Correlations Between Electrical and Material Properties of CVD Diamond
Abstract The electrical properties associated with diamond charged particle- and photo-detectors were studied using charged particle-induced conductivity (CPIC) and photo-induced conductivity (PIC). The collection distance d, the product of the excess carrier mobility μ excess carrier lifetime T and...
Ausführliche Beschreibung
Gespeichert in:
| Autor*in: |
White, C. [verfasserIn] Zhao, S. [verfasserIn] Gan, K. K. [verfasserIn] Kagan, H. [verfasserIn] Kass, R. [verfasserIn] Malchow, R. [verfasserIn] Morrow, F. [verfasserIn] Palmer, W. [verfasserIn] Han, S. [verfasserIn] Kania, D. [verfasserIn] Pan, L. S. [verfasserIn] Schnetzer, S. [verfasserIn] Stone, R. [verfasserIn] Teserek, R. [verfasserIn] Angus, J. [verfasserIn] Ma, S. J. [verfasserIn] Sugimoto, Y. [verfasserIn] |
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| Format: |
E-Artikel |
|---|---|
| Sprache: |
Englisch |
| Erschienen: |
1994 |
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| Übergeordnetes Werk: |
Enthalten in: MRS online proceedings library - Warrendale, Pa. : MRS, 1998, 339(1994), 1 vom: 01. Dez., Seite 589-594 |
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volume:339 ; year:1994 ; number:1 ; day:01 ; month:12 ; pages:589-594 |
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10.1557/PROC-339-589 |
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| 520 | |a Abstract The electrical properties associated with diamond charged particle- and photo-detectors were studied using charged particle-induced conductivity (CPIC) and photo-induced conductivity (PIC). The collection distance d, the product of the excess carrier mobility μ excess carrier lifetime T and electric field E, was used to characterize the diamonds. X-ray diffraction, Raman spectroscopy, photoluminescence, SEM and TEM were performed on CVD diamond detectors to investigate the limitations of the electrical properties. Correlations were found between the electrical properties and the material characterizations. | ||
| 700 | 1 | |a Zhao, S. |e verfasserin |4 aut | |
| 700 | 1 | |a Gan, K. K. |e verfasserin |4 aut | |
| 700 | 1 | |a Kagan, H. |e verfasserin |4 aut | |
| 700 | 1 | |a Kass, R. |e verfasserin |4 aut | |
| 700 | 1 | |a Malchow, R. |e verfasserin |4 aut | |
| 700 | 1 | |a Morrow, F. |e verfasserin |4 aut | |
| 700 | 1 | |a Palmer, W. |e verfasserin |4 aut | |
| 700 | 1 | |a Han, S. |e verfasserin |4 aut | |
| 700 | 1 | |a Kania, D. |e verfasserin |4 aut | |
| 700 | 1 | |a Pan, L. S. |e verfasserin |4 aut | |
| 700 | 1 | |a Schnetzer, S. |e verfasserin |4 aut | |
| 700 | 1 | |a Stone, R. |e verfasserin |4 aut | |
| 700 | 1 | |a Teserek, R. |e verfasserin |4 aut | |
| 700 | 1 | |a Angus, J. |e verfasserin |4 aut | |
| 700 | 1 | |a Ma, S. J. |e verfasserin |4 aut | |
| 700 | 1 | |a Sugimoto, Y. |e verfasserin |4 aut | |
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10.1557/PROC-339-589 doi (DE-627)SPR04163456X (SPR)PROC-339-589-e DE-627 ger DE-627 rakwb eng 670 ASE White, C. verfasserin aut Correlations Between Electrical and Material Properties of CVD Diamond 1994 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Abstract The electrical properties associated with diamond charged particle- and photo-detectors were studied using charged particle-induced conductivity (CPIC) and photo-induced conductivity (PIC). The collection distance d, the product of the excess carrier mobility μ excess carrier lifetime T and electric field E, was used to characterize the diamonds. X-ray diffraction, Raman spectroscopy, photoluminescence, SEM and TEM were performed on CVD diamond detectors to investigate the limitations of the electrical properties. Correlations were found between the electrical properties and the material characterizations. Zhao, S. verfasserin aut Gan, K. K. verfasserin aut Kagan, H. verfasserin aut Kass, R. verfasserin aut Malchow, R. verfasserin aut Morrow, F. verfasserin aut Palmer, W. verfasserin aut Han, S. verfasserin aut Kania, D. verfasserin aut Pan, L. S. verfasserin aut Schnetzer, S. verfasserin aut Stone, R. verfasserin aut Teserek, R. verfasserin aut Angus, J. verfasserin aut Ma, S. J. verfasserin aut Sugimoto, Y. verfasserin aut Enthalten in MRS online proceedings library Warrendale, Pa. : MRS, 1998 339(1994), 1 vom: 01. Dez., Seite 589-594 (DE-627)57782046X (DE-600)2451008-7 1946-4274 nnns volume:339 year:1994 number:1 day:01 month:12 pages:589-594 https://dx.doi.org/10.1557/PROC-339-589 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER GBV_ILN_2005 AR 339 1994 1 01 12 589-594 |
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10.1557/PROC-339-589 doi (DE-627)SPR04163456X (SPR)PROC-339-589-e DE-627 ger DE-627 rakwb eng 670 ASE White, C. verfasserin aut Correlations Between Electrical and Material Properties of CVD Diamond 1994 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Abstract The electrical properties associated with diamond charged particle- and photo-detectors were studied using charged particle-induced conductivity (CPIC) and photo-induced conductivity (PIC). The collection distance d, the product of the excess carrier mobility μ excess carrier lifetime T and electric field E, was used to characterize the diamonds. X-ray diffraction, Raman spectroscopy, photoluminescence, SEM and TEM were performed on CVD diamond detectors to investigate the limitations of the electrical properties. Correlations were found between the electrical properties and the material characterizations. Zhao, S. verfasserin aut Gan, K. K. verfasserin aut Kagan, H. verfasserin aut Kass, R. verfasserin aut Malchow, R. verfasserin aut Morrow, F. verfasserin aut Palmer, W. verfasserin aut Han, S. verfasserin aut Kania, D. verfasserin aut Pan, L. S. verfasserin aut Schnetzer, S. verfasserin aut Stone, R. verfasserin aut Teserek, R. verfasserin aut Angus, J. verfasserin aut Ma, S. J. verfasserin aut Sugimoto, Y. verfasserin aut Enthalten in MRS online proceedings library Warrendale, Pa. : MRS, 1998 339(1994), 1 vom: 01. Dez., Seite 589-594 (DE-627)57782046X (DE-600)2451008-7 1946-4274 nnns volume:339 year:1994 number:1 day:01 month:12 pages:589-594 https://dx.doi.org/10.1557/PROC-339-589 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER GBV_ILN_2005 AR 339 1994 1 01 12 589-594 |
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10.1557/PROC-339-589 doi (DE-627)SPR04163456X (SPR)PROC-339-589-e DE-627 ger DE-627 rakwb eng 670 ASE White, C. verfasserin aut Correlations Between Electrical and Material Properties of CVD Diamond 1994 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Abstract The electrical properties associated with diamond charged particle- and photo-detectors were studied using charged particle-induced conductivity (CPIC) and photo-induced conductivity (PIC). The collection distance d, the product of the excess carrier mobility μ excess carrier lifetime T and electric field E, was used to characterize the diamonds. X-ray diffraction, Raman spectroscopy, photoluminescence, SEM and TEM were performed on CVD diamond detectors to investigate the limitations of the electrical properties. Correlations were found between the electrical properties and the material characterizations. Zhao, S. verfasserin aut Gan, K. K. verfasserin aut Kagan, H. verfasserin aut Kass, R. verfasserin aut Malchow, R. verfasserin aut Morrow, F. verfasserin aut Palmer, W. verfasserin aut Han, S. verfasserin aut Kania, D. verfasserin aut Pan, L. S. verfasserin aut Schnetzer, S. verfasserin aut Stone, R. verfasserin aut Teserek, R. verfasserin aut Angus, J. verfasserin aut Ma, S. J. verfasserin aut Sugimoto, Y. verfasserin aut Enthalten in MRS online proceedings library Warrendale, Pa. : MRS, 1998 339(1994), 1 vom: 01. Dez., Seite 589-594 (DE-627)57782046X (DE-600)2451008-7 1946-4274 nnns volume:339 year:1994 number:1 day:01 month:12 pages:589-594 https://dx.doi.org/10.1557/PROC-339-589 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER GBV_ILN_2005 AR 339 1994 1 01 12 589-594 |
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10.1557/PROC-339-589 doi (DE-627)SPR04163456X (SPR)PROC-339-589-e DE-627 ger DE-627 rakwb eng 670 ASE White, C. verfasserin aut Correlations Between Electrical and Material Properties of CVD Diamond 1994 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Abstract The electrical properties associated with diamond charged particle- and photo-detectors were studied using charged particle-induced conductivity (CPIC) and photo-induced conductivity (PIC). The collection distance d, the product of the excess carrier mobility μ excess carrier lifetime T and electric field E, was used to characterize the diamonds. X-ray diffraction, Raman spectroscopy, photoluminescence, SEM and TEM were performed on CVD diamond detectors to investigate the limitations of the electrical properties. Correlations were found between the electrical properties and the material characterizations. Zhao, S. verfasserin aut Gan, K. K. verfasserin aut Kagan, H. verfasserin aut Kass, R. verfasserin aut Malchow, R. verfasserin aut Morrow, F. verfasserin aut Palmer, W. verfasserin aut Han, S. verfasserin aut Kania, D. verfasserin aut Pan, L. S. verfasserin aut Schnetzer, S. verfasserin aut Stone, R. verfasserin aut Teserek, R. verfasserin aut Angus, J. verfasserin aut Ma, S. J. verfasserin aut Sugimoto, Y. verfasserin aut Enthalten in MRS online proceedings library Warrendale, Pa. : MRS, 1998 339(1994), 1 vom: 01. Dez., Seite 589-594 (DE-627)57782046X (DE-600)2451008-7 1946-4274 nnns volume:339 year:1994 number:1 day:01 month:12 pages:589-594 https://dx.doi.org/10.1557/PROC-339-589 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER GBV_ILN_2005 AR 339 1994 1 01 12 589-594 |
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10.1557/PROC-339-589 doi (DE-627)SPR04163456X (SPR)PROC-339-589-e DE-627 ger DE-627 rakwb eng 670 ASE White, C. verfasserin aut Correlations Between Electrical and Material Properties of CVD Diamond 1994 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Abstract The electrical properties associated with diamond charged particle- and photo-detectors were studied using charged particle-induced conductivity (CPIC) and photo-induced conductivity (PIC). The collection distance d, the product of the excess carrier mobility μ excess carrier lifetime T and electric field E, was used to characterize the diamonds. X-ray diffraction, Raman spectroscopy, photoluminescence, SEM and TEM were performed on CVD diamond detectors to investigate the limitations of the electrical properties. Correlations were found between the electrical properties and the material characterizations. Zhao, S. verfasserin aut Gan, K. K. verfasserin aut Kagan, H. verfasserin aut Kass, R. verfasserin aut Malchow, R. verfasserin aut Morrow, F. verfasserin aut Palmer, W. verfasserin aut Han, S. verfasserin aut Kania, D. verfasserin aut Pan, L. S. verfasserin aut Schnetzer, S. verfasserin aut Stone, R. verfasserin aut Teserek, R. verfasserin aut Angus, J. verfasserin aut Ma, S. J. verfasserin aut Sugimoto, Y. verfasserin aut Enthalten in MRS online proceedings library Warrendale, Pa. : MRS, 1998 339(1994), 1 vom: 01. Dez., Seite 589-594 (DE-627)57782046X (DE-600)2451008-7 1946-4274 nnns volume:339 year:1994 number:1 day:01 month:12 pages:589-594 https://dx.doi.org/10.1557/PROC-339-589 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER GBV_ILN_2005 AR 339 1994 1 01 12 589-594 |
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Correlations Between Electrical and Material Properties of CVD Diamond |
| abstract |
Abstract The electrical properties associated with diamond charged particle- and photo-detectors were studied using charged particle-induced conductivity (CPIC) and photo-induced conductivity (PIC). The collection distance d, the product of the excess carrier mobility μ excess carrier lifetime T and electric field E, was used to characterize the diamonds. X-ray diffraction, Raman spectroscopy, photoluminescence, SEM and TEM were performed on CVD diamond detectors to investigate the limitations of the electrical properties. Correlations were found between the electrical properties and the material characterizations. |
| abstractGer |
Abstract The electrical properties associated with diamond charged particle- and photo-detectors were studied using charged particle-induced conductivity (CPIC) and photo-induced conductivity (PIC). The collection distance d, the product of the excess carrier mobility μ excess carrier lifetime T and electric field E, was used to characterize the diamonds. X-ray diffraction, Raman spectroscopy, photoluminescence, SEM and TEM were performed on CVD diamond detectors to investigate the limitations of the electrical properties. Correlations were found between the electrical properties and the material characterizations. |
| abstract_unstemmed |
Abstract The electrical properties associated with diamond charged particle- and photo-detectors were studied using charged particle-induced conductivity (CPIC) and photo-induced conductivity (PIC). The collection distance d, the product of the excess carrier mobility μ excess carrier lifetime T and electric field E, was used to characterize the diamonds. X-ray diffraction, Raman spectroscopy, photoluminescence, SEM and TEM were performed on CVD diamond detectors to investigate the limitations of the electrical properties. Correlations were found between the electrical properties and the material characterizations. |
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| container_issue |
1 |
| title_short |
Correlations Between Electrical and Material Properties of CVD Diamond |
| url |
https://dx.doi.org/10.1557/PROC-339-589 |
| remote_bool |
true |
| author2 |
Zhao, S. Gan, K. K. Kagan, H. Kass, R. Malchow, R. Morrow, F. Palmer, W. Han, S. Kania, D. Pan, L. S. Schnetzer, S. Stone, R. Teserek, R. Angus, J. Ma, S. J. Sugimoto, Y. |
| author2Str |
Zhao, S. Gan, K. K. Kagan, H. Kass, R. Malchow, R. Morrow, F. Palmer, W. Han, S. Kania, D. Pan, L. S. Schnetzer, S. Stone, R. Teserek, R. Angus, J. Ma, S. J. Sugimoto, Y. |
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57782046X |
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c |
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false |
| hochschulschrift_bool |
false |
| doi_str |
10.1557/PROC-339-589 |
| up_date |
2024-07-03T22:58:32.320Z |
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1803600540294184960 |
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