Studying the Adhesion Force and Glass Transition of Thin Polystyrene Films by Atomic Force Microscopy

Abstract The relaxation behaviors of thin polymer films show a strong dependence on temperature and film thickness. Direct quantitative detection of the relaxation behaviors of thin polymer films at nanometer scale by traditional instruments is however challenging. In this study, we employed atomic...
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Gespeichert in:

Autor*in:	Kang, Hua [verfasserIn] Qian, Xiaoqin [verfasserIn] Guan, Li [verfasserIn] Zhang, Meining [verfasserIn] Li, Qiang [verfasserIn] Wu, Aoli [verfasserIn] Dong, Mingdong [verfasserIn]

Format:	E-Artikel
Sprache:	Englisch

Erschienen:	2018

Schlagwörter:	Adhesion Force Glass Transition Temperature Polystyrene Atomic Force Microscope (AFM); Force Distance Curves

Übergeordnetes Werk:	Enthalten in: Nanoscale research letters - New York, NY [u.a.] : Springer, 2006, 13(2018), 1 vom: 09. Jan.
Übergeordnetes Werk:	volume:13 ; year:2018 ; number:1 ; day:09 ; month:01

Links:	Volltext

DOI / URN:	10.1186/s11671-017-2426-9

Katalog-ID:	SPR022064982

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520			\|a Abstract The relaxation behaviors of thin polymer films show a strong dependence on temperature and film thickness. Direct quantitative detection of the relaxation behaviors of thin polymer films at nanometer scale by traditional instruments is however challenging. In this study, we employed atomic force microscopy (AFM)-based force-distance curve to study the relaxation dynamics and the film thickness dependence of glass transition temperature (Tg) for normal thin polystyrene (PS) films supported on silicon substrate. The adhesion force (Fad) between AFM tip and normal thin PS film surfaces was quantitatively detected in situ under the variation of temperature and film thickness. The Tg of normal thin PS film was successfully obtained by the abrupt variation of Fad under temperature stimulation. Our result showed that the Tg of normal thin PS films decreased with the decreasing film thickness. The study here could be beneficial for understanding the relaxation dynamics of normal thin polymer films.
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allfields	10.1186/s11671-017-2426-9 doi (DE-627)SPR022064982 (SPR)s11671-017-2426-9-e DE-627 ger DE-627 rakwb eng 600 ASE Kang, Hua verfasserin aut Studying the Adhesion Force and Glass Transition of Thin Polystyrene Films by Atomic Force Microscopy 2018 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Abstract The relaxation behaviors of thin polymer films show a strong dependence on temperature and film thickness. Direct quantitative detection of the relaxation behaviors of thin polymer films at nanometer scale by traditional instruments is however challenging. In this study, we employed atomic force microscopy (AFM)-based force-distance curve to study the relaxation dynamics and the film thickness dependence of glass transition temperature (Tg) for normal thin polystyrene (PS) films supported on silicon substrate. The adhesion force (Fad) between AFM tip and normal thin PS film surfaces was quantitatively detected in situ under the variation of temperature and film thickness. The Tg of normal thin PS film was successfully obtained by the abrupt variation of Fad under temperature stimulation. Our result showed that the Tg of normal thin PS films decreased with the decreasing film thickness. The study here could be beneficial for understanding the relaxation dynamics of normal thin polymer films. Adhesion Force (dpeaa)DE-He213 Glass Transition Temperature (dpeaa)DE-He213 Polystyrene (dpeaa)DE-He213 Atomic Force Microscope (AFM); Force Distance Curves (dpeaa)DE-He213 Qian, Xiaoqin verfasserin aut Guan, Li verfasserin aut Zhang, Meining verfasserin aut Li, Qiang verfasserin aut Wu, Aoli verfasserin aut Dong, Mingdong verfasserin aut Enthalten in Nanoscale research letters New York, NY [u.a.] : Springer, 2006 13(2018), 1 vom: 09. Jan. (DE-627)518632474 (DE-600)2253244-4 1556-276X nnns volume:13 year:2018 number:1 day:09 month:01 https://dx.doi.org/10.1186/s11671-017-2426-9 kostenfrei Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_95 GBV_ILN_105 GBV_ILN_110 GBV_ILN_151 GBV_ILN_161 GBV_ILN_170 GBV_ILN_213 GBV_ILN_230 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_2014 GBV_ILN_2027 GBV_ILN_2055 GBV_ILN_4012 GBV_ILN_4037 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4249 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4335 GBV_ILN_4338 GBV_ILN_4367 GBV_ILN_4700 AR 13 2018 1 09 01
spelling	10.1186/s11671-017-2426-9 doi (DE-627)SPR022064982 (SPR)s11671-017-2426-9-e DE-627 ger DE-627 rakwb eng 600 ASE Kang, Hua verfasserin aut Studying the Adhesion Force and Glass Transition of Thin Polystyrene Films by Atomic Force Microscopy 2018 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Abstract The relaxation behaviors of thin polymer films show a strong dependence on temperature and film thickness. Direct quantitative detection of the relaxation behaviors of thin polymer films at nanometer scale by traditional instruments is however challenging. In this study, we employed atomic force microscopy (AFM)-based force-distance curve to study the relaxation dynamics and the film thickness dependence of glass transition temperature (Tg) for normal thin polystyrene (PS) films supported on silicon substrate. The adhesion force (Fad) between AFM tip and normal thin PS film surfaces was quantitatively detected in situ under the variation of temperature and film thickness. The Tg of normal thin PS film was successfully obtained by the abrupt variation of Fad under temperature stimulation. Our result showed that the Tg of normal thin PS films decreased with the decreasing film thickness. The study here could be beneficial for understanding the relaxation dynamics of normal thin polymer films. Adhesion Force (dpeaa)DE-He213 Glass Transition Temperature (dpeaa)DE-He213 Polystyrene (dpeaa)DE-He213 Atomic Force Microscope (AFM); Force Distance Curves (dpeaa)DE-He213 Qian, Xiaoqin verfasserin aut Guan, Li verfasserin aut Zhang, Meining verfasserin aut Li, Qiang verfasserin aut Wu, Aoli verfasserin aut Dong, Mingdong verfasserin aut Enthalten in Nanoscale research letters New York, NY [u.a.] : Springer, 2006 13(2018), 1 vom: 09. Jan. (DE-627)518632474 (DE-600)2253244-4 1556-276X nnns volume:13 year:2018 number:1 day:09 month:01 https://dx.doi.org/10.1186/s11671-017-2426-9 kostenfrei Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_95 GBV_ILN_105 GBV_ILN_110 GBV_ILN_151 GBV_ILN_161 GBV_ILN_170 GBV_ILN_213 GBV_ILN_230 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_2014 GBV_ILN_2027 GBV_ILN_2055 GBV_ILN_4012 GBV_ILN_4037 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4249 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4335 GBV_ILN_4338 GBV_ILN_4367 GBV_ILN_4700 AR 13 2018 1 09 01
allfields_unstemmed	10.1186/s11671-017-2426-9 doi (DE-627)SPR022064982 (SPR)s11671-017-2426-9-e DE-627 ger DE-627 rakwb eng 600 ASE Kang, Hua verfasserin aut Studying the Adhesion Force and Glass Transition of Thin Polystyrene Films by Atomic Force Microscopy 2018 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Abstract The relaxation behaviors of thin polymer films show a strong dependence on temperature and film thickness. Direct quantitative detection of the relaxation behaviors of thin polymer films at nanometer scale by traditional instruments is however challenging. In this study, we employed atomic force microscopy (AFM)-based force-distance curve to study the relaxation dynamics and the film thickness dependence of glass transition temperature (Tg) for normal thin polystyrene (PS) films supported on silicon substrate. The adhesion force (Fad) between AFM tip and normal thin PS film surfaces was quantitatively detected in situ under the variation of temperature and film thickness. The Tg of normal thin PS film was successfully obtained by the abrupt variation of Fad under temperature stimulation. Our result showed that the Tg of normal thin PS films decreased with the decreasing film thickness. The study here could be beneficial for understanding the relaxation dynamics of normal thin polymer films. Adhesion Force (dpeaa)DE-He213 Glass Transition Temperature (dpeaa)DE-He213 Polystyrene (dpeaa)DE-He213 Atomic Force Microscope (AFM); Force Distance Curves (dpeaa)DE-He213 Qian, Xiaoqin verfasserin aut Guan, Li verfasserin aut Zhang, Meining verfasserin aut Li, Qiang verfasserin aut Wu, Aoli verfasserin aut Dong, Mingdong verfasserin aut Enthalten in Nanoscale research letters New York, NY [u.a.] : Springer, 2006 13(2018), 1 vom: 09. Jan. (DE-627)518632474 (DE-600)2253244-4 1556-276X nnns volume:13 year:2018 number:1 day:09 month:01 https://dx.doi.org/10.1186/s11671-017-2426-9 kostenfrei Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_95 GBV_ILN_105 GBV_ILN_110 GBV_ILN_151 GBV_ILN_161 GBV_ILN_170 GBV_ILN_213 GBV_ILN_230 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_2014 GBV_ILN_2027 GBV_ILN_2055 GBV_ILN_4012 GBV_ILN_4037 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4249 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4335 GBV_ILN_4338 GBV_ILN_4367 GBV_ILN_4700 AR 13 2018 1 09 01
allfieldsGer	10.1186/s11671-017-2426-9 doi (DE-627)SPR022064982 (SPR)s11671-017-2426-9-e DE-627 ger DE-627 rakwb eng 600 ASE Kang, Hua verfasserin aut Studying the Adhesion Force and Glass Transition of Thin Polystyrene Films by Atomic Force Microscopy 2018 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Abstract The relaxation behaviors of thin polymer films show a strong dependence on temperature and film thickness. Direct quantitative detection of the relaxation behaviors of thin polymer films at nanometer scale by traditional instruments is however challenging. In this study, we employed atomic force microscopy (AFM)-based force-distance curve to study the relaxation dynamics and the film thickness dependence of glass transition temperature (Tg) for normal thin polystyrene (PS) films supported on silicon substrate. The adhesion force (Fad) between AFM tip and normal thin PS film surfaces was quantitatively detected in situ under the variation of temperature and film thickness. The Tg of normal thin PS film was successfully obtained by the abrupt variation of Fad under temperature stimulation. Our result showed that the Tg of normal thin PS films decreased with the decreasing film thickness. The study here could be beneficial for understanding the relaxation dynamics of normal thin polymer films. Adhesion Force (dpeaa)DE-He213 Glass Transition Temperature (dpeaa)DE-He213 Polystyrene (dpeaa)DE-He213 Atomic Force Microscope (AFM); Force Distance Curves (dpeaa)DE-He213 Qian, Xiaoqin verfasserin aut Guan, Li verfasserin aut Zhang, Meining verfasserin aut Li, Qiang verfasserin aut Wu, Aoli verfasserin aut Dong, Mingdong verfasserin aut Enthalten in Nanoscale research letters New York, NY [u.a.] : Springer, 2006 13(2018), 1 vom: 09. Jan. (DE-627)518632474 (DE-600)2253244-4 1556-276X nnns volume:13 year:2018 number:1 day:09 month:01 https://dx.doi.org/10.1186/s11671-017-2426-9 kostenfrei Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_95 GBV_ILN_105 GBV_ILN_110 GBV_ILN_151 GBV_ILN_161 GBV_ILN_170 GBV_ILN_213 GBV_ILN_230 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_2014 GBV_ILN_2027 GBV_ILN_2055 GBV_ILN_4012 GBV_ILN_4037 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4249 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4335 GBV_ILN_4338 GBV_ILN_4367 GBV_ILN_4700 AR 13 2018 1 09 01
allfieldsSound	10.1186/s11671-017-2426-9 doi (DE-627)SPR022064982 (SPR)s11671-017-2426-9-e DE-627 ger DE-627 rakwb eng 600 ASE Kang, Hua verfasserin aut Studying the Adhesion Force and Glass Transition of Thin Polystyrene Films by Atomic Force Microscopy 2018 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Abstract The relaxation behaviors of thin polymer films show a strong dependence on temperature and film thickness. Direct quantitative detection of the relaxation behaviors of thin polymer films at nanometer scale by traditional instruments is however challenging. In this study, we employed atomic force microscopy (AFM)-based force-distance curve to study the relaxation dynamics and the film thickness dependence of glass transition temperature (Tg) for normal thin polystyrene (PS) films supported on silicon substrate. The adhesion force (Fad) between AFM tip and normal thin PS film surfaces was quantitatively detected in situ under the variation of temperature and film thickness. The Tg of normal thin PS film was successfully obtained by the abrupt variation of Fad under temperature stimulation. Our result showed that the Tg of normal thin PS films decreased with the decreasing film thickness. The study here could be beneficial for understanding the relaxation dynamics of normal thin polymer films. Adhesion Force (dpeaa)DE-He213 Glass Transition Temperature (dpeaa)DE-He213 Polystyrene (dpeaa)DE-He213 Atomic Force Microscope (AFM); Force Distance Curves (dpeaa)DE-He213 Qian, Xiaoqin verfasserin aut Guan, Li verfasserin aut Zhang, Meining verfasserin aut Li, Qiang verfasserin aut Wu, Aoli verfasserin aut Dong, Mingdong verfasserin aut Enthalten in Nanoscale research letters New York, NY [u.a.] : Springer, 2006 13(2018), 1 vom: 09. Jan. (DE-627)518632474 (DE-600)2253244-4 1556-276X nnns volume:13 year:2018 number:1 day:09 month:01 https://dx.doi.org/10.1186/s11671-017-2426-9 kostenfrei Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_95 GBV_ILN_105 GBV_ILN_110 GBV_ILN_151 GBV_ILN_161 GBV_ILN_170 GBV_ILN_213 GBV_ILN_230 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_2014 GBV_ILN_2027 GBV_ILN_2055 GBV_ILN_4012 GBV_ILN_4037 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4249 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4335 GBV_ILN_4338 GBV_ILN_4367 GBV_ILN_4700 AR 13 2018 1 09 01
language	English
source	Enthalten in Nanoscale research letters 13(2018), 1 vom: 09. Jan. volume:13 year:2018 number:1 day:09 month:01
sourceStr	Enthalten in Nanoscale research letters 13(2018), 1 vom: 09. Jan. volume:13 year:2018 number:1 day:09 month:01
format_phy_str_mv	Article
institution	findex.gbv.de
topic_facet	Adhesion Force Glass Transition Temperature Polystyrene Atomic Force Microscope (AFM); Force Distance Curves
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container_title	Nanoscale research letters
authorswithroles_txt_mv	Kang, Hua @@aut@@ Qian, Xiaoqin @@aut@@ Guan, Li @@aut@@ Zhang, Meining @@aut@@ Li, Qiang @@aut@@ Wu, Aoli @@aut@@ Dong, Mingdong @@aut@@
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author	Kang, Hua
spellingShingle	Kang, Hua ddc 600 misc Adhesion Force misc Glass Transition Temperature misc Polystyrene misc Atomic Force Microscope (AFM); Force Distance Curves Studying the Adhesion Force and Glass Transition of Thin Polystyrene Films by Atomic Force Microscopy
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topic_title	600 ASE Studying the Adhesion Force and Glass Transition of Thin Polystyrene Films by Atomic Force Microscopy Adhesion Force (dpeaa)DE-He213 Glass Transition Temperature (dpeaa)DE-He213 Polystyrene (dpeaa)DE-He213 Atomic Force Microscope (AFM); Force Distance Curves (dpeaa)DE-He213
topic	ddc 600 misc Adhesion Force misc Glass Transition Temperature misc Polystyrene misc Atomic Force Microscope (AFM); Force Distance Curves
topic_unstemmed	ddc 600 misc Adhesion Force misc Glass Transition Temperature misc Polystyrene misc Atomic Force Microscope (AFM); Force Distance Curves
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title	Studying the Adhesion Force and Glass Transition of Thin Polystyrene Films by Atomic Force Microscopy
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title_full	Studying the Adhesion Force and Glass Transition of Thin Polystyrene Films by Atomic Force Microscopy
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title_sort	studying the adhesion force and glass transition of thin polystyrene films by atomic force microscopy
title_auth	Studying the Adhesion Force and Glass Transition of Thin Polystyrene Films by Atomic Force Microscopy
abstract	Abstract The relaxation behaviors of thin polymer films show a strong dependence on temperature and film thickness. Direct quantitative detection of the relaxation behaviors of thin polymer films at nanometer scale by traditional instruments is however challenging. In this study, we employed atomic force microscopy (AFM)-based force-distance curve to study the relaxation dynamics and the film thickness dependence of glass transition temperature (Tg) for normal thin polystyrene (PS) films supported on silicon substrate. The adhesion force (Fad) between AFM tip and normal thin PS film surfaces was quantitatively detected in situ under the variation of temperature and film thickness. The Tg of normal thin PS film was successfully obtained by the abrupt variation of Fad under temperature stimulation. Our result showed that the Tg of normal thin PS films decreased with the decreasing film thickness. The study here could be beneficial for understanding the relaxation dynamics of normal thin polymer films.
abstractGer	Abstract The relaxation behaviors of thin polymer films show a strong dependence on temperature and film thickness. Direct quantitative detection of the relaxation behaviors of thin polymer films at nanometer scale by traditional instruments is however challenging. In this study, we employed atomic force microscopy (AFM)-based force-distance curve to study the relaxation dynamics and the film thickness dependence of glass transition temperature (Tg) for normal thin polystyrene (PS) films supported on silicon substrate. The adhesion force (Fad) between AFM tip and normal thin PS film surfaces was quantitatively detected in situ under the variation of temperature and film thickness. The Tg of normal thin PS film was successfully obtained by the abrupt variation of Fad under temperature stimulation. Our result showed that the Tg of normal thin PS films decreased with the decreasing film thickness. The study here could be beneficial for understanding the relaxation dynamics of normal thin polymer films.
abstract_unstemmed	Abstract The relaxation behaviors of thin polymer films show a strong dependence on temperature and film thickness. Direct quantitative detection of the relaxation behaviors of thin polymer films at nanometer scale by traditional instruments is however challenging. In this study, we employed atomic force microscopy (AFM)-based force-distance curve to study the relaxation dynamics and the film thickness dependence of glass transition temperature (Tg) for normal thin polystyrene (PS) films supported on silicon substrate. The adhesion force (Fad) between AFM tip and normal thin PS film surfaces was quantitatively detected in situ under the variation of temperature and film thickness. The Tg of normal thin PS film was successfully obtained by the abrupt variation of Fad under temperature stimulation. Our result showed that the Tg of normal thin PS films decreased with the decreasing film thickness. The study here could be beneficial for understanding the relaxation dynamics of normal thin polymer films.
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title_short	Studying the Adhesion Force and Glass Transition of Thin Polystyrene Films by Atomic Force Microscopy
url	https://dx.doi.org/10.1186/s11671-017-2426-9
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author2	Qian, Xiaoqin Guan, Li Zhang, Meining Li, Qiang Wu, Aoli Dong, Mingdong
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Studying the Adhesion Force and Glass Transition of Thin Polystyrene Films by Atomic Force Microscopy

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