Qualitative Damage Assessment of Laser Contact Opening and Microstructural Evolution at the Rear Contact of a Perc Mono Crystalline Si Solar Cell upon Co-Firing with Si Doped Al Paste

Abstract In this study, the authors have demonstrated the effect of various metallization paste on the morphology and microstructure evolution at the local back surface field (LBSF) which includes evolution of Kirkendall voids at LBSF which are primarily responsible for reduced Al-BSF depth at the r...
Ausführliche Beschreibung

Gespeichert in:

Autor*in:	Singh, Devdutt [verfasserIn] Agrawal, Himadri Pant, Bharat K. Kamari, Priyanka

Format:	E-Artikel
Sprache:	Englisch

Erschienen:	2022

Schlagwörter:	Femtosecond laser Picosecond laser Nanosecond laser Kirkendall void Knotless screen

Anmerkung:	© The Institution of Engineers (India) 2022. Springer Nature or its licensor (e.g. a society or other partner) holds exclusive rights to this article under a publishing agreement with the author(s) or other rightsholder(s); author self-archiving of the accepted manuscript version of this article is solely governed by the terms of such publishing agreement and applicable law.

Übergeordnetes Werk:	Enthalten in: Journal of the Institution of Engineers (India) - [New Delhi] : Springer India, 2012, 104(2022), 2 vom: 14. Nov., Seite 767-776
Übergeordnetes Werk:	volume:104 ; year:2022 ; number:2 ; day:14 ; month:11 ; pages:767-776

Links:	Volltext

DOI / URN:	10.1007/s40033-022-00418-x

Katalog-ID:	SPR053960645

Internformat


LEADER	01000naa a22002652 4500
001	SPR053960645
003	DE-627
005	20231203064622.0
007	cr uuu---uuuuu
008	231203s2022 xx \|\|\|\|\|o 00\| \|\|eng c
024	7		\|a 10.1007/s40033-022-00418-x \|2 doi
035			\|a (DE-627)SPR053960645
035			\|a (SPR)s40033-022-00418-x-e
040			\|a DE-627 \|b ger \|c DE-627 \|e rakwb
041			\|a eng
100	1		\|a Singh, Devdutt \|e verfasserin \|0 (orcid)0000-0002-7882-0290 \|4 aut
245	1	0	\|a Qualitative Damage Assessment of Laser Contact Opening and Microstructural Evolution at the Rear Contact of a Perc Mono Crystalline Si Solar Cell upon Co-Firing with Si Doped Al Paste
264		1	\|c 2022
336			\|a Text \|b txt \|2 rdacontent
337			\|a Computermedien \|b c \|2 rdamedia
338			\|a Online-Ressource \|b cr \|2 rdacarrier
500			\|a © The Institution of Engineers (India) 2022. Springer Nature or its licensor (e.g. a society or other partner) holds exclusive rights to this article under a publishing agreement with the author(s) or other rightsholder(s); author self-archiving of the accepted manuscript version of this article is solely governed by the terms of such publishing agreement and applicable law.
520			\|a Abstract In this study, the authors have demonstrated the effect of various metallization paste on the morphology and microstructure evolution at the local back surface field (LBSF) which includes evolution of Kirkendall voids at LBSF which are primarily responsible for reduced Al-BSF depth at the rear contacts resulting in increased series resistance and sites for recombination. The fundamental cause for formation of void is re-crystallization process of Al-BSF which can be characterized using phase diagram calculation taking into account the surface energies of liquid Aluminum, solid Si surface and $ Al_{2} %$ O_{3} $ particles. A relationship between the ablation processes, formation of eutectic, a phase of hyper eutectic, void and solar cell performance is not yet established. The authors have also observed that it is not only the metallurgical process causing the formation of voids but also the geometrical aspect of laser ablated area, type of laser beam used, are also bound to play a vital role. The authors have also found that the metallization done using differently doped paste has resulted in reduction of formation of voids at LBSF. The researchers have optimized the dash pattern (2:1) with line spacing of about 700 nm using UV Pico and Green Pico laser and found that the Si doped paste have observed to nearly eliminated the voids at LBSF upon SEM characterization as well an improvement in VoC also indicate suppression of the Kirkendall void formation.
650		4	\|a Femtosecond laser \|7 (dpeaa)DE-He213
650		4	\|a Picosecond laser \|7 (dpeaa)DE-He213
650		4	\|a Nanosecond laser \|7 (dpeaa)DE-He213
650		4	\|a Kirkendall void \|7 (dpeaa)DE-He213
650		4	\|a Knotless screen \|7 (dpeaa)DE-He213
700	1		\|a Agrawal, Himadri \|4 aut
700	1		\|a Pant, Bharat K. \|4 aut
700	1		\|a Kamari, Priyanka \|4 aut
773	0	8	\|i Enthalten in \|t Journal of the Institution of Engineers (India) \|d [New Delhi] : Springer India, 2012 \|g 104(2022), 2 vom: 14. Nov., Seite 767-776 \|w (DE-627)722237006 \|w (DE-600)2677590-6 \|x 2250-2130 \|7 nnns
773	1	8	\|g volume:104 \|g year:2022 \|g number:2 \|g day:14 \|g month:11 \|g pages:767-776
856	4	0	\|u https://dx.doi.org/10.1007/s40033-022-00418-x \|z lizenzpflichtig \|3 Volltext
912			\|a GBV_USEFLAG_A
912			\|a SYSFLAG_A
912			\|a GBV_SPRINGER
912			\|a GBV_ILN_11
912			\|a GBV_ILN_20
912			\|a GBV_ILN_22
912			\|a GBV_ILN_23
912			\|a GBV_ILN_24
912			\|a GBV_ILN_31
912			\|a GBV_ILN_32
912			\|a GBV_ILN_39
912			\|a GBV_ILN_40
912			\|a GBV_ILN_60
912			\|a GBV_ILN_62
912			\|a GBV_ILN_63
912			\|a GBV_ILN_65
912			\|a GBV_ILN_69
912			\|a GBV_ILN_70
912			\|a GBV_ILN_73
912			\|a GBV_ILN_74
912			\|a GBV_ILN_90
912			\|a GBV_ILN_95
912			\|a GBV_ILN_100
912			\|a GBV_ILN_105
912			\|a GBV_ILN_110
912			\|a GBV_ILN_120
912			\|a GBV_ILN_138
912			\|a GBV_ILN_150
912			\|a GBV_ILN_151
912			\|a GBV_ILN_152
912			\|a GBV_ILN_161
912			\|a GBV_ILN_170
912			\|a GBV_ILN_171
912			\|a GBV_ILN_187
912			\|a GBV_ILN_213
912			\|a GBV_ILN_224
912			\|a GBV_ILN_230
912			\|a GBV_ILN_250
912			\|a GBV_ILN_281
912			\|a GBV_ILN_285
912			\|a GBV_ILN_293
912			\|a GBV_ILN_370
912			\|a GBV_ILN_602
912			\|a GBV_ILN_636
912			\|a GBV_ILN_702
912			\|a GBV_ILN_2001
912			\|a GBV_ILN_2003
912			\|a GBV_ILN_2004
912			\|a GBV_ILN_2005
912			\|a GBV_ILN_2006
912			\|a GBV_ILN_2007
912			\|a GBV_ILN_2008
912			\|a GBV_ILN_2009
912			\|a GBV_ILN_2010
912			\|a GBV_ILN_2011
912			\|a GBV_ILN_2014
912			\|a GBV_ILN_2015
912			\|a GBV_ILN_2020
912			\|a GBV_ILN_2021
912			\|a GBV_ILN_2025
912			\|a GBV_ILN_2026
912			\|a GBV_ILN_2027
912			\|a GBV_ILN_2031
912			\|a GBV_ILN_2034
912			\|a GBV_ILN_2037
912			\|a GBV_ILN_2038
912			\|a GBV_ILN_2039
912			\|a GBV_ILN_2044
912			\|a GBV_ILN_2048
912			\|a GBV_ILN_2049
912			\|a GBV_ILN_2050
912			\|a GBV_ILN_2055
912			\|a GBV_ILN_2056
912			\|a GBV_ILN_2057
912			\|a GBV_ILN_2059
912			\|a GBV_ILN_2061
912			\|a GBV_ILN_2064
912			\|a GBV_ILN_2065
912			\|a GBV_ILN_2068
912			\|a GBV_ILN_2088
912			\|a GBV_ILN_2093
912			\|a GBV_ILN_2106
912			\|a GBV_ILN_2107
912			\|a GBV_ILN_2108
912			\|a GBV_ILN_2110
912			\|a GBV_ILN_2111
912			\|a GBV_ILN_2112
912			\|a GBV_ILN_2113
912			\|a GBV_ILN_2118
912			\|a GBV_ILN_2122
912			\|a GBV_ILN_2129
912			\|a GBV_ILN_2143
912			\|a GBV_ILN_2144
912			\|a GBV_ILN_2147
912			\|a GBV_ILN_2148
912			\|a GBV_ILN_2152
912			\|a GBV_ILN_2153
912			\|a GBV_ILN_2188
912			\|a GBV_ILN_2232
912			\|a GBV_ILN_2336
912			\|a GBV_ILN_2446
912			\|a GBV_ILN_2470
912			\|a GBV_ILN_2472
912			\|a GBV_ILN_2507
912			\|a GBV_ILN_2522
912			\|a GBV_ILN_2548
912			\|a GBV_ILN_4035
912			\|a GBV_ILN_4037
912			\|a GBV_ILN_4046
912			\|a GBV_ILN_4112
912			\|a GBV_ILN_4125
912			\|a GBV_ILN_4126
912			\|a GBV_ILN_4242
912			\|a GBV_ILN_4246
912			\|a GBV_ILN_4249
912			\|a GBV_ILN_4251
912			\|a GBV_ILN_4305
912			\|a GBV_ILN_4306
912			\|a GBV_ILN_4307
912			\|a GBV_ILN_4313
912			\|a GBV_ILN_4322
912			\|a GBV_ILN_4323
912			\|a GBV_ILN_4324
912			\|a GBV_ILN_4325
912			\|a GBV_ILN_4326
912			\|a GBV_ILN_4328
912			\|a GBV_ILN_4333
912			\|a GBV_ILN_4334
912			\|a GBV_ILN_4335
912			\|a GBV_ILN_4336
912			\|a GBV_ILN_4338
912			\|a GBV_ILN_4393
912			\|a GBV_ILN_4700
951			\|a AR
952			\|d 104 \|j 2022 \|e 2 \|b 14 \|c 11 \|h 767-776

Indexfelder

author_variant	d s ds h a ha b k p bk bkp p k pk
matchkey_str	article:22502130:2022----::ulttvdmgassmnolsrotcoeignmcotutrlvltoateerotcoaecoorsalns
hierarchy_sort_str	2022
publishDate	2022
allfields	10.1007/s40033-022-00418-x doi (DE-627)SPR053960645 (SPR)s40033-022-00418-x-e DE-627 ger DE-627 rakwb eng Singh, Devdutt verfasserin (orcid)0000-0002-7882-0290 aut Qualitative Damage Assessment of Laser Contact Opening and Microstructural Evolution at the Rear Contact of a Perc Mono Crystalline Si Solar Cell upon Co-Firing with Si Doped Al Paste 2022 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier © The Institution of Engineers (India) 2022. Springer Nature or its licensor (e.g. a society or other partner) holds exclusive rights to this article under a publishing agreement with the author(s) or other rightsholder(s); author self-archiving of the accepted manuscript version of this article is solely governed by the terms of such publishing agreement and applicable law. Abstract In this study, the authors have demonstrated the effect of various metallization paste on the morphology and microstructure evolution at the local back surface field (LBSF) which includes evolution of Kirkendall voids at LBSF which are primarily responsible for reduced Al-BSF depth at the rear contacts resulting in increased series resistance and sites for recombination. The fundamental cause for formation of void is re-crystallization process of Al-BSF which can be characterized using phase diagram calculation taking into account the surface energies of liquid Aluminum, solid Si surface and $ Al_{2} %$ O_{3} $ particles. A relationship between the ablation processes, formation of eutectic, a phase of hyper eutectic, void and solar cell performance is not yet established. The authors have also observed that it is not only the metallurgical process causing the formation of voids but also the geometrical aspect of laser ablated area, type of laser beam used, are also bound to play a vital role. The authors have also found that the metallization done using differently doped paste has resulted in reduction of formation of voids at LBSF. The researchers have optimized the dash pattern (2:1) with line spacing of about 700 nm using UV Pico and Green Pico laser and found that the Si doped paste have observed to nearly eliminated the voids at LBSF upon SEM characterization as well an improvement in VoC also indicate suppression of the Kirkendall void formation. Femtosecond laser (dpeaa)DE-He213 Picosecond laser (dpeaa)DE-He213 Nanosecond laser (dpeaa)DE-He213 Kirkendall void (dpeaa)DE-He213 Knotless screen (dpeaa)DE-He213 Agrawal, Himadri aut Pant, Bharat K. aut Kamari, Priyanka aut Enthalten in Journal of the Institution of Engineers (India) [New Delhi] : Springer India, 2012 104(2022), 2 vom: 14. Nov., Seite 767-776 (DE-627)722237006 (DE-600)2677590-6 2250-2130 nnns volume:104 year:2022 number:2 day:14 month:11 pages:767-776 https://dx.doi.org/10.1007/s40033-022-00418-x lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_105 GBV_ILN_110 GBV_ILN_120 GBV_ILN_138 GBV_ILN_150 GBV_ILN_151 GBV_ILN_152 GBV_ILN_161 GBV_ILN_170 GBV_ILN_171 GBV_ILN_187 GBV_ILN_213 GBV_ILN_224 GBV_ILN_230 GBV_ILN_250 GBV_ILN_281 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_636 GBV_ILN_702 GBV_ILN_2001 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2006 GBV_ILN_2007 GBV_ILN_2008 GBV_ILN_2009 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2026 GBV_ILN_2027 GBV_ILN_2031 GBV_ILN_2034 GBV_ILN_2037 GBV_ILN_2038 GBV_ILN_2039 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2055 GBV_ILN_2056 GBV_ILN_2057 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2088 GBV_ILN_2093 GBV_ILN_2106 GBV_ILN_2107 GBV_ILN_2108 GBV_ILN_2110 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2118 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2144 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2188 GBV_ILN_2232 GBV_ILN_2336 GBV_ILN_2446 GBV_ILN_2470 GBV_ILN_2472 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_2548 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4046 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4242 GBV_ILN_4246 GBV_ILN_4249 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4328 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4336 GBV_ILN_4338 GBV_ILN_4393 GBV_ILN_4700 AR 104 2022 2 14 11 767-776
spelling	10.1007/s40033-022-00418-x doi (DE-627)SPR053960645 (SPR)s40033-022-00418-x-e DE-627 ger DE-627 rakwb eng Singh, Devdutt verfasserin (orcid)0000-0002-7882-0290 aut Qualitative Damage Assessment of Laser Contact Opening and Microstructural Evolution at the Rear Contact of a Perc Mono Crystalline Si Solar Cell upon Co-Firing with Si Doped Al Paste 2022 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier © The Institution of Engineers (India) 2022. Springer Nature or its licensor (e.g. a society or other partner) holds exclusive rights to this article under a publishing agreement with the author(s) or other rightsholder(s); author self-archiving of the accepted manuscript version of this article is solely governed by the terms of such publishing agreement and applicable law. Abstract In this study, the authors have demonstrated the effect of various metallization paste on the morphology and microstructure evolution at the local back surface field (LBSF) which includes evolution of Kirkendall voids at LBSF which are primarily responsible for reduced Al-BSF depth at the rear contacts resulting in increased series resistance and sites for recombination. The fundamental cause for formation of void is re-crystallization process of Al-BSF which can be characterized using phase diagram calculation taking into account the surface energies of liquid Aluminum, solid Si surface and $ Al_{2} %$ O_{3} $ particles. A relationship between the ablation processes, formation of eutectic, a phase of hyper eutectic, void and solar cell performance is not yet established. The authors have also observed that it is not only the metallurgical process causing the formation of voids but also the geometrical aspect of laser ablated area, type of laser beam used, are also bound to play a vital role. The authors have also found that the metallization done using differently doped paste has resulted in reduction of formation of voids at LBSF. The researchers have optimized the dash pattern (2:1) with line spacing of about 700 nm using UV Pico and Green Pico laser and found that the Si doped paste have observed to nearly eliminated the voids at LBSF upon SEM characterization as well an improvement in VoC also indicate suppression of the Kirkendall void formation. Femtosecond laser (dpeaa)DE-He213 Picosecond laser (dpeaa)DE-He213 Nanosecond laser (dpeaa)DE-He213 Kirkendall void (dpeaa)DE-He213 Knotless screen (dpeaa)DE-He213 Agrawal, Himadri aut Pant, Bharat K. aut Kamari, Priyanka aut Enthalten in Journal of the Institution of Engineers (India) [New Delhi] : Springer India, 2012 104(2022), 2 vom: 14. Nov., Seite 767-776 (DE-627)722237006 (DE-600)2677590-6 2250-2130 nnns volume:104 year:2022 number:2 day:14 month:11 pages:767-776 https://dx.doi.org/10.1007/s40033-022-00418-x lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_105 GBV_ILN_110 GBV_ILN_120 GBV_ILN_138 GBV_ILN_150 GBV_ILN_151 GBV_ILN_152 GBV_ILN_161 GBV_ILN_170 GBV_ILN_171 GBV_ILN_187 GBV_ILN_213 GBV_ILN_224 GBV_ILN_230 GBV_ILN_250 GBV_ILN_281 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_636 GBV_ILN_702 GBV_ILN_2001 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2006 GBV_ILN_2007 GBV_ILN_2008 GBV_ILN_2009 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2026 GBV_ILN_2027 GBV_ILN_2031 GBV_ILN_2034 GBV_ILN_2037 GBV_ILN_2038 GBV_ILN_2039 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2055 GBV_ILN_2056 GBV_ILN_2057 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2088 GBV_ILN_2093 GBV_ILN_2106 GBV_ILN_2107 GBV_ILN_2108 GBV_ILN_2110 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2118 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2144 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2188 GBV_ILN_2232 GBV_ILN_2336 GBV_ILN_2446 GBV_ILN_2470 GBV_ILN_2472 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_2548 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4046 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4242 GBV_ILN_4246 GBV_ILN_4249 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4328 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4336 GBV_ILN_4338 GBV_ILN_4393 GBV_ILN_4700 AR 104 2022 2 14 11 767-776
allfields_unstemmed	10.1007/s40033-022-00418-x doi (DE-627)SPR053960645 (SPR)s40033-022-00418-x-e DE-627 ger DE-627 rakwb eng Singh, Devdutt verfasserin (orcid)0000-0002-7882-0290 aut Qualitative Damage Assessment of Laser Contact Opening and Microstructural Evolution at the Rear Contact of a Perc Mono Crystalline Si Solar Cell upon Co-Firing with Si Doped Al Paste 2022 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier © The Institution of Engineers (India) 2022. Springer Nature or its licensor (e.g. a society or other partner) holds exclusive rights to this article under a publishing agreement with the author(s) or other rightsholder(s); author self-archiving of the accepted manuscript version of this article is solely governed by the terms of such publishing agreement and applicable law. Abstract In this study, the authors have demonstrated the effect of various metallization paste on the morphology and microstructure evolution at the local back surface field (LBSF) which includes evolution of Kirkendall voids at LBSF which are primarily responsible for reduced Al-BSF depth at the rear contacts resulting in increased series resistance and sites for recombination. The fundamental cause for formation of void is re-crystallization process of Al-BSF which can be characterized using phase diagram calculation taking into account the surface energies of liquid Aluminum, solid Si surface and $ Al_{2} %$ O_{3} $ particles. A relationship between the ablation processes, formation of eutectic, a phase of hyper eutectic, void and solar cell performance is not yet established. The authors have also observed that it is not only the metallurgical process causing the formation of voids but also the geometrical aspect of laser ablated area, type of laser beam used, are also bound to play a vital role. The authors have also found that the metallization done using differently doped paste has resulted in reduction of formation of voids at LBSF. The researchers have optimized the dash pattern (2:1) with line spacing of about 700 nm using UV Pico and Green Pico laser and found that the Si doped paste have observed to nearly eliminated the voids at LBSF upon SEM characterization as well an improvement in VoC also indicate suppression of the Kirkendall void formation. Femtosecond laser (dpeaa)DE-He213 Picosecond laser (dpeaa)DE-He213 Nanosecond laser (dpeaa)DE-He213 Kirkendall void (dpeaa)DE-He213 Knotless screen (dpeaa)DE-He213 Agrawal, Himadri aut Pant, Bharat K. aut Kamari, Priyanka aut Enthalten in Journal of the Institution of Engineers (India) [New Delhi] : Springer India, 2012 104(2022), 2 vom: 14. Nov., Seite 767-776 (DE-627)722237006 (DE-600)2677590-6 2250-2130 nnns volume:104 year:2022 number:2 day:14 month:11 pages:767-776 https://dx.doi.org/10.1007/s40033-022-00418-x lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_105 GBV_ILN_110 GBV_ILN_120 GBV_ILN_138 GBV_ILN_150 GBV_ILN_151 GBV_ILN_152 GBV_ILN_161 GBV_ILN_170 GBV_ILN_171 GBV_ILN_187 GBV_ILN_213 GBV_ILN_224 GBV_ILN_230 GBV_ILN_250 GBV_ILN_281 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_636 GBV_ILN_702 GBV_ILN_2001 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2006 GBV_ILN_2007 GBV_ILN_2008 GBV_ILN_2009 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2026 GBV_ILN_2027 GBV_ILN_2031 GBV_ILN_2034 GBV_ILN_2037 GBV_ILN_2038 GBV_ILN_2039 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2055 GBV_ILN_2056 GBV_ILN_2057 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2088 GBV_ILN_2093 GBV_ILN_2106 GBV_ILN_2107 GBV_ILN_2108 GBV_ILN_2110 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2118 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2144 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2188 GBV_ILN_2232 GBV_ILN_2336 GBV_ILN_2446 GBV_ILN_2470 GBV_ILN_2472 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_2548 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4046 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4242 GBV_ILN_4246 GBV_ILN_4249 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4328 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4336 GBV_ILN_4338 GBV_ILN_4393 GBV_ILN_4700 AR 104 2022 2 14 11 767-776
allfieldsGer	10.1007/s40033-022-00418-x doi (DE-627)SPR053960645 (SPR)s40033-022-00418-x-e DE-627 ger DE-627 rakwb eng Singh, Devdutt verfasserin (orcid)0000-0002-7882-0290 aut Qualitative Damage Assessment of Laser Contact Opening and Microstructural Evolution at the Rear Contact of a Perc Mono Crystalline Si Solar Cell upon Co-Firing with Si Doped Al Paste 2022 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier © The Institution of Engineers (India) 2022. Springer Nature or its licensor (e.g. a society or other partner) holds exclusive rights to this article under a publishing agreement with the author(s) or other rightsholder(s); author self-archiving of the accepted manuscript version of this article is solely governed by the terms of such publishing agreement and applicable law. Abstract In this study, the authors have demonstrated the effect of various metallization paste on the morphology and microstructure evolution at the local back surface field (LBSF) which includes evolution of Kirkendall voids at LBSF which are primarily responsible for reduced Al-BSF depth at the rear contacts resulting in increased series resistance and sites for recombination. The fundamental cause for formation of void is re-crystallization process of Al-BSF which can be characterized using phase diagram calculation taking into account the surface energies of liquid Aluminum, solid Si surface and $ Al_{2} %$ O_{3} $ particles. A relationship between the ablation processes, formation of eutectic, a phase of hyper eutectic, void and solar cell performance is not yet established. The authors have also observed that it is not only the metallurgical process causing the formation of voids but also the geometrical aspect of laser ablated area, type of laser beam used, are also bound to play a vital role. The authors have also found that the metallization done using differently doped paste has resulted in reduction of formation of voids at LBSF. The researchers have optimized the dash pattern (2:1) with line spacing of about 700 nm using UV Pico and Green Pico laser and found that the Si doped paste have observed to nearly eliminated the voids at LBSF upon SEM characterization as well an improvement in VoC also indicate suppression of the Kirkendall void formation. Femtosecond laser (dpeaa)DE-He213 Picosecond laser (dpeaa)DE-He213 Nanosecond laser (dpeaa)DE-He213 Kirkendall void (dpeaa)DE-He213 Knotless screen (dpeaa)DE-He213 Agrawal, Himadri aut Pant, Bharat K. aut Kamari, Priyanka aut Enthalten in Journal of the Institution of Engineers (India) [New Delhi] : Springer India, 2012 104(2022), 2 vom: 14. Nov., Seite 767-776 (DE-627)722237006 (DE-600)2677590-6 2250-2130 nnns volume:104 year:2022 number:2 day:14 month:11 pages:767-776 https://dx.doi.org/10.1007/s40033-022-00418-x lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_105 GBV_ILN_110 GBV_ILN_120 GBV_ILN_138 GBV_ILN_150 GBV_ILN_151 GBV_ILN_152 GBV_ILN_161 GBV_ILN_170 GBV_ILN_171 GBV_ILN_187 GBV_ILN_213 GBV_ILN_224 GBV_ILN_230 GBV_ILN_250 GBV_ILN_281 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_636 GBV_ILN_702 GBV_ILN_2001 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2006 GBV_ILN_2007 GBV_ILN_2008 GBV_ILN_2009 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2026 GBV_ILN_2027 GBV_ILN_2031 GBV_ILN_2034 GBV_ILN_2037 GBV_ILN_2038 GBV_ILN_2039 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2055 GBV_ILN_2056 GBV_ILN_2057 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2088 GBV_ILN_2093 GBV_ILN_2106 GBV_ILN_2107 GBV_ILN_2108 GBV_ILN_2110 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2118 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2144 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2188 GBV_ILN_2232 GBV_ILN_2336 GBV_ILN_2446 GBV_ILN_2470 GBV_ILN_2472 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_2548 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4046 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4242 GBV_ILN_4246 GBV_ILN_4249 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4328 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4336 GBV_ILN_4338 GBV_ILN_4393 GBV_ILN_4700 AR 104 2022 2 14 11 767-776
allfieldsSound	10.1007/s40033-022-00418-x doi (DE-627)SPR053960645 (SPR)s40033-022-00418-x-e DE-627 ger DE-627 rakwb eng Singh, Devdutt verfasserin (orcid)0000-0002-7882-0290 aut Qualitative Damage Assessment of Laser Contact Opening and Microstructural Evolution at the Rear Contact of a Perc Mono Crystalline Si Solar Cell upon Co-Firing with Si Doped Al Paste 2022 Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier © The Institution of Engineers (India) 2022. Springer Nature or its licensor (e.g. a society or other partner) holds exclusive rights to this article under a publishing agreement with the author(s) or other rightsholder(s); author self-archiving of the accepted manuscript version of this article is solely governed by the terms of such publishing agreement and applicable law. Abstract In this study, the authors have demonstrated the effect of various metallization paste on the morphology and microstructure evolution at the local back surface field (LBSF) which includes evolution of Kirkendall voids at LBSF which are primarily responsible for reduced Al-BSF depth at the rear contacts resulting in increased series resistance and sites for recombination. The fundamental cause for formation of void is re-crystallization process of Al-BSF which can be characterized using phase diagram calculation taking into account the surface energies of liquid Aluminum, solid Si surface and $ Al_{2} %$ O_{3} $ particles. A relationship between the ablation processes, formation of eutectic, a phase of hyper eutectic, void and solar cell performance is not yet established. The authors have also observed that it is not only the metallurgical process causing the formation of voids but also the geometrical aspect of laser ablated area, type of laser beam used, are also bound to play a vital role. The authors have also found that the metallization done using differently doped paste has resulted in reduction of formation of voids at LBSF. The researchers have optimized the dash pattern (2:1) with line spacing of about 700 nm using UV Pico and Green Pico laser and found that the Si doped paste have observed to nearly eliminated the voids at LBSF upon SEM characterization as well an improvement in VoC also indicate suppression of the Kirkendall void formation. Femtosecond laser (dpeaa)DE-He213 Picosecond laser (dpeaa)DE-He213 Nanosecond laser (dpeaa)DE-He213 Kirkendall void (dpeaa)DE-He213 Knotless screen (dpeaa)DE-He213 Agrawal, Himadri aut Pant, Bharat K. aut Kamari, Priyanka aut Enthalten in Journal of the Institution of Engineers (India) [New Delhi] : Springer India, 2012 104(2022), 2 vom: 14. Nov., Seite 767-776 (DE-627)722237006 (DE-600)2677590-6 2250-2130 nnns volume:104 year:2022 number:2 day:14 month:11 pages:767-776 https://dx.doi.org/10.1007/s40033-022-00418-x lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_105 GBV_ILN_110 GBV_ILN_120 GBV_ILN_138 GBV_ILN_150 GBV_ILN_151 GBV_ILN_152 GBV_ILN_161 GBV_ILN_170 GBV_ILN_171 GBV_ILN_187 GBV_ILN_213 GBV_ILN_224 GBV_ILN_230 GBV_ILN_250 GBV_ILN_281 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_636 GBV_ILN_702 GBV_ILN_2001 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2006 GBV_ILN_2007 GBV_ILN_2008 GBV_ILN_2009 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2026 GBV_ILN_2027 GBV_ILN_2031 GBV_ILN_2034 GBV_ILN_2037 GBV_ILN_2038 GBV_ILN_2039 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2055 GBV_ILN_2056 GBV_ILN_2057 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2088 GBV_ILN_2093 GBV_ILN_2106 GBV_ILN_2107 GBV_ILN_2108 GBV_ILN_2110 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2118 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2144 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2188 GBV_ILN_2232 GBV_ILN_2336 GBV_ILN_2446 GBV_ILN_2470 GBV_ILN_2472 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_2548 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4046 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4242 GBV_ILN_4246 GBV_ILN_4249 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4328 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4336 GBV_ILN_4338 GBV_ILN_4393 GBV_ILN_4700 AR 104 2022 2 14 11 767-776
language	English
source	Enthalten in Journal of the Institution of Engineers (India) 104(2022), 2 vom: 14. Nov., Seite 767-776 volume:104 year:2022 number:2 day:14 month:11 pages:767-776
sourceStr	Enthalten in Journal of the Institution of Engineers (India) 104(2022), 2 vom: 14. Nov., Seite 767-776 volume:104 year:2022 number:2 day:14 month:11 pages:767-776
format_phy_str_mv	Article
institution	findex.gbv.de
topic_facet	Femtosecond laser Picosecond laser Nanosecond laser Kirkendall void Knotless screen
isfreeaccess_bool	false
container_title	Journal of the Institution of Engineers (India)
authorswithroles_txt_mv	Singh, Devdutt @@aut@@ Agrawal, Himadri @@aut@@ Pant, Bharat K. @@aut@@ Kamari, Priyanka @@aut@@
publishDateDaySort_date	2022-11-14T00:00:00Z
hierarchy_top_id	722237006
id	SPR053960645
language_de	englisch
fullrecord	<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01000naa a22002652 4500</leader><controlfield tag="001">SPR053960645</controlfield><controlfield tag="003">DE-627</controlfield><controlfield tag="005">20231203064622.0</controlfield><controlfield tag="007">cr uuu---uuuuu</controlfield><controlfield tag="008">231203s2022 xx \|\|\|\|\|o 00\| \|\|eng c</controlfield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1007/s40033-022-00418-x</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-627)SPR053960645</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(SPR)s40033-022-00418-x-e</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-627</subfield><subfield code="b">ger</subfield><subfield code="c">DE-627</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Singh, Devdutt</subfield><subfield code="e">verfasserin</subfield><subfield code="0">(orcid)0000-0002-7882-0290</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Qualitative Damage Assessment of Laser Contact Opening and Microstructural Evolution at the Rear Contact of a Perc Mono Crystalline Si Solar Cell upon Co-Firing with Si Doped Al Paste</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">2022</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">Text</subfield><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">Computermedien</subfield><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">Online-Ressource</subfield><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">© The Institution of Engineers (India) 2022. Springer Nature or its licensor (e.g. a society or other partner) holds exclusive rights to this article under a publishing agreement with the author(s) or other rightsholder(s); author self-archiving of the accepted manuscript version of this article is solely governed by the terms of such publishing agreement and applicable law.</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">Abstract In this study, the authors have demonstrated the effect of various metallization paste on the morphology and microstructure evolution at the local back surface field (LBSF) which includes evolution of Kirkendall voids at LBSF which are primarily responsible for reduced Al-BSF depth at the rear contacts resulting in increased series resistance and sites for recombination. The fundamental cause for formation of void is re-crystallization process of Al-BSF which can be characterized using phase diagram calculation taking into account the surface energies of liquid Aluminum, solid Si surface and $ Al_{2} %$ O_{3} $ particles. A relationship between the ablation processes, formation of eutectic, a phase of hyper eutectic, void and solar cell performance is not yet established. The authors have also observed that it is not only the metallurgical process causing the formation of voids but also the geometrical aspect of laser ablated area, type of laser beam used, are also bound to play a vital role. The authors have also found that the metallization done using differently doped paste has resulted in reduction of formation of voids at LBSF. The researchers have optimized the dash pattern (2:1) with line spacing of about 700 nm using UV Pico and Green Pico laser and found that the Si doped paste have observed to nearly eliminated the voids at LBSF upon SEM characterization as well an improvement in VoC also indicate suppression of the Kirkendall void formation.</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Femtosecond laser</subfield><subfield code="7">(dpeaa)DE-He213</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Picosecond laser</subfield><subfield code="7">(dpeaa)DE-He213</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Nanosecond laser</subfield><subfield code="7">(dpeaa)DE-He213</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Kirkendall void</subfield><subfield code="7">(dpeaa)DE-He213</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Knotless screen</subfield><subfield code="7">(dpeaa)DE-He213</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Agrawal, Himadri</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Pant, Bharat K.</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Kamari, Priyanka</subfield><subfield code="4">aut</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="i">Enthalten in</subfield><subfield code="t">Journal of the Institution of Engineers (India)</subfield><subfield code="d">[New Delhi] : Springer India, 2012</subfield><subfield code="g">104(2022), 2 vom: 14. Nov., Seite 767-776</subfield><subfield code="w">(DE-627)722237006</subfield><subfield code="w">(DE-600)2677590-6</subfield><subfield code="x">2250-2130</subfield><subfield code="7">nnns</subfield></datafield><datafield tag="773" ind1="1" ind2="8"><subfield code="g">volume:104</subfield><subfield code="g">year:2022</subfield><subfield code="g">number:2</subfield><subfield code="g">day:14</subfield><subfield code="g">month:11</subfield><subfield code="g">pages:767-776</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://dx.doi.org/10.1007/s40033-022-00418-x</subfield><subfield code="z">lizenzpflichtig</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_USEFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SYSFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_SPRINGER</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_11</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_20</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_22</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_23</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_24</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_31</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_32</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_39</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_40</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_60</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_62</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_63</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_65</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_69</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_70</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_73</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_74</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_90</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_95</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_100</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_105</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_110</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_120</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_138</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_150</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_151</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_152</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_161</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_170</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_171</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_187</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_213</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_224</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_230</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_250</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_281</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_285</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_293</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_370</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_602</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_636</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_702</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2001</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2003</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2004</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2005</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2006</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2007</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2008</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2009</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2010</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2011</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2014</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2015</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2020</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2021</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2025</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2026</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2027</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2031</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2034</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2037</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2038</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2039</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2044</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2048</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2049</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2050</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2055</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2056</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2057</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2059</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2061</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2064</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2065</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2068</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2088</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2093</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2106</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2107</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2108</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2110</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2111</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2112</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2113</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2118</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2122</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2129</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2143</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2144</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2147</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2148</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2152</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2153</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2188</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2232</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2336</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2446</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2470</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2472</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2507</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2522</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2548</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4035</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4037</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4046</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4112</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4125</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4126</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4242</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4246</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4249</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4251</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4305</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4306</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4307</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4313</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4322</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4323</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4324</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4325</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4326</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4328</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4333</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4334</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4335</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4336</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4338</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4393</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4700</subfield></datafield><datafield tag="951" ind1=" " ind2=" "><subfield code="a">AR</subfield></datafield><datafield tag="952" ind1=" " ind2=" "><subfield code="d">104</subfield><subfield code="j">2022</subfield><subfield code="e">2</subfield><subfield code="b">14</subfield><subfield code="c">11</subfield><subfield code="h">767-776</subfield></datafield></record></collection>
author	Singh, Devdutt
spellingShingle	Singh, Devdutt misc Femtosecond laser misc Picosecond laser misc Nanosecond laser misc Kirkendall void misc Knotless screen Qualitative Damage Assessment of Laser Contact Opening and Microstructural Evolution at the Rear Contact of a Perc Mono Crystalline Si Solar Cell upon Co-Firing with Si Doped Al Paste
authorStr	Singh, Devdutt
ppnlink_with_tag_str_mv	@@773@@(DE-627)722237006
format	electronic Article
delete_txt_mv	keep
author_role	aut aut aut aut
collection	springer
remote_str	true
illustrated	Not Illustrated
issn	2250-2130
topic_title	Qualitative Damage Assessment of Laser Contact Opening and Microstructural Evolution at the Rear Contact of a Perc Mono Crystalline Si Solar Cell upon Co-Firing with Si Doped Al Paste Femtosecond laser (dpeaa)DE-He213 Picosecond laser (dpeaa)DE-He213 Nanosecond laser (dpeaa)DE-He213 Kirkendall void (dpeaa)DE-He213 Knotless screen (dpeaa)DE-He213
topic	misc Femtosecond laser misc Picosecond laser misc Nanosecond laser misc Kirkendall void misc Knotless screen
topic_unstemmed	misc Femtosecond laser misc Picosecond laser misc Nanosecond laser misc Kirkendall void misc Knotless screen
topic_browse	misc Femtosecond laser misc Picosecond laser misc Nanosecond laser misc Kirkendall void misc Knotless screen
format_facet	Elektronische Aufsätze Aufsätze Elektronische Ressource
format_main_str_mv	Text Zeitschrift/Artikel
carriertype_str_mv	cr
hierarchy_parent_title	Journal of the Institution of Engineers (India)
hierarchy_parent_id	722237006
hierarchy_top_title	Journal of the Institution of Engineers (India)
isfreeaccess_txt	false
familylinks_str_mv	(DE-627)722237006 (DE-600)2677590-6
title	Qualitative Damage Assessment of Laser Contact Opening and Microstructural Evolution at the Rear Contact of a Perc Mono Crystalline Si Solar Cell upon Co-Firing with Si Doped Al Paste
ctrlnum	(DE-627)SPR053960645 (SPR)s40033-022-00418-x-e
title_full	Qualitative Damage Assessment of Laser Contact Opening and Microstructural Evolution at the Rear Contact of a Perc Mono Crystalline Si Solar Cell upon Co-Firing with Si Doped Al Paste
author_sort	Singh, Devdutt
journal	Journal of the Institution of Engineers (India)
journalStr	Journal of the Institution of Engineers (India)
lang_code	eng
isOA_bool	false
recordtype	marc
publishDateSort	2022
contenttype_str_mv	txt
container_start_page	767
author_browse	Singh, Devdutt Agrawal, Himadri Pant, Bharat K. Kamari, Priyanka
container_volume	104
format_se	Elektronische Aufsätze
author-letter	Singh, Devdutt
doi_str_mv	10.1007/s40033-022-00418-x
normlink	(ORCID)0000-0002-7882-0290
normlink_prefix_str_mv	(orcid)0000-0002-7882-0290
title_sort	qualitative damage assessment of laser contact opening and microstructural evolution at the rear contact of a perc mono crystalline si solar cell upon co-firing with si doped al paste
title_auth	Qualitative Damage Assessment of Laser Contact Opening and Microstructural Evolution at the Rear Contact of a Perc Mono Crystalline Si Solar Cell upon Co-Firing with Si Doped Al Paste
abstract	Abstract In this study, the authors have demonstrated the effect of various metallization paste on the morphology and microstructure evolution at the local back surface field (LBSF) which includes evolution of Kirkendall voids at LBSF which are primarily responsible for reduced Al-BSF depth at the rear contacts resulting in increased series resistance and sites for recombination. The fundamental cause for formation of void is re-crystallization process of Al-BSF which can be characterized using phase diagram calculation taking into account the surface energies of liquid Aluminum, solid Si surface and $ Al_{2} %$ O_{3} $ particles. A relationship between the ablation processes, formation of eutectic, a phase of hyper eutectic, void and solar cell performance is not yet established. The authors have also observed that it is not only the metallurgical process causing the formation of voids but also the geometrical aspect of laser ablated area, type of laser beam used, are also bound to play a vital role. The authors have also found that the metallization done using differently doped paste has resulted in reduction of formation of voids at LBSF. The researchers have optimized the dash pattern (2:1) with line spacing of about 700 nm using UV Pico and Green Pico laser and found that the Si doped paste have observed to nearly eliminated the voids at LBSF upon SEM characterization as well an improvement in VoC also indicate suppression of the Kirkendall void formation. © The Institution of Engineers (India) 2022. Springer Nature or its licensor (e.g. a society or other partner) holds exclusive rights to this article under a publishing agreement with the author(s) or other rightsholder(s); author self-archiving of the accepted manuscript version of this article is solely governed by the terms of such publishing agreement and applicable law.
abstractGer	Abstract In this study, the authors have demonstrated the effect of various metallization paste on the morphology and microstructure evolution at the local back surface field (LBSF) which includes evolution of Kirkendall voids at LBSF which are primarily responsible for reduced Al-BSF depth at the rear contacts resulting in increased series resistance and sites for recombination. The fundamental cause for formation of void is re-crystallization process of Al-BSF which can be characterized using phase diagram calculation taking into account the surface energies of liquid Aluminum, solid Si surface and $ Al_{2} %$ O_{3} $ particles. A relationship between the ablation processes, formation of eutectic, a phase of hyper eutectic, void and solar cell performance is not yet established. The authors have also observed that it is not only the metallurgical process causing the formation of voids but also the geometrical aspect of laser ablated area, type of laser beam used, are also bound to play a vital role. The authors have also found that the metallization done using differently doped paste has resulted in reduction of formation of voids at LBSF. The researchers have optimized the dash pattern (2:1) with line spacing of about 700 nm using UV Pico and Green Pico laser and found that the Si doped paste have observed to nearly eliminated the voids at LBSF upon SEM characterization as well an improvement in VoC also indicate suppression of the Kirkendall void formation. © The Institution of Engineers (India) 2022. Springer Nature or its licensor (e.g. a society or other partner) holds exclusive rights to this article under a publishing agreement with the author(s) or other rightsholder(s); author self-archiving of the accepted manuscript version of this article is solely governed by the terms of such publishing agreement and applicable law.
abstract_unstemmed	Abstract In this study, the authors have demonstrated the effect of various metallization paste on the morphology and microstructure evolution at the local back surface field (LBSF) which includes evolution of Kirkendall voids at LBSF which are primarily responsible for reduced Al-BSF depth at the rear contacts resulting in increased series resistance and sites for recombination. The fundamental cause for formation of void is re-crystallization process of Al-BSF which can be characterized using phase diagram calculation taking into account the surface energies of liquid Aluminum, solid Si surface and $ Al_{2} %$ O_{3} $ particles. A relationship between the ablation processes, formation of eutectic, a phase of hyper eutectic, void and solar cell performance is not yet established. The authors have also observed that it is not only the metallurgical process causing the formation of voids but also the geometrical aspect of laser ablated area, type of laser beam used, are also bound to play a vital role. The authors have also found that the metallization done using differently doped paste has resulted in reduction of formation of voids at LBSF. The researchers have optimized the dash pattern (2:1) with line spacing of about 700 nm using UV Pico and Green Pico laser and found that the Si doped paste have observed to nearly eliminated the voids at LBSF upon SEM characterization as well an improvement in VoC also indicate suppression of the Kirkendall void formation. © The Institution of Engineers (India) 2022. Springer Nature or its licensor (e.g. a society or other partner) holds exclusive rights to this article under a publishing agreement with the author(s) or other rightsholder(s); author self-archiving of the accepted manuscript version of this article is solely governed by the terms of such publishing agreement and applicable law.
collection_details	GBV_USEFLAG_A SYSFLAG_A GBV_SPRINGER GBV_ILN_11 GBV_ILN_20 GBV_ILN_22 GBV_ILN_23 GBV_ILN_24 GBV_ILN_31 GBV_ILN_32 GBV_ILN_39 GBV_ILN_40 GBV_ILN_60 GBV_ILN_62 GBV_ILN_63 GBV_ILN_65 GBV_ILN_69 GBV_ILN_70 GBV_ILN_73 GBV_ILN_74 GBV_ILN_90 GBV_ILN_95 GBV_ILN_100 GBV_ILN_105 GBV_ILN_110 GBV_ILN_120 GBV_ILN_138 GBV_ILN_150 GBV_ILN_151 GBV_ILN_152 GBV_ILN_161 GBV_ILN_170 GBV_ILN_171 GBV_ILN_187 GBV_ILN_213 GBV_ILN_224 GBV_ILN_230 GBV_ILN_250 GBV_ILN_281 GBV_ILN_285 GBV_ILN_293 GBV_ILN_370 GBV_ILN_602 GBV_ILN_636 GBV_ILN_702 GBV_ILN_2001 GBV_ILN_2003 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2006 GBV_ILN_2007 GBV_ILN_2008 GBV_ILN_2009 GBV_ILN_2010 GBV_ILN_2011 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2020 GBV_ILN_2021 GBV_ILN_2025 GBV_ILN_2026 GBV_ILN_2027 GBV_ILN_2031 GBV_ILN_2034 GBV_ILN_2037 GBV_ILN_2038 GBV_ILN_2039 GBV_ILN_2044 GBV_ILN_2048 GBV_ILN_2049 GBV_ILN_2050 GBV_ILN_2055 GBV_ILN_2056 GBV_ILN_2057 GBV_ILN_2059 GBV_ILN_2061 GBV_ILN_2064 GBV_ILN_2065 GBV_ILN_2068 GBV_ILN_2088 GBV_ILN_2093 GBV_ILN_2106 GBV_ILN_2107 GBV_ILN_2108 GBV_ILN_2110 GBV_ILN_2111 GBV_ILN_2112 GBV_ILN_2113 GBV_ILN_2118 GBV_ILN_2122 GBV_ILN_2129 GBV_ILN_2143 GBV_ILN_2144 GBV_ILN_2147 GBV_ILN_2148 GBV_ILN_2152 GBV_ILN_2153 GBV_ILN_2188 GBV_ILN_2232 GBV_ILN_2336 GBV_ILN_2446 GBV_ILN_2470 GBV_ILN_2472 GBV_ILN_2507 GBV_ILN_2522 GBV_ILN_2548 GBV_ILN_4035 GBV_ILN_4037 GBV_ILN_4046 GBV_ILN_4112 GBV_ILN_4125 GBV_ILN_4126 GBV_ILN_4242 GBV_ILN_4246 GBV_ILN_4249 GBV_ILN_4251 GBV_ILN_4305 GBV_ILN_4306 GBV_ILN_4307 GBV_ILN_4313 GBV_ILN_4322 GBV_ILN_4323 GBV_ILN_4324 GBV_ILN_4325 GBV_ILN_4326 GBV_ILN_4328 GBV_ILN_4333 GBV_ILN_4334 GBV_ILN_4335 GBV_ILN_4336 GBV_ILN_4338 GBV_ILN_4393 GBV_ILN_4700
container_issue	2
title_short	Qualitative Damage Assessment of Laser Contact Opening and Microstructural Evolution at the Rear Contact of a Perc Mono Crystalline Si Solar Cell upon Co-Firing with Si Doped Al Paste
url	https://dx.doi.org/10.1007/s40033-022-00418-x
remote_bool	true
author2	Agrawal, Himadri Pant, Bharat K. Kamari, Priyanka
author2Str	Agrawal, Himadri Pant, Bharat K. Kamari, Priyanka
ppnlink	722237006
mediatype_str_mv	c
isOA_txt	false
hochschulschrift_bool	false
doi_str	10.1007/s40033-022-00418-x
up_date	2024-07-03T23:09:19.967Z
_version_	1803601219391848448
fullrecord_marcxml	<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01000naa a22002652 4500</leader><controlfield tag="001">SPR053960645</controlfield><controlfield tag="003">DE-627</controlfield><controlfield tag="005">20231203064622.0</controlfield><controlfield tag="007">cr uuu---uuuuu</controlfield><controlfield tag="008">231203s2022 xx \|\|\|\|\|o 00\| \|\|eng c</controlfield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1007/s40033-022-00418-x</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-627)SPR053960645</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(SPR)s40033-022-00418-x-e</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-627</subfield><subfield code="b">ger</subfield><subfield code="c">DE-627</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Singh, Devdutt</subfield><subfield code="e">verfasserin</subfield><subfield code="0">(orcid)0000-0002-7882-0290</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Qualitative Damage Assessment of Laser Contact Opening and Microstructural Evolution at the Rear Contact of a Perc Mono Crystalline Si Solar Cell upon Co-Firing with Si Doped Al Paste</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">2022</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">Text</subfield><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">Computermedien</subfield><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">Online-Ressource</subfield><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">© The Institution of Engineers (India) 2022. Springer Nature or its licensor (e.g. a society or other partner) holds exclusive rights to this article under a publishing agreement with the author(s) or other rightsholder(s); author self-archiving of the accepted manuscript version of this article is solely governed by the terms of such publishing agreement and applicable law.</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">Abstract In this study, the authors have demonstrated the effect of various metallization paste on the morphology and microstructure evolution at the local back surface field (LBSF) which includes evolution of Kirkendall voids at LBSF which are primarily responsible for reduced Al-BSF depth at the rear contacts resulting in increased series resistance and sites for recombination. The fundamental cause for formation of void is re-crystallization process of Al-BSF which can be characterized using phase diagram calculation taking into account the surface energies of liquid Aluminum, solid Si surface and $ Al_{2} %$ O_{3} $ particles. A relationship between the ablation processes, formation of eutectic, a phase of hyper eutectic, void and solar cell performance is not yet established. The authors have also observed that it is not only the metallurgical process causing the formation of voids but also the geometrical aspect of laser ablated area, type of laser beam used, are also bound to play a vital role. The authors have also found that the metallization done using differently doped paste has resulted in reduction of formation of voids at LBSF. The researchers have optimized the dash pattern (2:1) with line spacing of about 700 nm using UV Pico and Green Pico laser and found that the Si doped paste have observed to nearly eliminated the voids at LBSF upon SEM characterization as well an improvement in VoC also indicate suppression of the Kirkendall void formation.</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Femtosecond laser</subfield><subfield code="7">(dpeaa)DE-He213</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Picosecond laser</subfield><subfield code="7">(dpeaa)DE-He213</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Nanosecond laser</subfield><subfield code="7">(dpeaa)DE-He213</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Kirkendall void</subfield><subfield code="7">(dpeaa)DE-He213</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Knotless screen</subfield><subfield code="7">(dpeaa)DE-He213</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Agrawal, Himadri</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Pant, Bharat K.</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Kamari, Priyanka</subfield><subfield code="4">aut</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="i">Enthalten in</subfield><subfield code="t">Journal of the Institution of Engineers (India)</subfield><subfield code="d">[New Delhi] : Springer India, 2012</subfield><subfield code="g">104(2022), 2 vom: 14. Nov., Seite 767-776</subfield><subfield code="w">(DE-627)722237006</subfield><subfield code="w">(DE-600)2677590-6</subfield><subfield code="x">2250-2130</subfield><subfield code="7">nnns</subfield></datafield><datafield tag="773" ind1="1" ind2="8"><subfield code="g">volume:104</subfield><subfield code="g">year:2022</subfield><subfield code="g">number:2</subfield><subfield code="g">day:14</subfield><subfield code="g">month:11</subfield><subfield code="g">pages:767-776</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://dx.doi.org/10.1007/s40033-022-00418-x</subfield><subfield code="z">lizenzpflichtig</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_USEFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SYSFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_SPRINGER</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_11</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_20</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_22</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_23</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_24</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_31</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_32</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_39</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_40</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_60</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_62</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_63</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_65</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_69</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_70</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_73</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_74</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_90</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_95</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_100</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_105</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_110</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_120</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_138</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_150</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_151</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_152</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_161</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_170</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_171</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_187</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_213</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_224</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_230</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_250</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_281</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_285</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_293</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_370</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_602</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_636</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_702</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2001</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2003</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2004</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2005</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2006</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2007</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2008</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2009</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2010</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2011</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2014</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2015</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2020</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2021</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2025</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2026</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2027</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2031</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2034</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2037</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2038</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2039</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2044</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2048</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2049</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2050</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2055</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2056</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2057</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2059</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2061</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2064</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2065</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2068</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2088</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2093</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2106</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2107</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2108</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2110</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2111</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2112</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2113</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2118</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2122</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2129</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2143</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2144</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2147</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2148</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2152</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2153</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2188</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2232</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2336</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2446</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2470</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2472</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2507</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2522</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2548</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4035</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4037</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4046</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4112</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4125</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4126</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4242</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4246</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4249</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4251</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4305</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4306</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4307</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4313</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4322</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4323</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4324</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4325</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4326</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4328</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4333</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4334</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4335</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4336</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4338</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4393</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4700</subfield></datafield><datafield tag="951" ind1=" " ind2=" "><subfield code="a">AR</subfield></datafield><datafield tag="952" ind1=" " ind2=" "><subfield code="d">104</subfield><subfield code="j">2022</subfield><subfield code="e">2</subfield><subfield code="b">14</subfield><subfield code="c">11</subfield><subfield code="h">767-776</subfield></datafield></record></collection>
score	7.400237

Nicht das Richtige dabei?

Schreiben Sie uns!

Qualitative Damage Assessment of Laser Contact Opening and Microstructural Evolution at the Rear Contact of a Perc Mono Crystalline Si Solar Cell upon Co-Firing with Si Doped Al Paste

Nicht das Richtige dabei?

Zugang & Verfügbarkeit

Vorhandene Bände

Nicht das Richtige dabei?