Applications of Neutron Reflectivity Measurements to Nanoscience: Thin Films and Interfaces
Abstract Neutron reflectivity has matured in recent years from an exotic method used only by a few experts to an essential tool for the investigation of thin films and interfaces on the nanoscale. In contrast to x-ray reflectivity, which provides electron density profiles, neutron reflectivity revea...
Ausführliche Beschreibung
Gespeichert in:
| Autor*in: |
Ankner, John F. [verfasserIn] Zabel, Hartmut [verfasserIn] |
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| Format: |
E-Artikel |
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| Sprache: |
Englisch |
| Erschienen: |
2003 |
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Enthalten in: MRS bulletin - Berlin : Springer, 1982, 28(2003), 12 vom: Dez., Seite 918-922 |
|---|---|
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volume:28 ; year:2003 ; number:12 ; month:12 ; pages:918-922 |
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10.1557/mrs2003.255 |
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| 520 | |a Abstract Neutron reflectivity has matured in recent years from an exotic method used only by a few experts to an essential tool for the investigation of thin films and interfaces on the nanoscale. In contrast to x-ray reflectivity, which provides electron density profiles, neutron reflectivity reveals the nuclear density profile. This is an essential difference when exploring hydrogenous materials such as polymers, Langmuir–Blodgett films, and membranes. Furthermore, neutrons carry a magnetic moment that interacts with the magnetic induction of the film, revealing, in addition to the nuclear density profile, the magnetic density profile in layers and superlattices. Recent developments in the analysis of off-specular neutron reflectivity data enable the characterization of chemical and magnetic correlations within the film plane on nanometer to micron length scales. A new generation of pulsed neutron sources, featuring flux enhancements of factors of 10–100 over existing sources, will make these types of measurements even more exciting, while kinetic studies, pump-probe, and small-sample experiments will become feasible, opening new windows onto nanoscale materials science. | ||
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10.1557/mrs2003.255 doi (DE-627)SPR041936019 (SPR)mrs2003.255-e DE-627 ger DE-627 rakwb eng 670 ASE 51.00 bkl Ankner, John F. verfasserin aut Applications of Neutron Reflectivity Measurements to Nanoscience: Thin Films and Interfaces 2003 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Abstract Neutron reflectivity has matured in recent years from an exotic method used only by a few experts to an essential tool for the investigation of thin films and interfaces on the nanoscale. In contrast to x-ray reflectivity, which provides electron density profiles, neutron reflectivity reveals the nuclear density profile. This is an essential difference when exploring hydrogenous materials such as polymers, Langmuir–Blodgett films, and membranes. Furthermore, neutrons carry a magnetic moment that interacts with the magnetic induction of the film, revealing, in addition to the nuclear density profile, the magnetic density profile in layers and superlattices. Recent developments in the analysis of off-specular neutron reflectivity data enable the characterization of chemical and magnetic correlations within the film plane on nanometer to micron length scales. A new generation of pulsed neutron sources, featuring flux enhancements of factors of 10–100 over existing sources, will make these types of measurements even more exciting, while kinetic studies, pump-probe, and small-sample experiments will become feasible, opening new windows onto nanoscale materials science. nanoscale (dpeaa)DE-He213 neutron reflectivity (dpeaa)DE-He213 neutron scattering (dpeaa)DE-He213 thin films (dpeaa)DE-He213 Zabel, Hartmut verfasserin aut Enthalten in MRS bulletin Berlin : Springer, 1982 28(2003), 12 vom: Dez., Seite 918-922 (DE-627)379081628 (DE-600)2136359-6 1938-1425 nnns volume:28 year:2003 number:12 month:12 pages:918-922 https://dx.doi.org/10.1557/mrs2003.255 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER GBV_ILN_24 GBV_ILN_70 GBV_ILN_120 GBV_ILN_293 GBV_ILN_374 GBV_ILN_702 GBV_ILN_2190 GBV_ILN_4126 51.00 ASE AR 28 2003 12 12 918-922 |
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10.1557/mrs2003.255 doi (DE-627)SPR041936019 (SPR)mrs2003.255-e DE-627 ger DE-627 rakwb eng 670 ASE 51.00 bkl Ankner, John F. verfasserin aut Applications of Neutron Reflectivity Measurements to Nanoscience: Thin Films and Interfaces 2003 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Abstract Neutron reflectivity has matured in recent years from an exotic method used only by a few experts to an essential tool for the investigation of thin films and interfaces on the nanoscale. In contrast to x-ray reflectivity, which provides electron density profiles, neutron reflectivity reveals the nuclear density profile. This is an essential difference when exploring hydrogenous materials such as polymers, Langmuir–Blodgett films, and membranes. Furthermore, neutrons carry a magnetic moment that interacts with the magnetic induction of the film, revealing, in addition to the nuclear density profile, the magnetic density profile in layers and superlattices. Recent developments in the analysis of off-specular neutron reflectivity data enable the characterization of chemical and magnetic correlations within the film plane on nanometer to micron length scales. A new generation of pulsed neutron sources, featuring flux enhancements of factors of 10–100 over existing sources, will make these types of measurements even more exciting, while kinetic studies, pump-probe, and small-sample experiments will become feasible, opening new windows onto nanoscale materials science. nanoscale (dpeaa)DE-He213 neutron reflectivity (dpeaa)DE-He213 neutron scattering (dpeaa)DE-He213 thin films (dpeaa)DE-He213 Zabel, Hartmut verfasserin aut Enthalten in MRS bulletin Berlin : Springer, 1982 28(2003), 12 vom: Dez., Seite 918-922 (DE-627)379081628 (DE-600)2136359-6 1938-1425 nnns volume:28 year:2003 number:12 month:12 pages:918-922 https://dx.doi.org/10.1557/mrs2003.255 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER GBV_ILN_24 GBV_ILN_70 GBV_ILN_120 GBV_ILN_293 GBV_ILN_374 GBV_ILN_702 GBV_ILN_2190 GBV_ILN_4126 51.00 ASE AR 28 2003 12 12 918-922 |
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10.1557/mrs2003.255 doi (DE-627)SPR041936019 (SPR)mrs2003.255-e DE-627 ger DE-627 rakwb eng 670 ASE 51.00 bkl Ankner, John F. verfasserin aut Applications of Neutron Reflectivity Measurements to Nanoscience: Thin Films and Interfaces 2003 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Abstract Neutron reflectivity has matured in recent years from an exotic method used only by a few experts to an essential tool for the investigation of thin films and interfaces on the nanoscale. In contrast to x-ray reflectivity, which provides electron density profiles, neutron reflectivity reveals the nuclear density profile. This is an essential difference when exploring hydrogenous materials such as polymers, Langmuir–Blodgett films, and membranes. Furthermore, neutrons carry a magnetic moment that interacts with the magnetic induction of the film, revealing, in addition to the nuclear density profile, the magnetic density profile in layers and superlattices. Recent developments in the analysis of off-specular neutron reflectivity data enable the characterization of chemical and magnetic correlations within the film plane on nanometer to micron length scales. A new generation of pulsed neutron sources, featuring flux enhancements of factors of 10–100 over existing sources, will make these types of measurements even more exciting, while kinetic studies, pump-probe, and small-sample experiments will become feasible, opening new windows onto nanoscale materials science. nanoscale (dpeaa)DE-He213 neutron reflectivity (dpeaa)DE-He213 neutron scattering (dpeaa)DE-He213 thin films (dpeaa)DE-He213 Zabel, Hartmut verfasserin aut Enthalten in MRS bulletin Berlin : Springer, 1982 28(2003), 12 vom: Dez., Seite 918-922 (DE-627)379081628 (DE-600)2136359-6 1938-1425 nnns volume:28 year:2003 number:12 month:12 pages:918-922 https://dx.doi.org/10.1557/mrs2003.255 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER GBV_ILN_24 GBV_ILN_70 GBV_ILN_120 GBV_ILN_293 GBV_ILN_374 GBV_ILN_702 GBV_ILN_2190 GBV_ILN_4126 51.00 ASE AR 28 2003 12 12 918-922 |
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10.1557/mrs2003.255 doi (DE-627)SPR041936019 (SPR)mrs2003.255-e DE-627 ger DE-627 rakwb eng 670 ASE 51.00 bkl Ankner, John F. verfasserin aut Applications of Neutron Reflectivity Measurements to Nanoscience: Thin Films and Interfaces 2003 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Abstract Neutron reflectivity has matured in recent years from an exotic method used only by a few experts to an essential tool for the investigation of thin films and interfaces on the nanoscale. In contrast to x-ray reflectivity, which provides electron density profiles, neutron reflectivity reveals the nuclear density profile. This is an essential difference when exploring hydrogenous materials such as polymers, Langmuir–Blodgett films, and membranes. Furthermore, neutrons carry a magnetic moment that interacts with the magnetic induction of the film, revealing, in addition to the nuclear density profile, the magnetic density profile in layers and superlattices. Recent developments in the analysis of off-specular neutron reflectivity data enable the characterization of chemical and magnetic correlations within the film plane on nanometer to micron length scales. A new generation of pulsed neutron sources, featuring flux enhancements of factors of 10–100 over existing sources, will make these types of measurements even more exciting, while kinetic studies, pump-probe, and small-sample experiments will become feasible, opening new windows onto nanoscale materials science. nanoscale (dpeaa)DE-He213 neutron reflectivity (dpeaa)DE-He213 neutron scattering (dpeaa)DE-He213 thin films (dpeaa)DE-He213 Zabel, Hartmut verfasserin aut Enthalten in MRS bulletin Berlin : Springer, 1982 28(2003), 12 vom: Dez., Seite 918-922 (DE-627)379081628 (DE-600)2136359-6 1938-1425 nnns volume:28 year:2003 number:12 month:12 pages:918-922 https://dx.doi.org/10.1557/mrs2003.255 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER GBV_ILN_24 GBV_ILN_70 GBV_ILN_120 GBV_ILN_293 GBV_ILN_374 GBV_ILN_702 GBV_ILN_2190 GBV_ILN_4126 51.00 ASE AR 28 2003 12 12 918-922 |
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10.1557/mrs2003.255 doi (DE-627)SPR041936019 (SPR)mrs2003.255-e DE-627 ger DE-627 rakwb eng 670 ASE 51.00 bkl Ankner, John F. verfasserin aut Applications of Neutron Reflectivity Measurements to Nanoscience: Thin Films and Interfaces 2003 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Abstract Neutron reflectivity has matured in recent years from an exotic method used only by a few experts to an essential tool for the investigation of thin films and interfaces on the nanoscale. In contrast to x-ray reflectivity, which provides electron density profiles, neutron reflectivity reveals the nuclear density profile. This is an essential difference when exploring hydrogenous materials such as polymers, Langmuir–Blodgett films, and membranes. Furthermore, neutrons carry a magnetic moment that interacts with the magnetic induction of the film, revealing, in addition to the nuclear density profile, the magnetic density profile in layers and superlattices. Recent developments in the analysis of off-specular neutron reflectivity data enable the characterization of chemical and magnetic correlations within the film plane on nanometer to micron length scales. A new generation of pulsed neutron sources, featuring flux enhancements of factors of 10–100 over existing sources, will make these types of measurements even more exciting, while kinetic studies, pump-probe, and small-sample experiments will become feasible, opening new windows onto nanoscale materials science. nanoscale (dpeaa)DE-He213 neutron reflectivity (dpeaa)DE-He213 neutron scattering (dpeaa)DE-He213 thin films (dpeaa)DE-He213 Zabel, Hartmut verfasserin aut Enthalten in MRS bulletin Berlin : Springer, 1982 28(2003), 12 vom: Dez., Seite 918-922 (DE-627)379081628 (DE-600)2136359-6 1938-1425 nnns volume:28 year:2003 number:12 month:12 pages:918-922 https://dx.doi.org/10.1557/mrs2003.255 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER GBV_ILN_24 GBV_ILN_70 GBV_ILN_120 GBV_ILN_293 GBV_ILN_374 GBV_ILN_702 GBV_ILN_2190 GBV_ILN_4126 51.00 ASE AR 28 2003 12 12 918-922 |
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Abstract Neutron reflectivity has matured in recent years from an exotic method used only by a few experts to an essential tool for the investigation of thin films and interfaces on the nanoscale. In contrast to x-ray reflectivity, which provides electron density profiles, neutron reflectivity reveals the nuclear density profile. This is an essential difference when exploring hydrogenous materials such as polymers, Langmuir–Blodgett films, and membranes. Furthermore, neutrons carry a magnetic moment that interacts with the magnetic induction of the film, revealing, in addition to the nuclear density profile, the magnetic density profile in layers and superlattices. Recent developments in the analysis of off-specular neutron reflectivity data enable the characterization of chemical and magnetic correlations within the film plane on nanometer to micron length scales. A new generation of pulsed neutron sources, featuring flux enhancements of factors of 10–100 over existing sources, will make these types of measurements even more exciting, while kinetic studies, pump-probe, and small-sample experiments will become feasible, opening new windows onto nanoscale materials science. |
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Abstract Neutron reflectivity has matured in recent years from an exotic method used only by a few experts to an essential tool for the investigation of thin films and interfaces on the nanoscale. In contrast to x-ray reflectivity, which provides electron density profiles, neutron reflectivity reveals the nuclear density profile. This is an essential difference when exploring hydrogenous materials such as polymers, Langmuir–Blodgett films, and membranes. Furthermore, neutrons carry a magnetic moment that interacts with the magnetic induction of the film, revealing, in addition to the nuclear density profile, the magnetic density profile in layers and superlattices. Recent developments in the analysis of off-specular neutron reflectivity data enable the characterization of chemical and magnetic correlations within the film plane on nanometer to micron length scales. A new generation of pulsed neutron sources, featuring flux enhancements of factors of 10–100 over existing sources, will make these types of measurements even more exciting, while kinetic studies, pump-probe, and small-sample experiments will become feasible, opening new windows onto nanoscale materials science. |
| abstract_unstemmed |
Abstract Neutron reflectivity has matured in recent years from an exotic method used only by a few experts to an essential tool for the investigation of thin films and interfaces on the nanoscale. In contrast to x-ray reflectivity, which provides electron density profiles, neutron reflectivity reveals the nuclear density profile. This is an essential difference when exploring hydrogenous materials such as polymers, Langmuir–Blodgett films, and membranes. Furthermore, neutrons carry a magnetic moment that interacts with the magnetic induction of the film, revealing, in addition to the nuclear density profile, the magnetic density profile in layers and superlattices. Recent developments in the analysis of off-specular neutron reflectivity data enable the characterization of chemical and magnetic correlations within the film plane on nanometer to micron length scales. A new generation of pulsed neutron sources, featuring flux enhancements of factors of 10–100 over existing sources, will make these types of measurements even more exciting, while kinetic studies, pump-probe, and small-sample experiments will become feasible, opening new windows onto nanoscale materials science. |
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12 |
| title_short |
Applications of Neutron Reflectivity Measurements to Nanoscience: Thin Films and Interfaces |
| url |
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| author2 |
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