A brief review of the technological advancements of phase measuring deflectometry

Abstract This paper presents a short review for phase measuring deflectometry (PMD). PMD is a phase calculation based technique for three-dimensional (3D) measurement of specular surfaces. PMD can achieve nano-scale form measurement accuracy with the advantages of high dynamic range, non-contact, fu...
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Autor*in:	Xu, Yongjia [verfasserIn] Gao, Feng [verfasserIn] Jiang, Xiangqian [verfasserIn]

Format:	E-Artikel
Sprache:	Englisch

Erschienen:	2020

Schlagwörter:	Phase measuring deflectometry 3D measurement Specular surface Phase measurement Fringe analyses

Übergeordnetes Werk:	Enthalten in: PhotoniX - [London] : SpringerOpen, 2020, 1(2020), 1 vom: 05. Juni
Übergeordnetes Werk:	volume:1 ; year:2020 ; number:1 ; day:05 ; month:06

Links:	Volltext

DOI / URN:	10.1186/s43074-020-00015-9

Katalog-ID:	SPR039934535

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spelling	10.1186/s43074-020-00015-9 doi (DE-627)SPR039934535 (SPR)s43074-020-00015-9-e DE-627 ger DE-627 rakwb eng 621.3 ASE Xu, Yongjia verfasserin aut A brief review of the technological advancements of phase measuring deflectometry 2020 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Abstract This paper presents a short review for phase measuring deflectometry (PMD). PMD is a phase calculation based technique for three-dimensional (3D) measurement of specular surfaces. PMD can achieve nano-scale form measurement accuracy with the advantages of high dynamic range, non-contact, full field measurement which makes it a competitive method for specular surface measurement. With the development of computer science, display and imaging technology, there has been an advancement in speed for PMD in recent years. This paper discusses PMD focusing on the difference on its system configuration. Measurement principles, progress, advantages and problems are discussed for each category. The challenges and future development of PMD are also discussed. Phase measuring deflectometry (dpeaa)DE-He213 3D measurement (dpeaa)DE-He213 Specular surface (dpeaa)DE-He213 Phase measurement (dpeaa)DE-He213 Fringe analyses (dpeaa)DE-He213 Gao, Feng verfasserin aut Jiang, Xiangqian verfasserin aut Enthalten in PhotoniX [London] : SpringerOpen, 2020 1(2020), 1 vom: 05. Juni (DE-627)1694891844 (DE-600)3017005-9 2662-1991 nnns volume:1 year:2020 number:1 day:05 month:06 https://dx.doi.org/10.1186/s43074-020-00015-9 kostenfrei Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_95 GBV_ILN_105 GBV_ILN_110 GBV_ILN_151 GBV_ILN_161 GBV_ILN_170 GBV_ILN_213 GBV_ILN_230 GBV_ILN_285 GBV_ILN_293 GBV_ILN_602 GBV_ILN_2014 GBV_ILN_4012 GBV_ILN_4037 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4249 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4335 GBV_ILN_4338 GBV_ILN_4367 GBV_ILN_4700 AR 1 2020 1 05 06
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language	English
source	Enthalten in PhotoniX 1(2020), 1 vom: 05. Juni volume:1 year:2020 number:1 day:05 month:06
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topic_facet	Phase measuring deflectometry 3D measurement Specular surface Phase measurement Fringe analyses
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authorswithroles_txt_mv	Xu, Yongjia @@aut@@ Gao, Feng @@aut@@ Jiang, Xiangqian @@aut@@
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author	Xu, Yongjia
spellingShingle	Xu, Yongjia ddc 621.3 misc Phase measuring deflectometry misc 3D measurement misc Specular surface misc Phase measurement misc Fringe analyses A brief review of the technological advancements of phase measuring deflectometry
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topic_title	621.3 ASE A brief review of the technological advancements of phase measuring deflectometry Phase measuring deflectometry (dpeaa)DE-He213 3D measurement (dpeaa)DE-He213 Specular surface (dpeaa)DE-He213 Phase measurement (dpeaa)DE-He213 Fringe analyses (dpeaa)DE-He213
topic	ddc 621.3 misc Phase measuring deflectometry misc 3D measurement misc Specular surface misc Phase measurement misc Fringe analyses
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title	A brief review of the technological advancements of phase measuring deflectometry
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title_full	A brief review of the technological advancements of phase measuring deflectometry
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author_browse	Xu, Yongjia Gao, Feng Jiang, Xiangqian
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title_sort	brief review of the technological advancements of phase measuring deflectometry
title_auth	A brief review of the technological advancements of phase measuring deflectometry
abstract	Abstract This paper presents a short review for phase measuring deflectometry (PMD). PMD is a phase calculation based technique for three-dimensional (3D) measurement of specular surfaces. PMD can achieve nano-scale form measurement accuracy with the advantages of high dynamic range, non-contact, full field measurement which makes it a competitive method for specular surface measurement. With the development of computer science, display and imaging technology, there has been an advancement in speed for PMD in recent years. This paper discusses PMD focusing on the difference on its system configuration. Measurement principles, progress, advantages and problems are discussed for each category. The challenges and future development of PMD are also discussed.
abstractGer	Abstract This paper presents a short review for phase measuring deflectometry (PMD). PMD is a phase calculation based technique for three-dimensional (3D) measurement of specular surfaces. PMD can achieve nano-scale form measurement accuracy with the advantages of high dynamic range, non-contact, full field measurement which makes it a competitive method for specular surface measurement. With the development of computer science, display and imaging technology, there has been an advancement in speed for PMD in recent years. This paper discusses PMD focusing on the difference on its system configuration. Measurement principles, progress, advantages and problems are discussed for each category. The challenges and future development of PMD are also discussed.
abstract_unstemmed	Abstract This paper presents a short review for phase measuring deflectometry (PMD). PMD is a phase calculation based technique for three-dimensional (3D) measurement of specular surfaces. PMD can achieve nano-scale form measurement accuracy with the advantages of high dynamic range, non-contact, full field measurement which makes it a competitive method for specular surface measurement. With the development of computer science, display and imaging technology, there has been an advancement in speed for PMD in recent years. This paper discusses PMD focusing on the difference on its system configuration. Measurement principles, progress, advantages and problems are discussed for each category. The challenges and future development of PMD are also discussed.
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title_short	A brief review of the technological advancements of phase measuring deflectometry
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