Electrical properties of Pd-contacted single-walled carbon nanotubes: a scanning probe microscopy study
Abstract Pd is widely used in producing electrodes to single-walled carbon nanotubes (SWNT). However up to now its ability to form ohmic contacts to SWNTs was not employed in scanning probe microscopy (SPM). Here we present a study of SWNTs with Pd electrodes by SPM using Pd-coated tips. SWNTs were...
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| Autor*in: |
Kononenko, O. V. [verfasserIn] Bozhko, S. I. [verfasserIn] Matveev, V. N. [verfasserIn] Volkov, V. T. [verfasserIn] Knyazev, M. A. [verfasserIn] Il’in, A. I. [verfasserIn] Matveev, D. V. [verfasserIn] Kasumov, Yu. A. [verfasserIn] Khodos, I. I. [verfasserIn] |
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Englisch |
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2010 |
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Enthalten in: MRS online proceedings library - Warrendale, Pa. : MRS, 1998, 1258(2010), 1 vom: 01. Okt. |
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volume:1258 ; year:2010 ; number:1 ; day:01 ; month:10 |
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10.1557/PROC-1258-R10-19 |
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| 520 | |a Abstract Pd is widely used in producing electrodes to single-walled carbon nanotubes (SWNT). However up to now its ability to form ohmic contacts to SWNTs was not employed in scanning probe microscopy (SPM). Here we present a study of SWNTs with Pd electrodes by SPM using Pd-coated tips. SWNTs were selectively grown on oxidized silicon substrates by low pressure CVD method. Pd electrodes were prepared to SWNTs to fabricate two terminal structures for SWNTs resistance measurements. It is shown that SPM Kelvin mode is a reliable technique for SWNT detection on insulating substrate. Contact potential difference between Pd electrode and SWNT is measured using the Kelvin mode. | ||
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| 700 | 1 | |a Kasumov, Yu. A. |e verfasserin |4 aut | |
| 700 | 1 | |a Khodos, I. I. |e verfasserin |4 aut | |
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Abstract Pd is widely used in producing electrodes to single-walled carbon nanotubes (SWNT). However up to now its ability to form ohmic contacts to SWNTs was not employed in scanning probe microscopy (SPM). Here we present a study of SWNTs with Pd electrodes by SPM using Pd-coated tips. SWNTs were selectively grown on oxidized silicon substrates by low pressure CVD method. Pd electrodes were prepared to SWNTs to fabricate two terminal structures for SWNTs resistance measurements. It is shown that SPM Kelvin mode is a reliable technique for SWNT detection on insulating substrate. Contact potential difference between Pd electrode and SWNT is measured using the Kelvin mode. |
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Abstract Pd is widely used in producing electrodes to single-walled carbon nanotubes (SWNT). However up to now its ability to form ohmic contacts to SWNTs was not employed in scanning probe microscopy (SPM). Here we present a study of SWNTs with Pd electrodes by SPM using Pd-coated tips. SWNTs were selectively grown on oxidized silicon substrates by low pressure CVD method. Pd electrodes were prepared to SWNTs to fabricate two terminal structures for SWNTs resistance measurements. It is shown that SPM Kelvin mode is a reliable technique for SWNT detection on insulating substrate. Contact potential difference between Pd electrode and SWNT is measured using the Kelvin mode. |
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Abstract Pd is widely used in producing electrodes to single-walled carbon nanotubes (SWNT). However up to now its ability to form ohmic contacts to SWNTs was not employed in scanning probe microscopy (SPM). Here we present a study of SWNTs with Pd electrodes by SPM using Pd-coated tips. SWNTs were selectively grown on oxidized silicon substrates by low pressure CVD method. Pd electrodes were prepared to SWNTs to fabricate two terminal structures for SWNTs resistance measurements. It is shown that SPM Kelvin mode is a reliable technique for SWNT detection on insulating substrate. Contact potential difference between Pd electrode and SWNT is measured using the Kelvin mode. |
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Bozhko, S. I. Matveev, V. N. Volkov, V. T. Knyazev, M. A. Il’in, A. I. Matveev, D. V. Kasumov, Yu. A. Khodos, I. I. |
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Bozhko, S. I. Matveev, V. N. Volkov, V. T. Knyazev, M. A. Il’in, A. I. Matveev, D. V. Kasumov, Yu. A. Khodos, I. I. |
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10.1557/PROC-1258-R10-19 |
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