Multiwall carbon nanotube tips for scanning probe microscopy

Abstract In this work, multiwall carbon nanotube tips, which are assembled on the apexes of nichrome wires and AFM cantilevers, were tested. The fabricated probes exhibited high image resolution, namely, 2–6 nm in the sample plane and 2–3 Å in the vertical direction. It was shown that extreme force...
Ausführliche Beschreibung

Gespeichert in:
Autor*in:

Demicheva, O. V. [verfasserIn]

Meshkov, G. B.

Sinitsyna, O. V.

Tomishko, A. G.

Yaminsky, I. V.

Format:

E-Artikel

Sprache:

Englisch

Erschienen:

2008

Schlagwörter:

Atom Force Microscope

Atom Force Microscope Image

Platinum Particle

Atom Force Microscope Probe

Atom Force Microscope Cantilever

Anmerkung:

© Pleiades Publishing, Ltd. 2008

Übergeordnetes Werk:

Enthalten in: Nanotechnologies in Russia - [Moskau] : Pleiades Publishing, 2008, 3(2008), 11-12 vom: Dez., Seite 704-709

Übergeordnetes Werk:

volume:3 ; year:2008 ; number:11-12 ; month:12 ; pages:704-709

Links:

Volltext

DOI / URN:

10.1134/S1995078008110062

Katalog-ID:

SPR025213474

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