Energy Dispersive X-Ray Spectrometry with the Transition Edge Sensor Microcalorimeter: A Revolutionary Advance in Materials Microanalysis
Abstract The NIST microcalorimeter energy dispersive x-ray spectrometer provides important advances in x-ray spectrometry. The high spectral resolution, approaching 2 eV for photon energies below 2 keV, the wide photon energy coverage, 250 eV to 10 keV, and the energy dispersive operation enable a w...
Ausführliche Beschreibung
Gespeichert in:
| Autor*in: |
Newbury, Dale [verfasserIn] |
|---|
| Format: |
E-Artikel |
|---|---|
| Sprache: |
Englisch |
| Erschienen: |
1999 |
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| Anmerkung: |
© The Materials Research Society 2000 |
|---|
| Übergeordnetes Werk: |
Enthalten in: MRS online proceedings library - Springer International Publishing, 1998, 589(1999), 1 vom: Dez. |
|---|---|
| Übergeordnetes Werk: |
volume:589 ; year:1999 ; number:1 ; month:12 |
| Links: |
|---|
| DOI / URN: |
10.1557/PROC-589-75 |
|---|
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SPR042882079 |
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| 520 | |a Abstract The NIST microcalorimeter energy dispersive x-ray spectrometer provides important advances in x-ray spectrometry. The high spectral resolution, approaching 2 eV for photon energies below 2 keV, the wide photon energy coverage, 250 eV to 10 keV, and the energy dispersive operation enable a wide range of materials characterization problems to be addressed. This performance is especially critical to high spatial resolution, low-voltage x-ray microanalysis performed with the field-emission gun scanning electron microscope. | ||
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10.1557/PROC-589-75 doi (DE-627)SPR042882079 (SPR)PROC-589-75-e DE-627 ger DE-627 rakwb eng 670 VZ Newbury, Dale verfasserin aut Energy Dispersive X-Ray Spectrometry with the Transition Edge Sensor Microcalorimeter: A Revolutionary Advance in Materials Microanalysis 1999 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier © The Materials Research Society 2000 Abstract The NIST microcalorimeter energy dispersive x-ray spectrometer provides important advances in x-ray spectrometry. The high spectral resolution, approaching 2 eV for photon energies below 2 keV, the wide photon energy coverage, 250 eV to 10 keV, and the energy dispersive operation enable a wide range of materials characterization problems to be addressed. This performance is especially critical to high spatial resolution, low-voltage x-ray microanalysis performed with the field-emission gun scanning electron microscope. Wollman, David aut Irwin, Kent aut Hilton, Gene aut Martinis, John aut Enthalten in MRS online proceedings library Springer International Publishing, 1998 589(1999), 1 vom: Dez. (DE-627)57782046X (DE-600)2451008-7 1946-4274 nnns volume:589 year:1999 number:1 month:12 https://dx.doi.org/10.1557/PROC-589-75 lizenzpflichtig Volltext SYSFLAG_0 GBV_SPRINGER GBV_ILN_2005 AR 589 1999 1 12 |
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10.1557/PROC-589-75 doi (DE-627)SPR042882079 (SPR)PROC-589-75-e DE-627 ger DE-627 rakwb eng 670 VZ Newbury, Dale verfasserin aut Energy Dispersive X-Ray Spectrometry with the Transition Edge Sensor Microcalorimeter: A Revolutionary Advance in Materials Microanalysis 1999 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier © The Materials Research Society 2000 Abstract The NIST microcalorimeter energy dispersive x-ray spectrometer provides important advances in x-ray spectrometry. The high spectral resolution, approaching 2 eV for photon energies below 2 keV, the wide photon energy coverage, 250 eV to 10 keV, and the energy dispersive operation enable a wide range of materials characterization problems to be addressed. This performance is especially critical to high spatial resolution, low-voltage x-ray microanalysis performed with the field-emission gun scanning electron microscope. Wollman, David aut Irwin, Kent aut Hilton, Gene aut Martinis, John aut Enthalten in MRS online proceedings library Springer International Publishing, 1998 589(1999), 1 vom: Dez. (DE-627)57782046X (DE-600)2451008-7 1946-4274 nnns volume:589 year:1999 number:1 month:12 https://dx.doi.org/10.1557/PROC-589-75 lizenzpflichtig Volltext SYSFLAG_0 GBV_SPRINGER GBV_ILN_2005 AR 589 1999 1 12 |
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10.1557/PROC-589-75 doi (DE-627)SPR042882079 (SPR)PROC-589-75-e DE-627 ger DE-627 rakwb eng 670 VZ Newbury, Dale verfasserin aut Energy Dispersive X-Ray Spectrometry with the Transition Edge Sensor Microcalorimeter: A Revolutionary Advance in Materials Microanalysis 1999 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier © The Materials Research Society 2000 Abstract The NIST microcalorimeter energy dispersive x-ray spectrometer provides important advances in x-ray spectrometry. The high spectral resolution, approaching 2 eV for photon energies below 2 keV, the wide photon energy coverage, 250 eV to 10 keV, and the energy dispersive operation enable a wide range of materials characterization problems to be addressed. This performance is especially critical to high spatial resolution, low-voltage x-ray microanalysis performed with the field-emission gun scanning electron microscope. Wollman, David aut Irwin, Kent aut Hilton, Gene aut Martinis, John aut Enthalten in MRS online proceedings library Springer International Publishing, 1998 589(1999), 1 vom: Dez. (DE-627)57782046X (DE-600)2451008-7 1946-4274 nnns volume:589 year:1999 number:1 month:12 https://dx.doi.org/10.1557/PROC-589-75 lizenzpflichtig Volltext SYSFLAG_0 GBV_SPRINGER GBV_ILN_2005 AR 589 1999 1 12 |
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10.1557/PROC-589-75 doi (DE-627)SPR042882079 (SPR)PROC-589-75-e DE-627 ger DE-627 rakwb eng 670 VZ Newbury, Dale verfasserin aut Energy Dispersive X-Ray Spectrometry with the Transition Edge Sensor Microcalorimeter: A Revolutionary Advance in Materials Microanalysis 1999 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier © The Materials Research Society 2000 Abstract The NIST microcalorimeter energy dispersive x-ray spectrometer provides important advances in x-ray spectrometry. The high spectral resolution, approaching 2 eV for photon energies below 2 keV, the wide photon energy coverage, 250 eV to 10 keV, and the energy dispersive operation enable a wide range of materials characterization problems to be addressed. This performance is especially critical to high spatial resolution, low-voltage x-ray microanalysis performed with the field-emission gun scanning electron microscope. Wollman, David aut Irwin, Kent aut Hilton, Gene aut Martinis, John aut Enthalten in MRS online proceedings library Springer International Publishing, 1998 589(1999), 1 vom: Dez. (DE-627)57782046X (DE-600)2451008-7 1946-4274 nnns volume:589 year:1999 number:1 month:12 https://dx.doi.org/10.1557/PROC-589-75 lizenzpflichtig Volltext SYSFLAG_0 GBV_SPRINGER GBV_ILN_2005 AR 589 1999 1 12 |
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Abstract The NIST microcalorimeter energy dispersive x-ray spectrometer provides important advances in x-ray spectrometry. The high spectral resolution, approaching 2 eV for photon energies below 2 keV, the wide photon energy coverage, 250 eV to 10 keV, and the energy dispersive operation enable a wide range of materials characterization problems to be addressed. This performance is especially critical to high spatial resolution, low-voltage x-ray microanalysis performed with the field-emission gun scanning electron microscope. © The Materials Research Society 2000 |
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Abstract The NIST microcalorimeter energy dispersive x-ray spectrometer provides important advances in x-ray spectrometry. The high spectral resolution, approaching 2 eV for photon energies below 2 keV, the wide photon energy coverage, 250 eV to 10 keV, and the energy dispersive operation enable a wide range of materials characterization problems to be addressed. This performance is especially critical to high spatial resolution, low-voltage x-ray microanalysis performed with the field-emission gun scanning electron microscope. © The Materials Research Society 2000 |
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Abstract The NIST microcalorimeter energy dispersive x-ray spectrometer provides important advances in x-ray spectrometry. The high spectral resolution, approaching 2 eV for photon energies below 2 keV, the wide photon energy coverage, 250 eV to 10 keV, and the energy dispersive operation enable a wide range of materials characterization problems to be addressed. This performance is especially critical to high spatial resolution, low-voltage x-ray microanalysis performed with the field-emission gun scanning electron microscope. © The Materials Research Society 2000 |
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