Gate Driver for SiC Power MOSFETs Using Soft-Switching Technique
Abstract In this paper, gate drive IC for SiC power MOSFETs using soft-switching technique gate drive method is designed and implemented. Designed IC is suitable for driving silicon carbide (SiC) power MOSFET. The gate drive IC using soft-switching gate drive method, which is composed of high side a...
Ausführliche Beschreibung
Gespeichert in:
| Autor*in: |
Kim, Kihyun [verfasserIn] |
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| Format: |
E-Artikel |
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| Sprache: |
Englisch |
| Erschienen: |
2019 |
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| Schlagwörter: |
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| Anmerkung: |
© The Korean Institute of Electrical Engineers 2019 |
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| Übergeordnetes Werk: |
Enthalten in: Journal of electrical engineering & technology - [Singapore] : Springer Singapore, 2006, 14(2019), 3 vom: 18. Feb., Seite 1311-1319 |
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| Übergeordnetes Werk: |
volume:14 ; year:2019 ; number:3 ; day:18 ; month:02 ; pages:1311-1319 |
| Links: |
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| DOI / URN: |
10.1007/s42835-019-00117-w |
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| Katalog-ID: |
SPR03869168X |
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| 100 | 1 | |a Kim, Kihyun |e verfasserin |4 aut | |
| 245 | 1 | 0 | |a Gate Driver for SiC Power MOSFETs Using Soft-Switching Technique |
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| 520 | |a Abstract In this paper, gate drive IC for SiC power MOSFETs using soft-switching technique gate drive method is designed and implemented. Designed IC is suitable for driving silicon carbide (SiC) power MOSFET. The gate drive IC using soft-switching gate drive method, which is composed of high side and low side soft-switching controller, reduce the overshoot and switching loss of the SiC power MOSFET during the turn-on period effectively. The gate drive IC using soft-switching gate drive method reduces the switching loss by 14% without increasing the overshoot magnitude. To verify the electrical characteristics of the designed IC, simulations and experiments were performed. | ||
| 650 | 4 | |a Gate drive IC |7 (dpeaa)DE-He213 | |
| 650 | 4 | |a Soft-switching |7 (dpeaa)DE-He213 | |
| 650 | 4 | |a Switching loss |7 (dpeaa)DE-He213 | |
| 650 | 4 | |a SiC power MOSFET |7 (dpeaa)DE-He213 | |
| 700 | 1 | |a Kim, Hyoung-Woo |4 aut | |
| 700 | 1 | |a Lee, Kyoungho |4 aut | |
| 700 | 1 | |a Park, Jusung |4 aut | |
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| 856 | 4 | 0 | |u https://dx.doi.org/10.1007/s42835-019-00117-w |z lizenzpflichtig |3 Volltext |
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10.1007/s42835-019-00117-w doi (DE-627)SPR03869168X (SPR)s42835-019-00117-w-e DE-627 ger DE-627 rakwb eng Kim, Kihyun verfasserin aut Gate Driver for SiC Power MOSFETs Using Soft-Switching Technique 2019 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier © The Korean Institute of Electrical Engineers 2019 Abstract In this paper, gate drive IC for SiC power MOSFETs using soft-switching technique gate drive method is designed and implemented. Designed IC is suitable for driving silicon carbide (SiC) power MOSFET. The gate drive IC using soft-switching gate drive method, which is composed of high side and low side soft-switching controller, reduce the overshoot and switching loss of the SiC power MOSFET during the turn-on period effectively. The gate drive IC using soft-switching gate drive method reduces the switching loss by 14% without increasing the overshoot magnitude. To verify the electrical characteristics of the designed IC, simulations and experiments were performed. Gate drive IC (dpeaa)DE-He213 Soft-switching (dpeaa)DE-He213 Switching loss (dpeaa)DE-He213 SiC power MOSFET (dpeaa)DE-He213 Kim, Hyoung-Woo aut Lee, Kyoungho aut Park, Jusung aut Enthalten in Journal of electrical engineering & technology [Singapore] : Springer Singapore, 2006 14(2019), 3 vom: 18. Feb., Seite 1311-1319 (DE-627)519202015 (DE-600)2255142-6 2093-7423 nnns volume:14 year:2019 number:3 day:18 month:02 pages:1311-1319 https://dx.doi.org/10.1007/s42835-019-00117-w lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_105 GBV_ILN_110 GBV_ILN_138 GBV_ILN_150 GBV_ILN_151 GBV_ILN_161 GBV_ILN_170 GBV_ILN_171 GBV_ILN_187 GBV_ILN_213 GBV_ILN_224 GBV_ILN_230 GBV_ILN_250 GBV_ILN_281 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_636 GBV_ILN_702 GBV_ILN_2001 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2006 GBV_ILN_2007 GBV_ILN_2008 GBV_ILN_2009 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2026 GBV_ILN_2027 GBV_ILN_2031 GBV_ILN_2034 GBV_ILN_2037 GBV_ILN_2038 GBV_ILN_2039 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2055 GBV_ILN_2057 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2088 GBV_ILN_2093 GBV_ILN_2106 GBV_ILN_2107 GBV_ILN_2108 GBV_ILN_2110 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2118 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2144 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2188 GBV_ILN_2190 GBV_ILN_2232 GBV_ILN_2336 GBV_ILN_2446 GBV_ILN_2470 GBV_ILN_2472 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_2548 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4046 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4242 GBV_ILN_4246 GBV_ILN_4249 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4336 GBV_ILN_4338 GBV_ILN_4393 GBV_ILN_4700 AR 14 2019 3 18 02 1311-1319 |
| spelling |
10.1007/s42835-019-00117-w doi (DE-627)SPR03869168X (SPR)s42835-019-00117-w-e DE-627 ger DE-627 rakwb eng Kim, Kihyun verfasserin aut Gate Driver for SiC Power MOSFETs Using Soft-Switching Technique 2019 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier © The Korean Institute of Electrical Engineers 2019 Abstract In this paper, gate drive IC for SiC power MOSFETs using soft-switching technique gate drive method is designed and implemented. Designed IC is suitable for driving silicon carbide (SiC) power MOSFET. The gate drive IC using soft-switching gate drive method, which is composed of high side and low side soft-switching controller, reduce the overshoot and switching loss of the SiC power MOSFET during the turn-on period effectively. The gate drive IC using soft-switching gate drive method reduces the switching loss by 14% without increasing the overshoot magnitude. To verify the electrical characteristics of the designed IC, simulations and experiments were performed. Gate drive IC (dpeaa)DE-He213 Soft-switching (dpeaa)DE-He213 Switching loss (dpeaa)DE-He213 SiC power MOSFET (dpeaa)DE-He213 Kim, Hyoung-Woo aut Lee, Kyoungho aut Park, Jusung aut Enthalten in Journal of electrical engineering & technology [Singapore] : Springer Singapore, 2006 14(2019), 3 vom: 18. Feb., Seite 1311-1319 (DE-627)519202015 (DE-600)2255142-6 2093-7423 nnns volume:14 year:2019 number:3 day:18 month:02 pages:1311-1319 https://dx.doi.org/10.1007/s42835-019-00117-w lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_105 GBV_ILN_110 GBV_ILN_138 GBV_ILN_150 GBV_ILN_151 GBV_ILN_161 GBV_ILN_170 GBV_ILN_171 GBV_ILN_187 GBV_ILN_213 GBV_ILN_224 GBV_ILN_230 GBV_ILN_250 GBV_ILN_281 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_636 GBV_ILN_702 GBV_ILN_2001 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2006 GBV_ILN_2007 GBV_ILN_2008 GBV_ILN_2009 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2026 GBV_ILN_2027 GBV_ILN_2031 GBV_ILN_2034 GBV_ILN_2037 GBV_ILN_2038 GBV_ILN_2039 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2055 GBV_ILN_2057 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2088 GBV_ILN_2093 GBV_ILN_2106 GBV_ILN_2107 GBV_ILN_2108 GBV_ILN_2110 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2118 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2144 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2188 GBV_ILN_2190 GBV_ILN_2232 GBV_ILN_2336 GBV_ILN_2446 GBV_ILN_2470 GBV_ILN_2472 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_2548 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4046 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4242 GBV_ILN_4246 GBV_ILN_4249 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4336 GBV_ILN_4338 GBV_ILN_4393 GBV_ILN_4700 AR 14 2019 3 18 02 1311-1319 |
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10.1007/s42835-019-00117-w doi (DE-627)SPR03869168X (SPR)s42835-019-00117-w-e DE-627 ger DE-627 rakwb eng Kim, Kihyun verfasserin aut Gate Driver for SiC Power MOSFETs Using Soft-Switching Technique 2019 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier © The Korean Institute of Electrical Engineers 2019 Abstract In this paper, gate drive IC for SiC power MOSFETs using soft-switching technique gate drive method is designed and implemented. Designed IC is suitable for driving silicon carbide (SiC) power MOSFET. The gate drive IC using soft-switching gate drive method, which is composed of high side and low side soft-switching controller, reduce the overshoot and switching loss of the SiC power MOSFET during the turn-on period effectively. The gate drive IC using soft-switching gate drive method reduces the switching loss by 14% without increasing the overshoot magnitude. To verify the electrical characteristics of the designed IC, simulations and experiments were performed. Gate drive IC (dpeaa)DE-He213 Soft-switching (dpeaa)DE-He213 Switching loss (dpeaa)DE-He213 SiC power MOSFET (dpeaa)DE-He213 Kim, Hyoung-Woo aut Lee, Kyoungho aut Park, Jusung aut Enthalten in Journal of electrical engineering & technology [Singapore] : Springer Singapore, 2006 14(2019), 3 vom: 18. Feb., Seite 1311-1319 (DE-627)519202015 (DE-600)2255142-6 2093-7423 nnns volume:14 year:2019 number:3 day:18 month:02 pages:1311-1319 https://dx.doi.org/10.1007/s42835-019-00117-w lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_105 GBV_ILN_110 GBV_ILN_138 GBV_ILN_150 GBV_ILN_151 GBV_ILN_161 GBV_ILN_170 GBV_ILN_171 GBV_ILN_187 GBV_ILN_213 GBV_ILN_224 GBV_ILN_230 GBV_ILN_250 GBV_ILN_281 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_636 GBV_ILN_702 GBV_ILN_2001 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2006 GBV_ILN_2007 GBV_ILN_2008 GBV_ILN_2009 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2026 GBV_ILN_2027 GBV_ILN_2031 GBV_ILN_2034 GBV_ILN_2037 GBV_ILN_2038 GBV_ILN_2039 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2055 GBV_ILN_2057 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2088 GBV_ILN_2093 GBV_ILN_2106 GBV_ILN_2107 GBV_ILN_2108 GBV_ILN_2110 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2118 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2144 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2188 GBV_ILN_2190 GBV_ILN_2232 GBV_ILN_2336 GBV_ILN_2446 GBV_ILN_2470 GBV_ILN_2472 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_2548 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4046 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4242 GBV_ILN_4246 GBV_ILN_4249 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4336 GBV_ILN_4338 GBV_ILN_4393 GBV_ILN_4700 AR 14 2019 3 18 02 1311-1319 |
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10.1007/s42835-019-00117-w doi (DE-627)SPR03869168X (SPR)s42835-019-00117-w-e DE-627 ger DE-627 rakwb eng Kim, Kihyun verfasserin aut Gate Driver for SiC Power MOSFETs Using Soft-Switching Technique 2019 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier © The Korean Institute of Electrical Engineers 2019 Abstract In this paper, gate drive IC for SiC power MOSFETs using soft-switching technique gate drive method is designed and implemented. Designed IC is suitable for driving silicon carbide (SiC) power MOSFET. The gate drive IC using soft-switching gate drive method, which is composed of high side and low side soft-switching controller, reduce the overshoot and switching loss of the SiC power MOSFET during the turn-on period effectively. The gate drive IC using soft-switching gate drive method reduces the switching loss by 14% without increasing the overshoot magnitude. To verify the electrical characteristics of the designed IC, simulations and experiments were performed. Gate drive IC (dpeaa)DE-He213 Soft-switching (dpeaa)DE-He213 Switching loss (dpeaa)DE-He213 SiC power MOSFET (dpeaa)DE-He213 Kim, Hyoung-Woo aut Lee, Kyoungho aut Park, Jusung aut Enthalten in Journal of electrical engineering & technology [Singapore] : Springer Singapore, 2006 14(2019), 3 vom: 18. Feb., Seite 1311-1319 (DE-627)519202015 (DE-600)2255142-6 2093-7423 nnns volume:14 year:2019 number:3 day:18 month:02 pages:1311-1319 https://dx.doi.org/10.1007/s42835-019-00117-w lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_105 GBV_ILN_110 GBV_ILN_138 GBV_ILN_150 GBV_ILN_151 GBV_ILN_161 GBV_ILN_170 GBV_ILN_171 GBV_ILN_187 GBV_ILN_213 GBV_ILN_224 GBV_ILN_230 GBV_ILN_250 GBV_ILN_281 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_636 GBV_ILN_702 GBV_ILN_2001 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2006 GBV_ILN_2007 GBV_ILN_2008 GBV_ILN_2009 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2026 GBV_ILN_2027 GBV_ILN_2031 GBV_ILN_2034 GBV_ILN_2037 GBV_ILN_2038 GBV_ILN_2039 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2055 GBV_ILN_2057 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2088 GBV_ILN_2093 GBV_ILN_2106 GBV_ILN_2107 GBV_ILN_2108 GBV_ILN_2110 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2118 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2144 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2188 GBV_ILN_2190 GBV_ILN_2232 GBV_ILN_2336 GBV_ILN_2446 GBV_ILN_2470 GBV_ILN_2472 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_2548 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4046 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4242 GBV_ILN_4246 GBV_ILN_4249 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4336 GBV_ILN_4338 GBV_ILN_4393 GBV_ILN_4700 AR 14 2019 3 18 02 1311-1319 |
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10.1007/s42835-019-00117-w doi (DE-627)SPR03869168X (SPR)s42835-019-00117-w-e DE-627 ger DE-627 rakwb eng Kim, Kihyun verfasserin aut Gate Driver for SiC Power MOSFETs Using Soft-Switching Technique 2019 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier © The Korean Institute of Electrical Engineers 2019 Abstract In this paper, gate drive IC for SiC power MOSFETs using soft-switching technique gate drive method is designed and implemented. Designed IC is suitable for driving silicon carbide (SiC) power MOSFET. The gate drive IC using soft-switching gate drive method, which is composed of high side and low side soft-switching controller, reduce the overshoot and switching loss of the SiC power MOSFET during the turn-on period effectively. The gate drive IC using soft-switching gate drive method reduces the switching loss by 14% without increasing the overshoot magnitude. To verify the electrical characteristics of the designed IC, simulations and experiments were performed. Gate drive IC (dpeaa)DE-He213 Soft-switching (dpeaa)DE-He213 Switching loss (dpeaa)DE-He213 SiC power MOSFET (dpeaa)DE-He213 Kim, Hyoung-Woo aut Lee, Kyoungho aut Park, Jusung aut Enthalten in Journal of electrical engineering & technology [Singapore] : Springer Singapore, 2006 14(2019), 3 vom: 18. Feb., Seite 1311-1319 (DE-627)519202015 (DE-600)2255142-6 2093-7423 nnns volume:14 year:2019 number:3 day:18 month:02 pages:1311-1319 https://dx.doi.org/10.1007/s42835-019-00117-w lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_105 GBV_ILN_110 GBV_ILN_138 GBV_ILN_150 GBV_ILN_151 GBV_ILN_161 GBV_ILN_170 GBV_ILN_171 GBV_ILN_187 GBV_ILN_213 GBV_ILN_224 GBV_ILN_230 GBV_ILN_250 GBV_ILN_281 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_636 GBV_ILN_702 GBV_ILN_2001 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2006 GBV_ILN_2007 GBV_ILN_2008 GBV_ILN_2009 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2026 GBV_ILN_2027 GBV_ILN_2031 GBV_ILN_2034 GBV_ILN_2037 GBV_ILN_2038 GBV_ILN_2039 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2055 GBV_ILN_2057 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2088 GBV_ILN_2093 GBV_ILN_2106 GBV_ILN_2107 GBV_ILN_2108 GBV_ILN_2110 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2118 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2144 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2188 GBV_ILN_2190 GBV_ILN_2232 GBV_ILN_2336 GBV_ILN_2446 GBV_ILN_2470 GBV_ILN_2472 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_2548 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4046 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4242 GBV_ILN_4246 GBV_ILN_4249 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4336 GBV_ILN_4338 GBV_ILN_4393 GBV_ILN_4700 AR 14 2019 3 18 02 1311-1319 |
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Enthalten in Journal of electrical engineering & technology 14(2019), 3 vom: 18. Feb., Seite 1311-1319 volume:14 year:2019 number:3 day:18 month:02 pages:1311-1319 |
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Kim, Kihyun @@aut@@ Kim, Hyoung-Woo @@aut@@ Lee, Kyoungho @@aut@@ Park, Jusung @@aut@@ |
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2019-02-18T00:00:00Z |
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Kim, Kihyun |
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Kim, Kihyun misc Gate drive IC misc Soft-switching misc Switching loss misc SiC power MOSFET Gate Driver for SiC Power MOSFETs Using Soft-Switching Technique |
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Gate Driver for SiC Power MOSFETs Using Soft-Switching Technique Gate drive IC (dpeaa)DE-He213 Soft-switching (dpeaa)DE-He213 Switching loss (dpeaa)DE-He213 SiC power MOSFET (dpeaa)DE-He213 |
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gate driver for sic power mosfets using soft-switching technique |
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Gate Driver for SiC Power MOSFETs Using Soft-Switching Technique |
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Abstract In this paper, gate drive IC for SiC power MOSFETs using soft-switching technique gate drive method is designed and implemented. Designed IC is suitable for driving silicon carbide (SiC) power MOSFET. The gate drive IC using soft-switching gate drive method, which is composed of high side and low side soft-switching controller, reduce the overshoot and switching loss of the SiC power MOSFET during the turn-on period effectively. The gate drive IC using soft-switching gate drive method reduces the switching loss by 14% without increasing the overshoot magnitude. To verify the electrical characteristics of the designed IC, simulations and experiments were performed. © The Korean Institute of Electrical Engineers 2019 |
| abstractGer |
Abstract In this paper, gate drive IC for SiC power MOSFETs using soft-switching technique gate drive method is designed and implemented. Designed IC is suitable for driving silicon carbide (SiC) power MOSFET. The gate drive IC using soft-switching gate drive method, which is composed of high side and low side soft-switching controller, reduce the overshoot and switching loss of the SiC power MOSFET during the turn-on period effectively. The gate drive IC using soft-switching gate drive method reduces the switching loss by 14% without increasing the overshoot magnitude. To verify the electrical characteristics of the designed IC, simulations and experiments were performed. © The Korean Institute of Electrical Engineers 2019 |
| abstract_unstemmed |
Abstract In this paper, gate drive IC for SiC power MOSFETs using soft-switching technique gate drive method is designed and implemented. Designed IC is suitable for driving silicon carbide (SiC) power MOSFET. The gate drive IC using soft-switching gate drive method, which is composed of high side and low side soft-switching controller, reduce the overshoot and switching loss of the SiC power MOSFET during the turn-on period effectively. The gate drive IC using soft-switching gate drive method reduces the switching loss by 14% without increasing the overshoot magnitude. To verify the electrical characteristics of the designed IC, simulations and experiments were performed. © The Korean Institute of Electrical Engineers 2019 |
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