Quantitative modeling of perovskite-based direct X-ray flat panel detectors

Abstract Direct X-ray detectors based on semiconductors have drawn great attention from researchers in the pursuing of higher imaging quality. However, many previous works focused on the optimization of detection performances but seldomly watch them in an overall view and analyze how they will influ...
Ausführliche Beschreibung

Gespeichert in:
Autor*in:

Song, Zihao [verfasserIn]

Wang, Gaozhu [verfasserIn]

Pang, Jincong [verfasserIn]

Zheng, Zhiping [verfasserIn]

Xu, Ling [verfasserIn]

Zhou, Ying [verfasserIn]

Niu, Guangda [verfasserIn]

Tang, Jiang [verfasserIn]

Format:

E-Artikel

Sprache:

Englisch

Erschienen:

2024

Schlagwörter:

DQE

X-ray

Detector

Perovskite

Anmerkung:

© The Author(s) 2024

Übergeordnetes Werk:

Enthalten in: Frontiers of optoelectronics - Higher Education Press, 2012, 17(2024), 1 vom: 26. Sept.

Übergeordnetes Werk:

volume:17 ; year:2024 ; number:1 ; day:26 ; month:09

Links:

Volltext

DOI / URN:

10.1007/s12200-024-00136-0

Katalog-ID:

SPR057477639

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