Atomic resolution transmission electron microscopy of surfaces

Abstract A brief overview of transmission electron microscopy as it applies specifically to obtaining surface crystallographic information is presented. This review will encompass many of the practical aspects of obtaining surface crystal information from a transmission electron microscope, includin...
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Autor*in:	Chiaramonti, Ann N. [verfasserIn] Marks, Laurence D. [verfasserIn]

Format:	E-Artikel
Sprache:	Englisch

Erschienen:	2005

Übergeordnetes Werk:	Enthalten in: Journal of materials research - Berlin : Springer, 1986, 20(2005), 7 vom: 01. Juli, Seite 1619-1627
Übergeordnetes Werk:	volume:20 ; year:2005 ; number:7 ; day:01 ; month:07 ; pages:1619-1627

Links:	Volltext

DOI / URN:	10.1557/JMR.2005.0211

Katalog-ID:	SPR04176756X

Internformat


LEADER	01000caa a22002652 4500
001	SPR04176756X
003	DE-627
005	20220112054414.0
007	cr uuu---uuuuu
008	201105s2005 xx \|\|\|\|\|o 00\| \|\|eng c
024	7		\|a 10.1557/JMR.2005.0211 \|2 doi
035			\|a (DE-627)SPR04176756X
035			\|a (SPR)JMR.2005.0211-e
040			\|a DE-627 \|b ger \|c DE-627 \|e rakwb
041			\|a eng
082	0	4	\|a 670 \|q ASE
084			\|a 51.00 \|2 bkl
100	1		\|a Chiaramonti, Ann N. \|e verfasserin \|4 aut
245	1	0	\|a Atomic resolution transmission electron microscopy of surfaces
264		1	\|c 2005
336			\|a Text \|b txt \|2 rdacontent
337			\|a Computermedien \|b c \|2 rdamedia
338			\|a Online-Ressource \|b cr \|2 rdacarrier
520			\|a Abstract A brief overview of transmission electron microscopy as it applies specifically to obtaining surface crystallographic information is presented. This review will encompass many of the practical aspects of obtaining surface crystal information from a transmission electron microscope, including equipment requirements, experimental techniques, sample preparation methods, data extraction and image processing, and complimentary techniques.
700	1		\|a Marks, Laurence D. \|e verfasserin \|4 aut
773	0	8	\|i Enthalten in \|t Journal of materials research \|d Berlin : Springer, 1986 \|g 20(2005), 7 vom: 01. Juli, Seite 1619-1627 \|w (DE-627)320527026 \|w (DE-600)2015297-8 \|x 2044-5326 \|7 nnns
773	1	8	\|g volume:20 \|g year:2005 \|g number:7 \|g day:01 \|g month:07 \|g pages:1619-1627
856	4	0	\|u https://dx.doi.org/10.1557/JMR.2005.0211 \|z lizenzpflichtig \|3 Volltext
912			\|a GBV_USEFLAG_A
912			\|a SYSFLAG_A
912			\|a GBV_SPRINGER
912			\|a GBV_ILN_24
912			\|a GBV_ILN_31
912			\|a GBV_ILN_70
912			\|a GBV_ILN_120
912			\|a GBV_ILN_293
912			\|a GBV_ILN_374
912			\|a GBV_ILN_702
912			\|a GBV_ILN_2005
912			\|a GBV_ILN_2190
912			\|a GBV_ILN_2336
912			\|a GBV_ILN_4126
936	b	k	\|a 51.00 \|q ASE
951			\|a AR
952			\|d 20 \|j 2005 \|e 7 \|b 01 \|c 07 \|h 1619-1627

Indexfelder

author_variant	a n c an anc l d m ld ldm
matchkey_str	article:20445326:2005----::tmceouinrnmsinlcrnirs
hierarchy_sort_str	2005
bklnumber	51.00
publishDate	2005
allfields	10.1557/JMR.2005.0211 doi (DE-627)SPR04176756X (SPR)JMR.2005.0211-e DE-627 ger DE-627 rakwb eng 670 ASE 51.00 bkl Chiaramonti, Ann N. verfasserin aut Atomic resolution transmission electron microscopy of surfaces 2005 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Abstract A brief overview of transmission electron microscopy as it applies specifically to obtaining surface crystallographic information is presented. This review will encompass many of the practical aspects of obtaining surface crystal information from a transmission electron microscope, including equipment requirements, experimental techniques, sample preparation methods, data extraction and image processing, and complimentary techniques. Marks, Laurence D. verfasserin aut Enthalten in Journal of materials research Berlin : Springer, 1986 20(2005), 7 vom: 01. Juli, Seite 1619-1627 (DE-627)320527026 (DE-600)2015297-8 2044-5326 nnns volume:20 year:2005 number:7 day:01 month:07 pages:1619-1627 https://dx.doi.org/10.1557/JMR.2005.0211 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER GBV_ILN_24 GBV_ILN_31 GBV_ILN_70 GBV_ILN_120 GBV_ILN_293 GBV_ILN_374 GBV_ILN_702 GBV_ILN_2005 GBV_ILN_2190 GBV_ILN_2336 GBV_ILN_4126 51.00 ASE AR 20 2005 7 01 07 1619-1627
spelling	10.1557/JMR.2005.0211 doi (DE-627)SPR04176756X (SPR)JMR.2005.0211-e DE-627 ger DE-627 rakwb eng 670 ASE 51.00 bkl Chiaramonti, Ann N. verfasserin aut Atomic resolution transmission electron microscopy of surfaces 2005 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Abstract A brief overview of transmission electron microscopy as it applies specifically to obtaining surface crystallographic information is presented. This review will encompass many of the practical aspects of obtaining surface crystal information from a transmission electron microscope, including equipment requirements, experimental techniques, sample preparation methods, data extraction and image processing, and complimentary techniques. Marks, Laurence D. verfasserin aut Enthalten in Journal of materials research Berlin : Springer, 1986 20(2005), 7 vom: 01. Juli, Seite 1619-1627 (DE-627)320527026 (DE-600)2015297-8 2044-5326 nnns volume:20 year:2005 number:7 day:01 month:07 pages:1619-1627 https://dx.doi.org/10.1557/JMR.2005.0211 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER GBV_ILN_24 GBV_ILN_31 GBV_ILN_70 GBV_ILN_120 GBV_ILN_293 GBV_ILN_374 GBV_ILN_702 GBV_ILN_2005 GBV_ILN_2190 GBV_ILN_2336 GBV_ILN_4126 51.00 ASE AR 20 2005 7 01 07 1619-1627
allfields_unstemmed	10.1557/JMR.2005.0211 doi (DE-627)SPR04176756X (SPR)JMR.2005.0211-e DE-627 ger DE-627 rakwb eng 670 ASE 51.00 bkl Chiaramonti, Ann N. verfasserin aut Atomic resolution transmission electron microscopy of surfaces 2005 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Abstract A brief overview of transmission electron microscopy as it applies specifically to obtaining surface crystallographic information is presented. This review will encompass many of the practical aspects of obtaining surface crystal information from a transmission electron microscope, including equipment requirements, experimental techniques, sample preparation methods, data extraction and image processing, and complimentary techniques. Marks, Laurence D. verfasserin aut Enthalten in Journal of materials research Berlin : Springer, 1986 20(2005), 7 vom: 01. Juli, Seite 1619-1627 (DE-627)320527026 (DE-600)2015297-8 2044-5326 nnns volume:20 year:2005 number:7 day:01 month:07 pages:1619-1627 https://dx.doi.org/10.1557/JMR.2005.0211 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER GBV_ILN_24 GBV_ILN_31 GBV_ILN_70 GBV_ILN_120 GBV_ILN_293 GBV_ILN_374 GBV_ILN_702 GBV_ILN_2005 GBV_ILN_2190 GBV_ILN_2336 GBV_ILN_4126 51.00 ASE AR 20 2005 7 01 07 1619-1627
allfieldsGer	10.1557/JMR.2005.0211 doi (DE-627)SPR04176756X (SPR)JMR.2005.0211-e DE-627 ger DE-627 rakwb eng 670 ASE 51.00 bkl Chiaramonti, Ann N. verfasserin aut Atomic resolution transmission electron microscopy of surfaces 2005 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Abstract A brief overview of transmission electron microscopy as it applies specifically to obtaining surface crystallographic information is presented. This review will encompass many of the practical aspects of obtaining surface crystal information from a transmission electron microscope, including equipment requirements, experimental techniques, sample preparation methods, data extraction and image processing, and complimentary techniques. Marks, Laurence D. verfasserin aut Enthalten in Journal of materials research Berlin : Springer, 1986 20(2005), 7 vom: 01. Juli, Seite 1619-1627 (DE-627)320527026 (DE-600)2015297-8 2044-5326 nnns volume:20 year:2005 number:7 day:01 month:07 pages:1619-1627 https://dx.doi.org/10.1557/JMR.2005.0211 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER GBV_ILN_24 GBV_ILN_31 GBV_ILN_70 GBV_ILN_120 GBV_ILN_293 GBV_ILN_374 GBV_ILN_702 GBV_ILN_2005 GBV_ILN_2190 GBV_ILN_2336 GBV_ILN_4126 51.00 ASE AR 20 2005 7 01 07 1619-1627
allfieldsSound	10.1557/JMR.2005.0211 doi (DE-627)SPR04176756X (SPR)JMR.2005.0211-e DE-627 ger DE-627 rakwb eng 670 ASE 51.00 bkl Chiaramonti, Ann N. verfasserin aut Atomic resolution transmission electron microscopy of surfaces 2005 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Abstract A brief overview of transmission electron microscopy as it applies specifically to obtaining surface crystallographic information is presented. This review will encompass many of the practical aspects of obtaining surface crystal information from a transmission electron microscope, including equipment requirements, experimental techniques, sample preparation methods, data extraction and image processing, and complimentary techniques. Marks, Laurence D. verfasserin aut Enthalten in Journal of materials research Berlin : Springer, 1986 20(2005), 7 vom: 01. Juli, Seite 1619-1627 (DE-627)320527026 (DE-600)2015297-8 2044-5326 nnns volume:20 year:2005 number:7 day:01 month:07 pages:1619-1627 https://dx.doi.org/10.1557/JMR.2005.0211 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER GBV_ILN_24 GBV_ILN_31 GBV_ILN_70 GBV_ILN_120 GBV_ILN_293 GBV_ILN_374 GBV_ILN_702 GBV_ILN_2005 GBV_ILN_2190 GBV_ILN_2336 GBV_ILN_4126 51.00 ASE AR 20 2005 7 01 07 1619-1627
language	English
source	Enthalten in Journal of materials research 20(2005), 7 vom: 01. Juli, Seite 1619-1627 volume:20 year:2005 number:7 day:01 month:07 pages:1619-1627
sourceStr	Enthalten in Journal of materials research 20(2005), 7 vom: 01. Juli, Seite 1619-1627 volume:20 year:2005 number:7 day:01 month:07 pages:1619-1627
format_phy_str_mv	Article
institution	findex.gbv.de
dewey-raw	670
isfreeaccess_bool	false
container_title	Journal of materials research
authorswithroles_txt_mv	Chiaramonti, Ann N. @@aut@@ Marks, Laurence D. @@aut@@
publishDateDaySort_date	2005-07-01T00:00:00Z
hierarchy_top_id	320527026
dewey-sort	3670
id	SPR04176756X
language_de	englisch
fullrecord	<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01000caa a22002652 4500</leader><controlfield tag="001">SPR04176756X</controlfield><controlfield tag="003">DE-627</controlfield><controlfield tag="005">20220112054414.0</controlfield><controlfield tag="007">cr uuu---uuuuu</controlfield><controlfield tag="008">201105s2005 xx \|\|\|\|\|o 00\| \|\|eng c</controlfield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1557/JMR.2005.0211</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-627)SPR04176756X</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(SPR)JMR.2005.0211-e</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-627</subfield><subfield code="b">ger</subfield><subfield code="c">DE-627</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">670</subfield><subfield code="q">ASE</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">51.00</subfield><subfield code="2">bkl</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Chiaramonti, Ann N.</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Atomic resolution transmission electron microscopy of surfaces</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">2005</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">Text</subfield><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">Computermedien</subfield><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">Online-Ressource</subfield><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">Abstract A brief overview of transmission electron microscopy as it applies specifically to obtaining surface crystallographic information is presented. This review will encompass many of the practical aspects of obtaining surface crystal information from a transmission electron microscope, including equipment requirements, experimental techniques, sample preparation methods, data extraction and image processing, and complimentary techniques.</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Marks, Laurence D.</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="i">Enthalten in</subfield><subfield code="t">Journal of materials research</subfield><subfield code="d">Berlin : Springer, 1986</subfield><subfield code="g">20(2005), 7 vom: 01. Juli, Seite 1619-1627</subfield><subfield code="w">(DE-627)320527026</subfield><subfield code="w">(DE-600)2015297-8</subfield><subfield code="x">2044-5326</subfield><subfield code="7">nnns</subfield></datafield><datafield tag="773" ind1="1" ind2="8"><subfield code="g">volume:20</subfield><subfield code="g">year:2005</subfield><subfield code="g">number:7</subfield><subfield code="g">day:01</subfield><subfield code="g">month:07</subfield><subfield code="g">pages:1619-1627</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://dx.doi.org/10.1557/JMR.2005.0211</subfield><subfield code="z">lizenzpflichtig</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_USEFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SYSFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_SPRINGER</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_24</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_31</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_70</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_120</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_293</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_374</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_702</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2005</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2190</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2336</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4126</subfield></datafield><datafield tag="936" ind1="b" ind2="k"><subfield code="a">51.00</subfield><subfield code="q">ASE</subfield></datafield><datafield tag="951" ind1=" " ind2=" "><subfield code="a">AR</subfield></datafield><datafield tag="952" ind1=" " ind2=" "><subfield code="d">20</subfield><subfield code="j">2005</subfield><subfield code="e">7</subfield><subfield code="b">01</subfield><subfield code="c">07</subfield><subfield code="h">1619-1627</subfield></datafield></record></collection>
author	Chiaramonti, Ann N.
spellingShingle	Chiaramonti, Ann N. ddc 670 bkl 51.00 Atomic resolution transmission electron microscopy of surfaces
authorStr	Chiaramonti, Ann N.
ppnlink_with_tag_str_mv	@@773@@(DE-627)320527026
format	electronic Article
dewey-ones	670 - Manufacturing
delete_txt_mv	keep
author_role	aut aut
collection	springer
remote_str	true
illustrated	Not Illustrated
issn	2044-5326
topic_title	670 ASE 51.00 bkl Atomic resolution transmission electron microscopy of surfaces
topic	ddc 670 bkl 51.00
topic_unstemmed	ddc 670 bkl 51.00
topic_browse	ddc 670 bkl 51.00
format_facet	Elektronische Aufsätze Aufsätze Elektronische Ressource
format_main_str_mv	Text Zeitschrift/Artikel
carriertype_str_mv	cr
hierarchy_parent_title	Journal of materials research
hierarchy_parent_id	320527026
dewey-tens	670 - Manufacturing
hierarchy_top_title	Journal of materials research
isfreeaccess_txt	false
familylinks_str_mv	(DE-627)320527026 (DE-600)2015297-8
title	Atomic resolution transmission electron microscopy of surfaces
ctrlnum	(DE-627)SPR04176756X (SPR)JMR.2005.0211-e
title_full	Atomic resolution transmission electron microscopy of surfaces
author_sort	Chiaramonti, Ann N.
journal	Journal of materials research
journalStr	Journal of materials research
lang_code	eng
isOA_bool	false
dewey-hundreds	600 - Technology
recordtype	marc
publishDateSort	2005
contenttype_str_mv	txt
container_start_page	1619
author_browse	Chiaramonti, Ann N. Marks, Laurence D.
container_volume	20
class	670 ASE 51.00 bkl
format_se	Elektronische Aufsätze
author-letter	Chiaramonti, Ann N.
doi_str_mv	10.1557/JMR.2005.0211
dewey-full	670
author2-role	verfasserin
title_sort	atomic resolution transmission electron microscopy of surfaces
title_auth	Atomic resolution transmission electron microscopy of surfaces
abstract	Abstract A brief overview of transmission electron microscopy as it applies specifically to obtaining surface crystallographic information is presented. This review will encompass many of the practical aspects of obtaining surface crystal information from a transmission electron microscope, including equipment requirements, experimental techniques, sample preparation methods, data extraction and image processing, and complimentary techniques.
abstractGer	Abstract A brief overview of transmission electron microscopy as it applies specifically to obtaining surface crystallographic information is presented. This review will encompass many of the practical aspects of obtaining surface crystal information from a transmission electron microscope, including equipment requirements, experimental techniques, sample preparation methods, data extraction and image processing, and complimentary techniques.
abstract_unstemmed	Abstract A brief overview of transmission electron microscopy as it applies specifically to obtaining surface crystallographic information is presented. This review will encompass many of the practical aspects of obtaining surface crystal information from a transmission electron microscope, including equipment requirements, experimental techniques, sample preparation methods, data extraction and image processing, and complimentary techniques.
collection_details	GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER GBV_ILN_24 GBV_ILN_31 GBV_ILN_70 GBV_ILN_120 GBV_ILN_293 GBV_ILN_374 GBV_ILN_702 GBV_ILN_2005 GBV_ILN_2190 GBV_ILN_2336 GBV_ILN_4126
container_issue	7
title_short	Atomic resolution transmission electron microscopy of surfaces
url	https://dx.doi.org/10.1557/JMR.2005.0211
remote_bool	true
author2	Marks, Laurence D.
author2Str	Marks, Laurence D.
ppnlink	320527026
mediatype_str_mv	c
isOA_txt	false
hochschulschrift_bool	false
doi_str	10.1557/JMR.2005.0211
up_date	2024-07-03T23:33:51.243Z
_version_	1803602762132357120
fullrecord_marcxml	<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01000caa a22002652 4500</leader><controlfield tag="001">SPR04176756X</controlfield><controlfield tag="003">DE-627</controlfield><controlfield tag="005">20220112054414.0</controlfield><controlfield tag="007">cr uuu---uuuuu</controlfield><controlfield tag="008">201105s2005 xx \|\|\|\|\|o 00\| \|\|eng c</controlfield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1557/JMR.2005.0211</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-627)SPR04176756X</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(SPR)JMR.2005.0211-e</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-627</subfield><subfield code="b">ger</subfield><subfield code="c">DE-627</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">670</subfield><subfield code="q">ASE</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">51.00</subfield><subfield code="2">bkl</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Chiaramonti, Ann N.</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Atomic resolution transmission electron microscopy of surfaces</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">2005</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">Text</subfield><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">Computermedien</subfield><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">Online-Ressource</subfield><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">Abstract A brief overview of transmission electron microscopy as it applies specifically to obtaining surface crystallographic information is presented. This review will encompass many of the practical aspects of obtaining surface crystal information from a transmission electron microscope, including equipment requirements, experimental techniques, sample preparation methods, data extraction and image processing, and complimentary techniques.</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Marks, Laurence D.</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="i">Enthalten in</subfield><subfield code="t">Journal of materials research</subfield><subfield code="d">Berlin : Springer, 1986</subfield><subfield code="g">20(2005), 7 vom: 01. Juli, Seite 1619-1627</subfield><subfield code="w">(DE-627)320527026</subfield><subfield code="w">(DE-600)2015297-8</subfield><subfield code="x">2044-5326</subfield><subfield code="7">nnns</subfield></datafield><datafield tag="773" ind1="1" ind2="8"><subfield code="g">volume:20</subfield><subfield code="g">year:2005</subfield><subfield code="g">number:7</subfield><subfield code="g">day:01</subfield><subfield code="g">month:07</subfield><subfield code="g">pages:1619-1627</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://dx.doi.org/10.1557/JMR.2005.0211</subfield><subfield code="z">lizenzpflichtig</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_USEFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SYSFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_SPRINGER</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_24</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_31</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_70</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_120</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_293</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_374</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_702</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2005</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2190</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2336</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4126</subfield></datafield><datafield tag="936" ind1="b" ind2="k"><subfield code="a">51.00</subfield><subfield code="q">ASE</subfield></datafield><datafield tag="951" ind1=" " ind2=" "><subfield code="a">AR</subfield></datafield><datafield tag="952" ind1=" " ind2=" "><subfield code="d">20</subfield><subfield code="j">2005</subfield><subfield code="e">7</subfield><subfield code="b">01</subfield><subfield code="c">07</subfield><subfield code="h">1619-1627</subfield></datafield></record></collection>
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