Correlation Between 3-D Surface Topography and Different Deposition Times of Engineered Nia-C:H Thin Films

Abstract This study is aimed at analyzing the surface micromorphology of amorphous hydrogenated carbon layers containing nickel nanoparticles (Ni-NPsa-C:H) within their structure, which were sputtered by co-deposition of RF-Sputtering and RF-PECVD method from acetylene gas and nickel target on glass...
Ausführliche Beschreibung

Gespeichert in:
Autor*in:

Konsek, Dominika [verfasserIn]

Stach, Sebastian

Ţălu, Ştefan

Naderi, Sirvan

Arman, Ali

Format:

E-Artikel

Sprache:

Englisch

Erschienen:

2018

Schlagwörter:

Ni-NPs@a-C:H thin films

Fractal analysis

Three-dimensional surface micromorphology

Anmerkung:

© Springer Science+Business Media B.V., part of Springer Nature 2018

Übergeordnetes Werk:

Enthalten in: Silicon - Dordrecht : Springer Netherlands, 2009, 10(2018), 5 vom: 20. Juli, Seite 2141-2151

Übergeordnetes Werk:

volume:10 ; year:2018 ; number:5 ; day:20 ; month:07 ; pages:2141-2151

Links:

Volltext

DOI / URN:

10.1007/s12633-017-9743-6

Katalog-ID:

SPR026495570

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