Controlled nanodot fabrication by rippling polycarbonate surface using an AFM diamond tip

Abstract The single scratching test of polymer polycarbonate (PC) sample surface using an atomic force microscope (AFM) diamond tip for fabricating ripple patterns has been studied with the focus on the evaluation of the effect of the tip scratching angle on the pattern formation. The experimental r...
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Gespeichert in:

Autor*in:	Yan, Yongda [verfasserIn] Sun, Yang [verfasserIn] Li, Jiran [verfasserIn] Hu, Zhenjiang [verfasserIn] Zhao, Xuesen [verfasserIn]

Format:	E-Artikel
Sprache:	Englisch

Erschienen:	2014

Schlagwörter:	Atomic force microscope (AFM) Polycarbonate (PC) Scratching Ripples

Übergeordnetes Werk:	Enthalten in: Nanoscale research letters - New York, NY [u.a.] : Springer, 2006, 9(2014), 1 vom: 30. Juli
Übergeordnetes Werk:	volume:9 ; year:2014 ; number:1 ; day:30 ; month:07

Links:	Volltext

DOI / URN:	10.1186/1556-276X-9-372

Katalog-ID:	SPR021865086

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520			\|a Abstract The single scratching test of polymer polycarbonate (PC) sample surface using an atomic force microscope (AFM) diamond tip for fabricating ripple patterns has been studied with the focus on the evaluation of the effect of the tip scratching angle on the pattern formation. The experimental results indicated that the different oriented ripples can be easily machined by controlling the scratching angles of the AFM. And, the effects of the normal load and the feed on the ripples formation and their periods were also studied. Based on the ripple pattern formation, we firstly proposed a two-step scratching method to fabricate controllable and oriented complex three-dimensional (3D) nanodot arrays. These typical ripple formations can be described via a stick-slip and crack formation process.
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allfields	10.1186/1556-276X-9-372 doi (DE-627)SPR021865086 (SPR)1556-276X-9-372-e DE-627 ger DE-627 rakwb eng 600 ASE Yan, Yongda verfasserin aut Controlled nanodot fabrication by rippling polycarbonate surface using an AFM diamond tip 2014 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Abstract The single scratching test of polymer polycarbonate (PC) sample surface using an atomic force microscope (AFM) diamond tip for fabricating ripple patterns has been studied with the focus on the evaluation of the effect of the tip scratching angle on the pattern formation. The experimental results indicated that the different oriented ripples can be easily machined by controlling the scratching angles of the AFM. And, the effects of the normal load and the feed on the ripples formation and their periods were also studied. Based on the ripple pattern formation, we firstly proposed a two-step scratching method to fabricate controllable and oriented complex three-dimensional (3D) nanodot arrays. These typical ripple formations can be described via a stick-slip and crack formation process. Atomic force microscope (AFM) (dpeaa)DE-He213 Polycarbonate (PC) (dpeaa)DE-He213 Scratching (dpeaa)DE-He213 Ripples (dpeaa)DE-He213 Sun, Yang verfasserin aut Li, Jiran verfasserin aut Hu, Zhenjiang verfasserin aut Zhao, Xuesen verfasserin aut Enthalten in Nanoscale research letters New York, NY [u.a.] : Springer, 2006 9(2014), 1 vom: 30. Juli (DE-627)518632474 (DE-600)2253244-4 1556-276X nnns volume:9 year:2014 number:1 day:30 month:07 https://dx.doi.org/10.1186/1556-276X-9-372 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_95 GBV_ILN_105 GBV_ILN_110 GBV_ILN_151 GBV_ILN_161 GBV_ILN_170 GBV_ILN_213 GBV_ILN_230 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_2014 GBV_ILN_2027 GBV_ILN_2055 GBV_ILN_4012 GBV_ILN_4037 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4249 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4335 GBV_ILN_4338 GBV_ILN_4367 GBV_ILN_4700 AR 9 2014 1 30 07
spelling	10.1186/1556-276X-9-372 doi (DE-627)SPR021865086 (SPR)1556-276X-9-372-e DE-627 ger DE-627 rakwb eng 600 ASE Yan, Yongda verfasserin aut Controlled nanodot fabrication by rippling polycarbonate surface using an AFM diamond tip 2014 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Abstract The single scratching test of polymer polycarbonate (PC) sample surface using an atomic force microscope (AFM) diamond tip for fabricating ripple patterns has been studied with the focus on the evaluation of the effect of the tip scratching angle on the pattern formation. The experimental results indicated that the different oriented ripples can be easily machined by controlling the scratching angles of the AFM. And, the effects of the normal load and the feed on the ripples formation and their periods were also studied. Based on the ripple pattern formation, we firstly proposed a two-step scratching method to fabricate controllable and oriented complex three-dimensional (3D) nanodot arrays. These typical ripple formations can be described via a stick-slip and crack formation process. Atomic force microscope (AFM) (dpeaa)DE-He213 Polycarbonate (PC) (dpeaa)DE-He213 Scratching (dpeaa)DE-He213 Ripples (dpeaa)DE-He213 Sun, Yang verfasserin aut Li, Jiran verfasserin aut Hu, Zhenjiang verfasserin aut Zhao, Xuesen verfasserin aut Enthalten in Nanoscale research letters New York, NY [u.a.] : Springer, 2006 9(2014), 1 vom: 30. Juli (DE-627)518632474 (DE-600)2253244-4 1556-276X nnns volume:9 year:2014 number:1 day:30 month:07 https://dx.doi.org/10.1186/1556-276X-9-372 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_95 GBV_ILN_105 GBV_ILN_110 GBV_ILN_151 GBV_ILN_161 GBV_ILN_170 GBV_ILN_213 GBV_ILN_230 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_2014 GBV_ILN_2027 GBV_ILN_2055 GBV_ILN_4012 GBV_ILN_4037 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4249 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4335 GBV_ILN_4338 GBV_ILN_4367 GBV_ILN_4700 AR 9 2014 1 30 07
allfields_unstemmed	10.1186/1556-276X-9-372 doi (DE-627)SPR021865086 (SPR)1556-276X-9-372-e DE-627 ger DE-627 rakwb eng 600 ASE Yan, Yongda verfasserin aut Controlled nanodot fabrication by rippling polycarbonate surface using an AFM diamond tip 2014 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Abstract The single scratching test of polymer polycarbonate (PC) sample surface using an atomic force microscope (AFM) diamond tip for fabricating ripple patterns has been studied with the focus on the evaluation of the effect of the tip scratching angle on the pattern formation. The experimental results indicated that the different oriented ripples can be easily machined by controlling the scratching angles of the AFM. And, the effects of the normal load and the feed on the ripples formation and their periods were also studied. Based on the ripple pattern formation, we firstly proposed a two-step scratching method to fabricate controllable and oriented complex three-dimensional (3D) nanodot arrays. These typical ripple formations can be described via a stick-slip and crack formation process. Atomic force microscope (AFM) (dpeaa)DE-He213 Polycarbonate (PC) (dpeaa)DE-He213 Scratching (dpeaa)DE-He213 Ripples (dpeaa)DE-He213 Sun, Yang verfasserin aut Li, Jiran verfasserin aut Hu, Zhenjiang verfasserin aut Zhao, Xuesen verfasserin aut Enthalten in Nanoscale research letters New York, NY [u.a.] : Springer, 2006 9(2014), 1 vom: 30. Juli (DE-627)518632474 (DE-600)2253244-4 1556-276X nnns volume:9 year:2014 number:1 day:30 month:07 https://dx.doi.org/10.1186/1556-276X-9-372 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_95 GBV_ILN_105 GBV_ILN_110 GBV_ILN_151 GBV_ILN_161 GBV_ILN_170 GBV_ILN_213 GBV_ILN_230 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_2014 GBV_ILN_2027 GBV_ILN_2055 GBV_ILN_4012 GBV_ILN_4037 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4249 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4335 GBV_ILN_4338 GBV_ILN_4367 GBV_ILN_4700 AR 9 2014 1 30 07
allfieldsGer	10.1186/1556-276X-9-372 doi (DE-627)SPR021865086 (SPR)1556-276X-9-372-e DE-627 ger DE-627 rakwb eng 600 ASE Yan, Yongda verfasserin aut Controlled nanodot fabrication by rippling polycarbonate surface using an AFM diamond tip 2014 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Abstract The single scratching test of polymer polycarbonate (PC) sample surface using an atomic force microscope (AFM) diamond tip for fabricating ripple patterns has been studied with the focus on the evaluation of the effect of the tip scratching angle on the pattern formation. The experimental results indicated that the different oriented ripples can be easily machined by controlling the scratching angles of the AFM. And, the effects of the normal load and the feed on the ripples formation and their periods were also studied. Based on the ripple pattern formation, we firstly proposed a two-step scratching method to fabricate controllable and oriented complex three-dimensional (3D) nanodot arrays. These typical ripple formations can be described via a stick-slip and crack formation process. Atomic force microscope (AFM) (dpeaa)DE-He213 Polycarbonate (PC) (dpeaa)DE-He213 Scratching (dpeaa)DE-He213 Ripples (dpeaa)DE-He213 Sun, Yang verfasserin aut Li, Jiran verfasserin aut Hu, Zhenjiang verfasserin aut Zhao, Xuesen verfasserin aut Enthalten in Nanoscale research letters New York, NY [u.a.] : Springer, 2006 9(2014), 1 vom: 30. Juli (DE-627)518632474 (DE-600)2253244-4 1556-276X nnns volume:9 year:2014 number:1 day:30 month:07 https://dx.doi.org/10.1186/1556-276X-9-372 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_95 GBV_ILN_105 GBV_ILN_110 GBV_ILN_151 GBV_ILN_161 GBV_ILN_170 GBV_ILN_213 GBV_ILN_230 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_2014 GBV_ILN_2027 GBV_ILN_2055 GBV_ILN_4012 GBV_ILN_4037 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4249 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4335 GBV_ILN_4338 GBV_ILN_4367 GBV_ILN_4700 AR 9 2014 1 30 07
allfieldsSound	10.1186/1556-276X-9-372 doi (DE-627)SPR021865086 (SPR)1556-276X-9-372-e DE-627 ger DE-627 rakwb eng 600 ASE Yan, Yongda verfasserin aut Controlled nanodot fabrication by rippling polycarbonate surface using an AFM diamond tip 2014 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Abstract The single scratching test of polymer polycarbonate (PC) sample surface using an atomic force microscope (AFM) diamond tip for fabricating ripple patterns has been studied with the focus on the evaluation of the effect of the tip scratching angle on the pattern formation. The experimental results indicated that the different oriented ripples can be easily machined by controlling the scratching angles of the AFM. And, the effects of the normal load and the feed on the ripples formation and their periods were also studied. Based on the ripple pattern formation, we firstly proposed a two-step scratching method to fabricate controllable and oriented complex three-dimensional (3D) nanodot arrays. These typical ripple formations can be described via a stick-slip and crack formation process. Atomic force microscope (AFM) (dpeaa)DE-He213 Polycarbonate (PC) (dpeaa)DE-He213 Scratching (dpeaa)DE-He213 Ripples (dpeaa)DE-He213 Sun, Yang verfasserin aut Li, Jiran verfasserin aut Hu, Zhenjiang verfasserin aut Zhao, Xuesen verfasserin aut Enthalten in Nanoscale research letters New York, NY [u.a.] : Springer, 2006 9(2014), 1 vom: 30. Juli (DE-627)518632474 (DE-600)2253244-4 1556-276X nnns volume:9 year:2014 number:1 day:30 month:07 https://dx.doi.org/10.1186/1556-276X-9-372 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_95 GBV_ILN_105 GBV_ILN_110 GBV_ILN_151 GBV_ILN_161 GBV_ILN_170 GBV_ILN_213 GBV_ILN_230 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_2014 GBV_ILN_2027 GBV_ILN_2055 GBV_ILN_4012 GBV_ILN_4037 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4249 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4335 GBV_ILN_4338 GBV_ILN_4367 GBV_ILN_4700 AR 9 2014 1 30 07
language	English
source	Enthalten in Nanoscale research letters 9(2014), 1 vom: 30. Juli volume:9 year:2014 number:1 day:30 month:07
sourceStr	Enthalten in Nanoscale research letters 9(2014), 1 vom: 30. Juli volume:9 year:2014 number:1 day:30 month:07
format_phy_str_mv	Article
institution	findex.gbv.de
topic_facet	Atomic force microscope (AFM) Polycarbonate (PC) Scratching Ripples
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container_title	Nanoscale research letters
authorswithroles_txt_mv	Yan, Yongda @@aut@@ Sun, Yang @@aut@@ Li, Jiran @@aut@@ Hu, Zhenjiang @@aut@@ Zhao, Xuesen @@aut@@
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author	Yan, Yongda
spellingShingle	Yan, Yongda ddc 600 misc Atomic force microscope (AFM) misc Polycarbonate (PC) misc Scratching misc Ripples Controlled nanodot fabrication by rippling polycarbonate surface using an AFM diamond tip
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topic_title	600 ASE Controlled nanodot fabrication by rippling polycarbonate surface using an AFM diamond tip Atomic force microscope (AFM) (dpeaa)DE-He213 Polycarbonate (PC) (dpeaa)DE-He213 Scratching (dpeaa)DE-He213 Ripples (dpeaa)DE-He213
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topic_unstemmed	ddc 600 misc Atomic force microscope (AFM) misc Polycarbonate (PC) misc Scratching misc Ripples
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title	Controlled nanodot fabrication by rippling polycarbonate surface using an AFM diamond tip
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title_full	Controlled nanodot fabrication by rippling polycarbonate surface using an AFM diamond tip
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title_sort	controlled nanodot fabrication by rippling polycarbonate surface using an afm diamond tip
title_auth	Controlled nanodot fabrication by rippling polycarbonate surface using an AFM diamond tip
abstract	Abstract The single scratching test of polymer polycarbonate (PC) sample surface using an atomic force microscope (AFM) diamond tip for fabricating ripple patterns has been studied with the focus on the evaluation of the effect of the tip scratching angle on the pattern formation. The experimental results indicated that the different oriented ripples can be easily machined by controlling the scratching angles of the AFM. And, the effects of the normal load and the feed on the ripples formation and their periods were also studied. Based on the ripple pattern formation, we firstly proposed a two-step scratching method to fabricate controllable and oriented complex three-dimensional (3D) nanodot arrays. These typical ripple formations can be described via a stick-slip and crack formation process.
abstractGer	Abstract The single scratching test of polymer polycarbonate (PC) sample surface using an atomic force microscope (AFM) diamond tip for fabricating ripple patterns has been studied with the focus on the evaluation of the effect of the tip scratching angle on the pattern formation. The experimental results indicated that the different oriented ripples can be easily machined by controlling the scratching angles of the AFM. And, the effects of the normal load and the feed on the ripples formation and their periods were also studied. Based on the ripple pattern formation, we firstly proposed a two-step scratching method to fabricate controllable and oriented complex three-dimensional (3D) nanodot arrays. These typical ripple formations can be described via a stick-slip and crack formation process.
abstract_unstemmed	Abstract The single scratching test of polymer polycarbonate (PC) sample surface using an atomic force microscope (AFM) diamond tip for fabricating ripple patterns has been studied with the focus on the evaluation of the effect of the tip scratching angle on the pattern formation. The experimental results indicated that the different oriented ripples can be easily machined by controlling the scratching angles of the AFM. And, the effects of the normal load and the feed on the ripples formation and their periods were also studied. Based on the ripple pattern formation, we firstly proposed a two-step scratching method to fabricate controllable and oriented complex three-dimensional (3D) nanodot arrays. These typical ripple formations can be described via a stick-slip and crack formation process.
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title_short	Controlled nanodot fabrication by rippling polycarbonate surface using an AFM diamond tip
url	https://dx.doi.org/10.1186/1556-276X-9-372
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author2	Sun, Yang Li, Jiran Hu, Zhenjiang Zhao, Xuesen
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Controlled nanodot fabrication by rippling polycarbonate surface using an AFM diamond tip

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