Precision inspection of transparent component quality
Abstract In this work, a method using transmission interferometry is proposed to detect micro defects (streaks, inclusions, air bubbles, grooves, cracks, etc.) present in transparent materials surface. This technique is non-destructive and non-contact for the analysis of transparent and optical comp...
Ausführliche Beschreibung
Gespeichert in:
| Autor*in: |
Meziane, Rahima [verfasserIn] |
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| Format: |
E-Artikel |
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| Sprache: |
Englisch |
| Erschienen: |
2023 |
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| Schlagwörter: |
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| Anmerkung: |
© The Author(s), under exclusive licence to Springer-Verlag London Ltd., part of Springer Nature 2023. Springer Nature or its licensor (e.g. a society or other partner) holds exclusive rights to this article under a publishing agreement with the author(s) or other rightsholder(s); author self-archiving of the accepted manuscript version of this article is solely governed by the terms of such publishing agreement and applicable law. |
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| Übergeordnetes Werk: |
Enthalten in: The international journal of advanced manufacturing technology - London : Springer, 1985, 125(2023), 3-4 vom: 13. Jan., Seite 1731-1741 |
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| Übergeordnetes Werk: |
volume:125 ; year:2023 ; number:3-4 ; day:13 ; month:01 ; pages:1731-1741 |
| Links: |
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| DOI / URN: |
10.1007/s00170-022-10774-3 |
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SPR049347616 |
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| 520 | |a Abstract In this work, a method using transmission interferometry is proposed to detect micro defects (streaks, inclusions, air bubbles, grooves, cracks, etc.) present in transparent materials surface. This technique is non-destructive and non-contact for the analysis of transparent and optical components whose surfaces vary from a few $ mm^{2} $ to larger sizes. The purpose of this method is to provide a means as simple as possible and to identify defects with low contrast, and in particular barely visible defects, and to differentiate between the defects. The transmission system generates interference fringes by the superposition of two microscopic periodic structures. According to the principle of the method, the image of the periodic microscopic structure, transmitted by the laser beam, traverses the sample. It then superposed on the reference microscopic structure; to generate the interference fringes, which materialize the presence of defects in the material. Changes in the shape of interference fringes inform the presence and dimensions of defects. This technique makes it possible to clearly identify microscopic and submicroscopic defects, thanks to the high resolution of the system. The optical device used allows high defect magnification of up to 1000 times. This control and measurement method allows for real-time inspection. It provides high detection resolution, allowing better observation of defects, which facilitates the automation of measurements and controls. Therefore, the proposed method can be suitable for the detection of surface defects in transparent optical objects such as optical films, lenses, and prisms. | ||
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| 700 | 1 | |a Messagier, Meriem |4 aut | |
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10.1007/s00170-022-10774-3 doi (DE-627)SPR049347616 (SPR)s00170-022-10774-3-e DE-627 ger DE-627 rakwb eng Meziane, Rahima verfasserin aut Precision inspection of transparent component quality 2023 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier © The Author(s), under exclusive licence to Springer-Verlag London Ltd., part of Springer Nature 2023. Springer Nature or its licensor (e.g. a society or other partner) holds exclusive rights to this article under a publishing agreement with the author(s) or other rightsholder(s); author self-archiving of the accepted manuscript version of this article is solely governed by the terms of such publishing agreement and applicable law. Abstract In this work, a method using transmission interferometry is proposed to detect micro defects (streaks, inclusions, air bubbles, grooves, cracks, etc.) present in transparent materials surface. This technique is non-destructive and non-contact for the analysis of transparent and optical components whose surfaces vary from a few $ mm^{2} $ to larger sizes. The purpose of this method is to provide a means as simple as possible and to identify defects with low contrast, and in particular barely visible defects, and to differentiate between the defects. The transmission system generates interference fringes by the superposition of two microscopic periodic structures. According to the principle of the method, the image of the periodic microscopic structure, transmitted by the laser beam, traverses the sample. It then superposed on the reference microscopic structure; to generate the interference fringes, which materialize the presence of defects in the material. Changes in the shape of interference fringes inform the presence and dimensions of defects. This technique makes it possible to clearly identify microscopic and submicroscopic defects, thanks to the high resolution of the system. The optical device used allows high defect magnification of up to 1000 times. This control and measurement method allows for real-time inspection. It provides high detection resolution, allowing better observation of defects, which facilitates the automation of measurements and controls. Therefore, the proposed method can be suitable for the detection of surface defects in transparent optical objects such as optical films, lenses, and prisms. Optical inspection (dpeaa)DE-He213 Optical device (dpeaa)DE-He213 Transparent materials (dpeaa)DE-He213 Moiré technique (dpeaa)DE-He213 Moiré fringes (dpeaa)DE-He213 Grating (dpeaa)DE-He213 Meguellati, Saїd aut Messagier, Meriem aut Enthalten in The international journal of advanced manufacturing technology London : Springer, 1985 125(2023), 3-4 vom: 13. Jan., Seite 1731-1741 (DE-627)270127712 (DE-600)1476510-X 1433-3015 nnns volume:125 year:2023 number:3-4 day:13 month:01 pages:1731-1741 https://dx.doi.org/10.1007/s00170-022-10774-3 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_105 GBV_ILN_110 GBV_ILN_120 GBV_ILN_138 GBV_ILN_150 GBV_ILN_151 GBV_ILN_152 GBV_ILN_161 GBV_ILN_170 GBV_ILN_171 GBV_ILN_187 GBV_ILN_206 GBV_ILN_213 GBV_ILN_224 GBV_ILN_230 GBV_ILN_250 GBV_ILN_281 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_636 GBV_ILN_702 GBV_ILN_2001 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2006 GBV_ILN_2007 GBV_ILN_2008 GBV_ILN_2009 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2026 GBV_ILN_2027 GBV_ILN_2031 GBV_ILN_2034 GBV_ILN_2037 GBV_ILN_2038 GBV_ILN_2039 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2055 GBV_ILN_2056 GBV_ILN_2057 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2088 GBV_ILN_2093 GBV_ILN_2106 GBV_ILN_2107 GBV_ILN_2108 GBV_ILN_2110 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2118 GBV_ILN_2119 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2144 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2188 GBV_ILN_2190 GBV_ILN_2232 GBV_ILN_2336 GBV_ILN_2446 GBV_ILN_2470 GBV_ILN_2472 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_2548 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4046 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4242 GBV_ILN_4246 GBV_ILN_4249 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4328 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4336 GBV_ILN_4338 GBV_ILN_4393 GBV_ILN_4700 AR 125 2023 3-4 13 01 1731-1741 |
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10.1007/s00170-022-10774-3 doi (DE-627)SPR049347616 (SPR)s00170-022-10774-3-e DE-627 ger DE-627 rakwb eng Meziane, Rahima verfasserin aut Precision inspection of transparent component quality 2023 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier © The Author(s), under exclusive licence to Springer-Verlag London Ltd., part of Springer Nature 2023. Springer Nature or its licensor (e.g. a society or other partner) holds exclusive rights to this article under a publishing agreement with the author(s) or other rightsholder(s); author self-archiving of the accepted manuscript version of this article is solely governed by the terms of such publishing agreement and applicable law. Abstract In this work, a method using transmission interferometry is proposed to detect micro defects (streaks, inclusions, air bubbles, grooves, cracks, etc.) present in transparent materials surface. This technique is non-destructive and non-contact for the analysis of transparent and optical components whose surfaces vary from a few $ mm^{2} $ to larger sizes. The purpose of this method is to provide a means as simple as possible and to identify defects with low contrast, and in particular barely visible defects, and to differentiate between the defects. The transmission system generates interference fringes by the superposition of two microscopic periodic structures. According to the principle of the method, the image of the periodic microscopic structure, transmitted by the laser beam, traverses the sample. It then superposed on the reference microscopic structure; to generate the interference fringes, which materialize the presence of defects in the material. Changes in the shape of interference fringes inform the presence and dimensions of defects. This technique makes it possible to clearly identify microscopic and submicroscopic defects, thanks to the high resolution of the system. The optical device used allows high defect magnification of up to 1000 times. This control and measurement method allows for real-time inspection. It provides high detection resolution, allowing better observation of defects, which facilitates the automation of measurements and controls. Therefore, the proposed method can be suitable for the detection of surface defects in transparent optical objects such as optical films, lenses, and prisms. Optical inspection (dpeaa)DE-He213 Optical device (dpeaa)DE-He213 Transparent materials (dpeaa)DE-He213 Moiré technique (dpeaa)DE-He213 Moiré fringes (dpeaa)DE-He213 Grating (dpeaa)DE-He213 Meguellati, Saїd aut Messagier, Meriem aut Enthalten in The international journal of advanced manufacturing technology London : Springer, 1985 125(2023), 3-4 vom: 13. Jan., Seite 1731-1741 (DE-627)270127712 (DE-600)1476510-X 1433-3015 nnns volume:125 year:2023 number:3-4 day:13 month:01 pages:1731-1741 https://dx.doi.org/10.1007/s00170-022-10774-3 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_105 GBV_ILN_110 GBV_ILN_120 GBV_ILN_138 GBV_ILN_150 GBV_ILN_151 GBV_ILN_152 GBV_ILN_161 GBV_ILN_170 GBV_ILN_171 GBV_ILN_187 GBV_ILN_206 GBV_ILN_213 GBV_ILN_224 GBV_ILN_230 GBV_ILN_250 GBV_ILN_281 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_636 GBV_ILN_702 GBV_ILN_2001 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2006 GBV_ILN_2007 GBV_ILN_2008 GBV_ILN_2009 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2026 GBV_ILN_2027 GBV_ILN_2031 GBV_ILN_2034 GBV_ILN_2037 GBV_ILN_2038 GBV_ILN_2039 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2055 GBV_ILN_2056 GBV_ILN_2057 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2088 GBV_ILN_2093 GBV_ILN_2106 GBV_ILN_2107 GBV_ILN_2108 GBV_ILN_2110 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2118 GBV_ILN_2119 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2144 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2188 GBV_ILN_2190 GBV_ILN_2232 GBV_ILN_2336 GBV_ILN_2446 GBV_ILN_2470 GBV_ILN_2472 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_2548 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4046 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4242 GBV_ILN_4246 GBV_ILN_4249 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4328 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4336 GBV_ILN_4338 GBV_ILN_4393 GBV_ILN_4700 AR 125 2023 3-4 13 01 1731-1741 |
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10.1007/s00170-022-10774-3 doi (DE-627)SPR049347616 (SPR)s00170-022-10774-3-e DE-627 ger DE-627 rakwb eng Meziane, Rahima verfasserin aut Precision inspection of transparent component quality 2023 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier © The Author(s), under exclusive licence to Springer-Verlag London Ltd., part of Springer Nature 2023. Springer Nature or its licensor (e.g. a society or other partner) holds exclusive rights to this article under a publishing agreement with the author(s) or other rightsholder(s); author self-archiving of the accepted manuscript version of this article is solely governed by the terms of such publishing agreement and applicable law. Abstract In this work, a method using transmission interferometry is proposed to detect micro defects (streaks, inclusions, air bubbles, grooves, cracks, etc.) present in transparent materials surface. This technique is non-destructive and non-contact for the analysis of transparent and optical components whose surfaces vary from a few $ mm^{2} $ to larger sizes. The purpose of this method is to provide a means as simple as possible and to identify defects with low contrast, and in particular barely visible defects, and to differentiate between the defects. The transmission system generates interference fringes by the superposition of two microscopic periodic structures. According to the principle of the method, the image of the periodic microscopic structure, transmitted by the laser beam, traverses the sample. It then superposed on the reference microscopic structure; to generate the interference fringes, which materialize the presence of defects in the material. Changes in the shape of interference fringes inform the presence and dimensions of defects. This technique makes it possible to clearly identify microscopic and submicroscopic defects, thanks to the high resolution of the system. The optical device used allows high defect magnification of up to 1000 times. This control and measurement method allows for real-time inspection. It provides high detection resolution, allowing better observation of defects, which facilitates the automation of measurements and controls. Therefore, the proposed method can be suitable for the detection of surface defects in transparent optical objects such as optical films, lenses, and prisms. Optical inspection (dpeaa)DE-He213 Optical device (dpeaa)DE-He213 Transparent materials (dpeaa)DE-He213 Moiré technique (dpeaa)DE-He213 Moiré fringes (dpeaa)DE-He213 Grating (dpeaa)DE-He213 Meguellati, Saїd aut Messagier, Meriem aut Enthalten in The international journal of advanced manufacturing technology London : Springer, 1985 125(2023), 3-4 vom: 13. Jan., Seite 1731-1741 (DE-627)270127712 (DE-600)1476510-X 1433-3015 nnns volume:125 year:2023 number:3-4 day:13 month:01 pages:1731-1741 https://dx.doi.org/10.1007/s00170-022-10774-3 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_105 GBV_ILN_110 GBV_ILN_120 GBV_ILN_138 GBV_ILN_150 GBV_ILN_151 GBV_ILN_152 GBV_ILN_161 GBV_ILN_170 GBV_ILN_171 GBV_ILN_187 GBV_ILN_206 GBV_ILN_213 GBV_ILN_224 GBV_ILN_230 GBV_ILN_250 GBV_ILN_281 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_636 GBV_ILN_702 GBV_ILN_2001 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2006 GBV_ILN_2007 GBV_ILN_2008 GBV_ILN_2009 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2026 GBV_ILN_2027 GBV_ILN_2031 GBV_ILN_2034 GBV_ILN_2037 GBV_ILN_2038 GBV_ILN_2039 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2055 GBV_ILN_2056 GBV_ILN_2057 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2088 GBV_ILN_2093 GBV_ILN_2106 GBV_ILN_2107 GBV_ILN_2108 GBV_ILN_2110 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2118 GBV_ILN_2119 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2144 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2188 GBV_ILN_2190 GBV_ILN_2232 GBV_ILN_2336 GBV_ILN_2446 GBV_ILN_2470 GBV_ILN_2472 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_2548 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4046 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4242 GBV_ILN_4246 GBV_ILN_4249 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4328 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4336 GBV_ILN_4338 GBV_ILN_4393 GBV_ILN_4700 AR 125 2023 3-4 13 01 1731-1741 |
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10.1007/s00170-022-10774-3 doi (DE-627)SPR049347616 (SPR)s00170-022-10774-3-e DE-627 ger DE-627 rakwb eng Meziane, Rahima verfasserin aut Precision inspection of transparent component quality 2023 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier © The Author(s), under exclusive licence to Springer-Verlag London Ltd., part of Springer Nature 2023. Springer Nature or its licensor (e.g. a society or other partner) holds exclusive rights to this article under a publishing agreement with the author(s) or other rightsholder(s); author self-archiving of the accepted manuscript version of this article is solely governed by the terms of such publishing agreement and applicable law. Abstract In this work, a method using transmission interferometry is proposed to detect micro defects (streaks, inclusions, air bubbles, grooves, cracks, etc.) present in transparent materials surface. This technique is non-destructive and non-contact for the analysis of transparent and optical components whose surfaces vary from a few $ mm^{2} $ to larger sizes. The purpose of this method is to provide a means as simple as possible and to identify defects with low contrast, and in particular barely visible defects, and to differentiate between the defects. The transmission system generates interference fringes by the superposition of two microscopic periodic structures. According to the principle of the method, the image of the periodic microscopic structure, transmitted by the laser beam, traverses the sample. It then superposed on the reference microscopic structure; to generate the interference fringes, which materialize the presence of defects in the material. Changes in the shape of interference fringes inform the presence and dimensions of defects. This technique makes it possible to clearly identify microscopic and submicroscopic defects, thanks to the high resolution of the system. The optical device used allows high defect magnification of up to 1000 times. This control and measurement method allows for real-time inspection. It provides high detection resolution, allowing better observation of defects, which facilitates the automation of measurements and controls. Therefore, the proposed method can be suitable for the detection of surface defects in transparent optical objects such as optical films, lenses, and prisms. Optical inspection (dpeaa)DE-He213 Optical device (dpeaa)DE-He213 Transparent materials (dpeaa)DE-He213 Moiré technique (dpeaa)DE-He213 Moiré fringes (dpeaa)DE-He213 Grating (dpeaa)DE-He213 Meguellati, Saїd aut Messagier, Meriem aut Enthalten in The international journal of advanced manufacturing technology London : Springer, 1985 125(2023), 3-4 vom: 13. Jan., Seite 1731-1741 (DE-627)270127712 (DE-600)1476510-X 1433-3015 nnns volume:125 year:2023 number:3-4 day:13 month:01 pages:1731-1741 https://dx.doi.org/10.1007/s00170-022-10774-3 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_105 GBV_ILN_110 GBV_ILN_120 GBV_ILN_138 GBV_ILN_150 GBV_ILN_151 GBV_ILN_152 GBV_ILN_161 GBV_ILN_170 GBV_ILN_171 GBV_ILN_187 GBV_ILN_206 GBV_ILN_213 GBV_ILN_224 GBV_ILN_230 GBV_ILN_250 GBV_ILN_281 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_636 GBV_ILN_702 GBV_ILN_2001 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2006 GBV_ILN_2007 GBV_ILN_2008 GBV_ILN_2009 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2026 GBV_ILN_2027 GBV_ILN_2031 GBV_ILN_2034 GBV_ILN_2037 GBV_ILN_2038 GBV_ILN_2039 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2055 GBV_ILN_2056 GBV_ILN_2057 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2088 GBV_ILN_2093 GBV_ILN_2106 GBV_ILN_2107 GBV_ILN_2108 GBV_ILN_2110 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2118 GBV_ILN_2119 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2144 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2188 GBV_ILN_2190 GBV_ILN_2232 GBV_ILN_2336 GBV_ILN_2446 GBV_ILN_2470 GBV_ILN_2472 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_2548 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4046 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4242 GBV_ILN_4246 GBV_ILN_4249 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4328 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4336 GBV_ILN_4338 GBV_ILN_4393 GBV_ILN_4700 AR 125 2023 3-4 13 01 1731-1741 |
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10.1007/s00170-022-10774-3 doi (DE-627)SPR049347616 (SPR)s00170-022-10774-3-e DE-627 ger DE-627 rakwb eng Meziane, Rahima verfasserin aut Precision inspection of transparent component quality 2023 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier © The Author(s), under exclusive licence to Springer-Verlag London Ltd., part of Springer Nature 2023. Springer Nature or its licensor (e.g. a society or other partner) holds exclusive rights to this article under a publishing agreement with the author(s) or other rightsholder(s); author self-archiving of the accepted manuscript version of this article is solely governed by the terms of such publishing agreement and applicable law. Abstract In this work, a method using transmission interferometry is proposed to detect micro defects (streaks, inclusions, air bubbles, grooves, cracks, etc.) present in transparent materials surface. This technique is non-destructive and non-contact for the analysis of transparent and optical components whose surfaces vary from a few $ mm^{2} $ to larger sizes. The purpose of this method is to provide a means as simple as possible and to identify defects with low contrast, and in particular barely visible defects, and to differentiate between the defects. The transmission system generates interference fringes by the superposition of two microscopic periodic structures. According to the principle of the method, the image of the periodic microscopic structure, transmitted by the laser beam, traverses the sample. It then superposed on the reference microscopic structure; to generate the interference fringes, which materialize the presence of defects in the material. Changes in the shape of interference fringes inform the presence and dimensions of defects. This technique makes it possible to clearly identify microscopic and submicroscopic defects, thanks to the high resolution of the system. The optical device used allows high defect magnification of up to 1000 times. This control and measurement method allows for real-time inspection. It provides high detection resolution, allowing better observation of defects, which facilitates the automation of measurements and controls. Therefore, the proposed method can be suitable for the detection of surface defects in transparent optical objects such as optical films, lenses, and prisms. Optical inspection (dpeaa)DE-He213 Optical device (dpeaa)DE-He213 Transparent materials (dpeaa)DE-He213 Moiré technique (dpeaa)DE-He213 Moiré fringes (dpeaa)DE-He213 Grating (dpeaa)DE-He213 Meguellati, Saїd aut Messagier, Meriem aut Enthalten in The international journal of advanced manufacturing technology London : Springer, 1985 125(2023), 3-4 vom: 13. Jan., Seite 1731-1741 (DE-627)270127712 (DE-600)1476510-X 1433-3015 nnns volume:125 year:2023 number:3-4 day:13 month:01 pages:1731-1741 https://dx.doi.org/10.1007/s00170-022-10774-3 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_105 GBV_ILN_110 GBV_ILN_120 GBV_ILN_138 GBV_ILN_150 GBV_ILN_151 GBV_ILN_152 GBV_ILN_161 GBV_ILN_170 GBV_ILN_171 GBV_ILN_187 GBV_ILN_206 GBV_ILN_213 GBV_ILN_224 GBV_ILN_230 GBV_ILN_250 GBV_ILN_281 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_636 GBV_ILN_702 GBV_ILN_2001 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2006 GBV_ILN_2007 GBV_ILN_2008 GBV_ILN_2009 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2026 GBV_ILN_2027 GBV_ILN_2031 GBV_ILN_2034 GBV_ILN_2037 GBV_ILN_2038 GBV_ILN_2039 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2055 GBV_ILN_2056 GBV_ILN_2057 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2088 GBV_ILN_2093 GBV_ILN_2106 GBV_ILN_2107 GBV_ILN_2108 GBV_ILN_2110 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2118 GBV_ILN_2119 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2144 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2188 GBV_ILN_2190 GBV_ILN_2232 GBV_ILN_2336 GBV_ILN_2446 GBV_ILN_2470 GBV_ILN_2472 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_2548 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4046 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4242 GBV_ILN_4246 GBV_ILN_4249 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4328 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4336 GBV_ILN_4338 GBV_ILN_4393 GBV_ILN_4700 AR 125 2023 3-4 13 01 1731-1741 |
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Springer Nature or its licensor (e.g. a society or other partner) holds exclusive rights to this article under a publishing agreement with the author(s) or other rightsholder(s); author self-archiving of the accepted manuscript version of this article is solely governed by the terms of such publishing agreement and applicable law.</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">Abstract In this work, a method using transmission interferometry is proposed to detect micro defects (streaks, inclusions, air bubbles, grooves, cracks, etc.) present in transparent materials surface. This technique is non-destructive and non-contact for the analysis of transparent and optical components whose surfaces vary from a few $ mm^{2} $ to larger sizes. The purpose of this method is to provide a means as simple as possible and to identify defects with low contrast, and in particular barely visible defects, and to differentiate between the defects. 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precision inspection of transparent component quality |
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Precision inspection of transparent component quality |
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Abstract In this work, a method using transmission interferometry is proposed to detect micro defects (streaks, inclusions, air bubbles, grooves, cracks, etc.) present in transparent materials surface. This technique is non-destructive and non-contact for the analysis of transparent and optical components whose surfaces vary from a few $ mm^{2} $ to larger sizes. The purpose of this method is to provide a means as simple as possible and to identify defects with low contrast, and in particular barely visible defects, and to differentiate between the defects. The transmission system generates interference fringes by the superposition of two microscopic periodic structures. According to the principle of the method, the image of the periodic microscopic structure, transmitted by the laser beam, traverses the sample. It then superposed on the reference microscopic structure; to generate the interference fringes, which materialize the presence of defects in the material. Changes in the shape of interference fringes inform the presence and dimensions of defects. This technique makes it possible to clearly identify microscopic and submicroscopic defects, thanks to the high resolution of the system. The optical device used allows high defect magnification of up to 1000 times. This control and measurement method allows for real-time inspection. It provides high detection resolution, allowing better observation of defects, which facilitates the automation of measurements and controls. Therefore, the proposed method can be suitable for the detection of surface defects in transparent optical objects such as optical films, lenses, and prisms. © The Author(s), under exclusive licence to Springer-Verlag London Ltd., part of Springer Nature 2023. Springer Nature or its licensor (e.g. a society or other partner) holds exclusive rights to this article under a publishing agreement with the author(s) or other rightsholder(s); author self-archiving of the accepted manuscript version of this article is solely governed by the terms of such publishing agreement and applicable law. |
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Abstract In this work, a method using transmission interferometry is proposed to detect micro defects (streaks, inclusions, air bubbles, grooves, cracks, etc.) present in transparent materials surface. This technique is non-destructive and non-contact for the analysis of transparent and optical components whose surfaces vary from a few $ mm^{2} $ to larger sizes. The purpose of this method is to provide a means as simple as possible and to identify defects with low contrast, and in particular barely visible defects, and to differentiate between the defects. The transmission system generates interference fringes by the superposition of two microscopic periodic structures. According to the principle of the method, the image of the periodic microscopic structure, transmitted by the laser beam, traverses the sample. It then superposed on the reference microscopic structure; to generate the interference fringes, which materialize the presence of defects in the material. Changes in the shape of interference fringes inform the presence and dimensions of defects. This technique makes it possible to clearly identify microscopic and submicroscopic defects, thanks to the high resolution of the system. The optical device used allows high defect magnification of up to 1000 times. This control and measurement method allows for real-time inspection. It provides high detection resolution, allowing better observation of defects, which facilitates the automation of measurements and controls. Therefore, the proposed method can be suitable for the detection of surface defects in transparent optical objects such as optical films, lenses, and prisms. © The Author(s), under exclusive licence to Springer-Verlag London Ltd., part of Springer Nature 2023. Springer Nature or its licensor (e.g. a society or other partner) holds exclusive rights to this article under a publishing agreement with the author(s) or other rightsholder(s); author self-archiving of the accepted manuscript version of this article is solely governed by the terms of such publishing agreement and applicable law. |
| abstract_unstemmed |
Abstract In this work, a method using transmission interferometry is proposed to detect micro defects (streaks, inclusions, air bubbles, grooves, cracks, etc.) present in transparent materials surface. This technique is non-destructive and non-contact for the analysis of transparent and optical components whose surfaces vary from a few $ mm^{2} $ to larger sizes. The purpose of this method is to provide a means as simple as possible and to identify defects with low contrast, and in particular barely visible defects, and to differentiate between the defects. The transmission system generates interference fringes by the superposition of two microscopic periodic structures. According to the principle of the method, the image of the periodic microscopic structure, transmitted by the laser beam, traverses the sample. It then superposed on the reference microscopic structure; to generate the interference fringes, which materialize the presence of defects in the material. Changes in the shape of interference fringes inform the presence and dimensions of defects. This technique makes it possible to clearly identify microscopic and submicroscopic defects, thanks to the high resolution of the system. The optical device used allows high defect magnification of up to 1000 times. This control and measurement method allows for real-time inspection. It provides high detection resolution, allowing better observation of defects, which facilitates the automation of measurements and controls. Therefore, the proposed method can be suitable for the detection of surface defects in transparent optical objects such as optical films, lenses, and prisms. © The Author(s), under exclusive licence to Springer-Verlag London Ltd., part of Springer Nature 2023. Springer Nature or its licensor (e.g. a society or other partner) holds exclusive rights to this article under a publishing agreement with the author(s) or other rightsholder(s); author self-archiving of the accepted manuscript version of this article is solely governed by the terms of such publishing agreement and applicable law. |
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| title_short |
Precision inspection of transparent component quality |
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Meguellati, Saїd Messagier, Meriem |
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2024-07-04T00:26:31.737Z |
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| score |
7.4008274 |