gaussian, and Bragg. For different values of physical thickness (PT) and optical thickness (OT), the tunability of the OPBG of each profile is shown to depend on the maximum/minimum refractive indices. With an increase in the value of the maximum refractive index, the structures with the same PT showed a linear increment of the OPBG, in contrast to the structures with the same OT, showing an optimal combination of refractive indices for each structure to generate the maximum OPBG. An experimental verification was carried out with a multilayered dielectric porous silicon structure for all the three profiles. Omnidirectional mirrors (dpeaa)DE-He213 Porous silicon (dpeaa)DE-He213 Multilayered mirrors (dpeaa)DE-He213 Dielectric mirrors (dpeaa)DE-He213 Gaggero-Sager, Luis Manuel verfasserin aut Agarwal, Vivechana verfasserin aut Enthalten in Nanoscale research letters New York, NY [u.a.] : Springer, 2006 7(2012), 1 vom: 13. Juli (DE-627)518632474 (DE-600)2253244-4 1556-276X nnns volume:7 year:2012 number:1 day:13 month:07 https://dx.doi.org/10.1186/1556-276X-7-391 kostenfrei Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_95 GBV_ILN_105 GBV_ILN_110 GBV_ILN_151 GBV_ILN_161 GBV_ILN_170 GBV_ILN_213 GBV_ILN_230 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_2014 GBV_ILN_2027 GBV_ILN_2055 GBV_ILN_4012 GBV_ILN_4037 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4249 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4335 GBV_ILN_4338 GBV_ILN_4367 GBV_ILN_4700 AR 7 2012 1 13 07
language	English
source	Enthalten in Nanoscale research letters 7(2012), 1 vom: 13. Juli volume:7 year:2012 number:1 day:13 month:07
sourceStr	Enthalten in Nanoscale research letters 7(2012), 1 vom: 13. Juli volume:7 year:2012 number:1 day:13 month:07
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institution	findex.gbv.de
topic_facet	Omnidirectional mirrors Porous silicon Multilayered mirrors Dielectric mirrors
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authorswithroles_txt_mv	Ariza-Flores, Augusto David @@aut@@ Gaggero-Sager, Luis Manuel @@aut@@ Agarwal, Vivechana @@aut@@
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author	Ariza-Flores, Augusto David
spellingShingle	Ariza-Flores, Augusto David ddc 600 misc Omnidirectional mirrors misc Porous silicon misc Multilayered mirrors misc Dielectric mirrors Study of the omnidirectional photonic bandgap for dielectric mirrors based on porous silicon: effect of optical and physical thickness
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topic_title	600 ASE Study of the omnidirectional photonic bandgap for dielectric mirrors based on porous silicon: effect of optical and physical thickness Omnidirectional mirrors (dpeaa)DE-He213 Porous silicon (dpeaa)DE-He213 Multilayered mirrors (dpeaa)DE-He213 Dielectric mirrors (dpeaa)DE-He213
topic	ddc 600 misc Omnidirectional mirrors misc Porous silicon misc Multilayered mirrors misc Dielectric mirrors
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title	Study of the omnidirectional photonic bandgap for dielectric mirrors based on porous silicon: effect of optical and physical thickness
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title_full	Study of the omnidirectional photonic bandgap for dielectric mirrors based on porous silicon: effect of optical and physical thickness
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title_sort	study of the omnidirectional photonic bandgap for dielectric mirrors based on porous silicon: effect of optical and physical thickness
title_auth	Study of the omnidirectional photonic bandgap for dielectric mirrors based on porous silicon: effect of optical and physical thickness
abstract	Abstract We report the theoretical comparison of the omnidirectional photonic bandgap (OPBG) of one-dimensional dielectric photonic structures, using three different refractive index profiles: sinusoidal, Gaussian, and Bragg. For different values of physical thickness (PT) and optical thickness (OT), the tunability of the OPBG of each profile is shown to depend on the maximum/minimum refractive indices. With an increase in the value of the maximum refractive index, the structures with the same PT showed a linear increment of the OPBG, in contrast to the structures with the same OT, showing an optimal combination of refractive indices for each structure to generate the maximum OPBG. An experimental verification was carried out with a multilayered dielectric porous silicon structure for all the three profiles.
abstractGer	Abstract We report the theoretical comparison of the omnidirectional photonic bandgap (OPBG) of one-dimensional dielectric photonic structures, using three different refractive index profiles: sinusoidal, Gaussian, and Bragg. For different values of physical thickness (PT) and optical thickness (OT), the tunability of the OPBG of each profile is shown to depend on the maximum/minimum refractive indices. With an increase in the value of the maximum refractive index, the structures with the same PT showed a linear increment of the OPBG, in contrast to the structures with the same OT, showing an optimal combination of refractive indices for each structure to generate the maximum OPBG. An experimental verification was carried out with a multilayered dielectric porous silicon structure for all the three profiles.
abstract_unstemmed	Abstract We report the theoretical comparison of the omnidirectional photonic bandgap (OPBG) of one-dimensional dielectric photonic structures, using three different refractive index profiles: sinusoidal, Gaussian, and Bragg. For different values of physical thickness (PT) and optical thickness (OT), the tunability of the OPBG of each profile is shown to depend on the maximum/minimum refractive indices. With an increase in the value of the maximum refractive index, the structures with the same PT showed a linear increment of the OPBG, in contrast to the structures with the same OT, showing an optimal combination of refractive indices for each structure to generate the maximum OPBG. An experimental verification was carried out with a multilayered dielectric porous silicon structure for all the three profiles.
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title_short	Study of the omnidirectional photonic bandgap for dielectric mirrors based on porous silicon: effect of optical and physical thickness
url	https://dx.doi.org/10.1186/1556-276X-7-391
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